Search

Amber Altschul Misiaszek

Examiner (ID: 15024, Phone: (571)270-1362 , Office: P/3624 )

Most Active Art Unit
3624
Art Unit(s)
3626, 3624, 3682, 3686, 3684
Total Applications
709
Issued Applications
310
Pending Applications
65
Abandoned Applications
349

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 11472862 [patent_doc_number] => 20170059646 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-03-02 [patent_title] => 'SEMICONDUCTOR CIRCUIT HAVING TEST FUNCTION' [patent_app_type] => utility [patent_app_number] => 14/762569 [patent_app_country] => US [patent_app_date] => 2014-11-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2018 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14762569 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/762569
Semiconductor circuit having test function Nov 10, 2014 Issued
Array ( [id] => 11077186 [patent_doc_number] => 20160274150 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-09-22 [patent_title] => 'ISOLATION INTERFACE FOR AN ELECTRICITY METER AND ELECTRICITY METERING SYSTEM' [patent_app_type] => utility [patent_app_number] => 15/033948 [patent_app_country] => US [patent_app_date] => 2014-11-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3444 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15033948 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/033948
Isolation interface for an electricity meter and electricity metering system Nov 4, 2014 Issued
Array ( [id] => 12569226 [patent_doc_number] => 10018656 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2018-07-10 [patent_title] => Device, arrangement, and method for measuring a current intensity in a primary conductor through which current flows [patent_app_type] => utility [patent_app_number] => 15/032103 [patent_app_country] => US [patent_app_date] => 2014-10-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 3306 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 238 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15032103 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/032103
Device, arrangement, and method for measuring a current intensity in a primary conductor through which current flows Oct 28, 2014 Issued
Array ( [id] => 10199676 [patent_doc_number] => 20150084662 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-03-26 [patent_title] => 'APPARATUS AND METHOD FOR TERMINATING PROBE APPARATUS OF SEMICONDUCTOR WAFER' [patent_app_type] => utility [patent_app_number] => 14/504694 [patent_app_country] => US [patent_app_date] => 2014-10-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 1818 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14504694 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/504694
Apparatus and method for terminating probe apparatus of semiconductor wafer Oct 1, 2014 Issued
Array ( [id] => 10998002 [patent_doc_number] => 20160194948 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-07-07 [patent_title] => 'DOWNHOLE MULTI-PIPE SCALE AND CORROSION DETECTION USING CONFORMABLE SENSORS' [patent_app_type] => utility [patent_app_number] => 14/915825 [patent_app_country] => US [patent_app_date] => 2014-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 7737 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14915825 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/915825
Downhole multi-pipe scale and corrosion detection using conformable sensors Sep 29, 2014 Issued
Array ( [id] => 10998687 [patent_doc_number] => 20160195635 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-07-07 [patent_title] => 'DOWNHOLE INSPECTION, DETECTION, AND IMAGING USING CONFORMABLE SENSORS' [patent_app_type] => utility [patent_app_number] => 14/915879 [patent_app_country] => US [patent_app_date] => 2014-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 7452 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14915879 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/915879
Downhole inspection, detection, and imaging using conformable sensors Sep 29, 2014 Issued
Array ( [id] => 11763811 [patent_doc_number] => 09372228 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2016-06-21 [patent_title] => 'Non-contact test system for determining whether electronic device structures contain manufacturing faults' [patent_app_type] => utility [patent_app_number] => 14/500418 [patent_app_country] => US [patent_app_date] => 2014-09-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 24 [patent_figures_cnt] => 25 [patent_no_of_words] => 9034 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 83 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14500418 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/500418
Non-contact test system for determining whether electronic device structures contain manufacturing faults Sep 28, 2014 Issued
Array ( [id] => 11598032 [patent_doc_number] => 09645191 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2017-05-09 [patent_title] => 'Testing and setting performance parameters in a semiconductor device and method therefor' [patent_app_type] => utility [patent_app_number] => 14/484593 [patent_app_country] => US [patent_app_date] => 2014-09-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 21 [patent_no_of_words] => 12024 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 142 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14484593 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/484593
Testing and setting performance parameters in a semiconductor device and method therefor Sep 11, 2014 Issued
Array ( [id] => 11896346 [patent_doc_number] => 09766277 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2017-09-19 [patent_title] => 'Self-calibrating contactless power consumption sensing' [patent_app_type] => utility [patent_app_number] => 14/485424 [patent_app_country] => US [patent_app_date] => 2014-09-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 17 [patent_no_of_words] => 18087 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 253 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14485424 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/485424
Self-calibrating contactless power consumption sensing Sep 11, 2014 Issued
Array ( [id] => 10731010 [patent_doc_number] => 20160077161 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-03-17 [patent_title] => 'METHOD FOR IMPROVED DIAGNOSTIC IN DETERMINING AND PREVENTING INVERTER FAULTS' [patent_app_type] => utility [patent_app_number] => 14/484337 [patent_app_country] => US [patent_app_date] => 2014-09-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3011 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14484337 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/484337
METHOD FOR IMPROVED DIAGNOSTIC IN DETERMINING AND PREVENTING INVERTER FAULTS Sep 11, 2014 Abandoned
Array ( [id] => 10972315 [patent_doc_number] => 20140375349 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2014-12-25 [patent_title] => 'TESTER AND TEST SYSTEM INCLUDING THE SAME' [patent_app_type] => utility [patent_app_number] => 14/484777 [patent_app_country] => US [patent_app_date] => 2014-09-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 8372 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14484777 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/484777
Tester to simultaneously test different types of semiconductor devices and test system including the same Sep 11, 2014 Issued
Array ( [id] => 9914787 [patent_doc_number] => 20150069993 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-03-12 [patent_title] => 'APPARATUS FOR MONITORING AND DIAGNOSING POWER TRANSMISSION LINE' [patent_app_type] => utility [patent_app_number] => 14/483407 [patent_app_country] => US [patent_app_date] => 2014-09-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1753 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14483407 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/483407
APPARATUS FOR MONITORING AND DIAGNOSING POWER TRANSMISSION LINE Sep 10, 2014 Abandoned
Array ( [id] => 11540019 [patent_doc_number] => 09614444 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2017-04-04 [patent_title] => 'Dynamic voltage transition control in switched mode power converters' [patent_app_type] => utility [patent_app_number] => 14/483615 [patent_app_country] => US [patent_app_date] => 2014-09-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 11 [patent_no_of_words] => 5212 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 93 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14483615 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/483615
Dynamic voltage transition control in switched mode power converters Sep 10, 2014 Issued
Array ( [id] => 11231313 [patent_doc_number] => 09458535 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2016-10-04 [patent_title] => 'Semiconductor manufacturing device and semiconductor manufacturing method' [patent_app_type] => utility [patent_app_number] => 14/482075 [patent_app_country] => US [patent_app_date] => 2014-09-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4067 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 121 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14482075 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/482075
Semiconductor manufacturing device and semiconductor manufacturing method Sep 9, 2014 Issued
Array ( [id] => 10300271 [patent_doc_number] => 20150185271 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-07-02 [patent_title] => 'METHOD AND SYSTEM OF DIAGNOSING BREAKDOWN DURING PRE-CHARGING' [patent_app_type] => utility [patent_app_number] => 14/480946 [patent_app_country] => US [patent_app_date] => 2014-09-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3698 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14480946 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/480946
Method and system of diagnosing breakdown during pre-charging Sep 8, 2014 Issued
Array ( [id] => 10723803 [patent_doc_number] => 20160069952 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-03-10 [patent_title] => 'DETECTOR DEVICE FOR FUNCTIONAL CERTIFICATION' [patent_app_type] => utility [patent_app_number] => 14/477279 [patent_app_country] => US [patent_app_date] => 2014-09-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 3611 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14477279 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/477279
Detector device for functional certification Sep 3, 2014 Issued
Array ( [id] => 10350709 [patent_doc_number] => 20150235714 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-08-20 [patent_title] => 'SEMICONDUCTOR DEVICE FOR PARALLEL BIT TEST AND TEST METHOD THEREOF' [patent_app_type] => utility [patent_app_number] => 14/477618 [patent_app_country] => US [patent_app_date] => 2014-09-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 6546 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14477618 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/477618
Semiconductor device for parallel bit test and test method thereof Sep 3, 2014 Issued
Array ( [id] => 9906445 [patent_doc_number] => 20150061645 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-03-05 [patent_title] => 'SENSOR DEVICE' [patent_app_type] => utility [patent_app_number] => 14/477538 [patent_app_country] => US [patent_app_date] => 2014-09-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3421 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14477538 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/477538
Sensor device with inductors Sep 3, 2014 Issued
Array ( [id] => 10327108 [patent_doc_number] => 20150212112 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-07-30 [patent_title] => 'Active Probe Card' [patent_app_type] => utility [patent_app_number] => 14/476729 [patent_app_country] => US [patent_app_date] => 2014-09-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3384 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14476729 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/476729
Active probe card Sep 2, 2014 Issued
Array ( [id] => 12113739 [patent_doc_number] => 09869727 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2018-01-16 [patent_title] => 'Arrangement and method for monitoring a power supply' [patent_app_type] => utility [patent_app_number] => 14/915524 [patent_app_country] => US [patent_app_date] => 2014-09-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 5170 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 140 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14915524 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/915524
Arrangement and method for monitoring a power supply Sep 1, 2014 Issued
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