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Shawn Riley

Examiner (ID: 12497)

Most Active Art Unit
2838
Art Unit(s)
2102, 2111, 2504, 2838
Total Applications
2083
Issued Applications
1947
Pending Applications
7
Abandoned Applications
129

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 3856029 [patent_doc_number] => 05795492 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-08-18 [patent_title] => 'Etching metals using chlorine gas and hydrochloric gas in de-ionized water' [patent_app_type] => 1 [patent_app_number] => 8/846833 [patent_app_country] => US [patent_app_date] => 1997-04-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1052 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 38 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/795/05795492.pdf [firstpage_image] =>[orig_patent_app_number] => 846833 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/846833
Etching metals using chlorine gas and hydrochloric gas in de-ionized water Apr 29, 1997 Issued
Array ( [id] => 3889491 [patent_doc_number] => 05834377 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-11-10 [patent_title] => 'In situ method for CMP endpoint detection' [patent_app_type] => 1 [patent_app_number] => 8/826711 [patent_app_country] => US [patent_app_date] => 1997-04-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 10 [patent_no_of_words] => 2448 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 80 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/834/05834377.pdf [firstpage_image] =>[orig_patent_app_number] => 826711 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/826711
In situ method for CMP endpoint detection Apr 6, 1997 Issued
Array ( [id] => 3867966 [patent_doc_number] => 05837610 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-11-17 [patent_title] => 'Chemical mechanical polishing (CMP) apparatus and CMP method using the same' [patent_app_type] => 1 [patent_app_number] => 8/805659 [patent_app_country] => US [patent_app_date] => 1997-02-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 1625 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 85 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/837/05837610.pdf [firstpage_image] =>[orig_patent_app_number] => 805659 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/805659
Chemical mechanical polishing (CMP) apparatus and CMP method using the same Feb 26, 1997 Issued
Array ( [id] => 3981152 [patent_doc_number] => 05861226 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-01-19 [patent_title] => 'Method of fabricating a resonant micromesh filter' [patent_app_type] => 1 [patent_app_number] => 8/771590 [patent_app_country] => US [patent_app_date] => 1996-12-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 49 [patent_no_of_words] => 9219 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 208 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/861/05861226.pdf [firstpage_image] =>[orig_patent_app_number] => 771590 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/771590
Method of fabricating a resonant micromesh filter Dec 19, 1996 Issued
Array ( [id] => 3808293 [patent_doc_number] => 05811355 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-09-22 [patent_title] => 'Enhanced chemical-mechanical polishing (E-CMP) method of forming a planar surface on a thin film magnetic head to avoid pole recession' [patent_app_type] => 1 [patent_app_number] => 8/741838 [patent_app_country] => US [patent_app_date] => 1996-10-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 3259 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 86 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/811/05811355.pdf [firstpage_image] =>[orig_patent_app_number] => 741838 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/741838
Enhanced chemical-mechanical polishing (E-CMP) method of forming a planar surface on a thin film magnetic head to avoid pole recession Oct 30, 1996 Issued
Array ( [id] => 3802460 [patent_doc_number] => 05810963 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-09-22 [patent_title] => 'Plasma processing apparatus and method' [patent_app_type] => 1 [patent_app_number] => 8/722464 [patent_app_country] => US [patent_app_date] => 1996-09-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 17 [patent_no_of_words] => 8093 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 128 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/810/05810963.pdf [firstpage_image] =>[orig_patent_app_number] => 722464 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/722464
Plasma processing apparatus and method Sep 26, 1996 Issued
Array ( [id] => 3803226 [patent_doc_number] => 05811017 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-09-22 [patent_title] => 'Cantilever for use in a scanning probe microscope and method of manufacturing the same' [patent_app_type] => 1 [patent_app_number] => 8/645655 [patent_app_country] => US [patent_app_date] => 1996-05-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 24 [patent_no_of_words] => 5420 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 217 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/811/05811017.pdf [firstpage_image] =>[orig_patent_app_number] => 645655 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/645655
Cantilever for use in a scanning probe microscope and method of manufacturing the same May 13, 1996 Issued
Array ( [id] => 3791651 [patent_doc_number] => 05827395 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1998-10-27 [patent_title] => 'Polishing pad used for polishing silicon wafers and polishing method using the same' [patent_app_type] => 1 [patent_app_number] => 8/455519 [patent_app_country] => US [patent_app_date] => 1995-05-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 1976 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 44 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/827/05827395.pdf [firstpage_image] =>[orig_patent_app_number] => 455519 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/455519
Polishing pad used for polishing silicon wafers and polishing method using the same May 30, 1995 Issued
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