Search

Vinh P Nguyen

Examiner (ID: 2259, Phone: (571)272-1964 , Office: P/2867 )

Most Active Art Unit
2858
Art Unit(s)
2858, 2607, 2213, 2731, 2829, 2867, 3621, 2899
Total Applications
3696
Issued Applications
3184
Pending Applications
137
Abandoned Applications
409

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 19513502 [patent_doc_number] => 20240345188 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-10-17 [patent_title] => MAGNETIC SENSOR [patent_app_type] => utility [patent_app_number] => 18/751610 [patent_app_country] => US [patent_app_date] => 2024-06-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11199 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 68 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18751610 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/751610
Magnetic sensor including magnetic detection element disposed on inclined surface Jun 23, 2024 Issued
Array ( [id] => 19595244 [patent_doc_number] => 12153081 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2024-11-26 [patent_title] => Device and method for monitoring a turn-off capability [patent_app_type] => utility [patent_app_number] => 18/748409 [patent_app_country] => US [patent_app_date] => 2024-06-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 7284 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 253 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18748409 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/748409
Device and method for monitoring a turn-off capability Jun 19, 2024 Issued
Array ( [id] => 20387550 [patent_doc_number] => 12487275 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-12-02 [patent_title] => Enhanced direct current (DC) built-in-self-test (BIST) coverage for optical engines and advanced packaging [patent_app_type] => utility [patent_app_number] => 18/651462 [patent_app_country] => US [patent_app_date] => 2024-04-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 0 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 113 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18651462 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/651462
Enhanced direct current (DC) built-in-self-test (BIST) coverage for optical engines and advanced packaging Apr 29, 2024 Issued
Array ( [id] => 19710550 [patent_doc_number] => 20250020692 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-01-16 [patent_title] => ADHERED MULTILAYER DIE UNIT AND PROBE HEAD, PROBE SEAT, PROBE CARD AND TEST SYSTEM INCLUDING THE SAME [patent_app_type] => utility [patent_app_number] => 18/635405 [patent_app_country] => US [patent_app_date] => 2024-04-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11856 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -15 [patent_words_short_claim] => 34 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18635405 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/635405
ADHERED MULTILAYER DIE UNIT AND PROBE HEAD, PROBE SEAT, PROBE CARD AND TEST SYSTEM INCLUDING THE SAME Apr 14, 2024 Pending
Array ( [id] => 19694309 [patent_doc_number] => 20250012854 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-01-09 [patent_title] => TEST DEVICE AND SEMICONDUCTOR MANUFACTURING APPARATUS INCLUDING TEST DEVICE [patent_app_type] => utility [patent_app_number] => 18/620170 [patent_app_country] => US [patent_app_date] => 2024-03-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7686 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 101 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18620170 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/620170
TEST DEVICE AND SEMICONDUCTOR MANUFACTURING APPARATUS INCLUDING TEST DEVICE Mar 27, 2024 Pending
Array ( [id] => 19302186 [patent_doc_number] => 20240230763 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-07-11 [patent_title] => SOLENOID SYSTEM WITH POSITION AND TEMPERATURE DETECTION [patent_app_type] => utility [patent_app_number] => 18/617002 [patent_app_country] => US [patent_app_date] => 2024-03-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 16797 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -12 [patent_words_short_claim] => 148 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18617002 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/617002
Solenoid system with position and temperature detection Mar 25, 2024 Issued
Array ( [id] => 20249203 [patent_doc_number] => 20250298072 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-09-25 [patent_title] => PARALLEL DIPOLE LINE PHOTO-HALL SYSTEM WITH TEMPERATURE GRADIENT STAGE [patent_app_type] => utility [patent_app_number] => 18/613533 [patent_app_country] => US [patent_app_date] => 2024-03-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 1695 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -21 [patent_words_short_claim] => 62 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18613533 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/613533
PARALLEL DIPOLE LINE PHOTO-HALL SYSTEM WITH TEMPERATURE GRADIENT STAGE Mar 21, 2024 Pending
Array ( [id] => 19450281 [patent_doc_number] => 20240310411 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-09-19 [patent_title] => METHODS AND APPARATUS FOR SOURCE MEASUREMENT UNIT (SMU) OPERATION [patent_app_type] => utility [patent_app_number] => 18/605556 [patent_app_country] => US [patent_app_date] => 2024-03-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 13042 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -15 [patent_words_short_claim] => 68 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18605556 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/605556
METHODS AND APPARATUS FOR SOURCE MEASUREMENT UNIT (SMU) OPERATION Mar 13, 2024 Pending
Array ( [id] => 19659831 [patent_doc_number] => 20240426896 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-12-26 [patent_title] => SYSTEMS AND METHODS FOR TESTING FUNCTIONALITY AND PERFORMANCE OF A SENSOR AND HUB [patent_app_type] => utility [patent_app_number] => 18/593352 [patent_app_country] => US [patent_app_date] => 2024-03-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8805 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 218 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18593352 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/593352
SYSTEMS AND METHODS FOR TESTING FUNCTIONALITY AND PERFORMANCE OF A SENSOR AND HUB Feb 29, 2024 Pending
Array ( [id] => 19450297 [patent_doc_number] => 20240310427 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-09-19 [patent_title] => SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME [patent_app_type] => utility [patent_app_number] => 18/588421 [patent_app_country] => US [patent_app_date] => 2024-02-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9179 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 147 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18588421 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/588421
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME Feb 26, 2024 Pending
Array ( [id] => 19302177 [patent_doc_number] => 20240230754 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-07-11 [patent_title] => PROBE STATION CAPABLE OF MAINTAINING STABLE AND ACCURATE CONTACT TO DEVICE UNDER TEST [patent_app_type] => utility [patent_app_number] => 18/444745 [patent_app_country] => US [patent_app_date] => 2024-02-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3255 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 189 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18444745 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/444745
Probe station capable of maintaining stable and accurate contact to device under test Feb 17, 2024 Issued
Array ( [id] => 19602489 [patent_doc_number] => 20240393369 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-11-28 [patent_title] => REAL-EQUIVALENT-TIME OSCILLOSCOPE CLOCK DATA RECOVERY WITH SOFTWARE EQUALIZER [patent_app_type] => utility [patent_app_number] => 18/442359 [patent_app_country] => US [patent_app_date] => 2024-02-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4196 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -15 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18442359 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/442359
REAL-EQUIVALENT-TIME OSCILLOSCOPE CLOCK DATA RECOVERY WITH SOFTWARE EQUALIZER Feb 14, 2024 Pending
Array ( [id] => 20257168 [patent_doc_number] => 12429515 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-09-30 [patent_title] => System for determining leakage current of a field effect transistor over temperature [patent_app_type] => utility [patent_app_number] => 18/442662 [patent_app_country] => US [patent_app_date] => 2024-02-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 11 [patent_no_of_words] => 0 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 136 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18442662 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/442662
System for determining leakage current of a field effect transistor over temperature Feb 14, 2024 Issued
Array ( [id] => 20137332 [patent_doc_number] => 20250244376 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-07-31 [patent_title] => INSULATION INSPECTION SYSTEM WITH VOLTAGE AND CURRENT BALANCING CIRCUIT [patent_app_type] => utility [patent_app_number] => 18/428537 [patent_app_country] => US [patent_app_date] => 2024-01-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2460 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 97 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18428537 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/428537
INSULATION INSPECTION SYSTEM WITH VOLTAGE AND CURRENT BALANCING CIRCUIT Jan 30, 2024 Pending
Array ( [id] => 19891397 [patent_doc_number] => 20250116709 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-04-10 [patent_title] => APPARATUS FOR INDICATING BATTERY STATE AND METHOD OF CONTROLLING THE SAME [patent_app_type] => utility [patent_app_number] => 18/429279 [patent_app_country] => US [patent_app_date] => 2024-01-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5329 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 93 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18429279 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/429279
APPARATUS FOR INDICATING BATTERY STATE AND METHOD OF CONTROLLING THE SAME Jan 30, 2024 Pending
Array ( [id] => 19362187 [patent_doc_number] => 20240264221 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-08-08 [patent_title] => INDEPENDENT THERMAL CONTROLLER FOR MEMORY DEVICES AND DEVICE INTERFACE BOARDS [patent_app_type] => utility [patent_app_number] => 18/424501 [patent_app_country] => US [patent_app_date] => 2024-01-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7945 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -21 [patent_words_short_claim] => 76 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18424501 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/424501
INDEPENDENT THERMAL CONTROLLER FOR MEMORY DEVICES AND DEVICE INTERFACE BOARDS Jan 25, 2024 Pending
Array ( [id] => 20122651 [patent_doc_number] => 20250237682 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-07-24 [patent_title] => MEASURING AN OPEN CIRCUIT VOLTAGE OF A BATTERY [patent_app_type] => utility [patent_app_number] => 18/420312 [patent_app_country] => US [patent_app_date] => 2024-01-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2172 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 51 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18420312 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/420312
MEASURING AN OPEN CIRCUIT VOLTAGE OF A BATTERY Jan 22, 2024 Pending
Array ( [id] => 19710573 [patent_doc_number] => 20250020715 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-01-16 [patent_title] => INTEGRATED CIRCUIT PACKAGE WITH INTERNAL CIRCUITRY TO DETECT EXTERNAL COMPONENT PARAMETERS AND PARASITICS [patent_app_type] => utility [patent_app_number] => 18/420736 [patent_app_country] => US [patent_app_date] => 2024-01-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10937 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => 0 [patent_words_short_claim] => 89 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18420736 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/420736
INTEGRATED CIRCUIT PACKAGE WITH INTERNAL CIRCUITRY TO DETECT EXTERNAL COMPONENT PARAMETERS AND PARASITICS Jan 22, 2024 Abandoned
Array ( [id] => 20086503 [patent_doc_number] => 20250216439 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-07-03 [patent_title] => CIRCUIT FOR MONITORING DEGRADATION OF A SEMICONDUCTOR DEVICE [patent_app_type] => utility [patent_app_number] => 18/402140 [patent_app_country] => US [patent_app_date] => 2024-01-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8908 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -21 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18402140 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/402140
CIRCUIT FOR MONITORING DEGRADATION OF A SEMICONDUCTOR DEVICE Jan 1, 2024 Pending
Array ( [id] => 19302193 [patent_doc_number] => 20240230770 [patent_country] => US [patent_kind] => A9 [patent_issue_date] => 2024-07-11 [patent_title] => BATTERY MEASUREMENT METHOD AND APPARATUS [patent_app_type] => utility [patent_app_number] => 18/399074 [patent_app_country] => US [patent_app_date] => 2023-12-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 12300 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -6 [patent_words_short_claim] => 274 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18399074 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/399074
BATTERY MEASUREMENT METHOD AND APPARATUS Dec 27, 2023 Pending
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