
Andrew Yang
Examiner (ID: 19, Phone: (571)272-3472 , Office: P/3775 )
| Most Active Art Unit | 3775 |
| Art Unit(s) | 3733, 3775 |
| Total Applications | 1589 |
| Issued Applications | 1273 |
| Pending Applications | 126 |
| Abandoned Applications | 226 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4985835
[patent_doc_number] => 20070152173
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-07-05
[patent_title] => 'Ion implantation apparatus and ion implanting method'
[patent_app_type] => utility
[patent_app_number] => 11/712949
[patent_app_country] => US
[patent_app_date] => 2007-03-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 13
[patent_no_of_words] => 5702
[patent_no_of_claims] => 6
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0152/20070152173.pdf
[firstpage_image] =>[orig_patent_app_number] => 11712949
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/712949 | Ion implantation apparatus and ion implanting method | Mar 1, 2007 | Issued |
Array
(
[id] => 4443264
[patent_doc_number] => 07928373
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-04-19
[patent_title] => 'Isolating ions in quadrupole ion traps for mass spectrometry'
[patent_app_type] => utility
[patent_app_number] => 11/713210
[patent_app_country] => US
[patent_app_date] => 2007-03-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 16
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[patent_no_of_words] => 12341
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[patent_maintenance] => 1
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/928/07928373.pdf
[firstpage_image] =>[orig_patent_app_number] => 11713210
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/713210 | Isolating ions in quadrupole ion traps for mass spectrometry | Mar 1, 2007 | Issued |
Array
(
[id] => 5128963
[patent_doc_number] => 20070205360
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-09-06
[patent_title] => 'Time of Flight Ion Trap Tandem Mass Spectrometer System'
[patent_app_type] => utility
[patent_app_number] => 11/676698
[patent_app_country] => US
[patent_app_date] => 2007-02-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
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[patent_no_of_words] => 3089
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[pdf_file] => publications/A1/0205/20070205360.pdf
[firstpage_image] =>[orig_patent_app_number] => 11676698
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/676698 | Time of Flight Ion Trap Tandem Mass Spectrometer System | Feb 19, 2007 | Abandoned |
Array
(
[id] => 5019290
[patent_doc_number] => 20070145256
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-06-28
[patent_title] => 'PARTICLE MOVEMENT DEVICE'
[patent_app_type] => utility
[patent_app_number] => 11/671050
[patent_app_country] => US
[patent_app_date] => 2007-02-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
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[patent_no_of_words] => 3883
[patent_no_of_claims] => 32
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[pdf_file] => publications/A1/0145/20070145256.pdf
[firstpage_image] =>[orig_patent_app_number] => 11671050
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/671050 | Particle movement device | Feb 4, 2007 | Issued |
Array
(
[id] => 5217249
[patent_doc_number] => 20070158560
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-07-12
[patent_title] => 'Charged particle beam system, semiconductor inspection system, and method of machining sample'
[patent_app_type] => utility
[patent_app_number] => 11/646421
[patent_app_country] => US
[patent_app_date] => 2006-12-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 16
[patent_figures_cnt] => 16
[patent_no_of_words] => 4705
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[pdf_file] => publications/A1/0158/20070158560.pdf
[firstpage_image] =>[orig_patent_app_number] => 11646421
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/646421 | Charged particle beam system, semiconductor inspection system, and method of machining sample | Dec 27, 2006 | Abandoned |
Array
(
[id] => 4748937
[patent_doc_number] => 20080157007
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-07-03
[patent_title] => 'Active particle trapping for process control'
[patent_app_type] => utility
[patent_app_number] => 11/646155
[patent_app_country] => US
[patent_app_date] => 2006-12-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
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[patent_no_of_words] => 7451
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[pdf_file] => publications/A1/0157/20080157007.pdf
[firstpage_image] =>[orig_patent_app_number] => 11646155
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/646155 | Active particle trapping for process control | Dec 26, 2006 | Abandoned |
Array
(
[id] => 7978431
[patent_doc_number] => 08071963
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-12-06
[patent_title] => 'Debris mitigation system and lithographic apparatus'
[patent_app_type] => utility
[patent_app_number] => 11/645809
[patent_app_country] => US
[patent_app_date] => 2006-12-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 5101
[patent_no_of_claims] => 19
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/071/08071963.pdf
[firstpage_image] =>[orig_patent_app_number] => 11645809
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/645809 | Debris mitigation system and lithographic apparatus | Dec 26, 2006 | Issued |
Array
(
[id] => 4751400
[patent_doc_number] => 20080159471
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-07-03
[patent_title] => 'Debris mitigation system and lithographic apparatus'
[patent_app_type] => utility
[patent_app_number] => 11/645808
[patent_app_country] => US
[patent_app_date] => 2006-12-27
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[patent_drawing_sheets_cnt] => 4
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[patent_no_of_words] => 3971
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[pdf_file] => publications/A1/0159/20080159471.pdf
[firstpage_image] =>[orig_patent_app_number] => 11645808
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/645808 | Debris mitigation system and lithographic apparatus | Dec 26, 2006 | Issued |
Array
(
[id] => 5217257
[patent_doc_number] => 20070158568
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-07-12
[patent_title] => 'Apparatus and measuring method of aberration coefficient of scanning transmission electron microscope'
[patent_app_type] => utility
[patent_app_number] => 11/645567
[patent_app_country] => US
[patent_app_date] => 2006-12-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
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[pdf_file] => publications/A1/0158/20070158568.pdf
[firstpage_image] =>[orig_patent_app_number] => 11645567
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/645567 | Apparatus and measuring method of aberration coefficient of scanning transmission electron microscope | Dec 26, 2006 | Abandoned |
Array
(
[id] => 5217256
[patent_doc_number] => 20070158567
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-07-12
[patent_title] => 'Apparatus and adjusting method for a scanning transmission electron microscope'
[patent_app_type] => utility
[patent_app_number] => 11/644877
[patent_app_country] => US
[patent_app_date] => 2006-12-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
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[pdf_file] => publications/A1/0158/20070158567.pdf
[firstpage_image] =>[orig_patent_app_number] => 11644877
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/644877 | Apparatus and adjusting method for a scanning transmission electron microscope | Dec 25, 2006 | Abandoned |
Array
(
[id] => 75074
[patent_doc_number] => 07750320
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-07-06
[patent_title] => 'System and method for two-dimensional beam scan across a workpiece of an ion implanter'
[patent_app_type] => utility
[patent_app_number] => 11/644623
[patent_app_country] => US
[patent_app_date] => 2006-12-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
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[patent_no_of_words] => 4413
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[pdf_file] => patents/07/750/07750320.pdf
[firstpage_image] =>[orig_patent_app_number] => 11644623
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/644623 | System and method for two-dimensional beam scan across a workpiece of an ion implanter | Dec 21, 2006 | Issued |
Array
(
[id] => 4875596
[patent_doc_number] => 20080148978
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-06-26
[patent_title] => 'Assembly for blocking a beam of radiation and method of blocking a beam of radiation'
[patent_app_type] => utility
[patent_app_number] => 11/643954
[patent_app_country] => US
[patent_app_date] => 2006-12-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
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[firstpage_image] =>[orig_patent_app_number] => 11643954
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/643954 | Assembly for blocking a beam of radiation and method of blocking a beam of radiation | Dec 21, 2006 | Issued |
Array
(
[id] => 4443376
[patent_doc_number] => 07928416
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-04-19
[patent_title] => 'Laser produced plasma EUV light source'
[patent_app_type] => utility
[patent_app_number] => 11/644153
[patent_app_country] => US
[patent_app_date] => 2006-12-22
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[pdf_file] => patents/07/928/07928416.pdf
[firstpage_image] =>[orig_patent_app_number] => 11644153
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/644153 | Laser produced plasma EUV light source | Dec 21, 2006 | Issued |
Array
(
[id] => 4876438
[patent_doc_number] => 20080149821
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-06-26
[patent_title] => 'Method and apparatus for identifying the apex of a chromatographic peak'
[patent_app_type] => utility
[patent_app_number] => 11/644180
[patent_app_country] => US
[patent_app_date] => 2006-12-21
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[firstpage_image] =>[orig_patent_app_number] => 11644180
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/644180 | Method and apparatus for identifying the apex of a chromatographic peak | Dec 20, 2006 | Issued |
Array
(
[id] => 4946832
[patent_doc_number] => 20080302958
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[patent_issue_date] => 2008-12-11
[patent_title] => 'Mass Spectrometer'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/158603 | Mass spectrometer | Dec 20, 2006 | Issued |
Array
(
[id] => 4756501
[patent_doc_number] => 20080308726
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[patent_issue_date] => 2008-12-18
[patent_title] => 'Method for the Operation of a Measurement System With a Scanning Probe Microscope and a Measurement System'
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[patent_app_number] => 12/160039
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[firstpage_image] =>[orig_patent_app_number] => 12160039
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/160039 | Method for the operation of a measurement system with a scanning probe microscope and a measurement system | Dec 20, 2006 | Issued |
Array
(
[id] => 4443349
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[patent_issue_date] => 2011-04-19
[patent_title] => 'Lithographic apparatus and device manufacturing method'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/603228 | Lithographic apparatus and device manufacturing method | Nov 21, 2006 | Issued |
Array
(
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/592330 | Q-pole type mass spectrometer | Nov 2, 2006 | Abandoned |
Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/546610 | Matrix assisted laser desorption ionization (MALDI) support structures and methods of making MALDI support structures | Oct 11, 2006 | Abandoned |
Array
(
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