Gregory Listvoyb
Examiner (ID: 8829, Phone: (571)272-6105 , Office: P/1765 )
Most Active Art Unit | 1765 |
Art Unit(s) | 1796, 1765, 1711 |
Total Applications | 1391 |
Issued Applications | 860 |
Pending Applications | 96 |
Abandoned Applications | 435 |
Applications
Application number | Title of the application | Filing Date | Status |
---|---|---|---|
Array
(
[id] => 1385707
[patent_doc_number] => 06555822
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-04-29
[patent_title] => 'Method for identification of plastic materials by optical measurements'
[patent_app_type] => B1
[patent_app_number] => 09/626659
[patent_app_country] => US
[patent_app_date] => 2000-07-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 1
[patent_no_of_words] => 4297
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 7
[patent_words_short_claim] => 36
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/555/06555822.pdf
[firstpage_image] =>[orig_patent_app_number] => 09626659
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/626659 | Method for identification of plastic materials by optical measurements | Jul 26, 2000 | Issued |
Array
(
[id] => 1385553
[patent_doc_number] => 06555814
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-04-29
[patent_title] => 'Method and device for controlling the number of ions in ion cyclotron resonance mass spectrometers'
[patent_app_type] => B1
[patent_app_number] => 09/607774
[patent_app_country] => US
[patent_app_date] => 2000-06-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 4666
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 86
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/555/06555814.pdf
[firstpage_image] =>[orig_patent_app_number] => 09607774
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/607774 | Method and device for controlling the number of ions in ion cyclotron resonance mass spectrometers | Jun 29, 2000 | Issued |
Array
(
[id] => 1363513
[patent_doc_number] => 06573497
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-06-03
[patent_title] => 'Calibration of CD-SEM by e-beam induced current measurement'
[patent_app_type] => B1
[patent_app_number] => 09/607628
[patent_app_country] => US
[patent_app_date] => 2000-06-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 10
[patent_no_of_words] => 6988
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 79
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/573/06573497.pdf
[firstpage_image] =>[orig_patent_app_number] => 09607628
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/607628 | Calibration of CD-SEM by e-beam induced current measurement | Jun 29, 2000 | Issued |
Array
(
[id] => 1363526
[patent_doc_number] => 06573498
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-06-03
[patent_title] => 'Electric measurement of reference sample in a CD-SEM and method for calibration'
[patent_app_type] => B1
[patent_app_number] => 09/608096
[patent_app_country] => US
[patent_app_date] => 2000-06-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 10
[patent_no_of_words] => 6266
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 73
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/573/06573498.pdf
[firstpage_image] =>[orig_patent_app_number] => 09608096
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/608096 | Electric measurement of reference sample in a CD-SEM and method for calibration | Jun 29, 2000 | Issued |
Array
(
[id] => 1198785
[patent_doc_number] => 06727989
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2004-04-27
[patent_title] => 'Enhanced overlay measurement marks for overlay alignment and exposure tool condition control'
[patent_app_type] => B1
[patent_app_number] => 09/597123
[patent_app_country] => US
[patent_app_date] => 2000-06-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 4
[patent_no_of_words] => 2531
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 187
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/727/06727989.pdf
[firstpage_image] =>[orig_patent_app_number] => 09597123
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/597123 | Enhanced overlay measurement marks for overlay alignment and exposure tool condition control | Jun 19, 2000 | Issued |
Array
(
[id] => 1346424
[patent_doc_number] => 06586733
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-07-01
[patent_title] => 'Apparatus and methods for secondary electron emission microscope with dual beam'
[patent_app_type] => B1
[patent_app_number] => 09/579867
[patent_app_country] => US
[patent_app_date] => 2000-05-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 6949
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 102
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/586/06586733.pdf
[firstpage_image] =>[orig_patent_app_number] => 09579867
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/579867 | Apparatus and methods for secondary electron emission microscope with dual beam | May 24, 2000 | Issued |
Array
(
[id] => 1272599
[patent_doc_number] => 06653645
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-11-25
[patent_title] => 'Deflection lens device for electron beam lithography'
[patent_app_type] => B1
[patent_app_number] => 09/570899
[patent_app_country] => US
[patent_app_date] => 2000-05-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 8
[patent_no_of_words] => 4758
[patent_no_of_claims] => 34
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 151
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/653/06653645.pdf
[firstpage_image] =>[orig_patent_app_number] => 09570899
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/570899 | Deflection lens device for electron beam lithography | May 14, 2000 | Issued |
Array
(
[id] => 1217817
[patent_doc_number] => 06707031
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2004-03-16
[patent_title] => 'Laser optical bench for laser desorption ion sources and method of use thereof'
[patent_app_type] => B1
[patent_app_number] => 09/568745
[patent_app_country] => US
[patent_app_date] => 2000-05-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 5
[patent_no_of_words] => 3755
[patent_no_of_claims] => 57
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 155
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/707/06707031.pdf
[firstpage_image] =>[orig_patent_app_number] => 09568745
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/568745 | Laser optical bench for laser desorption ion sources and method of use thereof | May 10, 2000 | Issued |
Array
(
[id] => 1305756
[patent_doc_number] => 06621086
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-09-16
[patent_title] => 'Radiochromic imaging method'
[patent_app_type] => B1
[patent_app_number] => 09/569342
[patent_app_country] => US
[patent_app_date] => 2000-05-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 8
[patent_no_of_words] => 7333
[patent_no_of_claims] => 25
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 14
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/621/06621086.pdf
[firstpage_image] =>[orig_patent_app_number] => 09569342
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/569342 | Radiochromic imaging method | May 10, 2000 | Issued |
Array
(
[id] => 1189741
[patent_doc_number] => 06734442
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2004-05-11
[patent_title] => 'Mapping method for a microscope slide'
[patent_app_type] => B1
[patent_app_number] => 09/645983
[patent_app_country] => US
[patent_app_date] => 1998-05-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 1
[patent_no_of_words] => 3000
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 56
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/734/06734442.pdf
[firstpage_image] =>[orig_patent_app_number] => 09645983
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/645983 | Mapping method for a microscope slide | May 4, 1998 | Issued |