Search

Christopher Albert Gomez

Examiner (ID: 3701)

Most Active Art Unit
3628
Art Unit(s)
3628
Total Applications
98
Issued Applications
12
Pending Applications
45
Abandoned Applications
40

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4153781 [patent_doc_number] => 06064214 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-05-16 [patent_title] => 'Perimeter trace probe for plastic ball grid arrays' [patent_app_type] => 1 [patent_app_number] => 8/994186 [patent_app_country] => US [patent_app_date] => 1997-12-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1766 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 169 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/064/06064214.pdf [firstpage_image] =>[orig_patent_app_number] => 994186 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/994186
Perimeter trace probe for plastic ball grid arrays Dec 18, 1997 Issued
Array ( [id] => 4112629 [patent_doc_number] => 06023172 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-02-08 [patent_title] => 'Light-based method and apparatus for maintaining probe cards' [patent_app_type] => 1 [patent_app_number] => 8/992599 [patent_app_country] => US [patent_app_date] => 1997-12-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 3297 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 74 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/023/06023172.pdf [firstpage_image] =>[orig_patent_app_number] => 992599 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/992599
Light-based method and apparatus for maintaining probe cards Dec 16, 1997 Issued
Array ( [id] => 4199424 [patent_doc_number] => 06043668 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-03-28 [patent_title] => 'Planarity verification system for integrated circuit test probes' [patent_app_type] => 1 [patent_app_number] => 8/991788 [patent_app_country] => US [patent_app_date] => 1997-12-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 4621 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 159 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/043/06043668.pdf [firstpage_image] =>[orig_patent_app_number] => 991788 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/991788
Planarity verification system for integrated circuit test probes Dec 11, 1997 Issued
Array ( [id] => 4241100 [patent_doc_number] => 06118287 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-09-12 [patent_title] => 'Probe tip structure' [patent_app_type] => 1 [patent_app_number] => 8/987640 [patent_app_country] => US [patent_app_date] => 1997-12-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 16 [patent_no_of_words] => 3494 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 86 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/118/06118287.pdf [firstpage_image] =>[orig_patent_app_number] => 987640 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/987640
Probe tip structure Dec 8, 1997 Issued
Array ( [id] => 4104683 [patent_doc_number] => 06049214 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-04-11 [patent_title] => 'Universal printed circuit board inspection apparatus, and method of using same' [patent_app_type] => 1 [patent_app_number] => 8/985848 [patent_app_country] => US [patent_app_date] => 1997-12-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 2836 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 197 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/049/06049214.pdf [firstpage_image] =>[orig_patent_app_number] => 985848 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/985848
Universal printed circuit board inspection apparatus, and method of using same Dec 4, 1997 Issued
Array ( [id] => 4121745 [patent_doc_number] => 06046602 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-04-04 [patent_title] => 'Method for determining the state of strength of winding overhangs of electric machines, and arrangement for carrying out the method' [patent_app_type] => 1 [patent_app_number] => 8/986142 [patent_app_country] => US [patent_app_date] => 1997-12-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 2081 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 180 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/046/06046602.pdf [firstpage_image] =>[orig_patent_app_number] => 986142 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/986142
Method for determining the state of strength of winding overhangs of electric machines, and arrangement for carrying out the method Dec 4, 1997 Issued
Array ( [id] => 4213849 [patent_doc_number] => 06028436 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-02-22 [patent_title] => 'Method for forming coaxial silicon interconnects' [patent_app_type] => 1 [patent_app_number] => 8/982328 [patent_app_country] => US [patent_app_date] => 1997-12-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 21 [patent_no_of_words] => 5131 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 107 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/028/06028436.pdf [firstpage_image] =>[orig_patent_app_number] => 982328 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/982328
Method for forming coaxial silicon interconnects Dec 1, 1997 Issued
Array ( [id] => 4303558 [patent_doc_number] => 06198291 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-03-06 [patent_title] => 'Double-speed tester and method of use thereof for testing microelectronic devices' [patent_app_type] => 1 [patent_app_number] => 8/978542 [patent_app_country] => US [patent_app_date] => 1997-11-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 11 [patent_no_of_words] => 3767 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 190 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/198/06198291.pdf [firstpage_image] =>[orig_patent_app_number] => 978542 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/978542
Double-speed tester and method of use thereof for testing microelectronic devices Nov 25, 1997 Issued
Array ( [id] => 4199017 [patent_doc_number] => 06043640 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-03-28 [patent_title] => 'Multimeter with current sensor' [patent_app_type] => 1 [patent_app_number] => 8/960410 [patent_app_country] => US [patent_app_date] => 1997-10-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4322 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 124 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/043/06043640.pdf [firstpage_image] =>[orig_patent_app_number] => 960410 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/960410
Multimeter with current sensor Oct 28, 1997 Issued
Array ( [id] => 4186194 [patent_doc_number] => 06037779 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-03-14 [patent_title] => 'Bus isolation/diagnostic tool' [patent_app_type] => 1 [patent_app_number] => 8/948642 [patent_app_country] => US [patent_app_date] => 1997-10-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 3 [patent_no_of_words] => 2229 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 238 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/037/06037779.pdf [firstpage_image] =>[orig_patent_app_number] => 948642 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/948642
Bus isolation/diagnostic tool Oct 9, 1997 Issued
Array ( [id] => 4189045 [patent_doc_number] => 06020746 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-02-01 [patent_title] => 'Method and apparatus for probing an integrated circuit through the back side of an integrated circuit die' [patent_app_type] => 1 [patent_app_number] => 8/941888 [patent_app_country] => US [patent_app_date] => 1997-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 5243 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 56 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/020/06020746.pdf [firstpage_image] =>[orig_patent_app_number] => 941888 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/941888
Method and apparatus for probing an integrated circuit through the back side of an integrated circuit die Sep 29, 1997 Issued
Array ( [id] => 3955426 [patent_doc_number] => 05999006 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-12-07 [patent_title] => 'Method of and apparatus for conducting analysis of buried oxides' [patent_app_type] => 1 [patent_app_number] => 8/940378 [patent_app_country] => US [patent_app_date] => 1997-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 2720 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 120 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/999/05999006.pdf [firstpage_image] =>[orig_patent_app_number] => 940378 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/940378
Method of and apparatus for conducting analysis of buried oxides Sep 29, 1997 Issued
Array ( [id] => 4072293 [patent_doc_number] => 06008634 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-12-28 [patent_title] => 'Electrical junction box' [patent_app_type] => 1 [patent_app_number] => 8/942693 [patent_app_country] => US [patent_app_date] => 1997-09-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 9 [patent_no_of_words] => 2822 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 133 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/008/06008634.pdf [firstpage_image] =>[orig_patent_app_number] => 942693 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/942693
Electrical junction box Sep 28, 1997 Issued
Array ( [id] => 4077366 [patent_doc_number] => 06069484 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-05-30 [patent_title] => 'Source measure unit current preamplifier' [patent_app_type] => 1 [patent_app_number] => 8/937477 [patent_app_country] => US [patent_app_date] => 1997-09-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 2237 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 72 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/069/06069484.pdf [firstpage_image] =>[orig_patent_app_number] => 937477 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/937477
Source measure unit current preamplifier Sep 24, 1997 Issued
08/913776 METHOD OF MEASURING A DELAY TIME AND PULSE GENERATING APPARATUS FOR MEASURING A DELAY TIME FOR USE IN IMPLEMENTING THIS METHOD Sep 22, 1997 Abandoned
Array ( [id] => 1510050 [patent_doc_number] => 06441634 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-08-27 [patent_title] => 'Apparatus for testing emissive cathodes in matrix addressable displays' [patent_app_type] => B1 [patent_app_number] => 08/931097 [patent_app_country] => US [patent_app_date] => 1997-09-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 11 [patent_no_of_words] => 4367 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 55 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/441/06441634.pdf [firstpage_image] =>[orig_patent_app_number] => 08931097 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/931097
Apparatus for testing emissive cathodes in matrix addressable displays Sep 14, 1997 Issued
Array ( [id] => 4092321 [patent_doc_number] => 06025729 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-02-15 [patent_title] => 'Floating spring probe wireless test fixture' [patent_app_type] => 1 [patent_app_number] => 8/927191 [patent_app_country] => US [patent_app_date] => 1997-09-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4407 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 124 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/025/06025729.pdf [firstpage_image] =>[orig_patent_app_number] => 927191 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/927191
Floating spring probe wireless test fixture Sep 10, 1997 Issued
Array ( [id] => 3950064 [patent_doc_number] => 05982184 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-11-09 [patent_title] => 'Test head for integrated circuits' [patent_app_type] => 1 [patent_app_number] => 8/921780 [patent_app_country] => US [patent_app_date] => 1997-09-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 9 [patent_no_of_words] => 5131 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 231 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/982/05982184.pdf [firstpage_image] =>[orig_patent_app_number] => 921780 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/921780
Test head for integrated circuits Sep 1, 1997 Issued
Array ( [id] => 4088599 [patent_doc_number] => 06054862 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-04-25 [patent_title] => 'Vacuum chamber bakeout procedure for preventing ion gauge failure' [patent_app_type] => 1 [patent_app_number] => 8/921810 [patent_app_country] => US [patent_app_date] => 1997-09-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 4178 [patent_no_of_claims] => 37 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 49 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/054/06054862.pdf [firstpage_image] =>[orig_patent_app_number] => 921810 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/921810
Vacuum chamber bakeout procedure for preventing ion gauge failure Sep 1, 1997 Issued
Array ( [id] => 4040436 [patent_doc_number] => 05942910 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-08-24 [patent_title] => 'Method and circuit for providing accurate voltage sensing for a power transistor, or the like' [patent_app_type] => 1 [patent_app_number] => 8/919453 [patent_app_country] => US [patent_app_date] => 1997-08-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 3 [patent_no_of_words] => 2695 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 129 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/942/05942910.pdf [firstpage_image] =>[orig_patent_app_number] => 919453 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/919453
Method and circuit for providing accurate voltage sensing for a power transistor, or the like Aug 27, 1997 Issued
Menu