
Allison Walthall Johnson
Examiner (ID: 4909)
| Most Active Art Unit | 2629 |
| Art Unit(s) | 2628, OPQA, 2629, 2691 |
| Total Applications | 349 |
| Issued Applications | 164 |
| Pending Applications | 0 |
| Abandoned Applications | 185 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 20394590
[patent_doc_number] => 20250370065
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-12-04
[patent_title] => GROUND FAULT DETECTION TECHNIQUES IN MOBILE MACHINES
[patent_app_type] => utility
[patent_app_number] => 18/680695
[patent_app_country] => US
[patent_app_date] => 2024-05-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 1092
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 121
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18680695
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/680695 | GROUND FAULT DETECTION TECHNIQUES IN MOBILE MACHINES | May 30, 2024 | Pending |
Array
(
[id] => 20350902
[patent_doc_number] => 20250347754
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-11-13
[patent_title] => SYSTEMS AND METHODS FOR TESTING CAPACITORS IN AN INVERTER
[patent_app_type] => utility
[patent_app_number] => 18/659761
[patent_app_country] => US
[patent_app_date] => 2024-05-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 3424
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 86
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18659761
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/659761 | SYSTEMS AND METHODS FOR TESTING CAPACITORS IN AN INVERTER | May 8, 2024 | Pending |
Array
(
[id] => 19481041
[patent_doc_number] => 20240329083
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-10-03
[patent_title] => STATIONARY PROBE, MOVABLE PROBE, AND PROBING DEVICE CAPABLE OF ADJUSTING THE DETECTING POSITION USING THE SAME
[patent_app_type] => utility
[patent_app_number] => 18/592773
[patent_app_country] => US
[patent_app_date] => 2024-03-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 14902
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -19
[patent_words_short_claim] => 123
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18592773
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/592773 | STATIONARY PROBE, MOVABLE PROBE, AND PROBING DEVICE CAPABLE OF ADJUSTING THE DETECTING POSITION USING THE SAME | Feb 29, 2024 | Pending |
Array
(
[id] => 20194781
[patent_doc_number] => 20250271491
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-08-28
[patent_title] => METHOD AND MEASUREMENT SYSTEM OF DETERMINING A QUALITY METRIC FOR A DEVICE UNDER TEST HAVING MULTIPLE TRANSMISSION ANTENNAS
[patent_app_type] => utility
[patent_app_number] => 18/590482
[patent_app_country] => US
[patent_app_date] => 2024-02-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 6489
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 175
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18590482
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/590482 | METHOD AND MEASUREMENT SYSTEM OF DETERMINING A QUALITY METRIC FOR A DEVICE UNDER TEST HAVING MULTIPLE TRANSMISSION ANTENNAS | Feb 27, 2024 | Pending |
Array
(
[id] => 20017274
[patent_doc_number] => 20250155496
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-05-15
[patent_title] => PROBE CARD HOLDER FOR WAFER TESTING
[patent_app_type] => utility
[patent_app_number] => 18/406329
[patent_app_country] => US
[patent_app_date] => 2024-01-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 0
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -5
[patent_words_short_claim] => 123
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18406329
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/406329 | PROBE CARD HOLDER FOR WAFER TESTING | Jan 7, 2024 | Issued |
Array
(
[id] => 19302139
[patent_doc_number] => 20240230716
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-07-11
[patent_title] => SOCKET DEVICE FOR TESTING ICs
[patent_app_type] => utility
[patent_app_number] => 18/402668
[patent_app_country] => US
[patent_app_date] => 2024-01-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 4719
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -6
[patent_words_short_claim] => 77
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18402668
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/402668 | SOCKET DEVICE FOR TESTING ICs | Jan 1, 2024 | Pending |
Array
(
[id] => 19346582
[patent_doc_number] => 20240255545
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-08-01
[patent_title] => PROBE CARD AND TEST APPARATUS INCLUDING PROBE CARD
[patent_app_type] => utility
[patent_app_number] => 18/399918
[patent_app_country] => US
[patent_app_date] => 2023-12-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 5492
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 95
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18399918
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/399918 | PROBE CARD AND TEST APPARATUS INCLUDING PROBE CARD | Dec 28, 2023 | Pending |
Array
(
[id] => 20070519
[patent_doc_number] => 20250208741
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-06-26
[patent_title] => VARIABLE MAGNETIC COUPLING TOUCH SENSORS
[patent_app_type] => utility
[patent_app_number] => 18/492987
[patent_app_country] => US
[patent_app_date] => 2023-12-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 2223
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -60
[patent_words_short_claim] => 105
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18492987
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/492987 | VARIABLE MAGNETIC COUPLING TOUCH SENSORS | Dec 25, 2023 | Pending |
Array
(
[id] => 19992031
[patent_doc_number] => 20250130253
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-04-24
[patent_title] => MANAGEMENT SYSTEM FOR PROBE CARDS
[patent_app_type] => utility
[patent_app_number] => 18/395072
[patent_app_country] => US
[patent_app_date] => 2023-12-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 0
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -11
[patent_words_short_claim] => 94
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18395072
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/395072 | MANAGEMENT SYSTEM FOR PROBE CARDS | Dec 21, 2023 | Pending |
Array
(
[id] => 20069970
[patent_doc_number] => 20250208192
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-06-26
[patent_title] => SOCKET SYSTEMS WITH INTEGRATED PARTIALLY-CONDUCTIVE SUBSTRATES AND METHODS OF USING THE SAME
[patent_app_type] => utility
[patent_app_number] => 18/393548
[patent_app_country] => US
[patent_app_date] => 2023-12-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 2459
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 179
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18393548
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/393548 | SOCKET SYSTEMS WITH INTEGRATED PARTIALLY-CONDUCTIVE SUBSTRATES AND METHODS OF USING THE SAME | Dec 20, 2023 | Pending |
Array
(
[id] => 19632469
[patent_doc_number] => 20240410918
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-12-12
[patent_title] => PROBE CARD STRUCTURE FOR HIGH FREQUENCY TEST AND TESTING METHOD THEREOF
[patent_app_type] => utility
[patent_app_number] => 18/541001
[patent_app_country] => US
[patent_app_date] => 2023-12-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 3760
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -8
[patent_words_short_claim] => 76
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18541001
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/541001 | PROBE CARD STRUCTURE FOR HIGH FREQUENCY TEST AND TESTING METHOD THEREOF | Dec 14, 2023 | Pending |
Array
(
[id] => 19382334
[patent_doc_number] => 20240272204
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-08-15
[patent_title] => Current Measurement Device And Current Sensor
[patent_app_type] => utility
[patent_app_number] => 18/536477
[patent_app_country] => US
[patent_app_date] => 2023-12-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 7152
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -9
[patent_words_short_claim] => 199
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18536477
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/536477 | Current Measurement Device And Current Sensor | Dec 11, 2023 | Pending |
Array
(
[id] => 19333691
[patent_doc_number] => 20240248121
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-07-25
[patent_title] => Current Sensor
[patent_app_type] => utility
[patent_app_number] => 18/535092
[patent_app_country] => US
[patent_app_date] => 2023-12-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 5657
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -8
[patent_words_short_claim] => 141
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18535092
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/535092 | Current Sensor | Dec 10, 2023 | Pending |
Array
(
[id] => 19235057
[patent_doc_number] => 20240192251
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-06-13
[patent_title] => Testing Assisting Device And Method Of Providing A Testing Assisting Device
[patent_app_type] => utility
[patent_app_number] => 18/532172
[patent_app_country] => US
[patent_app_date] => 2023-12-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 5716
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 114
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18532172
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/532172 | Testing Assisting Device And Method Of Providing A Testing Assisting Device | Dec 6, 2023 | Pending |
Array
(
[id] => 19685468
[patent_doc_number] => 20250004013
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-01-02
[patent_title] => PROBE CARD STRUCTURE
[patent_app_type] => utility
[patent_app_number] => 18/522398
[patent_app_country] => US
[patent_app_date] => 2023-11-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 7040
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -20
[patent_words_short_claim] => 362
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18522398
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/522398 | PROBE CARD STRUCTURE | Nov 28, 2023 | Pending |
Array
(
[id] => 19204001
[patent_doc_number] => 20240175900
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-05-30
[patent_title] => PROBE HEAD AND METHOD OF PRODUCING TESTED SEMICONDUCTOR DIE AND VERTICAL PROBE MANUFACTURING METHOD
[patent_app_type] => utility
[patent_app_number] => 18/518759
[patent_app_country] => US
[patent_app_date] => 2023-11-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 10002
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -11
[patent_words_short_claim] => 236
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18518759
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/518759 | PROBE HEAD AND METHOD OF PRODUCING TESTED SEMICONDUCTOR DIE AND VERTICAL PROBE MANUFACTURING METHOD | Nov 23, 2023 | Pending |
Array
(
[id] => 19219191
[patent_doc_number] => 20240183895
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-06-06
[patent_title] => PROBE CARD TRANSPORTING APPARATUS AND METHOD
[patent_app_type] => utility
[patent_app_number] => 18/503840
[patent_app_country] => US
[patent_app_date] => 2023-11-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 9851
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 65
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18503840
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/503840 | PROBE CARD TRANSPORTING APPARATUS AND METHOD | Nov 6, 2023 | Pending |
Array
(
[id] => 20493634
[patent_doc_number] => 12535501
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2026-01-27
[patent_title] => Probe system with integrated choke inductor
[patent_app_type] => utility
[patent_app_number] => 18/387083
[patent_app_country] => US
[patent_app_date] => 2023-11-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 6
[patent_no_of_words] => 0
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 138
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18387083
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/387083 | Probe system with integrated choke inductor | Nov 5, 2023 | Issued |
Array
(
[id] => 19999835
[patent_doc_number] => 20250138057
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-05-01
[patent_title] => CIRCUIT TESTING DEVICE
[patent_app_type] => utility
[patent_app_number] => 18/383964
[patent_app_country] => US
[patent_app_date] => 2023-10-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 0
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -12
[patent_words_short_claim] => 255
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18383964
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/383964 | CIRCUIT TESTING DEVICE | Oct 25, 2023 | Pending |
Array
(
[id] => 19985097
[patent_doc_number] => 20250123319
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-04-17
[patent_title] => PROBE HEAD FOR LED TEST SYSTEM
[patent_app_type] => utility
[patent_app_number] => 18/380934
[patent_app_country] => US
[patent_app_date] => 2023-10-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 6969
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -37
[patent_words_short_claim] => 107
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18380934
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/380934 | PROBE HEAD FOR LED TEST SYSTEM | Oct 16, 2023 | Pending |