Search

Amir Hossein Etesam

Examiner (ID: 11869, Phone: (571)270-1946 , Office: P/2655 )

Most Active Art Unit
2655
Art Unit(s)
2652, 2651, 2655, 4185, 2614, 2692
Total Applications
990
Issued Applications
823
Pending Applications
3
Abandoned Applications
164

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 11284747 [patent_doc_number] => 09500597 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2016-11-22 [patent_title] => 'Determination of absolute dimensions of particles used as calibration standards for optical measurement system' [patent_app_type] => utility [patent_app_number] => 13/524147 [patent_app_country] => US [patent_app_date] => 2012-06-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 7968 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 126 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13524147 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/524147
Determination of absolute dimensions of particles used as calibration standards for optical measurement system Jun 14, 2012 Issued
Array ( [id] => 8520972 [patent_doc_number] => 20120320380 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-12-20 [patent_title] => 'TEST DEVICE FOR TESTING A BONDING LAYER BETWEEN WAFER-SHAPED SAMPLES AND TEST PROCESS FOR TESTING THE BONDING LAYER' [patent_app_type] => utility [patent_app_number] => 13/525184 [patent_app_country] => US [patent_app_date] => 2012-06-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 5328 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13525184 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/525184
Test device for testing a bonding layer between wafer-shaped samples and test process for testing the bonding layer Jun 14, 2012 Issued
Array ( [id] => 11774362 [patent_doc_number] => 09383260 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2016-07-05 [patent_title] => 'Laser ablation analysis system' [patent_app_type] => utility [patent_app_number] => 13/492923 [patent_app_country] => US [patent_app_date] => 2012-06-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 16 [patent_no_of_words] => 9403 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 231 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13492923 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/492923
Laser ablation analysis system Jun 9, 2012 Issued
Array ( [id] => 9179807 [patent_doc_number] => 20130321792 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-12-05 [patent_title] => 'UNIVERSAL TOOL FOR AUTOMATED GEM AND MINERAL IDENTIFICATION AND MEASUREMENT' [patent_app_type] => utility [patent_app_number] => 13/488175 [patent_app_country] => US [patent_app_date] => 2012-06-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 7608 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13488175 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/488175
Universal tool for automated gem and mineral identification and measurement Jun 3, 2012 Issued
Array ( [id] => 9066583 [patent_doc_number] => 20130258339 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-10-03 [patent_title] => 'WAFER ALIGNMENT MARK SCHEME' [patent_app_type] => utility [patent_app_number] => 13/485224 [patent_app_country] => US [patent_app_date] => 2012-05-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2247 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13485224 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/485224
WAFER ALIGNMENT MARK SCHEME May 30, 2012 Abandoned
Array ( [id] => 9159850 [patent_doc_number] => 20130308127 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-11-21 [patent_title] => 'ENHANCEMENT OF RAMAN SCATTERING' [patent_app_type] => utility [patent_app_number] => 13/472987 [patent_app_country] => US [patent_app_date] => 2012-05-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 6731 [patent_no_of_claims] => 45 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13472987 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/472987
Enhancement of raman scattering May 15, 2012 Issued
Array ( [id] => 10407970 [patent_doc_number] => 20150292978 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-10-15 [patent_title] => 'LENS POWER MEASUREMENT DEVICE AND MEASUREMENT METHOD' [patent_app_type] => utility [patent_app_number] => 14/396489 [patent_app_country] => US [patent_app_date] => 2012-05-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 11438 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14396489 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/396489
Lens power measurement device and measurement method May 10, 2012 Issued
Array ( [id] => 8488015 [patent_doc_number] => 20120287422 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-11-15 [patent_title] => 'SYSTEM FOR MEASURING PROPERTIES OF TEST SAMPLES IN FLUID' [patent_app_type] => utility [patent_app_number] => 13/467350 [patent_app_country] => US [patent_app_date] => 2012-05-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 6487 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13467350 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/467350
System for measuring properties of test samples in fluid May 8, 2012 Issued
Array ( [id] => 8695839 [patent_doc_number] => 20130057848 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-03-07 [patent_title] => 'IMAGING CRYSTALLINE DOMAINS OF SMALL MOLECULES' [patent_app_type] => utility [patent_app_number] => 13/464379 [patent_app_country] => US [patent_app_date] => 2012-05-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 7237 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13464379 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/464379
Imaging crystalline domains of small molecules May 3, 2012 Issued
Array ( [id] => 8481813 [patent_doc_number] => 20120281221 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-11-08 [patent_title] => 'PROCESS AND MEASURING EQUIPMENT FOR IMPROVING THE SIGNAL RESOLUTION IN GAS ABSORPTION SPECTROSCOPY' [patent_app_type] => utility [patent_app_number] => 13/460950 [patent_app_country] => US [patent_app_date] => 2012-05-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 3890 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13460950 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/460950
PROCESS AND MEASURING EQUIPMENT FOR IMPROVING THE SIGNAL RESOLUTION IN GAS ABSORPTION SPECTROSCOPY Apr 30, 2012 Abandoned
Array ( [id] => 13170199 [patent_doc_number] => 10101209 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2018-10-16 [patent_title] => Method and apparatus for quantifying solutions comprised of multiple analytes [patent_app_type] => utility [patent_app_number] => 13/506585 [patent_app_country] => US [patent_app_date] => 2012-04-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 8978 [patent_no_of_claims] => 41 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 277 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13506585 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/506585
Method and apparatus for quantifying solutions comprised of multiple analytes Apr 29, 2012 Issued
Array ( [id] => 9119473 [patent_doc_number] => 20130286395 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-10-31 [patent_title] => 'Tool Induced Shift Reduction Determination for Overlay Metrology' [patent_app_type] => utility [patent_app_number] => 13/457832 [patent_app_country] => US [patent_app_date] => 2012-04-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4317 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13457832 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/457832
Tool induced shift reduction determination for overlay metrology Apr 26, 2012 Issued
Array ( [id] => 11751892 [patent_doc_number] => 09709903 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2017-07-18 [patent_title] => 'Overlay target geometry for measuring multiple pitches' [patent_app_type] => utility [patent_app_number] => 13/446133 [patent_app_country] => US [patent_app_date] => 2012-04-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 10790 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 181 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13446133 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/446133
Overlay target geometry for measuring multiple pitches Apr 12, 2012 Issued
Array ( [id] => 8451760 [patent_doc_number] => 20120262706 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-10-18 [patent_title] => 'METHOD OF MEASURING CUT-OFF WAVELENGTH OF OPTICAL FIBER' [patent_app_type] => utility [patent_app_number] => 13/440757 [patent_app_country] => US [patent_app_date] => 2012-04-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 13418 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13440757 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/440757
Method of measuring cut-off wavelength of optical fiber Apr 4, 2012 Issued
Array ( [id] => 8425024 [patent_doc_number] => 20120246899 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-10-04 [patent_title] => 'PROFILE MEASURING APPARATUS, METHOD FOR MEASURING PROFILE, AND METHOD FOR MANUFACTURING STRUCTURE' [patent_app_type] => utility [patent_app_number] => 13/435147 [patent_app_country] => US [patent_app_date] => 2012-03-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 12384 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13435147 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/435147
PROFILE MEASURING APPARATUS, METHOD FOR MEASURING PROFILE, AND METHOD FOR MANUFACTURING STRUCTURE Mar 29, 2012 Abandoned
Array ( [id] => 8635902 [patent_doc_number] => 20130027705 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-01-31 [patent_title] => 'TRIPLE ISOTOPE METHOD AND ANALYZER FOR TOTAL ENERGY EXPENDITURE MEASUREMENTS' [patent_app_type] => utility [patent_app_number] => 13/426220 [patent_app_country] => US [patent_app_date] => 2012-03-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4255 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13426220 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/426220
Triple isotope method and analyzer for total energy expenditure measurements Mar 20, 2012 Issued
Array ( [id] => 9052579 [patent_doc_number] => 20130250293 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-09-26 [patent_title] => 'Method and Apparatus for Actively Monitoring an Inductively-Coupled Plasma Ion Source using an Optical Spectrometer' [patent_app_type] => utility [patent_app_number] => 13/424977 [patent_app_country] => US [patent_app_date] => 2012-03-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 7418 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13424977 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/424977
Method and Apparatus for Actively Monitoring an Inductively-Coupled Plasma Ion Source using an Optical Spectrometer Mar 19, 2012 Abandoned
Array ( [id] => 9317445 [patent_doc_number] => 20140049783 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2014-02-20 [patent_title] => 'SYSTEM, METHOD AND COMPUTER PROGRAM FOR RECEIVING A LIGHT BEAM' [patent_app_type] => utility [patent_app_number] => 14/005606 [patent_app_country] => US [patent_app_date] => 2012-03-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 6824 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14005606 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/005606
System, method and computer program for receiving a light beam Mar 14, 2012 Issued
Array ( [id] => 9032732 [patent_doc_number] => 20130235371 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-09-12 [patent_title] => 'HIGH-SPEED, 3-D METHOD AND SYSTEM FOR OPTICALLY INSPECTING PARTS' [patent_app_type] => utility [patent_app_number] => 13/414081 [patent_app_country] => US [patent_app_date] => 2012-03-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3485 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13414081 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/414081
High-speed, 3-D method and system for optically inspecting parts Mar 6, 2012 Issued
Array ( [id] => 9014685 [patent_doc_number] => 20130229649 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-09-05 [patent_title] => 'OPTICAL BRILLOUIN SENSING SYSTEMS' [patent_app_type] => utility [patent_app_number] => 13/409310 [patent_app_country] => US [patent_app_date] => 2012-03-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 6569 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13409310 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/409310
OPTICAL BRILLOUIN SENSING SYSTEMS Feb 29, 2012 Abandoned
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