Patents Prosecuted
Application number | Title of the patent | IPC | Filing Date | Decision Date |
---|---|---|---|---|
18081688 | MEMORY SYSTEM AND METHOD OF OPERATING MEMORY CONTROLLER INCLUDED IN THE MEMORY SYSTEM | G06F | Dec 14, 2022 | |
18081697 | DATA STORAGE DEVICE, MEMORY CONTROLLER THEREFOR, AND OPERATING METHOD THEREOF | G06F | Dec 14, 2022 | |
18081585 | STORAGE DEVICE, ELECTRONIC DEVICE INCLUDING THE SAME, AND OPERATING METHOD THEREOF | G06F | Dec 13, 2022 | |
18066158 | MEMORY EXPANSION DEVICE PERFORMING NEAR DATA PROCESSING FUNCTION AND ACCELERATOR SYSTEM INCLUDING THE SAME | G06F | Dec 13, 2022 | |
18081040 | SEMICONDUCTOR MEMORY DEVICE | H10B | Dec 13, 2022 | |
18066080 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | H10B, H10N | Dec 13, 2022 | |
18066161 | HOST DEVICE PERFORMING NEAR DATA PROCESSING FUNCTION AND ACCELERATOR SYSTEM INCLUDING THE SAME | G06F | Dec 13, 2022 | |
18081605 | MEMORY CONTROLLER AND METHOD OF OPERATING THE SAME | G06F | Dec 13, 2022 | |
18081519 | COMPUTING SYSTEM AND METHOD OF OPERATING THE SAME | G06F | Dec 13, 2022 | |
18065482 | AUXILIARY POWER CIRCUIT, ELECTRONIC DEVICE, AND METHOD FOR OPERATING AUXILIARY POWER CIRCUIT | H02M, G11C, H02J | Dec 12, 2022 | |
18080472 | SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD OF THE SEMICONDUCTOR MEMORY DEVICE | G11C, H01L | Dec 12, 2022 | |
18080282 | MEMORY DEVICE INCLUDING ERROR CORRECTION DEVICE | G11C | Dec 12, 2022 | |
18080293 | INTEGRATED CIRCUIT AND MEMORY DEVICE INCLUDING SAMPLING CIRCUIT | G11C | Dec 12, 2022 | |
18064757 | SEMICONDUCTOR DEVICE | H01L, G11C | Dec 11, 2022 | |
18079489 | TEST CIRCUIT MONITORING PBTI AND OPERATING METHOD THEREOF | G01R | Dec 11, 2022 | |
18078620 | MEMORY DEVICE AND OPERATING METHOD OF THE MEMORY DEVICE | G11C | Dec 8, 2022 | |
18063938 | SEMICONDUCTOR DEVICE INCLUDING FERROELECTRIC LAYER | H10B | Dec 8, 2022 | |
18064134 | STACKED SEMICONDUCTOR DEVICE INCLUDING HYBRID BONDING STRUCTURE | H01L | Dec 8, 2022 | |
18078732 | Merged buffer and memory device including the merged buffer | G11C | Dec 8, 2022 | Oct 9, 2023 |
18077775 | Probe test card and method of manufacturing the same | G01R | Dec 7, 2022 | Mar 18, 2024 |