Christopher Albert Gomez
Examiner (ID: 3701)
Most Active Art Unit | 3628 |
Art Unit(s) | 3628 |
Total Applications | 98 |
Issued Applications | 12 |
Pending Applications | 45 |
Abandoned Applications | 40 |
Applications
Application number | Title of the application | Filing Date | Status |
---|---|---|---|
Array
(
[id] => 4153781
[patent_doc_number] => 06064214
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-05-16
[patent_title] => 'Perimeter trace probe for plastic ball grid arrays'
[patent_app_type] => 1
[patent_app_number] => 8/994186
[patent_app_country] => US
[patent_app_date] => 1997-12-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 1766
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 169
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/064/06064214.pdf
[firstpage_image] =>[orig_patent_app_number] => 994186
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/994186 | Perimeter trace probe for plastic ball grid arrays | Dec 18, 1997 | Issued |
Array
(
[id] => 4112629
[patent_doc_number] => 06023172
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-02-08
[patent_title] => 'Light-based method and apparatus for maintaining probe cards'
[patent_app_type] => 1
[patent_app_number] => 8/992599
[patent_app_country] => US
[patent_app_date] => 1997-12-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 6
[patent_no_of_words] => 3297
[patent_no_of_claims] => 29
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 74
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/023/06023172.pdf
[firstpage_image] =>[orig_patent_app_number] => 992599
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/992599 | Light-based method and apparatus for maintaining probe cards | Dec 16, 1997 | Issued |
Array
(
[id] => 4199424
[patent_doc_number] => 06043668
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-03-28
[patent_title] => 'Planarity verification system for integrated circuit test probes'
[patent_app_type] => 1
[patent_app_number] => 8/991788
[patent_app_country] => US
[patent_app_date] => 1997-12-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 2
[patent_no_of_words] => 4621
[patent_no_of_claims] => 24
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 159
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/043/06043668.pdf
[firstpage_image] =>[orig_patent_app_number] => 991788
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/991788 | Planarity verification system for integrated circuit test probes | Dec 11, 1997 | Issued |
Array
(
[id] => 4241100
[patent_doc_number] => 06118287
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-09-12
[patent_title] => 'Probe tip structure'
[patent_app_type] => 1
[patent_app_number] => 8/987640
[patent_app_country] => US
[patent_app_date] => 1997-12-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 16
[patent_no_of_words] => 3494
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 86
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/118/06118287.pdf
[firstpage_image] =>[orig_patent_app_number] => 987640
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/987640 | Probe tip structure | Dec 8, 1997 | Issued |
Array
(
[id] => 4104683
[patent_doc_number] => 06049214
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-04-11
[patent_title] => 'Universal printed circuit board inspection apparatus, and method of using same'
[patent_app_type] => 1
[patent_app_number] => 8/985848
[patent_app_country] => US
[patent_app_date] => 1997-12-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 5
[patent_no_of_words] => 2836
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 197
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/049/06049214.pdf
[firstpage_image] =>[orig_patent_app_number] => 985848
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/985848 | Universal printed circuit board inspection apparatus, and method of using same | Dec 4, 1997 | Issued |
Array
(
[id] => 4121745
[patent_doc_number] => 06046602
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-04-04
[patent_title] => 'Method for determining the state of strength of winding overhangs of electric machines, and arrangement for carrying out the method'
[patent_app_type] => 1
[patent_app_number] => 8/986142
[patent_app_country] => US
[patent_app_date] => 1997-12-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 1
[patent_no_of_words] => 2081
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 180
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/046/06046602.pdf
[firstpage_image] =>[orig_patent_app_number] => 986142
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/986142 | Method for determining the state of strength of winding overhangs of electric machines, and arrangement for carrying out the method | Dec 4, 1997 | Issued |
Array
(
[id] => 4213849
[patent_doc_number] => 06028436
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-02-22
[patent_title] => 'Method for forming coaxial silicon interconnects'
[patent_app_type] => 1
[patent_app_number] => 8/982328
[patent_app_country] => US
[patent_app_date] => 1997-12-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 21
[patent_no_of_words] => 5131
[patent_no_of_claims] => 24
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 107
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/028/06028436.pdf
[firstpage_image] =>[orig_patent_app_number] => 982328
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/982328 | Method for forming coaxial silicon interconnects | Dec 1, 1997 | Issued |
Array
(
[id] => 4303558
[patent_doc_number] => 06198291
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-03-06
[patent_title] => 'Double-speed tester and method of use thereof for testing microelectronic devices'
[patent_app_type] => 1
[patent_app_number] => 8/978542
[patent_app_country] => US
[patent_app_date] => 1997-11-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 11
[patent_no_of_words] => 3767
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 190
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/198/06198291.pdf
[firstpage_image] =>[orig_patent_app_number] => 978542
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/978542 | Double-speed tester and method of use thereof for testing microelectronic devices | Nov 25, 1997 | Issued |
Array
(
[id] => 4199017
[patent_doc_number] => 06043640
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-03-28
[patent_title] => 'Multimeter with current sensor'
[patent_app_type] => 1
[patent_app_number] => 8/960410
[patent_app_country] => US
[patent_app_date] => 1997-10-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 4322
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 124
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/043/06043640.pdf
[firstpage_image] =>[orig_patent_app_number] => 960410
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/960410 | Multimeter with current sensor | Oct 28, 1997 | Issued |
Array
(
[id] => 4186194
[patent_doc_number] => 06037779
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-03-14
[patent_title] => 'Bus isolation/diagnostic tool'
[patent_app_type] => 1
[patent_app_number] => 8/948642
[patent_app_country] => US
[patent_app_date] => 1997-10-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 3
[patent_no_of_words] => 2229
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 238
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/037/06037779.pdf
[firstpage_image] =>[orig_patent_app_number] => 948642
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/948642 | Bus isolation/diagnostic tool | Oct 9, 1997 | Issued |
Array
(
[id] => 4189045
[patent_doc_number] => 06020746
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-02-01
[patent_title] => 'Method and apparatus for probing an integrated circuit through the back side of an integrated circuit die'
[patent_app_type] => 1
[patent_app_number] => 8/941888
[patent_app_country] => US
[patent_app_date] => 1997-09-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 5243
[patent_no_of_claims] => 27
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 56
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/020/06020746.pdf
[firstpage_image] =>[orig_patent_app_number] => 941888
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/941888 | Method and apparatus for probing an integrated circuit through the back side of an integrated circuit die | Sep 29, 1997 | Issued |
Array
(
[id] => 3955426
[patent_doc_number] => 05999006
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-12-07
[patent_title] => 'Method of and apparatus for conducting analysis of buried oxides'
[patent_app_type] => 1
[patent_app_number] => 8/940378
[patent_app_country] => US
[patent_app_date] => 1997-09-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 6
[patent_no_of_words] => 2720
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 120
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/999/05999006.pdf
[firstpage_image] =>[orig_patent_app_number] => 940378
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/940378 | Method of and apparatus for conducting analysis of buried oxides | Sep 29, 1997 | Issued |
Array
(
[id] => 4072293
[patent_doc_number] => 06008634
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-12-28
[patent_title] => 'Electrical junction box'
[patent_app_type] => 1
[patent_app_number] => 8/942693
[patent_app_country] => US
[patent_app_date] => 1997-09-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 9
[patent_no_of_words] => 2822
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 133
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/008/06008634.pdf
[firstpage_image] =>[orig_patent_app_number] => 942693
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/942693 | Electrical junction box | Sep 28, 1997 | Issued |
Array
(
[id] => 4077366
[patent_doc_number] => 06069484
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-05-30
[patent_title] => 'Source measure unit current preamplifier'
[patent_app_type] => 1
[patent_app_number] => 8/937477
[patent_app_country] => US
[patent_app_date] => 1997-09-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 5
[patent_no_of_words] => 2237
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 72
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/069/06069484.pdf
[firstpage_image] =>[orig_patent_app_number] => 937477
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/937477 | Source measure unit current preamplifier | Sep 24, 1997 | Issued |
08/913776 | METHOD OF MEASURING A DELAY TIME AND PULSE GENERATING APPARATUS FOR MEASURING A DELAY TIME FOR USE IN IMPLEMENTING THIS METHOD | Sep 22, 1997 | Abandoned |
Array
(
[id] => 1510050
[patent_doc_number] => 06441634
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-08-27
[patent_title] => 'Apparatus for testing emissive cathodes in matrix addressable displays'
[patent_app_type] => B1
[patent_app_number] => 08/931097
[patent_app_country] => US
[patent_app_date] => 1997-09-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 11
[patent_no_of_words] => 4367
[patent_no_of_claims] => 23
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 55
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/441/06441634.pdf
[firstpage_image] =>[orig_patent_app_number] => 08931097
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/931097 | Apparatus for testing emissive cathodes in matrix addressable displays | Sep 14, 1997 | Issued |
Array
(
[id] => 4092321
[patent_doc_number] => 06025729
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-02-15
[patent_title] => 'Floating spring probe wireless test fixture'
[patent_app_type] => 1
[patent_app_number] => 8/927191
[patent_app_country] => US
[patent_app_date] => 1997-09-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 4407
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 124
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/025/06025729.pdf
[firstpage_image] =>[orig_patent_app_number] => 927191
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/927191 | Floating spring probe wireless test fixture | Sep 10, 1997 | Issued |
Array
(
[id] => 3950064
[patent_doc_number] => 05982184
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-11-09
[patent_title] => 'Test head for integrated circuits'
[patent_app_type] => 1
[patent_app_number] => 8/921780
[patent_app_country] => US
[patent_app_date] => 1997-09-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 9
[patent_no_of_words] => 5131
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 231
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/982/05982184.pdf
[firstpage_image] =>[orig_patent_app_number] => 921780
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/921780 | Test head for integrated circuits | Sep 1, 1997 | Issued |
Array
(
[id] => 4088599
[patent_doc_number] => 06054862
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-04-25
[patent_title] => 'Vacuum chamber bakeout procedure for preventing ion gauge failure'
[patent_app_type] => 1
[patent_app_number] => 8/921810
[patent_app_country] => US
[patent_app_date] => 1997-09-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 8
[patent_no_of_words] => 4178
[patent_no_of_claims] => 37
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 49
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/054/06054862.pdf
[firstpage_image] =>[orig_patent_app_number] => 921810
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/921810 | Vacuum chamber bakeout procedure for preventing ion gauge failure | Sep 1, 1997 | Issued |
Array
(
[id] => 4040436
[patent_doc_number] => 05942910
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-08-24
[patent_title] => 'Method and circuit for providing accurate voltage sensing for a power transistor, or the like'
[patent_app_type] => 1
[patent_app_number] => 8/919453
[patent_app_country] => US
[patent_app_date] => 1997-08-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 3
[patent_no_of_words] => 2695
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 129
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/942/05942910.pdf
[firstpage_image] =>[orig_patent_app_number] => 919453
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/919453 | Method and circuit for providing accurate voltage sensing for a power transistor, or the like | Aug 27, 1997 | Issued |