Aaron L Troost
Examiner (ID: 1325, Phone: (571)270-5779 , Office: P/3668 )
Most Active Art Unit | 3668 |
Art Unit(s) | 3666, 3662, 3668 |
Total Applications | 751 |
Issued Applications | 529 |
Pending Applications | 66 |
Abandoned Applications | 156 |
Applications
Application number | Title of the application | Filing Date | Status |
---|---|---|---|
Array
(
[id] => 4232475
[patent_doc_number] => 06011617
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-01-04
[patent_title] => 'System for inspecting internal zones of a machine by optical fibre endoscopy'
[patent_app_type] => 1
[patent_app_number] => 9/199492
[patent_app_country] => US
[patent_app_date] => 1998-11-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 9
[patent_no_of_words] => 3077
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[patent_words_short_claim] => 130
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/011/06011617.pdf
[firstpage_image] =>[orig_patent_app_number] => 199492
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/199492 | System for inspecting internal zones of a machine by optical fibre endoscopy | Nov 24, 1998 | Issued |
Array
(
[id] => 4214563
[patent_doc_number] => 06078387
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-06-20
[patent_title] => 'Test apparatus'
[patent_app_type] => 1
[patent_app_number] => 9/197106
[patent_app_country] => US
[patent_app_date] => 1998-11-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[patent_no_of_words] => 2200
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[pdf_file] => patents/06/078/06078387.pdf
[firstpage_image] =>[orig_patent_app_number] => 197106
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/197106 | Test apparatus | Nov 19, 1998 | Issued |
Array
(
[id] => 4214621
[patent_doc_number] => 06078391
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-06-20
[patent_title] => 'Method and system for segmented scatter measurement'
[patent_app_type] => 1
[patent_app_number] => 9/193835
[patent_app_country] => US
[patent_app_date] => 1998-11-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[patent_no_of_words] => 5625
[patent_no_of_claims] => 21
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[patent_words_short_claim] => 101
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[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/078/06078391.pdf
[firstpage_image] =>[orig_patent_app_number] => 193835
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/193835 | Method and system for segmented scatter measurement | Nov 16, 1998 | Issued |
09/180493 | DEFECT DETECTING APPARATUS AND METHOD | Nov 9, 1998 | Abandoned |
Array
(
[id] => 4425158
[patent_doc_number] => 06177991
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-01-23
[patent_title] => 'Measuring device with automatic sample changer'
[patent_app_type] => 1
[patent_app_number] => 9/188751
[patent_app_country] => US
[patent_app_date] => 1998-11-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[patent_no_of_words] => 2996
[patent_no_of_claims] => 10
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[pdf_file] => patents/06/177/06177991.pdf
[firstpage_image] =>[orig_patent_app_number] => 188751
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/188751 | Measuring device with automatic sample changer | Nov 8, 1998 | Issued |
Array
(
[id] => 4045099
[patent_doc_number] => 05995231
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-11-30
[patent_title] => 'Method for calibrating a light traveling distance in a scanning module'
[patent_app_type] => 1
[patent_app_number] => 9/187196
[patent_app_country] => US
[patent_app_date] => 1998-11-03
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[patent_drawing_sheets_cnt] => 3
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[pdf_file] => patents/05/995/05995231.pdf
[firstpage_image] =>[orig_patent_app_number] => 187196
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/187196 | Method for calibrating a light traveling distance in a scanning module | Nov 2, 1998 | Issued |
Array
(
[id] => 4370498
[patent_doc_number] => 06191852
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-02-20
[patent_title] => 'Optical measurement system for detecting luminescence or fluorescence signals'
[patent_app_type] => 1
[patent_app_number] => 9/170482
[patent_app_country] => US
[patent_app_date] => 1998-10-13
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[pdf_file] => patents/06/191/06191852.pdf
[firstpage_image] =>[orig_patent_app_number] => 170482
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/170482 | Optical measurement system for detecting luminescence or fluorescence signals | Oct 12, 1998 | Issued |
Array
(
[id] => 4426032
[patent_doc_number] => 06178285
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-01-23
[patent_title] => 'Vision system for inspecting interconnections of optical cards mounted in a rack and associated methods'
[patent_app_type] => 1
[patent_app_number] => 9/168320
[patent_app_country] => US
[patent_app_date] => 1998-10-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 7
[patent_no_of_words] => 3789
[patent_no_of_claims] => 24
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[patent_words_short_claim] => 105
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[pdf_file] => patents/06/178/06178285.pdf
[firstpage_image] =>[orig_patent_app_number] => 168320
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/168320 | Vision system for inspecting interconnections of optical cards mounted in a rack and associated methods | Oct 7, 1998 | Issued |
Array
(
[id] => 4244185
[patent_doc_number] => 06075607
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-06-13
[patent_title] => 'Method for estimating durability of optical member against excimer laser irradiation and method for selecting silica glass optical member'
[patent_app_type] => 1
[patent_app_number] => 9/166528
[patent_app_country] => US
[patent_app_date] => 1998-10-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
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[pdf_file] => patents/06/075/06075607.pdf
[firstpage_image] =>[orig_patent_app_number] => 166528
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/166528 | Method for estimating durability of optical member against excimer laser irradiation and method for selecting silica glass optical member | Oct 5, 1998 | Issued |
Array
(
[id] => 4300149
[patent_doc_number] => 06211952
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-04-03
[patent_title] => 'Method and apparatus for inspecting glass containers for checks'
[patent_app_type] => 1
[patent_app_number] => 9/165599
[patent_app_country] => US
[patent_app_date] => 1998-10-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
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[pdf_file] => patents/06/211/06211952.pdf
[firstpage_image] =>[orig_patent_app_number] => 165599
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/165599 | Method and apparatus for inspecting glass containers for checks | Oct 1, 1998 | Issued |
Array
(
[id] => 4080482
[patent_doc_number] => 06069693
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-05-30
[patent_title] => 'Process for inspecting bonding of a laser amplifier disc'
[patent_app_type] => 1
[patent_app_number] => 9/161531
[patent_app_country] => US
[patent_app_date] => 1998-09-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[pdf_file] => patents/06/069/06069693.pdf
[firstpage_image] =>[orig_patent_app_number] => 161531
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/161531 | Process for inspecting bonding of a laser amplifier disc | Sep 27, 1998 | Issued |
Array
(
[id] => 4248700
[patent_doc_number] => 06081330
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-06-27
[patent_title] => 'Method and device for measuring the thickness of opaque and transparent films'
[patent_app_type] => 1
[patent_app_number] => 9/157005
[patent_app_country] => US
[patent_app_date] => 1998-09-18
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/06/081/06081330.pdf
[firstpage_image] =>[orig_patent_app_number] => 157005
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/157005 | Method and device for measuring the thickness of opaque and transparent films | Sep 17, 1998 | Issued |
Array
(
[id] => 4195588
[patent_doc_number] => 06094273
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-07-25
[patent_title] => 'Crystalline colloidal array compositions'
[patent_app_type] => 1
[patent_app_number] => 9/153871
[patent_app_country] => US
[patent_app_date] => 1998-09-15
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[pdf_file] => patents/06/094/06094273.pdf
[firstpage_image] =>[orig_patent_app_number] => 153871
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/153871 | Crystalline colloidal array compositions | Sep 14, 1998 | Issued |
Array
(
[id] => 4114700
[patent_doc_number] => 06100974
[patent_country] => US
[patent_kind] => NA
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[patent_title] => 'Imaging spectrometer/camera having convex grating'
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[firstpage_image] =>[orig_patent_app_number] => 153381
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/153381 | Imaging spectrometer/camera having convex grating | Sep 14, 1998 | Issued |
Array
(
[id] => 4192143
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[patent_title] => 'System for pseudo on-gimbal, automatic line-of-sight alignment and stabilization of off-gimbal electro-optical passive and active sensors'
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[firstpage_image] =>[orig_patent_app_number] => 152952
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/152952 | System for pseudo on-gimbal, automatic line-of-sight alignment and stabilization of off-gimbal electro-optical passive and active sensors | Sep 13, 1998 | Issued |
Array
(
[id] => 4113282
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[patent_kind] => NA
[patent_issue_date] => 2000-04-18
[patent_title] => 'Apparatus for wafer level testing of a micromachined device'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/149919 | Apparatus for wafer level testing of a micromachined device | Sep 8, 1998 | Issued |
Array
(
[id] => 4044883
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[patent_kind] => NA
[patent_issue_date] => 1999-11-30
[patent_title] => 'Apparatus and a method for measuring a density of defects existing in a semiconductor wafer and an apparatus and a method for measuring an inherent scattering intensity of defects existing in a semiconductor wafer'
[patent_app_type] => 1
[patent_app_number] => 9/146096
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[firstpage_image] =>[orig_patent_app_number] => 146096
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/146096 | Apparatus and a method for measuring a density of defects existing in a semiconductor wafer and an apparatus and a method for measuring an inherent scattering intensity of defects existing in a semiconductor wafer | Sep 2, 1998 | Issued |
Array
(
[id] => 4143597
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[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-01-18
[patent_title] => 'Inspection method for a correction pattern'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/135435 | Inspection method for a correction pattern | Aug 16, 1998 | Issued |
Array
(
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/134201 | Non-contact temperature and concentration measurement on liquid surfaces | Aug 13, 1998 | Issued |
Array
(
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[patent_issue_date] => 1999-08-03
[patent_title] => 'Optical interferometer with multiple heads'
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[firstpage_image] =>[orig_patent_app_number] => 132244
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/132244 | Optical interferometer with multiple heads | Aug 10, 1998 | Issued |