Search

Amber Altschul Misiaszek

Examiner (ID: 15024, Phone: (571)270-1362 , Office: P/3624 )

Most Active Art Unit
3624
Art Unit(s)
3626, 3624, 3682, 3686, 3684
Total Applications
709
Issued Applications
310
Pending Applications
65
Abandoned Applications
349

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 12045583 [patent_doc_number] => 09823176 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2017-11-21 [patent_title] => 'Particulate matter sensor' [patent_app_type] => utility [patent_app_number] => 15/143415 [patent_app_country] => US [patent_app_date] => 2016-04-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4809 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 98 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15143415 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/143415
Particulate matter sensor Apr 28, 2016 Issued
Array ( [id] => 13816447 [patent_doc_number] => 10184989 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2019-01-22 [patent_title] => Load bank for testing a variety of power sources and voltages [patent_app_type] => utility [patent_app_number] => 15/142562 [patent_app_country] => US [patent_app_date] => 2016-04-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 3281 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 85 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15142562 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/142562
Load bank for testing a variety of power sources and voltages Apr 28, 2016 Issued
Array ( [id] => 14362765 [patent_doc_number] => 10302677 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2019-05-28 [patent_title] => Multiple pin probes with support for performing parallel measurements [patent_app_type] => utility [patent_app_number] => 15/139883 [patent_app_country] => US [patent_app_date] => 2016-04-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2449 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 298 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15139883 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/139883
Multiple pin probes with support for performing parallel measurements Apr 26, 2016 Issued
Array ( [id] => 12200824 [patent_doc_number] => 09903886 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2018-02-27 [patent_title] => 'Testing probe and testing apparatus for ensuring good contact between testing probe and surface of test sample' [patent_app_type] => utility [patent_app_number] => 15/137849 [patent_app_country] => US [patent_app_date] => 2016-04-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4349 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 201 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15137849 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/137849
Testing probe and testing apparatus for ensuring good contact between testing probe and surface of test sample Apr 24, 2016 Issued
Array ( [id] => 11532575 [patent_doc_number] => 20170092553 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-03-30 [patent_title] => 'APPARATUS AND METHOD FOR EVALUATING SEMICONDUCTOR DEVICE' [patent_app_type] => utility [patent_app_number] => 15/136448 [patent_app_country] => US [patent_app_date] => 2016-04-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5138 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15136448 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/136448
Apparatus and method for evaluating semiconductor device comprising thermal image processing Apr 21, 2016 Issued
Array ( [id] => 14174403 [patent_doc_number] => 10261208 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2019-04-16 [patent_title] => Apparatus and methods for detecting obscured features [patent_app_type] => utility [patent_app_number] => 15/136570 [patent_app_country] => US [patent_app_date] => 2016-04-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 19 [patent_no_of_words] => 22056 [patent_no_of_claims] => 36 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 147 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15136570 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/136570
Apparatus and methods for detecting obscured features Apr 21, 2016 Issued
Array ( [id] => 12627141 [patent_doc_number] => 20180100877 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-04-12 [patent_title] => CURRENT DETECTION DEVICE [patent_app_type] => utility [patent_app_number] => 15/568882 [patent_app_country] => US [patent_app_date] => 2016-04-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3610 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -3 [patent_words_short_claim] => 94 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15568882 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/568882
CURRENT DETECTION DEVICE Apr 20, 2016 Abandoned
Array ( [id] => 15853049 [patent_doc_number] => 10641798 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2020-05-05 [patent_title] => Current detection device having a fixing portion formed in a wiring member [patent_app_type] => utility [patent_app_number] => 15/568910 [patent_app_country] => US [patent_app_date] => 2016-04-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 2398 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 179 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15568910 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/568910
Current detection device having a fixing portion formed in a wiring member Apr 20, 2016 Issued
Array ( [id] => 14702825 [patent_doc_number] => 10379152 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2019-08-13 [patent_title] => Method for the characterization and monitoring of integrated circuits [patent_app_type] => utility [patent_app_number] => 15/093190 [patent_app_country] => US [patent_app_date] => 2016-04-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 23 [patent_no_of_words] => 13170 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 169 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15093190 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/093190
Method for the characterization and monitoring of integrated circuits Apr 6, 2016 Issued
Array ( [id] => 12664063 [patent_doc_number] => 20180113187 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-04-26 [patent_title] => Calibration Arrangement and a Method for a Microwave Analyzing or Measuring Instrument [patent_app_type] => utility [patent_app_number] => 15/565163 [patent_app_country] => US [patent_app_date] => 2016-04-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4882 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -21 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15565163 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/565163
Calibration arrangement and a method for a microwave analyzing or measuring instrument Apr 3, 2016 Issued
Array ( [id] => 12261765 [patent_doc_number] => 20180080961 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-03-22 [patent_title] => 'ISOLATED DC CURRENT AND VOLTAGE SENSOR WITH LOW CROSSTALK' [patent_app_type] => utility [patent_app_number] => 15/561783 [patent_app_country] => US [patent_app_date] => 2016-03-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3910 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15561783 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/561783
Isolated DC current and voltage sensor with low crosstalk Mar 29, 2016 Issued
Array ( [id] => 12645015 [patent_doc_number] => 20180106836 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-04-19 [patent_title] => METHOD FOR VALIDATING FUSE HEADS [patent_app_type] => utility [patent_app_number] => 15/562831 [patent_app_country] => US [patent_app_date] => 2016-03-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2916 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 215 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15562831 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/562831
Method for validation of a fuse head in an electronic detonator Mar 28, 2016 Issued
Array ( [id] => 15062751 [patent_doc_number] => 10461691 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2019-10-29 [patent_title] => Solar testing device [patent_app_type] => utility [patent_app_number] => 15/571911 [patent_app_country] => US [patent_app_date] => 2016-03-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 2420 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 123 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15571911 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/571911
Solar testing device Mar 23, 2016 Issued
Array ( [id] => 14854989 [patent_doc_number] => 10416214 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2019-09-17 [patent_title] => System for testing wireless terminal and method for controlling the same [patent_app_type] => utility [patent_app_number] => 15/565282 [patent_app_country] => US [patent_app_date] => 2016-03-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 8 [patent_no_of_words] => 5104 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 218 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15565282 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/565282
System for testing wireless terminal and method for controlling the same Mar 23, 2016 Issued
Array ( [id] => 12186832 [patent_doc_number] => 20180045768 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-02-15 [patent_title] => 'Detecting Failure Locations in Power Cables' [patent_app_type] => utility [patent_app_number] => 15/560246 [patent_app_country] => US [patent_app_date] => 2016-03-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 12651 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 11 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15560246 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/560246
Detecting failure locations in power cables Mar 17, 2016 Issued
Array ( [id] => 12663997 [patent_doc_number] => 20180113165 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-04-26 [patent_title] => INSPECTION DEVICE AND INSPECTION METHOD [patent_app_type] => utility [patent_app_number] => 15/568849 [patent_app_country] => US [patent_app_date] => 2016-03-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 14619 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 105 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15568849 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/568849
Inspection device and inspection method for performing dynamic and static characteristics tests Mar 13, 2016 Issued
Array ( [id] => 10990434 [patent_doc_number] => 20160187379 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-06-30 [patent_title] => 'APPARATUS AND METHOD FOR TERMINATING PROBE APPARATUS OF SEMICONDUCTOR WAFER' [patent_app_type] => utility [patent_app_number] => 15/062423 [patent_app_country] => US [patent_app_date] => 2016-03-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 1819 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15062423 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/062423
Apparatus and method for terminating probe apparatus of semiconductor wafer Mar 6, 2016 Issued
Array ( [id] => 11422597 [patent_doc_number] => 20170030741 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-02-02 [patent_title] => 'MICRO-ELECTRO-MECHANICAL SYSTEM DEVICE WITH ELECTRICAL COMPENSATION AND READOUT CIRCUIT THEREOF' [patent_app_type] => utility [patent_app_number] => 15/057912 [patent_app_country] => US [patent_app_date] => 2016-03-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4366 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15057912 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/057912
MICRO-ELECTRO-MECHANICAL SYSTEM DEVICE WITH ELECTRICAL COMPENSATION AND READOUT CIRCUIT THEREOF Feb 29, 2016 Abandoned
Array ( [id] => 12010892 [patent_doc_number] => 09804207 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2017-10-31 [patent_title] => 'Internal voltage monitoring for integrated circuit devices' [patent_app_type] => utility [patent_app_number] => 15/058014 [patent_app_country] => US [patent_app_date] => 2016-03-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5150 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 149 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15058014 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/058014
Internal voltage monitoring for integrated circuit devices Feb 29, 2016 Issued
Array ( [id] => 11365349 [patent_doc_number] => 20170003331 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-01-05 [patent_title] => 'METER WITH COMMUNICATION FUNCTION' [patent_app_type] => utility [patent_app_number] => 15/057527 [patent_app_country] => US [patent_app_date] => 2016-03-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4640 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15057527 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/057527
Meter with communication function Feb 29, 2016 Issued
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