Alexander S Thomas
Examiner (ID: 6457, Phone: (571)272-1502 , Office: P/1783 )
Most Active Art Unit | 1783 |
Art Unit(s) | 1772, 1783, 1315, 1721, 1504, 2899, 1508, 1794, 1773, 1506 |
Total Applications | 4004 |
Issued Applications | 3000 |
Pending Applications | 169 |
Abandoned Applications | 835 |
Applications
Application number | Title of the application | Filing Date | Status |
---|---|---|---|
Array
(
[id] => 6918171
[patent_doc_number] => 20050095732
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-05-05
[patent_title] => 'Plasma processing apparatus and method and apparatus for measuring DC potential'
[patent_app_type] => utility
[patent_app_number] => 10/933422
[patent_app_country] => US
[patent_app_date] => 2004-09-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
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[pdf_file] => publications/A1/0095/20050095732.pdf
[firstpage_image] =>[orig_patent_app_number] => 10933422
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/933422 | Plasma processing apparatus and method and apparatus for measuring DC potential | Sep 2, 2004 | Abandoned |
Array
(
[id] => 5897830
[patent_doc_number] => 20060043063
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-03-02
[patent_title] => 'Electrically floating diagnostic plasma probe with ion property sensors'
[patent_app_type] => utility
[patent_app_number] => 10/933167
[patent_app_country] => US
[patent_app_date] => 2004-09-02
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/933167 | Electrically floating diagnostic plasma probe with ion property sensors | Sep 1, 2004 | Abandoned |
Array
(
[id] => 5897519
[patent_doc_number] => 20060042752
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-03-02
[patent_title] => 'Plasma processing apparatuses and methods'
[patent_app_type] => utility
[patent_app_number] => 10/930993
[patent_app_country] => US
[patent_app_date] => 2004-08-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[patent_no_of_claims] => 87
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[pdf_file] => publications/A1/0042/20060042752.pdf
[firstpage_image] =>[orig_patent_app_number] => 10930993
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/930993 | Plasma processing apparatuses and methods | Aug 29, 2004 | Abandoned |
Array
(
[id] => 5897524
[patent_doc_number] => 20060042757
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-03-02
[patent_title] => 'Wafer processing apparatus capable of controlling wafer temperature'
[patent_app_type] => utility
[patent_app_number] => 10/927095
[patent_app_country] => US
[patent_app_date] => 2004-08-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
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[patent_no_of_words] => 7871
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[firstpage_image] =>[orig_patent_app_number] => 10927095
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/927095 | Wafer processing apparatus capable of controlling wafer temperature | Aug 26, 2004 | Abandoned |
Array
(
[id] => 5897834
[patent_doc_number] => 20060043067
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-03-02
[patent_title] => 'Yttria insulator ring for use inside a plasma chamber'
[patent_app_type] => utility
[patent_app_number] => 10/925923
[patent_app_country] => US
[patent_app_date] => 2004-08-26
[patent_effective_date] => 0000-00-00
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[firstpage_image] =>[orig_patent_app_number] => 10925923
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/925923 | Yttria insulator ring for use inside a plasma chamber | Aug 25, 2004 | Abandoned |
Array
(
[id] => 6914685
[patent_doc_number] => 20050092246
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-05-05
[patent_title] => 'Device for depositing thin layers with a wireless detection of process parameters'
[patent_app_type] => utility
[patent_app_number] => 10/922660
[patent_app_country] => US
[patent_app_date] => 2004-08-20
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[pdf_file] => publications/A1/0092/20050092246.pdf
[firstpage_image] =>[orig_patent_app_number] => 10922660
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/922660 | Device for depositing thin layers with a wireless detection of process parameters | Aug 19, 2004 | Abandoned |
Array
(
[id] => 12414
[patent_doc_number] => 07806983
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[patent_kind] => B2
[patent_issue_date] => 2010-10-05
[patent_title] => 'Substrate temperature control in an ALD reactor'
[patent_app_type] => utility
[patent_app_number] => 10/921604
[patent_app_country] => US
[patent_app_date] => 2004-08-18
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[patent_drawing_sheets_cnt] => 40
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[pdf_file] => patents/07/806/07806983.pdf
[firstpage_image] =>[orig_patent_app_number] => 10921604
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/921604 | Substrate temperature control in an ALD reactor | Aug 17, 2004 | Issued |
Array
(
[id] => 214977
[patent_doc_number] => 07618494
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-11-17
[patent_title] => 'Substrate holding structure and substrate processing device'
[patent_app_type] => utility
[patent_app_number] => 10/568683
[patent_app_country] => US
[patent_app_date] => 2004-08-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
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[pdf_file] => patents/07/618/07618494.pdf
[firstpage_image] =>[orig_patent_app_number] => 10568683
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/568683 | Substrate holding structure and substrate processing device | Aug 17, 2004 | Issued |
Array
(
[id] => 7119782
[patent_doc_number] => 20050011611
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-01-20
[patent_title] => 'Wafer probe for measuring plasma and surface characteristics in plasma processing environments'
[patent_app_type] => utility
[patent_app_number] => 10/920138
[patent_app_country] => US
[patent_app_date] => 2004-08-17
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[patent_drawing_sheets_cnt] => 16
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[firstpage_image] =>[orig_patent_app_number] => 10920138
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/920138 | Wafer probe for measuring plasma and surface characteristics in plasma processing environments | Aug 16, 2004 | Abandoned |
Array
(
[id] => 7119522
[patent_doc_number] => 20050011351
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-01-20
[patent_title] => 'Pressure control apparatus and method of establishing a desired level or pressure within at least one processing chamber'
[patent_app_type] => utility
[patent_app_number] => 10/919252
[patent_app_country] => US
[patent_app_date] => 2004-08-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/919252 | Pressure control apparatus and method of establishing a desired level or pressure within at least one processing chamber | Aug 16, 2004 | Abandoned |
Array
(
[id] => 7195291
[patent_doc_number] => 20050051099
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-03-10
[patent_title] => 'Susceptor provided with indentations and an epitaxial reactor which uses the same'
[patent_app_type] => utility
[patent_app_number] => 10/916780
[patent_app_country] => US
[patent_app_date] => 2004-08-12
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[patent_drawing_sheets_cnt] => 4
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/916780 | Susceptor provided with indentations and an epitaxial reactor which uses the same | Aug 11, 2004 | Abandoned |
Array
(
[id] => 6968963
[patent_doc_number] => 20050034673
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[patent_issue_date] => 2005-02-17
[patent_title] => 'Apparatus having edge frame and method of using the same'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/916959 | Apparatus having edge frame and method of using the same | Aug 10, 2004 | Abandoned |
Array
(
[id] => 376685
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[patent_kind] => B2
[patent_issue_date] => 2007-12-25
[patent_title] => 'Multiple axis tumbler coating apparatus'
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[patent_app_number] => 10/914904
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/914904 | Multiple axis tumbler coating apparatus | Aug 8, 2004 | Issued |
Array
(
[id] => 6987919
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[patent_title] => 'Plasma processing apparatus and method for stabilizing inner wall of processing chamber'
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Array
(
[id] => 5876618
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/912182 | Method and system for substrate temperature profile control | Aug 5, 2004 | Abandoned |
Array
(
[id] => 7029263
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[patent_issue_date] => 2005-02-10
[patent_title] => 'Semiconductor Manufacturing Apparatus'
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Array
(
[id] => 5151276
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Array
(
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Array
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Array
(
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/902132 | Measuring method and apparatus of thin film thickness | Jul 29, 2004 | Abandoned |