Microneedle array imaging device, microneedle array imaging method, microneedle array inspection device, and microneedle array inspection method | Patent Publication Number 20190188844

US 20190188844 A1
Patent NumberUS 10922805 B2
Application Number16283841
Filled DateFeb 25, 2019
Priority DateAug 17, 2017
Publication DateJun 20, 2019
Original AssigneeFujifilm Holdings Corporation
Current AssigneeFujifilm
Inventor/ApplicantsKazuo ONISHI
Takashi MUROOKA
Takashi Murooka
Kazuo Onishi
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