Kawing Chan
Examiner (ID: 286, Phone: (571)270-3909 , Office: P/2837 )
Most Active Art Unit | 2837 |
Art Unit(s) | 2846, 4147, 2837 |
Total Applications | 892 |
Issued Applications | 614 |
Pending Applications | 66 |
Abandoned Applications | 212 |
Applications
Application number | Title of the application | Filing Date | Status |
---|---|---|---|
Array
(
[id] => 9447571
[patent_doc_number] => 20140118740
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2014-05-01
[patent_title] => 'SYSTEMS AND METHODS FOR MEASURING A PROFILE CHARACTERISTIC OF A GLASS SAMPLE'
[patent_app_type] => utility
[patent_app_number] => 14/055351
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[rel_patent_id] =>[rel_patent_doc_number] =>) 14/055351 | Systems and methods for measuring a profile characteristic of a glass sample | Oct 15, 2013 | Issued |
Array
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[patent_issue_date] => 2014-09-30
[patent_title] => 'Reference systems for indicating slope and alignment and related devices, systems, and methods'
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Array
(
[id] => 9470482
[patent_doc_number] => 08724123
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[patent_kind] => B2
[patent_issue_date] => 2014-05-13
[patent_title] => 'Method and device for vehicle measurement'
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[patent_app_number] => 14/011355
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[patent_app_date] => 2013-08-27
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[rel_patent_id] =>[rel_patent_doc_number] =>) 14/011355 | Method and device for vehicle measurement | Aug 26, 2013 | Issued |
Array
(
[id] => 9779408
[patent_doc_number] => 08854621
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[patent_kind] => B1
[patent_issue_date] => 2014-10-07
[patent_title] => 'Systems and methods for determining nanoparticle dimensions'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 14/011055 | Systems and methods for determining nanoparticle dimensions | Aug 26, 2013 | Issued |
Array
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[id] => 9089815
[patent_doc_number] => 20130269126
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[patent_issue_date] => 2013-10-17
[patent_title] => 'APPARATUS AND METHOD FOR INSPECTING DEFECT IN OBJECT SURFACE'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/915161 | Apparatus and method for inspecting defect in object surface | Jun 10, 2013 | Issued |
Array
(
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[patent_doc_number] => 08724113
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[patent_kind] => B2
[patent_issue_date] => 2014-05-13
[patent_title] => 'Method for forming a nanostructure penetrating a layer'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/886148 | Method for forming a nanostructure penetrating a layer | May 1, 2013 | Issued |
Array
(
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[patent_title] => 'LUMINESCENCE REFERENCE STANDARDS'
[patent_app_type] => utility
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/765568 | Luminescence reference standards | Feb 11, 2013 | Issued |
Array
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[id] => 9485314
[patent_doc_number] => 08731275
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[patent_issue_date] => 2014-05-20
[patent_title] => 'Method and apparatus for reviewing defects'
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[patent_app_number] => 13/729635
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/729635 | Method and apparatus for reviewing defects | Dec 27, 2012 | Issued |
Array
(
[id] => 8816678
[patent_doc_number] => 20130117723
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[patent_issue_date] => 2013-05-09
[patent_title] => 'PATTERN SHAPE EVALUATION METHOD, PATTERN SHAPE EVALUATION DEVICE, PATTERN SHAPE EVALUATING DATA GENERATION DEVICE AND SEMICONDUCTOR SHAPE EVALUATION SYSTEM USING THE SAME'
[patent_app_type] => utility
[patent_app_number] => 13/712611
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/712611 | PATTERN SHAPE EVALUATION METHOD, PATTERN SHAPE EVALUATION DEVICE, PATTERN SHAPE EVALUATING DATA GENERATION DEVICE AND SEMICONDUCTOR SHAPE EVALUATION SYSTEM USING THE SAME | Dec 11, 2012 | Abandoned |
Array
(
[id] => 9583658
[patent_doc_number] => 08773663
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[patent_kind] => B2
[patent_issue_date] => 2014-07-08
[patent_title] => 'Luminous unit'
[patent_app_type] => utility
[patent_app_number] => 13/622261
[patent_app_country] => US
[patent_app_date] => 2012-09-18
[patent_effective_date] => 0000-00-00
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[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13622261
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/622261 | Luminous unit | Sep 17, 2012 | Issued |
Array
(
[id] => 10839363
[patent_doc_number] => 08867044
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[patent_kind] => B2
[patent_issue_date] => 2014-10-21
[patent_title] => 'Computing device and method for scanning edges of an object'
[patent_app_type] => utility
[patent_app_number] => 13/594857
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/594857 | Computing device and method for scanning edges of an object | Aug 25, 2012 | Issued |
Array
(
[id] => 8658053
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[patent_title] => 'OBJECT DETECTING DEVICE AND INFORMATION ACQUIRING DEVICE'
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Array
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Array
(
[id] => 8463576
[patent_doc_number] => 20120268744
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[patent_issue_date] => 2012-10-25
[patent_title] => 'MULTIPLE MEASUREMENT TECHNIQUES INCLUDING FOCUSED BEAM SCATTEROMETRY FOR CHARACTERIZATION OF SAMPLES'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/423866 | Multiple measurement techniques including focused beam scatterometry for characterization of samples | Mar 18, 2012 | Issued |
Array
(
[id] => 8404260
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/418652 | OBJECT DETECTING APPARATUS | Mar 12, 2012 | Abandoned |
Array
(
[id] => 9498022
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/982455 | Method and device for measuring surfaces in a highly precise manner | Feb 7, 2012 | Issued |
Array
(
[id] => 8159302
[patent_doc_number] => 20120100643
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[patent_kind] => A1
[patent_issue_date] => 2012-04-26
[patent_title] => 'DAMAGE EVALUATION METHOD OF COMPOUND SEMICONDUCTOR MEMBER, PRODUCTION METHOD OF COMPOUND SEMICONDUCTOR MEMBER, GALLIUM NITRIDE COMPOUND SEMICONDUCTOR MEMBER, AND GALLIUM NITRIDE COMPOUND SEMICONDUCTOR MEMBRANE'
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Array
(
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Array
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/304658 | Profile measuring apparatus, method for measuring profile, and method for manufacturing product | Nov 26, 2011 | Issued |