
Alesa M. Allgood
Examiner (ID: 10976, Phone: (571)270-5811 , Office: P/2868 )
| Most Active Art Unit | 2868 |
| Art Unit(s) | 2868, 4154, 2858 |
| Total Applications | 938 |
| Issued Applications | 751 |
| Pending Applications | 79 |
| Abandoned Applications | 120 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 8863759
[patent_doc_number] => 20130147462
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2013-06-13
[patent_title] => 'FAST WIDEBAND FREQUENCY COMPARATOR'
[patent_app_type] => utility
[patent_app_number] => 13/687200
[patent_app_country] => US
[patent_app_date] => 2012-11-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 5867
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13687200
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/687200 | Fast wideband frequency comparator | Nov 27, 2012 | Issued |
Array
(
[id] => 8818970
[patent_doc_number] => 20130120015
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2013-05-16
[patent_title] => 'TEST CARRIER'
[patent_app_type] => utility
[patent_app_number] => 13/677653
[patent_app_country] => US
[patent_app_date] => 2012-11-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 11
[patent_no_of_words] => 3829
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13677653
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/677653 | TEST CARRIER | Nov 14, 2012 | Abandoned |
Array
(
[id] => 11192632
[patent_doc_number] => 09423441
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2016-08-23
[patent_title] => 'Integrated circuit having receiver jitter tolerance (“JTOL”) measurement'
[patent_app_type] => utility
[patent_app_number] => 13/621783
[patent_app_country] => US
[patent_app_date] => 2012-09-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 9
[patent_no_of_words] => 5046
[patent_no_of_claims] => 29
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 30
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13621783
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/621783 | Integrated circuit having receiver jitter tolerance (“JTOLâ€) measurement | Sep 16, 2012 | Issued |
Array
(
[id] => 10944051
[patent_doc_number] => 20140347072
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2014-11-27
[patent_title] => 'Variable Resistor Arrangement, Measurement Bridge Circuit and Method for Calibrating a Measurement Bridge Circuit'
[patent_app_type] => utility
[patent_app_number] => 14/353758
[patent_app_country] => US
[patent_app_date] => 2012-09-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 3278
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14353758
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/353758 | Variable resistor arrangement, measurement bridge circuit and method for calibrating a measurement bridge circuit | Sep 5, 2012 | Issued |
Array
(
[id] => 8948195
[patent_doc_number] => 20130193975
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2013-08-01
[patent_title] => 'ELECTROLOCATION APPARATUS AND METHODS FOR PROVIDING INFORMATION ABOUT ONE OR MORE SUBTERRANEAN FEATURE'
[patent_app_type] => utility
[patent_app_number] => 13/563944
[patent_app_country] => US
[patent_app_date] => 2012-08-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 8040
[patent_no_of_claims] => 29
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13563944
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/563944 | Electrolocation apparatus and methods for providing information about one or more subterranean feature | Jul 31, 2012 | Issued |
Array
(
[id] => 9627351
[patent_doc_number] => 08797037
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2014-08-05
[patent_title] => 'Apparatus and methods for providing information about one or more subterranean feature'
[patent_app_type] => utility
[patent_app_number] => 13/564004
[patent_app_country] => US
[patent_app_date] => 2012-08-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
[patent_figures_cnt] => 17
[patent_no_of_words] => 12108
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 223
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13564004
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/564004 | Apparatus and methods for providing information about one or more subterranean feature | Jul 31, 2012 | Issued |
Array
(
[id] => 8610528
[patent_doc_number] => 20130015840
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2013-01-17
[patent_title] => 'Method for Obtaining Field Strength Information'
[patent_app_type] => utility
[patent_app_number] => 13/548961
[patent_app_country] => US
[patent_app_date] => 2012-07-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 3424
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13548961
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/548961 | Method for obtaining field strength information | Jul 12, 2012 | Issued |
Array
(
[id] => 9065716
[patent_doc_number] => 20130257472
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2013-10-03
[patent_title] => 'ELECTRICAL CHARACTERIZATION OF SEMICONDUCTOR MATERIALS'
[patent_app_type] => utility
[patent_app_number] => 13/523180
[patent_app_country] => US
[patent_app_date] => 2012-06-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 25
[patent_figures_cnt] => 25
[patent_no_of_words] => 17047
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13523180
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/523180 | Electrical characterization of semiconductor materials | Jun 13, 2012 | Issued |
Array
(
[id] => 9952002
[patent_doc_number] => 09000798
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2015-04-07
[patent_title] => 'Method of test probe alignment control'
[patent_app_type] => utility
[patent_app_number] => 13/495421
[patent_app_country] => US
[patent_app_date] => 2012-06-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 4881
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 64
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13495421
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/495421 | Method of test probe alignment control | Jun 12, 2012 | Issued |
Array
(
[id] => 8839341
[patent_doc_number] => 20130134969
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2013-05-30
[patent_title] => 'THREE-DIMENSIONAL MAGNETIC FIELD SENSOR AND METHOD OF PRODUCING SAME'
[patent_app_type] => utility
[patent_app_number] => 13/493495
[patent_app_country] => US
[patent_app_date] => 2012-06-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 8893
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13493495
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/493495 | Three-dimensional magnetic field sensor and method of producing same | Jun 10, 2012 | Issued |
Array
(
[id] => 9000855
[patent_doc_number] => 20130221979
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2013-08-29
[patent_title] => 'TECHNIQUES FOR IMPROVING RELIABILITY OF A FAULT CURRENT LIMITING SYSTEM'
[patent_app_type] => utility
[patent_app_number] => 13/493782
[patent_app_country] => US
[patent_app_date] => 2012-06-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 4751
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13493782
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/493782 | Techniques for improving reliability of a fault current limiting system | Jun 10, 2012 | Issued |
Array
(
[id] => 8514246
[patent_doc_number] => 20120313654
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2012-12-13
[patent_title] => 'Voltage Detection Method and Voltage Detector Circuit'
[patent_app_type] => utility
[patent_app_number] => 13/490443
[patent_app_country] => US
[patent_app_date] => 2012-06-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 3508
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13490443
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/490443 | Voltage Detection Method and Voltage Detector Circuit | Jun 5, 2012 | Abandoned |
Array
(
[id] => 8507116
[patent_doc_number] => 20120306523
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2012-12-06
[patent_title] => 'PROBE CARD'
[patent_app_type] => utility
[patent_app_number] => 13/486400
[patent_app_country] => US
[patent_app_date] => 2012-06-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 13
[patent_no_of_words] => 9015
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13486400
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/486400 | Probe card for testing a semiconductor chip | May 31, 2012 | Issued |
Array
(
[id] => 8514250
[patent_doc_number] => 20120313658
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2012-12-13
[patent_title] => 'Dual Probing Tip System'
[patent_app_type] => utility
[patent_app_number] => 13/487069
[patent_app_country] => US
[patent_app_date] => 2012-06-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 3491
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13487069
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/487069 | Dual probing tip system | May 31, 2012 | Issued |
Array
(
[id] => 10588815
[patent_doc_number] => 09310422
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2016-04-12
[patent_title] => 'Methods and apparatus for testing small form factor antenna tuning elements'
[patent_app_type] => utility
[patent_app_number] => 13/487149
[patent_app_country] => US
[patent_app_date] => 2012-06-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
[patent_figures_cnt] => 24
[patent_no_of_words] => 10708
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 257
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13487149
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/487149 | Methods and apparatus for testing small form factor antenna tuning elements | May 31, 2012 | Issued |
Array
(
[id] => 8851404
[patent_doc_number] => 20130141079
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2013-06-06
[patent_title] => 'SUBSTRATE AND METHOD FOR MANUFACTURING THE SAME, AND PROBE CARD'
[patent_app_type] => utility
[patent_app_number] => 13/482353
[patent_app_country] => US
[patent_app_date] => 2012-05-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 3813
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13482353
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/482353 | Substrate and method for manufacturing the same, and probe card | May 28, 2012 | Issued |
Array
(
[id] => 8564166
[patent_doc_number] => 20120326737
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2012-12-27
[patent_title] => 'METHOD OF MEASURING SCATTERING PARAMETERS OF DEVICE UNDER TEST'
[patent_app_type] => utility
[patent_app_number] => 13/481842
[patent_app_country] => US
[patent_app_date] => 2012-05-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 4656
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13481842
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/481842 | Method of measuring scattering parameters of device under test | May 26, 2012 | Issued |
Array
(
[id] => 10893489
[patent_doc_number] => 08917105
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2014-12-23
[patent_title] => 'Solder bump testing apparatus and methods of use'
[patent_app_type] => utility
[patent_app_number] => 13/481160
[patent_app_country] => US
[patent_app_date] => 2012-05-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 14
[patent_no_of_words] => 5748
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 31
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13481160
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/481160 | Solder bump testing apparatus and methods of use | May 24, 2012 | Issued |
Array
(
[id] => 9996819
[patent_doc_number] => 09041421
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2015-05-26
[patent_title] => 'IC, circuitry, and RF BIST system'
[patent_app_type] => utility
[patent_app_number] => 13/480969
[patent_app_country] => US
[patent_app_date] => 2012-05-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 6244
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 93
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13480969
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/480969 | IC, circuitry, and RF BIST system | May 24, 2012 | Issued |
Array
(
[id] => 8500199
[patent_doc_number] => 20120299607
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2012-11-29
[patent_title] => 'Testing of Defibrillator Electrodes'
[patent_app_type] => utility
[patent_app_number] => 13/480881
[patent_app_country] => US
[patent_app_date] => 2012-05-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 3717
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13480881
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/480881 | Testing of defibrillator electrodes | May 24, 2012 | Issued |