Christopher Albert Gomez
Examiner (ID: 3701)
Most Active Art Unit | 3628 |
Art Unit(s) | 3628 |
Total Applications | 98 |
Issued Applications | 12 |
Pending Applications | 45 |
Abandoned Applications | 40 |
Applications
Application number | Title of the application | Filing Date | Status |
---|---|---|---|
Array
(
[id] => 1525087
[patent_doc_number] => 06353311
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-03-05
[patent_title] => 'Universal particle flux pressure converter'
[patent_app_type] => B1
[patent_app_number] => 09/109595
[patent_app_country] => US
[patent_app_date] => 1998-07-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 15
[patent_no_of_words] => 13111
[patent_no_of_claims] => 25
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 72
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/353/06353311.pdf
[firstpage_image] =>[orig_patent_app_number] => 09109595
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/109595 | Universal particle flux pressure converter | Jul 1, 1998 | Issued |
Array
(
[id] => 4326024
[patent_doc_number] => 06249115
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-06-19
[patent_title] => 'Method of controlling brightness and contrast in a raster scan digital oscilloscope'
[patent_app_type] => 1
[patent_app_number] => 9/106385
[patent_app_country] => US
[patent_app_date] => 1998-06-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 5
[patent_no_of_words] => 3682
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 8
[patent_words_short_claim] => 124
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/249/06249115.pdf
[firstpage_image] =>[orig_patent_app_number] => 106385
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/106385 | Method of controlling brightness and contrast in a raster scan digital oscilloscope | Jun 24, 1998 | Issued |
Array
(
[id] => 4423820
[patent_doc_number] => 06194910
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-02-27
[patent_title] => 'Relayless voltage measurement in automatic test equipment'
[patent_app_type] => 1
[patent_app_number] => 9/104099
[patent_app_country] => US
[patent_app_date] => 1998-06-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 4811
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 151
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/194/06194910.pdf
[firstpage_image] =>[orig_patent_app_number] => 104099
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/104099 | Relayless voltage measurement in automatic test equipment | Jun 23, 1998 | Issued |
Array
(
[id] => 1462079
[patent_doc_number] => 06392431
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-05-21
[patent_title] => 'Flexibly suspended heat exchange head for a DUT'
[patent_app_type] => B1
[patent_app_number] => 09/043098
[patent_app_country] => US
[patent_app_date] => 1998-06-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 7
[patent_no_of_words] => 3478
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 158
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/392/06392431.pdf
[firstpage_image] =>[orig_patent_app_number] => 09043098
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/043098 | Flexibly suspended heat exchange head for a DUT | Jun 21, 1998 | Issued |
09/100598 | WIRE CUTTER TOOL WITH INTEGRAL INSULATION PIERCING CIRCUIT TESTER | Jun 21, 1998 | Abandoned |
Array
(
[id] => 4321401
[patent_doc_number] => 06242899
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-06-05
[patent_title] => 'Waveform translator for DC to 75 GHz oscillography'
[patent_app_type] => 1
[patent_app_number] => 9/096993
[patent_app_country] => US
[patent_app_date] => 1998-06-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 7563
[patent_no_of_claims] => 14
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[patent_maintenance] => 1
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/242/06242899.pdf
[firstpage_image] =>[orig_patent_app_number] => 096993
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/096993 | Waveform translator for DC to 75 GHz oscillography | Jun 12, 1998 | Issued |
Array
(
[id] => 4139341
[patent_doc_number] => 06147503
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-11-14
[patent_title] => 'Method for the simultaneous and independent determination of moisture content and density of particulate materials from radio-frequency permittivity measurements'
[patent_app_type] => 1
[patent_app_number] => 9/074394
[patent_app_country] => US
[patent_app_date] => 1998-05-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 18
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[patent_no_of_words] => 7088
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/147/06147503.pdf
[firstpage_image] =>[orig_patent_app_number] => 074394
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/074394 | Method for the simultaneous and independent determination of moisture content and density of particulate materials from radio-frequency permittivity measurements | May 7, 1998 | Issued |
Array
(
[id] => 4134005
[patent_doc_number] => 06127818
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-10-03
[patent_title] => 'Tightening rings for integrated circuit tester heads'
[patent_app_type] => 1
[patent_app_number] => 9/066211
[patent_app_country] => US
[patent_app_date] => 1998-04-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 6
[patent_no_of_words] => 2836
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 83
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/127/06127818.pdf
[firstpage_image] =>[orig_patent_app_number] => 066211
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/066211 | Tightening rings for integrated circuit tester heads | Apr 23, 1998 | Issued |
Array
(
[id] => 4199477
[patent_doc_number] => 06043671
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-03-28
[patent_title] => 'Semiconductor inspection device with guide member for probe needle for probe card and method of controlling the same'
[patent_app_type] => 1
[patent_app_number] => 9/058892
[patent_app_country] => US
[patent_app_date] => 1998-04-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 10
[patent_no_of_words] => 6638
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 57
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/043/06043671.pdf
[firstpage_image] =>[orig_patent_app_number] => 058892
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/058892 | Semiconductor inspection device with guide member for probe needle for probe card and method of controlling the same | Apr 12, 1998 | Issued |
Array
(
[id] => 4153795
[patent_doc_number] => 06064215
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-05-16
[patent_title] => 'High temperature probe card for testing integrated circuits'
[patent_app_type] => 1
[patent_app_number] => 9/057080
[patent_app_country] => US
[patent_app_date] => 1998-04-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
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[patent_no_of_words] => 3929
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/064/06064215.pdf
[firstpage_image] =>[orig_patent_app_number] => 057080
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/057080 | High temperature probe card for testing integrated circuits | Apr 7, 1998 | Issued |
Array
(
[id] => 4244708
[patent_doc_number] => 06144212
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-11-07
[patent_title] => 'Vertical needle type probe card, method of manufacturing thereof, method of replacing defective probe needle and test method of wafer using the probe card'
[patent_app_type] => 1
[patent_app_number] => 9/055778
[patent_app_country] => US
[patent_app_date] => 1998-04-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 29
[patent_no_of_words] => 6288
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 4
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[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/144/06144212.pdf
[firstpage_image] =>[orig_patent_app_number] => 055778
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/055778 | Vertical needle type probe card, method of manufacturing thereof, method of replacing defective probe needle and test method of wafer using the probe card | Apr 6, 1998 | Issued |
Array
(
[id] => 4336031
[patent_doc_number] => 06320398
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-11-20
[patent_title] => 'Semiconductor device testing apparatus'
[patent_app_type] => 1
[patent_app_number] => 9/051419
[patent_app_country] => US
[patent_app_date] => 1998-04-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 15
[patent_no_of_words] => 9969
[patent_no_of_claims] => 32
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/320/06320398.pdf
[firstpage_image] =>[orig_patent_app_number] => 051419
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/051419 | Semiconductor device testing apparatus | Apr 5, 1998 | Issued |
Array
(
[id] => 4240997
[patent_doc_number] => 06118280
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-09-12
[patent_title] => 'Method for detecting defects in dielectric film'
[patent_app_type] => 1
[patent_app_number] => 9/049201
[patent_app_country] => US
[patent_app_date] => 1998-03-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/118/06118280.pdf
[firstpage_image] =>[orig_patent_app_number] => 049201
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/049201 | Method for detecting defects in dielectric film | Mar 26, 1998 | Issued |
Array
(
[id] => 4106229
[patent_doc_number] => 06066957
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-05-23
[patent_title] => 'Floating spring probe wireless test fixture'
[patent_app_type] => 1
[patent_app_number] => 9/045232
[patent_app_country] => US
[patent_app_date] => 1998-03-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/066/06066957.pdf
[firstpage_image] =>[orig_patent_app_number] => 045232
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/045232 | Floating spring probe wireless test fixture | Mar 19, 1998 | Issued |
Array
(
[id] => 4163338
[patent_doc_number] => 06107804
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-08-22
[patent_title] => 'Apparatus for measuring the amount of electric charge induced in conductive part and method of measuring electric charge'
[patent_app_type] => 1
[patent_app_number] => 9/038354
[patent_app_country] => US
[patent_app_date] => 1998-03-10
[patent_effective_date] => 0000-00-00
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[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/107/06107804.pdf
[firstpage_image] =>[orig_patent_app_number] => 038354
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/038354 | Apparatus for measuring the amount of electric charge induced in conductive part and method of measuring electric charge | Mar 9, 1998 | Issued |
Array
(
[id] => 4114935
[patent_doc_number] => 06057688
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-05-02
[patent_title] => 'Residual capacity detecting apparatus for an electric vehicle\'s battery and a related residual capacity measuring method'
[patent_app_type] => 1
[patent_app_number] => 9/034365
[patent_app_country] => US
[patent_app_date] => 1998-03-04
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/06/057/06057688.pdf
[firstpage_image] =>[orig_patent_app_number] => 034365
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/034365 | Residual capacity detecting apparatus for an electric vehicle's battery and a related residual capacity measuring method | Mar 3, 1998 | Issued |
Array
(
[id] => 4226081
[patent_doc_number] => 06040705
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-03-21
[patent_title] => 'Rolling electrical contactor'
[patent_app_type] => 1
[patent_app_number] => 9/032696
[patent_app_country] => US
[patent_app_date] => 1998-02-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 13
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[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/040/06040705.pdf
[firstpage_image] =>[orig_patent_app_number] => 032696
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/032696 | Rolling electrical contactor | Feb 26, 1998 | Issued |
Array
(
[id] => 4103767
[patent_doc_number] => 06097202
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-08-01
[patent_title] => 'Circuit board inspection apparatus and method'
[patent_app_type] => 1
[patent_app_number] => 9/032239
[patent_app_country] => US
[patent_app_date] => 1998-02-27
[patent_effective_date] => 0000-00-00
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[patent_figures_cnt] => 25
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[pdf_file] => patents/06/097/06097202.pdf
[firstpage_image] =>[orig_patent_app_number] => 032239
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/032239 | Circuit board inspection apparatus and method | Feb 26, 1998 | Issued |
Array
(
[id] => 4246178
[patent_doc_number] => 06091257
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-07-18
[patent_title] => 'Vacuum activated backside contact'
[patent_app_type] => 1
[patent_app_number] => 9/032496
[patent_app_country] => US
[patent_app_date] => 1998-02-26
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/06/091/06091257.pdf
[firstpage_image] =>[orig_patent_app_number] => 032496
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/032496 | Vacuum activated backside contact | Feb 25, 1998 | Issued |
Array
(
[id] => 4139059
[patent_doc_number] => 06147485
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-11-14
[patent_title] => 'Universal test fixture for circuit packs'
[patent_app_type] => 1
[patent_app_number] => 9/027634
[patent_app_country] => US
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[patent_effective_date] => 0000-00-00
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/147/06147485.pdf
[firstpage_image] =>[orig_patent_app_number] => 027634
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/027634 | Universal test fixture for circuit packs | Feb 22, 1998 | Issued |