Persistent command parameter table for pre-silicon device testing | Patent Publication Number 20160240267

US 20160240267 A1
Patent NumberUS 09524801 B2
Application Number15073221
Filled DateMar 17, 2016
Priority DateFeb 12, 2015
Publication DateAug 18, 2016
Inventor/ApplicantsRebecca M. Gott
Chakrapani Rayadurgam
Edward J. Kaminski, JR.
Edward J. Kaminski, Jr.
Dean G. Bair
William J. Lewis
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