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Patents Prosecuted

Application numberTitle of the patentIPCFiling DateDecision Date
18081688 MEMORY SYSTEM AND METHOD OF OPERATING MEMORY CONTROLLER INCLUDED IN THE MEMORY SYSTEM G06F Dec 14, 2022
18081697 DATA STORAGE DEVICE, MEMORY CONTROLLER THEREFOR, AND OPERATING METHOD THEREOF G06F Dec 14, 2022
18081585 STORAGE DEVICE, ELECTRONIC DEVICE INCLUDING THE SAME, AND OPERATING METHOD THEREOF G06F Dec 13, 2022
18066158 MEMORY EXPANSION DEVICE PERFORMING NEAR DATA PROCESSING FUNCTION AND ACCELERATOR SYSTEM INCLUDING THE SAME G06F Dec 13, 2022
18081040 SEMICONDUCTOR MEMORY DEVICE H10B Dec 13, 2022
18066080 SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME H10B, H10N Dec 13, 2022
18066161 HOST DEVICE PERFORMING NEAR DATA PROCESSING FUNCTION AND ACCELERATOR SYSTEM INCLUDING THE SAME G06F Dec 13, 2022
18081605 MEMORY CONTROLLER AND METHOD OF OPERATING THE SAME G06F Dec 13, 2022
18081519 COMPUTING SYSTEM AND METHOD OF OPERATING THE SAME G06F Dec 13, 2022
18065482 AUXILIARY POWER CIRCUIT, ELECTRONIC DEVICE, AND METHOD FOR OPERATING AUXILIARY POWER CIRCUIT H02M, G11C, H02J Dec 12, 2022
18080472 SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD OF THE SEMICONDUCTOR MEMORY DEVICE G11C, H01L Dec 12, 2022
18080282 MEMORY DEVICE INCLUDING ERROR CORRECTION DEVICE G11C Dec 12, 2022
18080293 INTEGRATED CIRCUIT AND MEMORY DEVICE INCLUDING SAMPLING CIRCUIT G11C Dec 12, 2022
18064757 SEMICONDUCTOR DEVICE H01L, G11C Dec 11, 2022
18079489 TEST CIRCUIT MONITORING PBTI AND OPERATING METHOD THEREOF G01R Dec 11, 2022
18078620 MEMORY DEVICE AND OPERATING METHOD OF THE MEMORY DEVICE G11C Dec 8, 2022
18063938 SEMICONDUCTOR DEVICE INCLUDING FERROELECTRIC LAYER H10B Dec 8, 2022
18064134 STACKED SEMICONDUCTOR DEVICE INCLUDING HYBRID BONDING STRUCTURE H01L Dec 8, 2022
18078732 Merged buffer and memory device including the merged buffer G11C Dec 8, 2022 Oct 9, 2023
18077775 Probe test card and method of manufacturing the same G01R Dec 7, 2022 Mar 18, 2024
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