Andrew J Oyer
Examiner (ID: 2471, Phone: (571)270-0347 , Office: P/1767 )
Most Active Art Unit | 1767 |
Art Unit(s) | 1767 |
Total Applications | 638 |
Issued Applications | 430 |
Pending Applications | 78 |
Abandoned Applications | 130 |
Applications
Application number | Title of the application | Filing Date | Status |
---|---|---|---|
Array
(
[id] => 4197251
[patent_doc_number] => 06013533
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-01-11
[patent_title] => 'Real time quiescent current test limit methodology'
[patent_app_type] => 1
[patent_app_number] => 8/924187
[patent_app_country] => US
[patent_app_date] => 1997-09-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[pdf_file] => patents/06/013/06013533.pdf
[firstpage_image] =>[orig_patent_app_number] => 924187
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/924187 | Real time quiescent current test limit methodology | Sep 4, 1997 | Issued |
Array
(
[id] => 4138777
[patent_doc_number] => 06060328
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-05-09
[patent_title] => 'Methods and arrangements for determining an endpoint for an in-situ local interconnect etching process'
[patent_app_type] => 1
[patent_app_number] => 8/924569
[patent_app_country] => US
[patent_app_date] => 1997-09-05
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/06/060/06060328.pdf
[firstpage_image] =>[orig_patent_app_number] => 924569
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/924569 | Methods and arrangements for determining an endpoint for an in-situ local interconnect etching process | Sep 4, 1997 | Issued |
Array
(
[id] => 3968402
[patent_doc_number] => 05904490
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-05-18
[patent_title] => 'Method of measuring electron shading damage'
[patent_app_type] => 1
[patent_app_number] => 8/926331
[patent_app_country] => US
[patent_app_date] => 1997-09-05
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/904/05904490.pdf
[firstpage_image] =>[orig_patent_app_number] => 926331
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/926331 | Method of measuring electron shading damage | Sep 4, 1997 | Issued |
Array
(
[id] => 4002483
[patent_doc_number] => 06004827
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-12-21
[patent_title] => 'Integrated circuit processing'
[patent_app_type] => 1
[patent_app_number] => 8/922487
[patent_app_country] => US
[patent_app_date] => 1997-09-03
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/06/004/06004827.pdf
[firstpage_image] =>[orig_patent_app_number] => 922487
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/922487 | Integrated circuit processing | Sep 2, 1997 | Issued |
Array
(
[id] => 3884252
[patent_doc_number] => 05776795
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-07-07
[patent_title] => 'Method of making a contactless capacitor-coupled bipolar active pixel sensor with intergrated electronic shutter'
[patent_app_type] => 1
[patent_app_number] => 8/923757
[patent_app_country] => US
[patent_app_date] => 1997-09-02
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[pdf_file] => patents/05/776/05776795.pdf
[firstpage_image] =>[orig_patent_app_number] => 923757
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/923757 | Method of making a contactless capacitor-coupled bipolar active pixel sensor with intergrated electronic shutter | Sep 1, 1997 | Issued |
Array
(
[id] => 4084258
[patent_doc_number] => 06025208
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-02-15
[patent_title] => 'Method of making electrical elements on the sidewalls of micromechanical structures'
[patent_app_type] => 1
[patent_app_number] => 8/921647
[patent_app_country] => US
[patent_app_date] => 1997-08-27
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[firstpage_image] =>[orig_patent_app_number] => 921647
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/921647 | Method of making electrical elements on the sidewalls of micromechanical structures | Aug 26, 1997 | Issued |
Array
(
[id] => 3966763
[patent_doc_number] => 05956572
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-09-21
[patent_title] => 'Method of fabricating integrated thin film solar cells'
[patent_app_type] => 1
[patent_app_number] => 8/917105
[patent_app_country] => US
[patent_app_date] => 1997-08-25
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[pdf_file] => patents/05/956/05956572.pdf
[firstpage_image] =>[orig_patent_app_number] => 917105
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/917105 | Method of fabricating integrated thin film solar cells | Aug 24, 1997 | Issued |
Array
(
[id] => 3993164
[patent_doc_number] => 05985682
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-11-16
[patent_title] => 'Method for testing a bumped semiconductor die'
[patent_app_type] => 1
[patent_app_number] => 8/917265
[patent_app_country] => US
[patent_app_date] => 1997-08-25
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/985/05985682.pdf
[firstpage_image] =>[orig_patent_app_number] => 917265
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/917265 | Method for testing a bumped semiconductor die | Aug 24, 1997 | Issued |
Array
(
[id] => 4245529
[patent_doc_number] => 06136632
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-10-24
[patent_title] => 'Active matrix substrate, method of producing an active matrix substrate, liquid crystal display device, and electronic equipment'
[patent_app_type] => 1
[patent_app_number] => 8/894621
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[pdf_file] => patents/06/136/06136632.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/894621 | Active matrix substrate, method of producing an active matrix substrate, liquid crystal display device, and electronic equipment | Aug 21, 1997 | Issued |
Array
(
[id] => 4039070
[patent_doc_number] => 05926721
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-07-20
[patent_title] => 'Isolation method for semiconductor device using selective epitaxial growth'
[patent_app_type] => 1
[patent_app_number] => 8/924467
[patent_app_country] => US
[patent_app_date] => 1997-08-21
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/926/05926721.pdf
[firstpage_image] =>[orig_patent_app_number] => 924467
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/924467 | Isolation method for semiconductor device using selective epitaxial growth | Aug 20, 1997 | Issued |
Array
(
[id] => 4136266
[patent_doc_number] => 06015718
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-01-18
[patent_title] => 'Indentification of the composition of particles in a process chamber'
[patent_app_type] => 1
[patent_app_number] => 8/911471
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[patent_app_date] => 1997-08-14
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[pdf_file] => patents/06/015/06015718.pdf
[firstpage_image] =>[orig_patent_app_number] => 911471
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/911471 | Indentification of the composition of particles in a process chamber | Aug 13, 1997 | Issued |
Array
(
[id] => 4232400
[patent_doc_number] => 06117701
[patent_country] => US
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[patent_issue_date] => 2000-09-12
[patent_title] => 'Method for manufacturing a rate-of-rotation sensor'
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[patent_app_number] => 8/907601
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[pdf_file] => patents/06/117/06117701.pdf
[firstpage_image] =>[orig_patent_app_number] => 907601
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/907601 | Method for manufacturing a rate-of-rotation sensor | Aug 7, 1997 | Issued |
Array
(
[id] => 4023514
[patent_doc_number] => 05882947
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-03-16
[patent_title] => 'Method for probing the error of energy and dosage in the high-energy ion implantation'
[patent_app_type] => 1
[patent_app_number] => 8/906085
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Array
(
[id] => 4185177
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[patent_issue_date] => 2000-07-25
[patent_title] => 'Low temperature adhesion bonding method for composite substrates'
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[patent_app_number] => 8/902993
[patent_app_country] => US
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/902993 | Low temperature adhesion bonding method for composite substrates | Jul 29, 1997 | Issued |
Array
(
[id] => 3944910
[patent_doc_number] => 05953579
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[patent_title] => 'In-line test of contact opening of semiconductor device'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/902107 | In-line test of contact opening of semiconductor device | Jul 28, 1997 | Issued |
Array
(
[id] => 4137045
[patent_doc_number] => 06034405
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-03-07
[patent_title] => 'Bonding of aluminum oxide components to silicons substrates'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/899291 | Bonding of aluminum oxide components to silicons substrates | Jul 21, 1997 | Issued |
Array
(
[id] => 4406228
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[patent_country] => US
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[patent_issue_date] => 2001-01-09
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Array
(
[id] => 4102341
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Array
(
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Array
(
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[pdf_file] => patents/05/861/05861327.pdf
[firstpage_image] =>[orig_patent_app_number] => 889939
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/889939 | Fabrication method of gate electrode in semiconductor device | Jul 9, 1997 | Issued |