Method and apparatus for built-in self-test of smart memories | Patent Number 06154861

US 06154861 NA
Application Number8477742
Publication Number-
Pendency5 years, 5 months, 26 days
Filled DateJun 7, 1995
Priority DateSep 17, 1992
Publication Date-
Expiration DateSep 17, 2012
Inventor/Applicants Mark G. Harward
ExaminesTU, CHRISTINE TRINH LE
Art Unit2784
Technology Center2700
Assignments
Texas Instruments
Current
Texas Instruments
Original
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