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Nalin B Pilapitiya

Examiner (ID: 13996)

Most Active Art Unit
2617
Art Unit(s)
2617
Total Applications
11
Issued Applications
3
Pending Applications
0
Abandoned Applications
8

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 3516119 [patent_doc_number] => 05563509 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-10-08 [patent_title] => 'Adaptable load board assembly for testing ICs with different power/ground bond pad and/or pin configurations' [patent_app_type] => 1 [patent_app_number] => 8/574862 [patent_app_country] => US [patent_app_date] => 1995-12-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 18 [patent_no_of_words] => 5851 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 272 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/563/05563509.pdf [firstpage_image] =>[orig_patent_app_number] => 574862 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/574862
Adaptable load board assembly for testing ICs with different power/ground bond pad and/or pin configurations Dec 18, 1995 Issued
Array ( [id] => 3556802 [patent_doc_number] => 05555422 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-09-10 [patent_title] => 'Prober for semiconductor integrated circuit element wafer' [patent_app_type] => 1 [patent_app_number] => 8/547383 [patent_app_country] => US [patent_app_date] => 1995-10-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 22 [patent_no_of_words] => 11695 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 236 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/555/05555422.pdf [firstpage_image] =>[orig_patent_app_number] => 547383 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/547383
Prober for semiconductor integrated circuit element wafer Oct 23, 1995 Issued
Array ( [id] => 3593312 [patent_doc_number] => 05550479 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-08-27 [patent_title] => 'Signal measuring apparatus and signal measuring method' [patent_app_type] => 1 [patent_app_number] => 8/498911 [patent_app_country] => US [patent_app_date] => 1995-07-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 23 [patent_no_of_words] => 11461 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 153 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/550/05550479.pdf [firstpage_image] =>[orig_patent_app_number] => 498911 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/498911
Signal measuring apparatus and signal measuring method Jul 5, 1995 Issued
Array ( [id] => 3619402 [patent_doc_number] => 05510705 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-04-23 [patent_title] => 'Electrical test arrangement and apparatus' [patent_app_type] => 1 [patent_app_number] => 8/495870 [patent_app_country] => US [patent_app_date] => 1995-06-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 2400 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 82 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/510/05510705.pdf [firstpage_image] =>[orig_patent_app_number] => 495870 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/495870
Electrical test arrangement and apparatus Jun 27, 1995 Issued
Array ( [id] => 3586760 [patent_doc_number] => 05498971 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-03-12 [patent_title] => 'Method and control circuit for measuring the temperature of an integrated circuit' [patent_app_type] => 1 [patent_app_number] => 8/470639 [patent_app_country] => US [patent_app_date] => 1995-06-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 3223 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 113 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/498/05498971.pdf [firstpage_image] =>[orig_patent_app_number] => 470639 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/470639
Method and control circuit for measuring the temperature of an integrated circuit Jun 5, 1995 Issued
Array ( [id] => 3595859 [patent_doc_number] => 05568054 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-10-22 [patent_title] => 'Probe apparatus having burn-in test function' [patent_app_type] => 1 [patent_app_number] => 8/444888 [patent_app_country] => US [patent_app_date] => 1995-05-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 10 [patent_no_of_words] => 5470 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 132 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/568/05568054.pdf [firstpage_image] =>[orig_patent_app_number] => 444888 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/444888
Probe apparatus having burn-in test function May 18, 1995 Issued
Array ( [id] => 3552527 [patent_doc_number] => 05545975 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-08-13 [patent_title] => 'Storm monitor' [patent_app_type] => 1 [patent_app_number] => 8/404749 [patent_app_country] => US [patent_app_date] => 1995-05-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 17 [patent_no_of_words] => 12035 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 199 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/545/05545975.pdf [firstpage_image] =>[orig_patent_app_number] => 404749 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/404749
Storm monitor May 10, 1995 Issued
Array ( [id] => 3492640 [patent_doc_number] => 05475317 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-12-12 [patent_title] => 'Singulated bare die tester and method of performing forced temperature electrical tests and burn-in' [patent_app_type] => 1 [patent_app_number] => 8/427974 [patent_app_country] => US [patent_app_date] => 1995-04-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 6623 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 150 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/475/05475317.pdf [firstpage_image] =>[orig_patent_app_number] => 427974 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/427974
Singulated bare die tester and method of performing forced temperature electrical tests and burn-in Apr 20, 1995 Issued
Array ( [id] => 3619458 [patent_doc_number] => 05510709 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-04-23 [patent_title] => 'Eddy current surface inspection probe for aircraft fastener inspection, and inspection method' [patent_app_type] => 1 [patent_app_number] => 8/423489 [patent_app_country] => US [patent_app_date] => 1995-04-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 4426 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 193 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/510/05510709.pdf [firstpage_image] =>[orig_patent_app_number] => 423489 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/423489
Eddy current surface inspection probe for aircraft fastener inspection, and inspection method Apr 18, 1995 Issued
08/417441 TRANSLATOR FIXTURE WITH MODULE FOR EXPANDING TEST POINTS Apr 4, 1995 Abandoned
Array ( [id] => 3525551 [patent_doc_number] => 05530374 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-06-25 [patent_title] => 'Method of identifying probe position and probing method in prober' [patent_app_type] => 1 [patent_app_number] => 8/401231 [patent_app_country] => US [patent_app_date] => 1995-03-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 16 [patent_no_of_words] => 5996 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 330 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/530/05530374.pdf [firstpage_image] =>[orig_patent_app_number] => 401231 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/401231
Method of identifying probe position and probing method in prober Mar 8, 1995 Issued
Array ( [id] => 3531661 [patent_doc_number] => 05541502 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-07-30 [patent_title] => 'Level measuring set for low-frequency signals' [patent_app_type] => 1 [patent_app_number] => 8/381970 [patent_app_country] => US [patent_app_date] => 1995-02-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 770 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 137 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/541/05541502.pdf [firstpage_image] =>[orig_patent_app_number] => 381970 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/381970
Level measuring set for low-frequency signals Feb 12, 1995 Issued
Array ( [id] => 3521065 [patent_doc_number] => 05486758 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-01-23 [patent_title] => 'Integral variable reluctance speed sensor' [patent_app_type] => 1 [patent_app_number] => 8/374401 [patent_app_country] => US [patent_app_date] => 1995-01-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 12 [patent_no_of_words] => 5117 [patent_no_of_claims] => 33 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 73 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/486/05486758.pdf [firstpage_image] =>[orig_patent_app_number] => 374401 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/374401
Integral variable reluctance speed sensor Jan 16, 1995 Issued
Array ( [id] => 3591946 [patent_doc_number] => 05552718 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-09-03 [patent_title] => 'Electrical test structure and method for space and line measurement' [patent_app_type] => 1 [patent_app_number] => 8/368181 [patent_app_country] => US [patent_app_date] => 1995-01-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 11 [patent_no_of_words] => 4959 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 141 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/552/05552718.pdf [firstpage_image] =>[orig_patent_app_number] => 368181 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/368181
Electrical test structure and method for space and line measurement Jan 3, 1995 Issued
Array ( [id] => 3617736 [patent_doc_number] => 05534788 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-07-09 [patent_title] => 'Integrated resistor for sensing electrical parameters' [patent_app_type] => 1 [patent_app_number] => 8/352481 [patent_app_country] => US [patent_app_date] => 1994-12-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4180 [patent_no_of_claims] => 31 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 94 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/534/05534788.pdf [firstpage_image] =>[orig_patent_app_number] => 352481 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/352481
Integrated resistor for sensing electrical parameters Dec 8, 1994 Issued
Array ( [id] => 3595319 [patent_doc_number] => 05585736 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-12-17 [patent_title] => 'Contact probe utilizing conductive meltable probing material' [patent_app_type] => 1 [patent_app_number] => 8/346037 [patent_app_country] => US [patent_app_date] => 1994-11-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 3833 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 156 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/585/05585736.pdf [firstpage_image] =>[orig_patent_app_number] => 346037 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/346037
Contact probe utilizing conductive meltable probing material Nov 28, 1994 Issued
Array ( [id] => 3593535 [patent_doc_number] => 05517105 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-05-14 [patent_title] => 'Dual linked zoom boxes for instrument display' [patent_app_type] => 1 [patent_app_number] => 8/328983 [patent_app_country] => US [patent_app_date] => 1994-10-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4209 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 317 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/517/05517105.pdf [firstpage_image] =>[orig_patent_app_number] => 328983 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/328983
Dual linked zoom boxes for instrument display Oct 24, 1994 Issued
Array ( [id] => 3494508 [patent_doc_number] => 05471135 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-11-28 [patent_title] => 'Tester and method for testing a rectifier-regulator' [patent_app_type] => 1 [patent_app_number] => 8/325970 [patent_app_country] => US [patent_app_date] => 1994-10-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 4967 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 307 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/471/05471135.pdf [firstpage_image] =>[orig_patent_app_number] => 325970 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/325970
Tester and method for testing a rectifier-regulator Oct 19, 1994 Issued
Array ( [id] => 3580765 [patent_doc_number] => 05523677 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-06-04 [patent_title] => 'DC current sensor' [patent_app_type] => 1 [patent_app_number] => 8/321792 [patent_app_country] => US [patent_app_date] => 1994-10-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 15 [patent_no_of_words] => 11654 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 201 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/523/05523677.pdf [firstpage_image] =>[orig_patent_app_number] => 321792 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/321792
DC current sensor Oct 11, 1994 Issued
Array ( [id] => 3525016 [patent_doc_number] => 05530341 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-06-25 [patent_title] => 'External clock count based auto trigger for an oscilloscope' [patent_app_type] => 1 [patent_app_number] => 8/320722 [patent_app_country] => US [patent_app_date] => 1994-10-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 1407 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 88 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/530/05530341.pdf [firstpage_image] =>[orig_patent_app_number] => 320722 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/320722
External clock count based auto trigger for an oscilloscope Oct 10, 1994 Issued
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