
Vinh P Nguyen
Examiner (ID: 2259, Phone: (571)272-1964 , Office: P/2867 )
| Most Active Art Unit | 2858 |
| Art Unit(s) | 2858, 2607, 2213, 2731, 2829, 2867, 3621, 2899 |
| Total Applications | 3696 |
| Issued Applications | 3184 |
| Pending Applications | 137 |
| Abandoned Applications | 409 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 19513502
[patent_doc_number] => 20240345188
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-10-17
[patent_title] => MAGNETIC SENSOR
[patent_app_type] => utility
[patent_app_number] => 18/751610
[patent_app_country] => US
[patent_app_date] => 2024-06-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 11199
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -13
[patent_words_short_claim] => 68
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18751610
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/751610 | Magnetic sensor including magnetic detection element disposed on inclined surface | Jun 23, 2024 | Issued |
Array
(
[id] => 19595244
[patent_doc_number] => 12153081
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2024-11-26
[patent_title] => Device and method for monitoring a turn-off capability
[patent_app_type] => utility
[patent_app_number] => 18/748409
[patent_app_country] => US
[patent_app_date] => 2024-06-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 5
[patent_no_of_words] => 7284
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 253
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18748409
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/748409 | Device and method for monitoring a turn-off capability | Jun 19, 2024 | Issued |
Array
(
[id] => 20387550
[patent_doc_number] => 12487275
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-12-02
[patent_title] => Enhanced direct current (DC) built-in-self-test (BIST) coverage for optical engines and advanced packaging
[patent_app_type] => utility
[patent_app_number] => 18/651462
[patent_app_country] => US
[patent_app_date] => 2024-04-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 0
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 113
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18651462
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/651462 | Enhanced direct current (DC) built-in-self-test (BIST) coverage for optical engines and advanced packaging | Apr 29, 2024 | Issued |
Array
(
[id] => 19710550
[patent_doc_number] => 20250020692
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-01-16
[patent_title] => ADHERED MULTILAYER DIE UNIT AND PROBE HEAD, PROBE SEAT, PROBE CARD AND TEST SYSTEM INCLUDING THE SAME
[patent_app_type] => utility
[patent_app_number] => 18/635405
[patent_app_country] => US
[patent_app_date] => 2024-04-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 11856
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -15
[patent_words_short_claim] => 34
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18635405
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/635405 | ADHERED MULTILAYER DIE UNIT AND PROBE HEAD, PROBE SEAT, PROBE CARD AND TEST SYSTEM INCLUDING THE SAME | Apr 14, 2024 | Pending |
Array
(
[id] => 19694309
[patent_doc_number] => 20250012854
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-01-09
[patent_title] => TEST DEVICE AND SEMICONDUCTOR MANUFACTURING APPARATUS INCLUDING TEST DEVICE
[patent_app_type] => utility
[patent_app_number] => 18/620170
[patent_app_country] => US
[patent_app_date] => 2024-03-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 7686
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 101
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18620170
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/620170 | TEST DEVICE AND SEMICONDUCTOR MANUFACTURING APPARATUS INCLUDING TEST DEVICE | Mar 27, 2024 | Pending |
Array
(
[id] => 19302186
[patent_doc_number] => 20240230763
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-07-11
[patent_title] => SOLENOID SYSTEM WITH POSITION AND TEMPERATURE DETECTION
[patent_app_type] => utility
[patent_app_number] => 18/617002
[patent_app_country] => US
[patent_app_date] => 2024-03-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 16797
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -12
[patent_words_short_claim] => 148
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18617002
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/617002 | Solenoid system with position and temperature detection | Mar 25, 2024 | Issued |
Array
(
[id] => 20249203
[patent_doc_number] => 20250298072
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-09-25
[patent_title] => PARALLEL DIPOLE LINE PHOTO-HALL SYSTEM WITH TEMPERATURE GRADIENT STAGE
[patent_app_type] => utility
[patent_app_number] => 18/613533
[patent_app_country] => US
[patent_app_date] => 2024-03-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 1695
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -21
[patent_words_short_claim] => 62
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18613533
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/613533 | PARALLEL DIPOLE LINE PHOTO-HALL SYSTEM WITH TEMPERATURE GRADIENT STAGE | Mar 21, 2024 | Pending |
Array
(
[id] => 19450281
[patent_doc_number] => 20240310411
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-09-19
[patent_title] => METHODS AND APPARATUS FOR SOURCE MEASUREMENT UNIT (SMU) OPERATION
[patent_app_type] => utility
[patent_app_number] => 18/605556
[patent_app_country] => US
[patent_app_date] => 2024-03-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 13042
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -15
[patent_words_short_claim] => 68
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18605556
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/605556 | METHODS AND APPARATUS FOR SOURCE MEASUREMENT UNIT (SMU) OPERATION | Mar 13, 2024 | Pending |
Array
(
[id] => 19659831
[patent_doc_number] => 20240426896
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-12-26
[patent_title] => SYSTEMS AND METHODS FOR TESTING FUNCTIONALITY AND PERFORMANCE OF A SENSOR AND HUB
[patent_app_type] => utility
[patent_app_number] => 18/593352
[patent_app_country] => US
[patent_app_date] => 2024-03-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 8805
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -18
[patent_words_short_claim] => 218
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18593352
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/593352 | SYSTEMS AND METHODS FOR TESTING FUNCTIONALITY AND PERFORMANCE OF A SENSOR AND HUB | Feb 29, 2024 | Pending |
Array
(
[id] => 19450297
[patent_doc_number] => 20240310427
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-09-19
[patent_title] => SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
[patent_app_type] => utility
[patent_app_number] => 18/588421
[patent_app_country] => US
[patent_app_date] => 2024-02-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 9179
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -13
[patent_words_short_claim] => 147
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18588421
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/588421 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME | Feb 26, 2024 | Pending |
Array
(
[id] => 19302177
[patent_doc_number] => 20240230754
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-07-11
[patent_title] => PROBE STATION CAPABLE OF MAINTAINING STABLE AND ACCURATE CONTACT TO DEVICE UNDER TEST
[patent_app_type] => utility
[patent_app_number] => 18/444745
[patent_app_country] => US
[patent_app_date] => 2024-02-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 3255
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -14
[patent_words_short_claim] => 189
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18444745
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/444745 | Probe station capable of maintaining stable and accurate contact to device under test | Feb 17, 2024 | Issued |
Array
(
[id] => 19602489
[patent_doc_number] => 20240393369
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-11-28
[patent_title] => REAL-EQUIVALENT-TIME OSCILLOSCOPE CLOCK DATA RECOVERY WITH SOFTWARE EQUALIZER
[patent_app_type] => utility
[patent_app_number] => 18/442359
[patent_app_country] => US
[patent_app_date] => 2024-02-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 4196
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -15
[patent_words_short_claim] => 115
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18442359
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/442359 | REAL-EQUIVALENT-TIME OSCILLOSCOPE CLOCK DATA RECOVERY WITH SOFTWARE EQUALIZER | Feb 14, 2024 | Pending |
Array
(
[id] => 20257168
[patent_doc_number] => 12429515
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-09-30
[patent_title] => System for determining leakage current of a field effect transistor over temperature
[patent_app_type] => utility
[patent_app_number] => 18/442662
[patent_app_country] => US
[patent_app_date] => 2024-02-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 11
[patent_no_of_words] => 0
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 136
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18442662
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/442662 | System for determining leakage current of a field effect transistor over temperature | Feb 14, 2024 | Issued |
Array
(
[id] => 20137332
[patent_doc_number] => 20250244376
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-07-31
[patent_title] => INSULATION INSPECTION SYSTEM WITH VOLTAGE AND CURRENT BALANCING CIRCUIT
[patent_app_type] => utility
[patent_app_number] => 18/428537
[patent_app_country] => US
[patent_app_date] => 2024-01-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 2460
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -18
[patent_words_short_claim] => 97
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18428537
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/428537 | INSULATION INSPECTION SYSTEM WITH VOLTAGE AND CURRENT BALANCING CIRCUIT | Jan 30, 2024 | Pending |
Array
(
[id] => 19891397
[patent_doc_number] => 20250116709
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-04-10
[patent_title] => APPARATUS FOR INDICATING BATTERY STATE AND METHOD OF CONTROLLING THE SAME
[patent_app_type] => utility
[patent_app_number] => 18/429279
[patent_app_country] => US
[patent_app_date] => 2024-01-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 5329
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -10
[patent_words_short_claim] => 93
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18429279
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/429279 | APPARATUS FOR INDICATING BATTERY STATE AND METHOD OF CONTROLLING THE SAME | Jan 30, 2024 | Pending |
Array
(
[id] => 19362187
[patent_doc_number] => 20240264221
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-08-08
[patent_title] => INDEPENDENT THERMAL CONTROLLER FOR MEMORY DEVICES AND DEVICE INTERFACE BOARDS
[patent_app_type] => utility
[patent_app_number] => 18/424501
[patent_app_country] => US
[patent_app_date] => 2024-01-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 7945
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -21
[patent_words_short_claim] => 76
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18424501
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/424501 | INDEPENDENT THERMAL CONTROLLER FOR MEMORY DEVICES AND DEVICE INTERFACE BOARDS | Jan 25, 2024 | Pending |
Array
(
[id] => 20122651
[patent_doc_number] => 20250237682
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-07-24
[patent_title] => MEASURING AN OPEN CIRCUIT VOLTAGE OF A BATTERY
[patent_app_type] => utility
[patent_app_number] => 18/420312
[patent_app_country] => US
[patent_app_date] => 2024-01-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 2172
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 51
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18420312
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/420312 | MEASURING AN OPEN CIRCUIT VOLTAGE OF A BATTERY | Jan 22, 2024 | Pending |
Array
(
[id] => 19710573
[patent_doc_number] => 20250020715
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-01-16
[patent_title] => INTEGRATED CIRCUIT PACKAGE WITH INTERNAL CIRCUITRY TO DETECT EXTERNAL COMPONENT PARAMETERS AND PARASITICS
[patent_app_type] => utility
[patent_app_number] => 18/420736
[patent_app_country] => US
[patent_app_date] => 2024-01-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 10937
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => 0
[patent_words_short_claim] => 89
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18420736
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/420736 | INTEGRATED CIRCUIT PACKAGE WITH INTERNAL CIRCUITRY TO DETECT EXTERNAL COMPONENT PARAMETERS AND PARASITICS | Jan 22, 2024 | Abandoned |
Array
(
[id] => 20086503
[patent_doc_number] => 20250216439
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-07-03
[patent_title] => CIRCUIT FOR MONITORING DEGRADATION OF A SEMICONDUCTOR DEVICE
[patent_app_type] => utility
[patent_app_number] => 18/402140
[patent_app_country] => US
[patent_app_date] => 2024-01-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 8908
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -21
[patent_words_short_claim] => 125
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18402140
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/402140 | CIRCUIT FOR MONITORING DEGRADATION OF A SEMICONDUCTOR DEVICE | Jan 1, 2024 | Pending |
Array
(
[id] => 19302193
[patent_doc_number] => 20240230770
[patent_country] => US
[patent_kind] => A9
[patent_issue_date] => 2024-07-11
[patent_title] => BATTERY MEASUREMENT METHOD AND APPARATUS
[patent_app_type] => utility
[patent_app_number] => 18/399074
[patent_app_country] => US
[patent_app_date] => 2023-12-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 12300
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -6
[patent_words_short_claim] => 274
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18399074
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/399074 | BATTERY MEASUREMENT METHOD AND APPARATUS | Dec 27, 2023 | Pending |