![](/images/general/no_picture/200_user.png)
Alexander S Thomas
Examiner (ID: 6457, Phone: (571)272-1502 , Office: P/1783 )
Most Active Art Unit | 1783 |
Art Unit(s) | 1772, 1783, 1315, 1721, 1504, 2899, 1508, 1794, 1773, 1506 |
Total Applications | 4004 |
Issued Applications | 3000 |
Pending Applications | 169 |
Abandoned Applications | 835 |
Applications
Application number | Title of the application | Filing Date | Status |
---|---|---|---|
Array
(
[id] => 7029740
[patent_doc_number] => 20050028928
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-02-10
[patent_title] => 'Substrate processing apparatus and substrate processing method'
[patent_app_type] => utility
[patent_app_number] => 10/900880
[patent_app_country] => US
[patent_app_date] => 2004-07-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
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[pdf_file] => publications/A1/0028/20050028928.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/900880 | Substrate processing apparatus and substrate processing method | Jul 27, 2004 | Abandoned |
Array
(
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[patent_doc_number] => 20050000651
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-01-06
[patent_title] => 'High pressure processing chamber for semiconductor substrate'
[patent_app_type] => utility
[patent_app_number] => 10/897296
[patent_app_country] => US
[patent_app_date] => 2004-07-21
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[firstpage_image] =>[orig_patent_app_number] => 10897296
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/897296 | High pressure processing chamber for semiconductor substrate | Jul 20, 2004 | Issued |
Array
(
[id] => 7022288
[patent_doc_number] => 20050016682
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-01-27
[patent_title] => 'Method of setting etching parameters and system therefor'
[patent_app_type] => utility
[patent_app_number] => 10/893275
[patent_app_country] => US
[patent_app_date] => 2004-07-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/893275 | Method of setting etching parameters and system therefor | Jul 18, 2004 | Abandoned |
Array
(
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[patent_doc_number] => 07316783
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-01-08
[patent_title] => 'Method of wiring formation and method for manufacturing electronic components'
[patent_app_type] => utility
[patent_app_number] => 10/885306
[patent_app_country] => US
[patent_app_date] => 2004-07-07
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/07/316/07316783.pdf
[firstpage_image] =>[orig_patent_app_number] => 10885306
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/885306 | Method of wiring formation and method for manufacturing electronic components | Jul 6, 2004 | Issued |
Array
(
[id] => 537972
[patent_doc_number] => 07166187
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[patent_kind] => B2
[patent_issue_date] => 2007-01-23
[patent_title] => 'Segmented cold plate for rapid thermal processing (RTP) tool for conduction cooling'
[patent_app_type] => utility
[patent_app_number] => 10/879463
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[patent_app_date] => 2004-06-29
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[pdf_file] => patents/07/166/07166187.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/879463 | Segmented cold plate for rapid thermal processing (RTP) tool for conduction cooling | Jun 28, 2004 | Issued |
Array
(
[id] => 7275853
[patent_doc_number] => 20040235304
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[patent_issue_date] => 2004-11-25
[patent_title] => 'Plasma treatment apparatus'
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[patent_app_number] => 10/876735
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Array
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[id] => 7275852
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[patent_title] => 'Endpoint determination of process residues in wafer-less auto clean process using optical emission spectroscopy'
[patent_app_type] => new
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[patent_drawing_sheets_cnt] => 11
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[firstpage_image] =>[orig_patent_app_number] => 10876442
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/876442 | Endpoint determination of process residues in wafer-less auto clean process using optical emission spectroscopy | Jun 24, 2004 | Abandoned |
Array
(
[id] => 7015352
[patent_doc_number] => 20050217794
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[patent_kind] => A1
[patent_issue_date] => 2005-10-06
[patent_title] => 'Semiconductor manufacturing apparatus and method for assisting monitoring and analysis of the same'
[patent_app_type] => utility
[patent_app_number] => 10/875232
[patent_app_country] => US
[patent_app_date] => 2004-06-25
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[patent_drawing_sheets_cnt] => 9
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[pdf_file] => publications/A1/0217/20050217794.pdf
[firstpage_image] =>[orig_patent_app_number] => 10875232
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/875232 | Semiconductor manufacturing apparatus and method for assisting monitoring and analysis of the same | Jun 24, 2004 | Abandoned |
Array
(
[id] => 6974855
[patent_doc_number] => 20050284570
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-12-29
[patent_title] => 'Diagnostic plasma measurement device having patterned sensors and features'
[patent_app_type] => utility
[patent_app_number] => 10/875954
[patent_app_country] => US
[patent_app_date] => 2004-06-24
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[pdf_file] => publications/A1/0284/20050284570.pdf
[firstpage_image] =>[orig_patent_app_number] => 10875954
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/875954 | Diagnostic plasma measurement device having patterned sensors and features | Jun 23, 2004 | Abandoned |
Array
(
[id] => 173422
[patent_doc_number] => 07658801
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-02-09
[patent_title] => 'Heat treatment apparatus'
[patent_app_type] => utility
[patent_app_number] => 10/561017
[patent_app_country] => US
[patent_app_date] => 2004-06-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
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[firstpage_image] =>[orig_patent_app_number] => 10561017
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/561017 | Heat treatment apparatus | Jun 21, 2004 | Issued |
Array
(
[id] => 6928421
[patent_doc_number] => 20050279453
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-12-22
[patent_title] => 'System and methods for surface cleaning'
[patent_app_type] => utility
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[pdf_file] => publications/A1/0279/20050279453.pdf
[firstpage_image] =>[orig_patent_app_number] => 10870646
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/870646 | System and methods for surface cleaning | Jun 16, 2004 | Abandoned |
Array
(
[id] => 7022129
[patent_doc_number] => 20050016568
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-01-27
[patent_title] => 'Apparatus and method for cleaning of semiconductor device manufacturing equipment'
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Array
(
[id] => 8444537
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[patent_issue_date] => 2012-10-16
[patent_title] => 'High frequency power source and its control method, and plasma processing apparatus'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/864538 | High frequency power source and its control method, and plasma processing apparatus | Jun 9, 2004 | Issued |
Array
(
[id] => 7359824
[patent_doc_number] => 20040216678
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[patent_title] => 'Wafer Holder for Semiconductor Manufacturing Equipment and Semiconductor Manufacturing Equipment in Which It Is Installed'
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Array
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[id] => 6925540
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[patent_issue_date] => 2005-10-27
[patent_title] => 'Method and arrangement for the regulation of the layer thickness of a coating material on a web moved in its longitudinal direction'
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Array
(
[id] => 386280
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[patent_title] => 'Via etch process'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/854541 | Via etch process | May 24, 2004 | Issued |
Array
(
[id] => 7058069
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[patent_title] => 'Method and apparatus for vaporizing and delivering reactant'
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/555813 | Processing Apparatus Using Source Gas and Reactive Gas | May 12, 2004 | Abandoned |
Array
(
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[patent_title] => ' In Situ module for particle removal from solid-state surfaces'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/845377 | In situ module for particle removal from solid-state surfaces | May 12, 2004 | Issued |
Array
(
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/839710 | Forming thin film on semiconductor wafer | May 5, 2004 | Abandoned |