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Christopher Albert Gomez

Examiner (ID: 3701)

Most Active Art Unit
3628
Art Unit(s)
3628
Total Applications
98
Issued Applications
12
Pending Applications
45
Abandoned Applications
40

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 1525087 [patent_doc_number] => 06353311 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-03-05 [patent_title] => 'Universal particle flux pressure converter' [patent_app_type] => B1 [patent_app_number] => 09/109595 [patent_app_country] => US [patent_app_date] => 1998-07-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 15 [patent_no_of_words] => 13111 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 72 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/353/06353311.pdf [firstpage_image] =>[orig_patent_app_number] => 09109595 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/109595
Universal particle flux pressure converter Jul 1, 1998 Issued
Array ( [id] => 4326024 [patent_doc_number] => 06249115 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-06-19 [patent_title] => 'Method of controlling brightness and contrast in a raster scan digital oscilloscope' [patent_app_type] => 1 [patent_app_number] => 9/106385 [patent_app_country] => US [patent_app_date] => 1998-06-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 5 [patent_no_of_words] => 3682 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 124 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/249/06249115.pdf [firstpage_image] =>[orig_patent_app_number] => 106385 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/106385
Method of controlling brightness and contrast in a raster scan digital oscilloscope Jun 24, 1998 Issued
Array ( [id] => 4423820 [patent_doc_number] => 06194910 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-02-27 [patent_title] => 'Relayless voltage measurement in automatic test equipment' [patent_app_type] => 1 [patent_app_number] => 9/104099 [patent_app_country] => US [patent_app_date] => 1998-06-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4811 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 151 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/194/06194910.pdf [firstpage_image] =>[orig_patent_app_number] => 104099 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/104099
Relayless voltage measurement in automatic test equipment Jun 23, 1998 Issued
Array ( [id] => 1462079 [patent_doc_number] => 06392431 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-05-21 [patent_title] => 'Flexibly suspended heat exchange head for a DUT' [patent_app_type] => B1 [patent_app_number] => 09/043098 [patent_app_country] => US [patent_app_date] => 1998-06-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 7 [patent_no_of_words] => 3478 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 158 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/392/06392431.pdf [firstpage_image] =>[orig_patent_app_number] => 09043098 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/043098
Flexibly suspended heat exchange head for a DUT Jun 21, 1998 Issued
09/100598 WIRE CUTTER TOOL WITH INTEGRAL INSULATION PIERCING CIRCUIT TESTER Jun 21, 1998 Abandoned
Array ( [id] => 4321401 [patent_doc_number] => 06242899 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-06-05 [patent_title] => 'Waveform translator for DC to 75 GHz oscillography' [patent_app_type] => 1 [patent_app_number] => 9/096993 [patent_app_country] => US [patent_app_date] => 1998-06-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 7563 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 142 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/242/06242899.pdf [firstpage_image] =>[orig_patent_app_number] => 096993 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/096993
Waveform translator for DC to 75 GHz oscillography Jun 12, 1998 Issued
Array ( [id] => 4139341 [patent_doc_number] => 06147503 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-11-14 [patent_title] => 'Method for the simultaneous and independent determination of moisture content and density of particulate materials from radio-frequency permittivity measurements' [patent_app_type] => 1 [patent_app_number] => 9/074394 [patent_app_country] => US [patent_app_date] => 1998-05-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 18 [patent_no_of_words] => 7088 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 95 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/147/06147503.pdf [firstpage_image] =>[orig_patent_app_number] => 074394 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/074394
Method for the simultaneous and independent determination of moisture content and density of particulate materials from radio-frequency permittivity measurements May 7, 1998 Issued
Array ( [id] => 4134005 [patent_doc_number] => 06127818 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-10-03 [patent_title] => 'Tightening rings for integrated circuit tester heads' [patent_app_type] => 1 [patent_app_number] => 9/066211 [patent_app_country] => US [patent_app_date] => 1998-04-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 6 [patent_no_of_words] => 2836 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 83 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/127/06127818.pdf [firstpage_image] =>[orig_patent_app_number] => 066211 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/066211
Tightening rings for integrated circuit tester heads Apr 23, 1998 Issued
Array ( [id] => 4199477 [patent_doc_number] => 06043671 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-03-28 [patent_title] => 'Semiconductor inspection device with guide member for probe needle for probe card and method of controlling the same' [patent_app_type] => 1 [patent_app_number] => 9/058892 [patent_app_country] => US [patent_app_date] => 1998-04-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 10 [patent_no_of_words] => 6638 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 57 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/043/06043671.pdf [firstpage_image] =>[orig_patent_app_number] => 058892 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/058892
Semiconductor inspection device with guide member for probe needle for probe card and method of controlling the same Apr 12, 1998 Issued
Array ( [id] => 4153795 [patent_doc_number] => 06064215 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-05-16 [patent_title] => 'High temperature probe card for testing integrated circuits' [patent_app_type] => 1 [patent_app_number] => 9/057080 [patent_app_country] => US [patent_app_date] => 1998-04-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 18 [patent_no_of_words] => 3929 [patent_no_of_claims] => 43 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/064/06064215.pdf [firstpage_image] =>[orig_patent_app_number] => 057080 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/057080
High temperature probe card for testing integrated circuits Apr 7, 1998 Issued
Array ( [id] => 4244708 [patent_doc_number] => 06144212 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-11-07 [patent_title] => 'Vertical needle type probe card, method of manufacturing thereof, method of replacing defective probe needle and test method of wafer using the probe card' [patent_app_type] => 1 [patent_app_number] => 9/055778 [patent_app_country] => US [patent_app_date] => 1998-04-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 29 [patent_no_of_words] => 6288 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 201 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/144/06144212.pdf [firstpage_image] =>[orig_patent_app_number] => 055778 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/055778
Vertical needle type probe card, method of manufacturing thereof, method of replacing defective probe needle and test method of wafer using the probe card Apr 6, 1998 Issued
Array ( [id] => 4336031 [patent_doc_number] => 06320398 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-11-20 [patent_title] => 'Semiconductor device testing apparatus' [patent_app_type] => 1 [patent_app_number] => 9/051419 [patent_app_country] => US [patent_app_date] => 1998-04-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 15 [patent_no_of_words] => 9969 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 310 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/320/06320398.pdf [firstpage_image] =>[orig_patent_app_number] => 051419 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/051419
Semiconductor device testing apparatus Apr 5, 1998 Issued
Array ( [id] => 4240997 [patent_doc_number] => 06118280 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-09-12 [patent_title] => 'Method for detecting defects in dielectric film' [patent_app_type] => 1 [patent_app_number] => 9/049201 [patent_app_country] => US [patent_app_date] => 1998-03-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 10076 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 108 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/118/06118280.pdf [firstpage_image] =>[orig_patent_app_number] => 049201 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/049201
Method for detecting defects in dielectric film Mar 26, 1998 Issued
Array ( [id] => 4106229 [patent_doc_number] => 06066957 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-05-23 [patent_title] => 'Floating spring probe wireless test fixture' [patent_app_type] => 1 [patent_app_number] => 9/045232 [patent_app_country] => US [patent_app_date] => 1998-03-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5470 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 148 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/066/06066957.pdf [firstpage_image] =>[orig_patent_app_number] => 045232 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/045232
Floating spring probe wireless test fixture Mar 19, 1998 Issued
Array ( [id] => 4163338 [patent_doc_number] => 06107804 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-08-22 [patent_title] => 'Apparatus for measuring the amount of electric charge induced in conductive part and method of measuring electric charge' [patent_app_type] => 1 [patent_app_number] => 9/038354 [patent_app_country] => US [patent_app_date] => 1998-03-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 20 [patent_no_of_words] => 6865 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 152 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/107/06107804.pdf [firstpage_image] =>[orig_patent_app_number] => 038354 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/038354
Apparatus for measuring the amount of electric charge induced in conductive part and method of measuring electric charge Mar 9, 1998 Issued
Array ( [id] => 4114935 [patent_doc_number] => 06057688 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-05-02 [patent_title] => 'Residual capacity detecting apparatus for an electric vehicle\'s battery and a related residual capacity measuring method' [patent_app_type] => 1 [patent_app_number] => 9/034365 [patent_app_country] => US [patent_app_date] => 1998-03-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 26 [patent_no_of_words] => 9534 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 97 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/057/06057688.pdf [firstpage_image] =>[orig_patent_app_number] => 034365 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/034365
Residual capacity detecting apparatus for an electric vehicle's battery and a related residual capacity measuring method Mar 3, 1998 Issued
Array ( [id] => 4226081 [patent_doc_number] => 06040705 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-03-21 [patent_title] => 'Rolling electrical contactor' [patent_app_type] => 1 [patent_app_number] => 9/032696 [patent_app_country] => US [patent_app_date] => 1998-02-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 13 [patent_no_of_words] => 3331 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 232 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/040/06040705.pdf [firstpage_image] =>[orig_patent_app_number] => 032696 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/032696
Rolling electrical contactor Feb 26, 1998 Issued
Array ( [id] => 4103767 [patent_doc_number] => 06097202 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-08-01 [patent_title] => 'Circuit board inspection apparatus and method' [patent_app_type] => 1 [patent_app_number] => 9/032239 [patent_app_country] => US [patent_app_date] => 1998-02-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 25 [patent_no_of_words] => 5847 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 88 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/097/06097202.pdf [firstpage_image] =>[orig_patent_app_number] => 032239 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/032239
Circuit board inspection apparatus and method Feb 26, 1998 Issued
Array ( [id] => 4246178 [patent_doc_number] => 06091257 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-07-18 [patent_title] => 'Vacuum activated backside contact' [patent_app_type] => 1 [patent_app_number] => 9/032496 [patent_app_country] => US [patent_app_date] => 1998-02-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 3 [patent_no_of_words] => 1697 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 197 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/091/06091257.pdf [firstpage_image] =>[orig_patent_app_number] => 032496 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/032496
Vacuum activated backside contact Feb 25, 1998 Issued
Array ( [id] => 4139059 [patent_doc_number] => 06147485 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-11-14 [patent_title] => 'Universal test fixture for circuit packs' [patent_app_type] => 1 [patent_app_number] => 9/027634 [patent_app_country] => US [patent_app_date] => 1998-02-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 21 [patent_no_of_words] => 3634 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 192 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/147/06147485.pdf [firstpage_image] =>[orig_patent_app_number] => 027634 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/027634
Universal test fixture for circuit packs Feb 22, 1998 Issued
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