
Allen J. Flanigan
Examiner (ID: 9389, Phone: (571)272-4910 , Office: P/3744 )
| Most Active Art Unit | |
| Art Unit(s) | |
| Total Applications | |
| Issued Applications | |
| Pending Applications | |
| Abandoned Applications |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
| 08/378269 | LATERAL DOUBLE-DIFFUSED MOSFET (LDMOSFET) | Jan 25, 1995 | Abandoned |
| 08/364514 | POWER TRANSISTOR DEVICE HAVING ULTRA DEEP INCREASED CONCENTRATION REGION | Dec 26, 1994 | Abandoned |
| 08/363989 | Resonant tunneling transistor | Dec 26, 1994 | Issued |
| 08/333407 | ESD protection structure using LDMOS diodes with thick copper interconnect | Nov 1, 1994 | Issued |
| 08/333461 | LDMOS TRANSISTOR WITH THICK COPPER INTERCONNECT | Nov 1, 1994 | Abandoned |
| 08/329688 | Peltier element as series noise clamp | Oct 25, 1994 | Issued |
| 08/328229 | HIGH-FREQUENCY SEMICONDUCTOR DEVICE WITH PROTECTION DEVICE | Oct 24, 1994 | Abandoned |
| 08/326175 | SEMICONDUCTOR DEVICE | Oct 18, 1994 | Abandoned |
| 90/003603 | MONOLITHIC SEMICONDUCTOR SWITCHING DEVICE | Oct 16, 1994 | Issued |
| 08/323063 | Pin amorphous silicon photovoltaic element with counter-doped intermediate layer | Oct 13, 1994 | Issued |
| 08/306532 | Electrostatic discharge protection device | Sep 13, 1994 | Issued |
| 08/305229 | DEVICE AND METHOD OF MANUFACTURE FOR PROTECTION AGAINST PLASMA CHARGING DAMAGE IN ADVANCED MOS TECHNOLOGIES | Sep 12, 1994 | Abandoned |
| 08/296175 | ISOLATION REGION STRUCTURE OF A SEMICONDUCTOR DEVICE AND METHOD FOR MAKING | Aug 28, 1994 | Abandoned |
| 08/290408 | SINGLE TWIST LAYOUT AND METHOD FOR PAIRED LINE CONDUCTORS OF INTEGRATED CIRCUITS | Aug 14, 1994 | Abandoned |
| 08/283196 | SEMICONDUCTOR MEMORY WHEREIN METALLIC INTERCONNECTION LAYER IS APPLIED WITH THE SAME POTENTIAL AS WORD LINE AND IS CONNECTED TO WORD LINE IN REGIONS OTHER THAN MEMORY CELLS | Aug 3, 1994 | Abandoned |
| 08/286112 | SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE | Aug 3, 1994 | Abandoned |
| 08/266798 | ELECTRON EMITTING ELEMENT | Jun 27, 1994 | Abandoned |
| 08/265990 | HOT-ELECTRON-PROGRAMMABLE, TUNNEL-ELECTRON-ERASABLE, NONVOLATILE MEMORY | Jun 26, 1994 | Abandoned |
| 08/241033 | NANO-OHM-CM2 CONTACT TO SEMICONDUCTOR AND OHMIC CONTACT TO OXIDES | May 9, 1994 | Abandoned |
| 08/236653 | THIN FILM PIEZORESISTIVE SENSOR AND METHOD FOR MAKING SAME | Apr 28, 1994 | Abandoned |