Search

Alesa M. Allgood

Examiner (ID: 10976, Phone: (571)270-5811 , Office: P/2868 )

Most Active Art Unit
2868
Art Unit(s)
2868, 4154, 2858
Total Applications
938
Issued Applications
751
Pending Applications
79
Abandoned Applications
120

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 8863759 [patent_doc_number] => 20130147462 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-06-13 [patent_title] => 'FAST WIDEBAND FREQUENCY COMPARATOR' [patent_app_type] => utility [patent_app_number] => 13/687200 [patent_app_country] => US [patent_app_date] => 2012-11-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 5867 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13687200 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/687200
Fast wideband frequency comparator Nov 27, 2012 Issued
Array ( [id] => 8818970 [patent_doc_number] => 20130120015 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-05-16 [patent_title] => 'TEST CARRIER' [patent_app_type] => utility [patent_app_number] => 13/677653 [patent_app_country] => US [patent_app_date] => 2012-11-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 3829 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13677653 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/677653
TEST CARRIER Nov 14, 2012 Abandoned
Array ( [id] => 11192632 [patent_doc_number] => 09423441 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2016-08-23 [patent_title] => 'Integrated circuit having receiver jitter tolerance (“JTOL”) measurement' [patent_app_type] => utility [patent_app_number] => 13/621783 [patent_app_country] => US [patent_app_date] => 2012-09-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 9 [patent_no_of_words] => 5046 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 30 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13621783 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/621783
Integrated circuit having receiver jitter tolerance (“JTOL”) measurement Sep 16, 2012 Issued
Array ( [id] => 10944051 [patent_doc_number] => 20140347072 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2014-11-27 [patent_title] => 'Variable Resistor Arrangement, Measurement Bridge Circuit and Method for Calibrating a Measurement Bridge Circuit' [patent_app_type] => utility [patent_app_number] => 14/353758 [patent_app_country] => US [patent_app_date] => 2012-09-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 3278 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14353758 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/353758
Variable resistor arrangement, measurement bridge circuit and method for calibrating a measurement bridge circuit Sep 5, 2012 Issued
Array ( [id] => 8948195 [patent_doc_number] => 20130193975 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-08-01 [patent_title] => 'ELECTROLOCATION APPARATUS AND METHODS FOR PROVIDING INFORMATION ABOUT ONE OR MORE SUBTERRANEAN FEATURE' [patent_app_type] => utility [patent_app_number] => 13/563944 [patent_app_country] => US [patent_app_date] => 2012-08-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 8040 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13563944 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/563944
Electrolocation apparatus and methods for providing information about one or more subterranean feature Jul 31, 2012 Issued
Array ( [id] => 9627351 [patent_doc_number] => 08797037 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-08-05 [patent_title] => 'Apparatus and methods for providing information about one or more subterranean feature' [patent_app_type] => utility [patent_app_number] => 13/564004 [patent_app_country] => US [patent_app_date] => 2012-08-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 17 [patent_no_of_words] => 12108 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 223 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13564004 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/564004
Apparatus and methods for providing information about one or more subterranean feature Jul 31, 2012 Issued
Array ( [id] => 8610528 [patent_doc_number] => 20130015840 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-01-17 [patent_title] => 'Method for Obtaining Field Strength Information' [patent_app_type] => utility [patent_app_number] => 13/548961 [patent_app_country] => US [patent_app_date] => 2012-07-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3424 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13548961 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/548961
Method for obtaining field strength information Jul 12, 2012 Issued
Array ( [id] => 9065716 [patent_doc_number] => 20130257472 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-10-03 [patent_title] => 'ELECTRICAL CHARACTERIZATION OF SEMICONDUCTOR MATERIALS' [patent_app_type] => utility [patent_app_number] => 13/523180 [patent_app_country] => US [patent_app_date] => 2012-06-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 25 [patent_figures_cnt] => 25 [patent_no_of_words] => 17047 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13523180 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/523180
Electrical characterization of semiconductor materials Jun 13, 2012 Issued
Array ( [id] => 9952002 [patent_doc_number] => 09000798 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2015-04-07 [patent_title] => 'Method of test probe alignment control' [patent_app_type] => utility [patent_app_number] => 13/495421 [patent_app_country] => US [patent_app_date] => 2012-06-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4881 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 64 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13495421 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/495421
Method of test probe alignment control Jun 12, 2012 Issued
Array ( [id] => 8839341 [patent_doc_number] => 20130134969 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-05-30 [patent_title] => 'THREE-DIMENSIONAL MAGNETIC FIELD SENSOR AND METHOD OF PRODUCING SAME' [patent_app_type] => utility [patent_app_number] => 13/493495 [patent_app_country] => US [patent_app_date] => 2012-06-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 8893 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13493495 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/493495
Three-dimensional magnetic field sensor and method of producing same Jun 10, 2012 Issued
Array ( [id] => 9000855 [patent_doc_number] => 20130221979 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-08-29 [patent_title] => 'TECHNIQUES FOR IMPROVING RELIABILITY OF A FAULT CURRENT LIMITING SYSTEM' [patent_app_type] => utility [patent_app_number] => 13/493782 [patent_app_country] => US [patent_app_date] => 2012-06-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4751 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13493782 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/493782
Techniques for improving reliability of a fault current limiting system Jun 10, 2012 Issued
Array ( [id] => 8514246 [patent_doc_number] => 20120313654 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-12-13 [patent_title] => 'Voltage Detection Method and Voltage Detector Circuit' [patent_app_type] => utility [patent_app_number] => 13/490443 [patent_app_country] => US [patent_app_date] => 2012-06-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3508 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13490443 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/490443
Voltage Detection Method and Voltage Detector Circuit Jun 5, 2012 Abandoned
Array ( [id] => 8507116 [patent_doc_number] => 20120306523 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-12-06 [patent_title] => 'PROBE CARD' [patent_app_type] => utility [patent_app_number] => 13/486400 [patent_app_country] => US [patent_app_date] => 2012-06-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 9015 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13486400 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/486400
Probe card for testing a semiconductor chip May 31, 2012 Issued
Array ( [id] => 8514250 [patent_doc_number] => 20120313658 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-12-13 [patent_title] => 'Dual Probing Tip System' [patent_app_type] => utility [patent_app_number] => 13/487069 [patent_app_country] => US [patent_app_date] => 2012-06-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3491 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13487069 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/487069
Dual probing tip system May 31, 2012 Issued
Array ( [id] => 10588815 [patent_doc_number] => 09310422 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2016-04-12 [patent_title] => 'Methods and apparatus for testing small form factor antenna tuning elements' [patent_app_type] => utility [patent_app_number] => 13/487149 [patent_app_country] => US [patent_app_date] => 2012-06-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 24 [patent_no_of_words] => 10708 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 257 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13487149 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/487149
Methods and apparatus for testing small form factor antenna tuning elements May 31, 2012 Issued
Array ( [id] => 8851404 [patent_doc_number] => 20130141079 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-06-06 [patent_title] => 'SUBSTRATE AND METHOD FOR MANUFACTURING THE SAME, AND PROBE CARD' [patent_app_type] => utility [patent_app_number] => 13/482353 [patent_app_country] => US [patent_app_date] => 2012-05-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 3813 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13482353 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/482353
Substrate and method for manufacturing the same, and probe card May 28, 2012 Issued
Array ( [id] => 8564166 [patent_doc_number] => 20120326737 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-12-27 [patent_title] => 'METHOD OF MEASURING SCATTERING PARAMETERS OF DEVICE UNDER TEST' [patent_app_type] => utility [patent_app_number] => 13/481842 [patent_app_country] => US [patent_app_date] => 2012-05-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4656 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13481842 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/481842
Method of measuring scattering parameters of device under test May 26, 2012 Issued
Array ( [id] => 10893489 [patent_doc_number] => 08917105 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-12-23 [patent_title] => 'Solder bump testing apparatus and methods of use' [patent_app_type] => utility [patent_app_number] => 13/481160 [patent_app_country] => US [patent_app_date] => 2012-05-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 14 [patent_no_of_words] => 5748 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 31 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13481160 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/481160
Solder bump testing apparatus and methods of use May 24, 2012 Issued
Array ( [id] => 9996819 [patent_doc_number] => 09041421 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2015-05-26 [patent_title] => 'IC, circuitry, and RF BIST system' [patent_app_type] => utility [patent_app_number] => 13/480969 [patent_app_country] => US [patent_app_date] => 2012-05-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 6244 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 93 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13480969 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/480969
IC, circuitry, and RF BIST system May 24, 2012 Issued
Array ( [id] => 8500199 [patent_doc_number] => 20120299607 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-11-29 [patent_title] => 'Testing of Defibrillator Electrodes' [patent_app_type] => utility [patent_app_number] => 13/480881 [patent_app_country] => US [patent_app_date] => 2012-05-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 3717 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13480881 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/480881
Testing of defibrillator electrodes May 24, 2012 Issued
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