Amelie R. Davis

Array ( [id] => 4403030 [patent_doc_number] => 06279134 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-08-21 [patent_title] => 'Storage device and storage subsystem for efficiently writing error correcting code' [patent_app_type] => 1 [patent_app_number] => 9/437270 [patent_app_country] => US [patent_app_date] => 1999-11-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 11 [patent_no_of_words] => 3760 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 187 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/279/06279134.pdf [firstpage_image] =>[orig_patent_app_number] => 437270 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1540708 [patent_doc_number] => 06490704 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-12-03 [patent_title] => 'Method for correcting synchronization error and radio system' [patent_app_type] => B1 [patent_app_number] => 09/434880 [patent_app_country] => US [patent_app_date] => 1999-11-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 1776 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 133 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/490/06490704.pdf [firstpage_image] =>[orig_patent_app_number] => 09434880 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1120082 [patent_doc_number] => 06802008 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-10-05 [patent_title] => 'IC card and IC chip module' [patent_app_type] => B1 [patent_app_number] => 09/423293 [patent_app_country] => US [patent_app_date] => 1999-11-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 24 [patent_no_of_words] => 7370 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 82 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/802/06802008.pdf [firstpage_image] =>[orig_patent_app_number] => 09423293 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4424783 [patent_doc_number] => 06266792 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-07-24 [patent_title] => 'Semiconductor memory, memory device, and memory card' [patent_app_type] => 1 [patent_app_number] => 9/427068 [patent_app_country] => US [patent_app_date] => 1999-10-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 36 [patent_figures_cnt] => 68 [patent_no_of_words] => 22311 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 169 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/266/06266792.pdf [firstpage_image] =>[orig_patent_app_number] => 427068 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1596082 [patent_doc_number] => 06484282 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-11-19 [patent_title] => 'Test pattern generator, a memory testing device, and a method of generating a plurality of test patterns' [patent_app_type] => B1 [patent_app_number] => 09/418758 [patent_app_country] => US [patent_app_date] => 1999-10-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 20 [patent_no_of_words] => 12556 [patent_no_of_claims] => 66 [patent_no_of_ind_claims] => 12 [patent_words_short_claim] => 129 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/484/06484282.pdf [firstpage_image] =>[orig_patent_app_number] => 09418758 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1240972 [patent_doc_number] => 06691266 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-02-10 [patent_title] => 'Bus mastering debugging system for integrated circuits' [patent_app_type] => B1 [patent_app_number] => 09/418948 [patent_app_country] => US [patent_app_date] => 1999-10-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4014 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 46 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/691/06691266.pdf [firstpage_image] =>[orig_patent_app_number] => 09418948 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1572578 [patent_doc_number] => 06378092 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-04-23 [patent_title] => 'Integrated circuit testing' [patent_app_type] => B1 [patent_app_number] => 09/418748 [patent_app_country] => US [patent_app_date] => 1999-10-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2240 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 55 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/378/06378092.pdf [firstpage_image] =>[orig_patent_app_number] => 09418748 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1279969 [patent_doc_number] => 06654921 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-11-25 [patent_title] => 'Decoding data from multiple sources' [patent_app_type] => B1 [patent_app_number] => 09/419444 [patent_app_country] => US [patent_app_date] => 1999-10-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 9 [patent_no_of_words] => 4349 [patent_no_of_claims] => 37 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 69 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/654/06654921.pdf [firstpage_image] =>[orig_patent_app_number] => 09419444 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1553197 [patent_doc_number] => 06446236 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-09-03 [patent_title] => 'Reading encoded information subject to random and transient errors' [patent_app_type] => B1 [patent_app_number] => 09/418191 [patent_app_country] => US [patent_app_date] => 1999-10-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 11 [patent_no_of_words] => 5670 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/446/06446236.pdf [firstpage_image] =>[orig_patent_app_number] => 09418191 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1240999 [patent_doc_number] => 06691278 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-02-10 [patent_title] => 'Detecting errors in coded bit strings' [patent_app_type] => B1 [patent_app_number] => 09/418210 [patent_app_country] => US [patent_app_date] => 1999-10-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 6497 [patent_no_of_claims] => 61 [patent_no_of_ind_claims] => 13 [patent_words_short_claim] => 45 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/691/06691278.pdf [firstpage_image] =>[orig_patent_app_number] => 09418210 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1604531 [patent_doc_number] => 06434717 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-08-13 [patent_title] => 'Error detecting device and method' [patent_app_type] => B1 [patent_app_number] => 09/417516 [patent_app_country] => US [patent_app_date] => 1999-10-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 6201 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 154 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/434/06434717.pdf [firstpage_image] =>[orig_patent_app_number] => 09417516 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1424087 [patent_doc_number] => 06539513 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-03-25 [patent_title] => 'Dual functioning symbol error correction code' [patent_app_type] => B1 [patent_app_number] => 09/417948 [patent_app_country] => US [patent_app_date] => 1999-10-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 13 [patent_no_of_words] => 5917 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 139 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/539/06539513.pdf [firstpage_image] =>[orig_patent_app_number] => 09417948 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1456938 [patent_doc_number] => 06457148 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-09-24 [patent_title] => 'Apparatus for testing semiconductor device' [patent_app_type] => B1 [patent_app_number] => 09/402839 [patent_app_country] => US [patent_app_date] => 1999-10-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 21 [patent_no_of_words] => 14478 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 327 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/457/06457148.pdf [firstpage_image] =>[orig_patent_app_number] => 09402839 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1429381 [patent_doc_number] => 06513138 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-01-28 [patent_title] => 'Pattern generator for semiconductor test system' [patent_app_type] => B1 [patent_app_number] => 09/415927 [patent_app_country] => US [patent_app_date] => 1999-10-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 23 [patent_no_of_words] => 7488 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 168 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/513/06513138.pdf [firstpage_image] =>[orig_patent_app_number] => 09415927 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1416390 [patent_doc_number] => 06550029 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-04-15 [patent_title] => 'Testing system and methods with protocol pattern injection and external verification' [patent_app_type] => B1 [patent_app_number] => 09/415144 [patent_app_country] => US [patent_app_date] => 1999-10-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 11 [patent_no_of_words] => 4173 [patent_no_of_claims] => 37 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 75 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/550/06550029.pdf [firstpage_image] =>[orig_patent_app_number] => 09415144 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1382490 [patent_doc_number] => 06574760 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-06-03 [patent_title] => 'Testing method and apparatus assuring semiconductor device quality and reliability' [patent_app_type] => B1 [patent_app_number] => 09/413926 [patent_app_country] => US [patent_app_date] => 1999-10-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 10 [patent_no_of_words] => 5914 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 58 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/574/06574760.pdf [firstpage_image] =>[orig_patent_app_number] => 09413926 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1501751 [patent_doc_number] => 06405341 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-06-11 [patent_title] => 'Multi-dimensional pseudo noise generating circuit for soft-decision decoding' [patent_app_type] => B1 [patent_app_number] => 09/413601 [patent_app_country] => US [patent_app_date] => 1999-10-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 5497 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 108 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/405/06405341.pdf [firstpage_image] =>[orig_patent_app_number] => 09413601 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1324395 [patent_doc_number] => 06611941 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-08-26 [patent_title] => 'Method for RAMDAC testing' [patent_app_type] => B1 [patent_app_number] => 09/413498 [patent_app_country] => US [patent_app_date] => 1999-10-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 17 [patent_no_of_words] => 4140 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 107 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/611/06611941.pdf [firstpage_image] =>[orig_patent_app_number] => 09413498 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1329472 [patent_doc_number] => 06606728 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-08-12 [patent_title] => 'Rate (M/N) code encoder, detector, and decoder for control data' [patent_app_type] => B1 [patent_app_number] => 09/413082 [patent_app_country] => US [patent_app_date] => 1999-10-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 18 [patent_no_of_words] => 8555 [patent_no_of_claims] => 38 [patent_no_of_ind_claims] => 12 [patent_words_short_claim] => 87 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/606/06606728.pdf [firstpage_image] =>[orig_patent_app_number] => 09413082 [rel_patent_id] =>[rel_patent_doc_number] =>)