Jaime F Cardenas Navia

Array ( [id] => 976943 [patent_doc_number] => 06934019 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-08-23 [patent_title] => 'Confocal wafer-inspection system' [patent_app_type] => utility [patent_app_number] => 10/820367 [patent_app_country] => US [patent_app_date] => 2004-04-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2475 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 167 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/934/06934019.pdf [firstpage_image] =>[orig_patent_app_number] => 10820367 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 988682 [patent_doc_number] => 06922237 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-07-26 [patent_title] => 'Device and methods for inspecting soldered connections' [patent_app_type] => utility [patent_app_number] => 10/807464 [patent_app_country] => US [patent_app_date] => 2004-03-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 5307 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 86 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/922/06922237.pdf [firstpage_image] =>[orig_patent_app_number] => 10807464 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7400355 [patent_doc_number] => 20040105099 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-06-03 [patent_title] => 'System and method for characterizing three-dimensional structures' [patent_app_type] => new [patent_app_number] => 10/718780 [patent_app_country] => US [patent_app_date] => 2003-11-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 20 [patent_no_of_words] => 11908 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 65 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0105/20040105099.pdf [firstpage_image] =>[orig_patent_app_number] => 10718780 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1010123 [patent_doc_number] => 06900888 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-05-31 [patent_title] => 'Method and apparatus for inspecting a pattern formed on a substrate' [patent_app_type] => utility [patent_app_number] => 10/650756 [patent_app_country] => US [patent_app_date] => 2003-08-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 23 [patent_figures_cnt] => 55 [patent_no_of_words] => 10866 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 99 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/900/06900888.pdf [firstpage_image] =>[orig_patent_app_number] => 10650756 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1194581 [patent_doc_number] => 06731379 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-05-04 [patent_title] => 'Method and device for determining the concentration of heparin in a sample of fluid' [patent_app_type] => B2 [patent_app_number] => 10/634169 [patent_app_country] => US [patent_app_date] => 2003-08-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4801 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 224 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/731/06731379.pdf [firstpage_image] =>[orig_patent_app_number] => 10634169 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6662852 [patent_doc_number] => 20030202178 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-10-30 [patent_title] => 'Semiconductor wafer inspection apparatus' [patent_app_type] => new [patent_app_number] => 10/438561 [patent_app_country] => US [patent_app_date] => 2003-05-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 8334 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 114 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0202/20030202178.pdf [firstpage_image] =>[orig_patent_app_number] => 10438561 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1134904 [patent_doc_number] => 06788394 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-09-07 [patent_title] => 'Spectrophotometric system and method for the identification and characterization of a particle in a bodily fluid' [patent_app_type] => B1 [patent_app_number] => 10/249637 [patent_app_country] => US [patent_app_date] => 2003-04-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 4533 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 67 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/788/06788394.pdf [firstpage_image] =>[orig_patent_app_number] => 10249637 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6828313 [patent_doc_number] => 20030179371 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-09-25 [patent_title] => 'Method of objectively evaluating a surface mark' [patent_app_type] => new [patent_app_number] => 10/394673 [patent_app_country] => US [patent_app_date] => 2003-03-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3400 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 96 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0179/20030179371.pdf [firstpage_image] =>[orig_patent_app_number] => 10394673 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1038672 [patent_doc_number] => 06873412 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-03-29 [patent_title] => 'Method and device for suppressing multiple scattering when examining turbid media by means of three-dimensional cross-correlation technique' [patent_app_type] => utility [patent_app_number] => 10/301002 [patent_app_country] => US [patent_app_date] => 2002-11-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 24 [patent_figures_cnt] => 24 [patent_no_of_words] => 8439 [patent_no_of_claims] => 46 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 108 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/873/06873412.pdf [firstpage_image] =>[orig_patent_app_number] => 10301002 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 983151 [patent_doc_number] => 06927849 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-08-09 [patent_title] => 'Optical fiber coating defect detector' [patent_app_type] => utility [patent_app_number] => 10/278372 [patent_app_country] => US [patent_app_date] => 2002-10-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 2471 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/927/06927849.pdf [firstpage_image] =>[orig_patent_app_number] => 10278372 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6864177 [patent_doc_number] => 20030189703 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-10-09 [patent_title] => 'IMAGE PICKUP APPARATUS AND DEFECT INSPECTION APPARATUS FOR PHOTOMASK' [patent_app_type] => new [patent_app_number] => 10/261679 [patent_app_country] => US [patent_app_date] => 2002-10-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 6552 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 384 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0189/20030189703.pdf [firstpage_image] =>[orig_patent_app_number] => 10261679 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6620145 [patent_doc_number] => 20030210397 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-11-13 [patent_title] => 'Inspecting apparatus for foreign matter and inspecting mechanism thereof' [patent_app_type] => new [patent_app_number] => 10/251234 [patent_app_country] => US [patent_app_date] => 2002-09-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4964 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 101 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0210/20030210397.pdf [firstpage_image] =>[orig_patent_app_number] => 10251234 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6870151 [patent_doc_number] => 20030082840 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-05-01 [patent_title] => 'Method and system for determining a thickness of a layer' [patent_app_type] => new [patent_app_number] => 10/243460 [patent_app_country] => US [patent_app_date] => 2002-09-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3524 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 118 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0082/20030082840.pdf [firstpage_image] =>[orig_patent_app_number] => 10243460 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6777358 [patent_doc_number] => 20030048439 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-03-13 [patent_title] => 'Method and apparatus for inspecting pattern defects' [patent_app_type] => new [patent_app_number] => 10/218463 [patent_app_country] => US [patent_app_date] => 2002-08-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 11886 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 10 [patent_words_short_claim] => 47 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0048/20030048439.pdf [firstpage_image] =>[orig_patent_app_number] => 10218463 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1003395 [patent_doc_number] => 06909495 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-06-21 [patent_title] => 'Emissivity probe' [patent_app_type] => utility [patent_app_number] => 10/218067 [patent_app_country] => US [patent_app_date] => 2002-08-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 9 [patent_no_of_words] => 3475 [patent_no_of_claims] => 42 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 264 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/909/06909495.pdf [firstpage_image] =>[orig_patent_app_number] => 10218067 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 980080 [patent_doc_number] => 06930770 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-08-16 [patent_title] => 'High throughput inspection system and method for generating transmitted and/or reflected images' [patent_app_type] => utility [patent_app_number] => 10/215972 [patent_app_country] => US [patent_app_date] => 2002-08-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 10 [patent_no_of_words] => 3977 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 136 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/930/06930770.pdf [firstpage_image] =>[orig_patent_app_number] => 10215972 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1067194 [patent_doc_number] => 06847464 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-01-25 [patent_title] => 'Measurement of photolithographic features' [patent_app_type] => utility [patent_app_number] => 10/211468 [patent_app_country] => US [patent_app_date] => 2002-08-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4559 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 129 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/847/06847464.pdf [firstpage_image] =>[orig_patent_app_number] => 10211468 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7619315 [patent_doc_number] => 06943874 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-09-13 [patent_title] => 'Apparatus for inspecting a surface' [patent_app_type] => utility [patent_app_number] => 10/221668 [patent_app_country] => US [patent_app_date] => 2002-08-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2797 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 329 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/943/06943874.pdf [firstpage_image] =>[orig_patent_app_number] => 10221668 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 983167 [patent_doc_number] => 06927857 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-08-09 [patent_title] => 'Process for the detection of marked components of a composite article using infrared blockers' [patent_app_type] => utility [patent_app_number] => 10/210685 [patent_app_country] => US [patent_app_date] => 2002-07-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 11 [patent_no_of_words] => 13093 [patent_no_of_claims] => 31 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/927/06927857.pdf [firstpage_image] =>[orig_patent_app_number] => 10210685 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1026275 [patent_doc_number] => 06885451 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-04-26 [patent_title] => 'Infrared detection of composite article components' [patent_app_type] => utility [patent_app_number] => 10/210675 [patent_app_country] => US [patent_app_date] => 2002-07-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 12 [patent_no_of_words] => 13742 [patent_no_of_claims] => 45 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 104 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/885/06885451.pdf [firstpage_image] =>[orig_patent_app_number] => 10210675 [rel_patent_id] =>[rel_patent_doc_number] =>)