Alexander O. Williams

Array ( [id] => 20572679 [patent_doc_number] => 20260066607 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2026-03-05 [patent_title] => LIGHT SOURCE SYSTEM AND METHOD OF OPERATION [patent_app_type] => utility [patent_app_number] => 19/320258 [patent_app_country] => US [patent_app_date] => 2025-09-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 1371 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 517 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 19320258 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 20514681 [patent_doc_number] => 20260038784 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2026-02-05 [patent_title] => Mass Spectrometry with Time-Offset Electrospray Ion Beams [patent_app_type] => utility [patent_app_number] => 19/311797 [patent_app_country] => US [patent_app_date] => 2025-08-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 20855 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -26 [patent_words_short_claim] => 146 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 19311797 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 20053722 [patent_doc_number] => 20250191944 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-06-12 [patent_title] => SYSTEM AND METHOD OF VERIFYING WORKPIECE ALIGNMENT [patent_app_type] => utility [patent_app_number] => 18/969520 [patent_app_country] => US [patent_app_date] => 2024-12-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3267 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 176 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18969520 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 20521328 [patent_doc_number] => 20260045437 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2026-02-12 [patent_title] => FIELD CURVATURE CORRECTOR FOR USE IN MULTI-ELECTRON-BEAM OPTICAL SYSTEM [patent_app_type] => utility [patent_app_number] => 18/930438 [patent_app_country] => US [patent_app_date] => 2024-10-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2029 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 96 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18930438 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19788432 [patent_doc_number] => 20250062111 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-02-20 [patent_title] => MULTI-REFLECTION MASS SPECTROMETER [patent_app_type] => utility [patent_app_number] => 18/803184 [patent_app_country] => US [patent_app_date] => 2024-08-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6839 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 169 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18803184 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 20476148 [patent_doc_number] => 20260018369 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2026-01-15 [patent_title] => LENS WITH A SCANNING SYSTEM, CHARGED PARTICLE BEAM APPARATUS, AND METHOD OF SCANNING A CHARGED PARTICLE BEAM [patent_app_type] => utility [patent_app_number] => 18/773470 [patent_app_country] => US [patent_app_date] => 2024-07-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 1287 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 62 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18773470 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19531676 [patent_doc_number] => 20240355578 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-10-24 [patent_title] => SOFTWARE, METHODS, AND SYSTEMS FOR DETERMINATION OF A LOCAL FOCUS POINT [patent_app_type] => utility [patent_app_number] => 18/761319 [patent_app_country] => US [patent_app_date] => 2024-07-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 17081 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 94 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18761319 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 20429599 [patent_doc_number] => 20250391692 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-12-25 [patent_title] => HYBRID VACUUM ELECTROSTATIC CHUCK IN VACUUM CHAMBER FOR HIGH WARPAGE WAFERS [patent_app_type] => utility [patent_app_number] => 18/749484 [patent_app_country] => US [patent_app_date] => 2024-06-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6829 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 176 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18749484 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19725019 [patent_doc_number] => 20250027770 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-01-23 [patent_title] => QUANTUM COLLIMATION METHOD FOR ATOMIC BEAM, QUANTUM COLLIMATOR FOR ATOMIC BEAM, ATOMIC INTERFEROMETER, AND ATOMIC GYROSCOPE [patent_app_type] => utility [patent_app_number] => 18/743697 [patent_app_country] => US [patent_app_date] => 2024-06-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10389 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -4 [patent_words_short_claim] => 99 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18743697 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19696228 [patent_doc_number] => 20250014773 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-01-09 [patent_title] => TEMPORARILY CHANGING THE QUANTIZATION FIELD OF AN ATOMIC OBJECT CONFINEMENT APPARATUS [patent_app_type] => utility [patent_app_number] => 18/738398 [patent_app_country] => US [patent_app_date] => 2024-06-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8360 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 134 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18738398 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19712534 [patent_doc_number] => 20250022676 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-01-16 [patent_title] => ELECTRON BEAM DEVICE INCLUDING SCHOTTKY EMITTER AND METHOD OF OPERATING SCHOTTKY EMITTER [patent_app_type] => utility [patent_app_number] => 18/669862 [patent_app_country] => US [patent_app_date] => 2024-05-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6966 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -7 [patent_words_short_claim] => 135 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18669862 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19447442 [patent_doc_number] => 20240307572 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-09-19 [patent_title] => DISINFECTION UNIT AND SHEET PROCESSING APPARATUS [patent_app_type] => utility [patent_app_number] => 18/668326 [patent_app_country] => US [patent_app_date] => 2024-05-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9210 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -15 [patent_words_short_claim] => 48 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18668326 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19604651 [patent_doc_number] => 20240395531 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-11-28 [patent_title] => MULTI-REFLECTION MASS SPECTROMETER [patent_app_type] => utility [patent_app_number] => 18/669215 [patent_app_country] => US [patent_app_date] => 2024-05-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9555 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -19 [patent_words_short_claim] => 354 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18669215 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19587863 [patent_doc_number] => 20240385420 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-11-21 [patent_title] => LIGHT FLUX CONTROLLING MEMBER, LIGHT EMITTING DEVICE, IRRADIATION DEVICE, STERILIZATION DEVICE [patent_app_type] => utility [patent_app_number] => 18/663292 [patent_app_country] => US [patent_app_date] => 2024-05-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9157 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 223 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18663292 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19570479 [patent_doc_number] => 20240374771 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-11-14 [patent_title] => CONTAINER STERILIZATION DEVICE USING PULSED LIGHT [patent_app_type] => utility [patent_app_number] => 18/657168 [patent_app_country] => US [patent_app_date] => 2024-05-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 15633 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 99 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18657168 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19775599 [patent_doc_number] => 20250057025 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-02-13 [patent_title] => DISPLAY DEVICE AND METHOD FOR INSPECTING THE DISPLAY DEVICE [patent_app_type] => utility [patent_app_number] => 18/605581 [patent_app_country] => US [patent_app_date] => 2024-03-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 13873 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18605581 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19435914 [patent_doc_number] => 20240304412 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-09-12 [patent_title] => PARTICLE BEAM MICROSCOPE [patent_app_type] => utility [patent_app_number] => 18/600289 [patent_app_country] => US [patent_app_date] => 2024-03-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 13434 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18600289 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19434044 [patent_doc_number] => 20240302542 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-09-12 [patent_title] => PARTICLE BEAM MICROSCOPE [patent_app_type] => utility [patent_app_number] => 18/600229 [patent_app_country] => US [patent_app_date] => 2024-03-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8881 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18600229 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 20196714 [patent_doc_number] => 20250273424 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-08-28 [patent_title] => USE OF MULTIPLE ELECTRON BEAMS FOR HIGH THROUGHPUT INSPECTION [patent_app_type] => utility [patent_app_number] => 18/590930 [patent_app_country] => US [patent_app_date] => 2024-02-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2107 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 186 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18590930 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19346484 [patent_doc_number] => 20240255447 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-08-01 [patent_title] => ELECTRON DIFFRACTION SYSTEM FOR CHARACTERIZING NANOCRYSTALLINE STRUCTURES [patent_app_type] => utility [patent_app_number] => 18/429073 [patent_app_country] => US [patent_app_date] => 2024-01-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 12186 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 250 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18429073 [rel_patent_id] =>[rel_patent_doc_number] =>)