![](/images/general/no_picture/200_user.png)
Nalin B Pilapitiya
Examiner (ID: 13996)
Most Active Art Unit | 2617 |
Art Unit(s) | 2617 |
Total Applications | 11 |
Issued Applications | 3 |
Pending Applications | 0 |
Abandoned Applications | 8 |
Applications
Application number | Title of the application | Filing Date | Status |
---|---|---|---|
Array
(
[id] => 3516119
[patent_doc_number] => 05563509
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-10-08
[patent_title] => 'Adaptable load board assembly for testing ICs with different power/ground bond pad and/or pin configurations'
[patent_app_type] => 1
[patent_app_number] => 8/574862
[patent_app_country] => US
[patent_app_date] => 1995-12-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 18
[patent_no_of_words] => 5851
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 272
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/563/05563509.pdf
[firstpage_image] =>[orig_patent_app_number] => 574862
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/574862 | Adaptable load board assembly for testing ICs with different power/ground bond pad and/or pin configurations | Dec 18, 1995 | Issued |
Array
(
[id] => 3556802
[patent_doc_number] => 05555422
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-09-10
[patent_title] => 'Prober for semiconductor integrated circuit element wafer'
[patent_app_type] => 1
[patent_app_number] => 8/547383
[patent_app_country] => US
[patent_app_date] => 1995-10-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 22
[patent_no_of_words] => 11695
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 236
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/555/05555422.pdf
[firstpage_image] =>[orig_patent_app_number] => 547383
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/547383 | Prober for semiconductor integrated circuit element wafer | Oct 23, 1995 | Issued |
Array
(
[id] => 3593312
[patent_doc_number] => 05550479
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-08-27
[patent_title] => 'Signal measuring apparatus and signal measuring method'
[patent_app_type] => 1
[patent_app_number] => 8/498911
[patent_app_country] => US
[patent_app_date] => 1995-07-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 23
[patent_no_of_words] => 11461
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 153
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/550/05550479.pdf
[firstpage_image] =>[orig_patent_app_number] => 498911
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/498911 | Signal measuring apparatus and signal measuring method | Jul 5, 1995 | Issued |
Array
(
[id] => 3619402
[patent_doc_number] => 05510705
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-04-23
[patent_title] => 'Electrical test arrangement and apparatus'
[patent_app_type] => 1
[patent_app_number] => 8/495870
[patent_app_country] => US
[patent_app_date] => 1995-06-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 6
[patent_no_of_words] => 2400
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 82
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/510/05510705.pdf
[firstpage_image] =>[orig_patent_app_number] => 495870
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/495870 | Electrical test arrangement and apparatus | Jun 27, 1995 | Issued |
Array
(
[id] => 3586760
[patent_doc_number] => 05498971
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-03-12
[patent_title] => 'Method and control circuit for measuring the temperature of an integrated circuit'
[patent_app_type] => 1
[patent_app_number] => 8/470639
[patent_app_country] => US
[patent_app_date] => 1995-06-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 3
[patent_no_of_words] => 3223
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 113
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/498/05498971.pdf
[firstpage_image] =>[orig_patent_app_number] => 470639
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/470639 | Method and control circuit for measuring the temperature of an integrated circuit | Jun 5, 1995 | Issued |
Array
(
[id] => 3595859
[patent_doc_number] => 05568054
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-10-22
[patent_title] => 'Probe apparatus having burn-in test function'
[patent_app_type] => 1
[patent_app_number] => 8/444888
[patent_app_country] => US
[patent_app_date] => 1995-05-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 10
[patent_no_of_words] => 5470
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 132
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/568/05568054.pdf
[firstpage_image] =>[orig_patent_app_number] => 444888
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/444888 | Probe apparatus having burn-in test function | May 18, 1995 | Issued |
Array
(
[id] => 3552527
[patent_doc_number] => 05545975
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-08-13
[patent_title] => 'Storm monitor'
[patent_app_type] => 1
[patent_app_number] => 8/404749
[patent_app_country] => US
[patent_app_date] => 1995-05-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 17
[patent_no_of_words] => 12035
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 199
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/545/05545975.pdf
[firstpage_image] =>[orig_patent_app_number] => 404749
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/404749 | Storm monitor | May 10, 1995 | Issued |
Array
(
[id] => 3492640
[patent_doc_number] => 05475317
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-12-12
[patent_title] => 'Singulated bare die tester and method of performing forced temperature electrical tests and burn-in'
[patent_app_type] => 1
[patent_app_number] => 8/427974
[patent_app_country] => US
[patent_app_date] => 1995-04-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 6
[patent_no_of_words] => 6623
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 150
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/475/05475317.pdf
[firstpage_image] =>[orig_patent_app_number] => 427974
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/427974 | Singulated bare die tester and method of performing forced temperature electrical tests and burn-in | Apr 20, 1995 | Issued |
Array
(
[id] => 3619458
[patent_doc_number] => 05510709
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-04-23
[patent_title] => 'Eddy current surface inspection probe for aircraft fastener inspection, and inspection method'
[patent_app_type] => 1
[patent_app_number] => 8/423489
[patent_app_country] => US
[patent_app_date] => 1995-04-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 6
[patent_no_of_words] => 4426
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 193
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/510/05510709.pdf
[firstpage_image] =>[orig_patent_app_number] => 423489
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/423489 | Eddy current surface inspection probe for aircraft fastener inspection, and inspection method | Apr 18, 1995 | Issued |
08/417441 | TRANSLATOR FIXTURE WITH MODULE FOR EXPANDING TEST POINTS | Apr 4, 1995 | Abandoned |
Array
(
[id] => 3525551
[patent_doc_number] => 05530374
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-06-25
[patent_title] => 'Method of identifying probe position and probing method in prober'
[patent_app_type] => 1
[patent_app_number] => 8/401231
[patent_app_country] => US
[patent_app_date] => 1995-03-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 16
[patent_no_of_words] => 5996
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 330
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/530/05530374.pdf
[firstpage_image] =>[orig_patent_app_number] => 401231
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/401231 | Method of identifying probe position and probing method in prober | Mar 8, 1995 | Issued |
Array
(
[id] => 3531661
[patent_doc_number] => 05541502
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-07-30
[patent_title] => 'Level measuring set for low-frequency signals'
[patent_app_type] => 1
[patent_app_number] => 8/381970
[patent_app_country] => US
[patent_app_date] => 1995-02-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 1
[patent_no_of_words] => 770
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 137
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/541/05541502.pdf
[firstpage_image] =>[orig_patent_app_number] => 381970
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/381970 | Level measuring set for low-frequency signals | Feb 12, 1995 | Issued |
Array
(
[id] => 3521065
[patent_doc_number] => 05486758
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-01-23
[patent_title] => 'Integral variable reluctance speed sensor'
[patent_app_type] => 1
[patent_app_number] => 8/374401
[patent_app_country] => US
[patent_app_date] => 1995-01-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 12
[patent_no_of_words] => 5117
[patent_no_of_claims] => 33
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 73
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/486/05486758.pdf
[firstpage_image] =>[orig_patent_app_number] => 374401
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/374401 | Integral variable reluctance speed sensor | Jan 16, 1995 | Issued |
Array
(
[id] => 3591946
[patent_doc_number] => 05552718
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-09-03
[patent_title] => 'Electrical test structure and method for space and line measurement'
[patent_app_type] => 1
[patent_app_number] => 8/368181
[patent_app_country] => US
[patent_app_date] => 1995-01-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 11
[patent_no_of_words] => 4959
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 141
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/552/05552718.pdf
[firstpage_image] =>[orig_patent_app_number] => 368181
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/368181 | Electrical test structure and method for space and line measurement | Jan 3, 1995 | Issued |
Array
(
[id] => 3617736
[patent_doc_number] => 05534788
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-07-09
[patent_title] => 'Integrated resistor for sensing electrical parameters'
[patent_app_type] => 1
[patent_app_number] => 8/352481
[patent_app_country] => US
[patent_app_date] => 1994-12-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 4180
[patent_no_of_claims] => 31
[patent_no_of_ind_claims] => 7
[patent_words_short_claim] => 94
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/534/05534788.pdf
[firstpage_image] =>[orig_patent_app_number] => 352481
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/352481 | Integrated resistor for sensing electrical parameters | Dec 8, 1994 | Issued |
Array
(
[id] => 3595319
[patent_doc_number] => 05585736
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-12-17
[patent_title] => 'Contact probe utilizing conductive meltable probing material'
[patent_app_type] => 1
[patent_app_number] => 8/346037
[patent_app_country] => US
[patent_app_date] => 1994-11-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 3833
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 156
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/585/05585736.pdf
[firstpage_image] =>[orig_patent_app_number] => 346037
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/346037 | Contact probe utilizing conductive meltable probing material | Nov 28, 1994 | Issued |
Array
(
[id] => 3593535
[patent_doc_number] => 05517105
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-05-14
[patent_title] => 'Dual linked zoom boxes for instrument display'
[patent_app_type] => 1
[patent_app_number] => 8/328983
[patent_app_country] => US
[patent_app_date] => 1994-10-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 4209
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 317
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/517/05517105.pdf
[firstpage_image] =>[orig_patent_app_number] => 328983
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/328983 | Dual linked zoom boxes for instrument display | Oct 24, 1994 | Issued |
Array
(
[id] => 3494508
[patent_doc_number] => 05471135
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-11-28
[patent_title] => 'Tester and method for testing a rectifier-regulator'
[patent_app_type] => 1
[patent_app_number] => 8/325970
[patent_app_country] => US
[patent_app_date] => 1994-10-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 4967
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 307
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/471/05471135.pdf
[firstpage_image] =>[orig_patent_app_number] => 325970
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/325970 | Tester and method for testing a rectifier-regulator | Oct 19, 1994 | Issued |
Array
(
[id] => 3580765
[patent_doc_number] => 05523677
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-06-04
[patent_title] => 'DC current sensor'
[patent_app_type] => 1
[patent_app_number] => 8/321792
[patent_app_country] => US
[patent_app_date] => 1994-10-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 15
[patent_no_of_words] => 11654
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 201
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/523/05523677.pdf
[firstpage_image] =>[orig_patent_app_number] => 321792
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/321792 | DC current sensor | Oct 11, 1994 | Issued |
Array
(
[id] => 3525016
[patent_doc_number] => 05530341
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-06-25
[patent_title] => 'External clock count based auto trigger for an oscilloscope'
[patent_app_type] => 1
[patent_app_number] => 8/320722
[patent_app_country] => US
[patent_app_date] => 1994-10-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 1407
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 88
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/530/05530341.pdf
[firstpage_image] =>[orig_patent_app_number] => 320722
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/320722 | External clock count based auto trigger for an oscilloscope | Oct 10, 1994 | Issued |