Benny T Lee
Examiner (ID: 8237, Phone: (571)272-1764 , Office: P/2842 )
Most Active Art Unit | 2502 |
Art Unit(s) | 2502, 2817, 2506, 2842, 2843, 3621 |
Total Applications | 3332 |
Issued Applications | 2750 |
Pending Applications | 172 |
Abandoned Applications | 410 |
Applications
Application number | Title of the application | Filing Date | Status |
---|---|---|---|
Array
(
[id] => 18806525
[patent_doc_number] => 20230380855
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-11-30
[patent_title] => System And Method For Controlling An Ultrasonic Tool
[patent_app_type] => utility
[patent_app_number] => 18/232872
[patent_app_country] => US
[patent_app_date] => 2023-08-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 8899
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -14
[patent_words_short_claim] => 37
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18232872
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/232872 | System And Method For Controlling An Ultrasonic Tool | Aug 10, 2023 | Pending |
Array
(
[id] => 18694048
[patent_doc_number] => 20230324452
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-10-12
[patent_title] => TEST SYSTEM
[patent_app_type] => utility
[patent_app_number] => 18/335360
[patent_app_country] => US
[patent_app_date] => 2023-06-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 11355
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -8
[patent_words_short_claim] => 104
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18335360
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/335360 | TEST SYSTEM | Jun 14, 2023 | Pending |
Array
(
[id] => 18694077
[patent_doc_number] => 20230324481
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-10-12
[patent_title] => ELECTROMAGNETIC SHIELDING FOR MAGNETIC RESONANCE IMAGING METHODS AND APPARATUS
[patent_app_type] => utility
[patent_app_number] => 18/335961
[patent_app_country] => US
[patent_app_date] => 2023-06-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 54367
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 87
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18335961
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/335961 | ELECTROMAGNETIC SHIELDING FOR MAGNETIC RESONANCE IMAGING METHODS AND APPARATUS | Jun 14, 2023 | Pending |
Array
(
[id] => 18629583
[patent_doc_number] => 20230288467
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-09-14
[patent_title] => ELECTROSTATIC CHARGE SENSOR WITH HIGH IMPEDANCE CONTACT PADS
[patent_app_type] => utility
[patent_app_number] => 18/320867
[patent_app_country] => US
[patent_app_date] => 2023-05-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 4451
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 45
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18320867
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/320867 | Electrostatic charge sensor with high impedance contact pads | May 18, 2023 | Issued |
Array
(
[id] => 18421643
[patent_doc_number] => 20230176107
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-06-08
[patent_title] => TESTING APPARATUS AND TESTING METHOD FOR A/D CONVERTER
[patent_app_type] => utility
[patent_app_number] => 18/075613
[patent_app_country] => US
[patent_app_date] => 2022-12-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 6786
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -16
[patent_words_short_claim] => 87
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18075613
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/075613 | TESTING APPARATUS AND TESTING METHOD FOR A/D CONVERTER | Dec 5, 2022 | Pending |
Array
(
[id] => 18287059
[patent_doc_number] => 20230102531
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-03-30
[patent_title] => Advanced Systems and Methods for Measuring Mutual Inductance of Area of Influence
[patent_app_type] => utility
[patent_app_number] => 18/071507
[patent_app_country] => US
[patent_app_date] => 2022-11-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 12664
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -18
[patent_words_short_claim] => 115
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18071507
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/071507 | Advanced systems and methods for measuring mutual inductance of area of influence | Nov 28, 2022 | Issued |
Array
(
[id] => 18159507
[patent_doc_number] => 20230026099
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-01-26
[patent_title] => SYSTEM AND METHOD OF DETERMINING AGE OF A TRANSFORMER
[patent_app_type] => utility
[patent_app_number] => 17/955267
[patent_app_country] => US
[patent_app_date] => 2022-09-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 6824
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -11
[patent_words_short_claim] => 2
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17955267
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/955267 | System and method of determining age of a transformer | Sep 27, 2022 | Issued |
Array
(
[id] => 19475057
[patent_doc_number] => 12105136
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-10-01
[patent_title] => Method for determining material parameters of a multilayer test sample
[patent_app_type] => utility
[patent_app_number] => 17/940999
[patent_app_country] => US
[patent_app_date] => 2022-09-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 4281
[patent_no_of_claims] => 30
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 349
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17940999
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/940999 | Method for determining material parameters of a multilayer test sample | Sep 7, 2022 | Issued |
Array
(
[id] => 18855099
[patent_doc_number] => 11852673
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2023-12-26
[patent_title] => Method for generating chip probing wafer map
[patent_app_type] => utility
[patent_app_number] => 17/904000
[patent_app_country] => US
[patent_app_date] => 2022-09-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 6259
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 257
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17904000
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/904000 | Method for generating chip probing wafer map | Sep 5, 2022 | Issued |
Array
(
[id] => 18270344
[patent_doc_number] => 20230091586
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-03-23
[patent_title] => THERMAL MEASUREMENT OF MATERIALS
[patent_app_type] => utility
[patent_app_number] => 17/903632
[patent_app_country] => US
[patent_app_date] => 2022-09-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 2928
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 78
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17903632
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/903632 | THERMAL MEASUREMENT OF MATERIALS | Sep 5, 2022 | Pending |
Array
(
[id] => 18486230
[patent_doc_number] => 20230213573
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-07-06
[patent_title] => METHOD AND DEVICE FOR TESTING WAFER, ELECTRONIC DEVICE AND STORAGE MEDIUM
[patent_app_type] => utility
[patent_app_number] => 17/899274
[patent_app_country] => US
[patent_app_date] => 2022-08-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 7669
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -7
[patent_words_short_claim] => 150
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17899274
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/899274 | METHOD AND DEVICE FOR TESTING WAFER, ELECTRONIC DEVICE AND STORAGE MEDIUM | Aug 29, 2022 | Pending |
Array
(
[id] => 18265024
[patent_doc_number] => 20230086266
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-03-23
[patent_title] => ELECTRONIC DEVICE TESTING APPARATUS AND ELECTRONIC DEVICE TESTING METHOD
[patent_app_type] => utility
[patent_app_number] => 17/822816
[patent_app_country] => US
[patent_app_date] => 2022-08-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 4223
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -8
[patent_words_short_claim] => 203
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17822816
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/822816 | ELECTRONIC DEVICE TESTING APPARATUS AND ELECTRONIC DEVICE TESTING METHOD | Aug 28, 2022 | Pending |
Array
(
[id] => 18238541
[patent_doc_number] => 20230070852
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-03-09
[patent_title] => COUPLING DEVICE FOR AN NMR FLOW CELL
[patent_app_type] => utility
[patent_app_number] => 17/895831
[patent_app_country] => US
[patent_app_date] => 2022-08-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 7163
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -14
[patent_words_short_claim] => 166
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17895831
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/895831 | Coupling device for an NMR flow cell | Aug 24, 2022 | Issued |
Array
(
[id] => 18338165
[patent_doc_number] => 20230130114
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-04-27
[patent_title] => CHIP TEST CARRIER
[patent_app_type] => utility
[patent_app_number] => 17/888279
[patent_app_country] => US
[patent_app_date] => 2022-08-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 2974
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -6
[patent_words_short_claim] => 427
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17888279
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/888279 | CHIP TEST CARRIER | Aug 14, 2022 | Pending |
Array
(
[id] => 18094696
[patent_doc_number] => 20220413037
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-12-29
[patent_title] => APPARATUS AND METHOD FOR MANAGING POWER OF TEST CIRCUITS
[patent_app_type] => utility
[patent_app_number] => 17/848972
[patent_app_country] => US
[patent_app_date] => 2022-06-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 2152
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -4
[patent_words_short_claim] => 60
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17848972
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/848972 | Apparatus and method for managing power of test circuits | Jun 23, 2022 | Issued |
Array
(
[id] => 19340059
[patent_doc_number] => 12050244
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-07-30
[patent_title] => Method for reduction of SIC MOSFET gate voltage glitches
[patent_app_type] => utility
[patent_app_number] => 17/842164
[patent_app_country] => US
[patent_app_date] => 2022-06-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 5071
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 170
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17842164
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/842164 | Method for reduction of SIC MOSFET gate voltage glitches | Jun 15, 2022 | Issued |
Array
(
[id] => 17931281
[patent_doc_number] => 20220326406
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-10-13
[patent_title] => SYSTEMS, METHODS, AND APPARATUS FOR DETECTING FERROMAGNETIC FOREIGN OBJECTS IN A PREDETERMINED SPACE
[patent_app_type] => utility
[patent_app_number] => 17/836841
[patent_app_country] => US
[patent_app_date] => 2022-06-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 15849
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -18
[patent_words_short_claim] => 219
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17836841
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/836841 | Systems, methods, and apparatus for detecting ferromagnetic foreign objects in a predetermined space | Jun 8, 2022 | Issued |
Array
(
[id] => 18059424
[patent_doc_number] => 20220390510
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-12-08
[patent_title] => Illuminator Method and Device for Semiconductor Package Testing
[patent_app_type] => utility
[patent_app_number] => 17/805274
[patent_app_country] => US
[patent_app_date] => 2022-06-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 4343
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 44
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17805274
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/805274 | Illuminator Method and Device for Semiconductor Package Testing | Jun 2, 2022 | Pending |
Array
(
[id] => 19551646
[patent_doc_number] => 12135349
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-11-05
[patent_title] => Docking device and method for coupling second devices for interface units, disposition system and docking element
[patent_app_type] => utility
[patent_app_number] => 17/830779
[patent_app_country] => US
[patent_app_date] => 2022-06-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 5
[patent_no_of_words] => 12133
[patent_no_of_claims] => 32
[patent_no_of_ind_claims] => 9
[patent_words_short_claim] => 119
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17830779
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/830779 | Docking device and method for coupling second devices for interface units, disposition system and docking element | Jun 1, 2022 | Issued |
Array
(
[id] => 19340060
[patent_doc_number] => 12050245
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-07-30
[patent_title] => Semiconductor testing device and method of operating the same
[patent_app_type] => utility
[patent_app_number] => 17/664771
[patent_app_country] => US
[patent_app_date] => 2022-05-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 16
[patent_figures_cnt] => 16
[patent_no_of_words] => 7951
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 95
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17664771
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/664771 | Semiconductor testing device and method of operating the same | May 23, 2022 | Issued |