
Allison Walthall Johnson
Examiner (ID: 4909)
| Most Active Art Unit | 2629 |
| Art Unit(s) | 2628, OPQA, 2629, 2691 |
| Total Applications | 349 |
| Issued Applications | 164 |
| Pending Applications | 0 |
| Abandoned Applications | 185 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 19818135
[patent_doc_number] => 20250076342
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-03-06
[patent_title] => Apparatus, System and Method for Repairing a Test Contact Arrangement
[patent_app_type] => utility
[patent_app_number] => 18/578196
[patent_app_country] => US
[patent_app_date] => 2023-03-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 5199
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -13
[patent_words_short_claim] => 155
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18578196
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/578196 | Apparatus, System and Method for Repairing a Test Contact Arrangement | Mar 15, 2023 | Pending |
Array
(
[id] => 19771358
[patent_doc_number] => 20250052784
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-02-13
[patent_title] => PROBE PIN AND PROBE CARD
[patent_app_type] => utility
[patent_app_number] => 18/578963
[patent_app_country] => US
[patent_app_date] => 2023-02-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 6860
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -11
[patent_words_short_claim] => 181
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18578963
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/578963 | PROBE PIN AND PROBE CARD | Feb 19, 2023 | Pending |
Array
(
[id] => 18631785
[patent_doc_number] => 20230290690
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-09-14
[patent_title] => TSV TEST STRUCTURE AND TSV SHORT TEST METHOD
[patent_app_type] => utility
[patent_app_number] => 18/168085
[patent_app_country] => US
[patent_app_date] => 2023-02-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 5655
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -13
[patent_words_short_claim] => 99
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18168085
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/168085 | TSV TEST STRUCTURE AND TSV SHORT TEST METHOD | Feb 12, 2023 | Pending |
Array
(
[id] => 19282984
[patent_doc_number] => 20240219460
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-07-04
[patent_title] => ENHANCED ELECTRON BEAM (E-BEAM) APPARATUS AND METHODOLOGY WITH NANO-SCALE E-BEAM PROBE TIPS FOR FAULT ISOLATION IN INTEGRATED CIRCUITS AND OTHER STRUCTURES
[patent_app_type] => utility
[patent_app_number] => 18/090415
[patent_app_country] => US
[patent_app_date] => 2022-12-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 12309
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 69
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18090415
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/090415 | ENHANCED ELECTRON BEAM (E-BEAM) APPARATUS AND METHODOLOGY WITH NANO-SCALE E-BEAM PROBE TIPS FOR FAULT ISOLATION IN INTEGRATED CIRCUITS AND OTHER STRUCTURES | Dec 27, 2022 | Pending |
Array
(
[id] => 19266765
[patent_doc_number] => 20240210466
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-06-27
[patent_title] => ENHANCED STATIC-DYNAMIC STRESS TECHNIQUES TO ACCELERATE LATENT DEFECTS FOR INTEGRATED CIRCUITS
[patent_app_type] => utility
[patent_app_number] => 18/089411
[patent_app_country] => US
[patent_app_date] => 2022-12-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 5347
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 105
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18089411
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/089411 | ENHANCED STATIC-DYNAMIC STRESS TECHNIQUES TO ACCELERATE LATENT DEFECTS FOR INTEGRATED CIRCUITS | Dec 26, 2022 | Pending |
Array
(
[id] => 19694204
[patent_doc_number] => 20250012749
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-01-09
[patent_title] => APPARATUS TO ENAMEL RATE SELECTED REGIONS OF METAL OBJECTS
[patent_app_type] => utility
[patent_app_number] => 18/711669
[patent_app_country] => US
[patent_app_date] => 2022-12-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 4210
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 2
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18711669
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/711669 | APPARATUS TO ENAMEL RATE SELECTED REGIONS OF METAL OBJECTS | Dec 1, 2022 | Pending |
Array
(
[id] => 19250241
[patent_doc_number] => 20240201229
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-06-20
[patent_title] => CURRENT SPECIFYING DEVICE
[patent_app_type] => utility
[patent_app_number] => 18/554890
[patent_app_country] => US
[patent_app_date] => 2022-07-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 4085
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -6
[patent_words_short_claim] => 111
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18554890
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/554890 | CURRENT SPECIFYING DEVICE | Jul 11, 2022 | Pending |
Array
(
[id] => 19282946
[patent_doc_number] => 20240219422
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-07-04
[patent_title] => ANISOTROPIC ELECTROCONDUCTIVE SHEET, METHOD FOR PRODUCING SAME, ELECTRICAL INSPECTION DEVICE, AND ELECTRICAL INSPECTION METHOD
[patent_app_type] => utility
[patent_app_number] => 18/292379
[patent_app_country] => US
[patent_app_date] => 2022-06-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 9723
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -15
[patent_words_short_claim] => 124
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18292379
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/292379 | ANISOTROPIC ELECTROCONDUCTIVE SHEET, METHOD FOR PRODUCING SAME, ELECTRICAL INSPECTION DEVICE, AND ELECTRICAL INSPECTION METHOD | Jun 29, 2022 | Pending |
Array
(
[id] => 19450280
[patent_doc_number] => 20240310410
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-09-19
[patent_title] => PROBE HEAD WITH REPLACEABLE PROBE BOARD
[patent_app_type] => utility
[patent_app_number] => 18/570966
[patent_app_country] => US
[patent_app_date] => 2022-06-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 12061
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -22
[patent_words_short_claim] => 24
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18570966
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/570966 | PROBE HEAD WITH REPLACEABLE PROBE BOARD | Jun 5, 2022 | Pending |
Array
(
[id] => 17777941
[patent_doc_number] => 20220244291
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-08-04
[patent_title] => SHIELDED FINE-PITCH HIGH-PERFORMANCE IMPEDANCE TUNABLE INTERCONNECT
[patent_app_type] => utility
[patent_app_number] => 17/728174
[patent_app_country] => US
[patent_app_date] => 2022-04-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 6532
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 81
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17728174
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/728174 | SHIELDED FINE-PITCH HIGH-PERFORMANCE IMPEDANCE TUNABLE INTERCONNECT | Apr 24, 2022 | Pending |
Array
(
[id] => 19101692
[patent_doc_number] => 20240120920
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-04-11
[patent_title] => CAPACITIVE SENSOR WITH OPTIMIZED NOISE IMMUNITY
[patent_app_type] => utility
[patent_app_number] => 18/262264
[patent_app_country] => US
[patent_app_date] => 2022-02-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 3633
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -19
[patent_words_short_claim] => 279
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18262264
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/262264 | CAPACITIVE SENSOR WITH OPTIMIZED NOISE IMMUNITY | Feb 21, 2022 | Pending |
Array
(
[id] => 19113873
[patent_doc_number] => 20240125623
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-04-18
[patent_title] => MAGNETIC SCALE, MAGNETIC SCALE SYSTEM, METHOD FOR MANUFACTURING MAGNETIC SCALE, AND METHOD FOR MANUFACTURING MAGNETIC SCALE SYSTEM
[patent_app_type] => utility
[patent_app_number] => 18/546055
[patent_app_country] => US
[patent_app_date] => 2022-02-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 4618
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -9
[patent_words_short_claim] => 28
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18546055
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/546055 | MAGNETIC SCALE, MAGNETIC SCALE SYSTEM, METHOD FOR MANUFACTURING MAGNETIC SCALE, AND METHOD FOR MANUFACTURING MAGNETIC SCALE SYSTEM | Feb 14, 2022 | Pending |
Array
(
[id] => 19128573
[patent_doc_number] => 20240133926
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-04-25
[patent_title] => Current Sensing Device
[patent_app_type] => utility
[patent_app_number] => 18/546727
[patent_app_country] => US
[patent_app_date] => 2022-02-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 4695
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -9
[patent_words_short_claim] => 108
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18546727
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/546727 | Current Sensing Device | Feb 13, 2022 | Pending |
Array
(
[id] => 19128573
[patent_doc_number] => 20240133926
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-04-25
[patent_title] => Current Sensing Device
[patent_app_type] => utility
[patent_app_number] => 18/546727
[patent_app_country] => US
[patent_app_date] => 2022-02-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 4695
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -9
[patent_words_short_claim] => 108
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18546727
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/546727 | Current Sensing Device | Feb 13, 2022 | Pending |
Array
(
[id] => 19450290
[patent_doc_number] => 20240310420
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-09-19
[patent_title] => INTERFERENCE-INSENSITIVE DETERMINATION OF A CAPACITANCE
[patent_app_type] => utility
[patent_app_number] => 18/273392
[patent_app_country] => US
[patent_app_date] => 2022-01-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 6646
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -13
[patent_words_short_claim] => 132
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18273392
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/273392 | Interference-insensitive determination of a capacitance | Jan 12, 2022 | Issued |
Array
(
[id] => 19529557
[patent_doc_number] => 20240353459
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-10-24
[patent_title] => ELECTROMAGNETICALLY INDUCED GRATING-BASED ELECTRIC FIELD DETECTION SYSTEM AND METHOD
[patent_app_type] => utility
[patent_app_number] => 18/684882
[patent_app_country] => US
[patent_app_date] => 2021-12-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 4442
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -7
[patent_words_short_claim] => 110
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18684882
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/684882 | ELECTROMAGNETICALLY INDUCED GRATING-BASED ELECTRIC FIELD DETECTION SYSTEM AND METHOD | Dec 20, 2021 | Pending |
Array
(
[id] => 20549672
[patent_doc_number] => 12560457
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2026-02-24
[patent_title] => Measurement device comprising a system for mechanically uncoupling a Hall effect sensor
[patent_app_type] => utility
[patent_app_number] => 18/266397
[patent_app_country] => US
[patent_app_date] => 2021-11-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 8
[patent_no_of_words] => 0
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 247
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18266397
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/266397 | Measurement device comprising a system for mechanically uncoupling a Hall effect sensor | Nov 25, 2021 | Issued |
Array
(
[id] => 19056958
[patent_doc_number] => 20240098927
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-03-21
[patent_title] => ELECTRICAL DEVICE, INVERTER, ELECTRIC DRIVE, VEHICLE AND MANUFACTURING METHODS
[patent_app_type] => utility
[patent_app_number] => 18/254271
[patent_app_country] => US
[patent_app_date] => 2021-10-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 2929
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -19
[patent_words_short_claim] => 37
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18254271
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/254271 | ELECTRICAL DEVICE, INVERTER, ELECTRIC DRIVE, VEHICLE AND MANUFACTURING METHODS | Oct 26, 2021 | Pending |
Array
(
[id] => 19035678
[patent_doc_number] => 20240085493
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-03-14
[patent_title] => FLEXIBLE PROBE FOR MICROLED DEFECT DETECTION AND MANUFACTURING METHOD THEREFOR
[patent_app_type] => utility
[patent_app_number] => 18/262059
[patent_app_country] => US
[patent_app_date] => 2021-10-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 5030
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -18
[patent_words_short_claim] => 109
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18262059
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/262059 | Flexible probe for MicroLED defect detection and manufacturing method therefor | Oct 20, 2021 | Issued |
Array
(
[id] => 19433959
[patent_doc_number] => 20240302457
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-09-12
[patent_title] => MAGNETIC FIELD DETECTION SENSING DEVICE AND FLUXGATE CHIP PACKAGING STRUCTURE THEREOF
[patent_app_type] => utility
[patent_app_number] => 18/276446
[patent_app_country] => US
[patent_app_date] => 2021-07-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 2313
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -8
[patent_words_short_claim] => 51
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18276446
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/276446 | MAGNETIC FIELD DETECTION SENSING DEVICE AND FLUXGATE CHIP PACKAGING STRUCTURE THEREOF | Jul 14, 2021 | Abandoned |