SYSTEMS AND METHODS FOR SEMICONDUCTOR CHIP SURFACE TOPOGRAPHY METROLOGY | Patent Publication Number 20230144331
US 20230144331 A1Publication DateMay 11, 2023
Original Assignee
Current AssigneeYangtze Memory Technologies Co. Ltd.
Inventor/ApplicantsSicong Wang
Xiaoye Ding
Xiaoye Ding
Empower your practice with Patexia Publication Prosecution IP Module.
Get access to our exclusive rankings and unlock powerful data.
Looking for a Publication Attorney?
Get in touch with our team or create your account to start exploring a
network of over 120K attorneys.