Search

Andrew Yang

Examiner (ID: 19, Phone: (571)272-3472 , Office: P/3775 )

Most Active Art Unit
3775
Art Unit(s)
3733, 3775
Total Applications
1589
Issued Applications
1273
Pending Applications
126
Abandoned Applications
226

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4985835 [patent_doc_number] => 20070152173 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-07-05 [patent_title] => 'Ion implantation apparatus and ion implanting method' [patent_app_type] => utility [patent_app_number] => 11/712949 [patent_app_country] => US [patent_app_date] => 2007-03-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 5702 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0152/20070152173.pdf [firstpage_image] =>[orig_patent_app_number] => 11712949 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/712949
Ion implantation apparatus and ion implanting method Mar 1, 2007 Issued
Array ( [id] => 4443264 [patent_doc_number] => 07928373 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-04-19 [patent_title] => 'Isolating ions in quadrupole ion traps for mass spectrometry' [patent_app_type] => utility [patent_app_number] => 11/713210 [patent_app_country] => US [patent_app_date] => 2007-03-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 26 [patent_no_of_words] => 12341 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 260 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/928/07928373.pdf [firstpage_image] =>[orig_patent_app_number] => 11713210 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/713210
Isolating ions in quadrupole ion traps for mass spectrometry Mar 1, 2007 Issued
Array ( [id] => 5128963 [patent_doc_number] => 20070205360 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-09-06 [patent_title] => 'Time of Flight Ion Trap Tandem Mass Spectrometer System' [patent_app_type] => utility [patent_app_number] => 11/676698 [patent_app_country] => US [patent_app_date] => 2007-02-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3089 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0205/20070205360.pdf [firstpage_image] =>[orig_patent_app_number] => 11676698 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/676698
Time of Flight Ion Trap Tandem Mass Spectrometer System Feb 19, 2007 Abandoned
Array ( [id] => 5019290 [patent_doc_number] => 20070145256 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-06-28 [patent_title] => 'PARTICLE MOVEMENT DEVICE' [patent_app_type] => utility [patent_app_number] => 11/671050 [patent_app_country] => US [patent_app_date] => 2007-02-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3883 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0145/20070145256.pdf [firstpage_image] =>[orig_patent_app_number] => 11671050 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/671050
Particle movement device Feb 4, 2007 Issued
Array ( [id] => 5217249 [patent_doc_number] => 20070158560 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-07-12 [patent_title] => 'Charged particle beam system, semiconductor inspection system, and method of machining sample' [patent_app_type] => utility [patent_app_number] => 11/646421 [patent_app_country] => US [patent_app_date] => 2006-12-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 4705 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0158/20070158560.pdf [firstpage_image] =>[orig_patent_app_number] => 11646421 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/646421
Charged particle beam system, semiconductor inspection system, and method of machining sample Dec 27, 2006 Abandoned
Array ( [id] => 4748937 [patent_doc_number] => 20080157007 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-07-03 [patent_title] => 'Active particle trapping for process control' [patent_app_type] => utility [patent_app_number] => 11/646155 [patent_app_country] => US [patent_app_date] => 2006-12-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 7451 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0157/20080157007.pdf [firstpage_image] =>[orig_patent_app_number] => 11646155 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/646155
Active particle trapping for process control Dec 26, 2006 Abandoned
Array ( [id] => 7978431 [patent_doc_number] => 08071963 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-12-06 [patent_title] => 'Debris mitigation system and lithographic apparatus' [patent_app_type] => utility [patent_app_number] => 11/645809 [patent_app_country] => US [patent_app_date] => 2006-12-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5101 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/071/08071963.pdf [firstpage_image] =>[orig_patent_app_number] => 11645809 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/645809
Debris mitigation system and lithographic apparatus Dec 26, 2006 Issued
Array ( [id] => 4751400 [patent_doc_number] => 20080159471 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-07-03 [patent_title] => 'Debris mitigation system and lithographic apparatus' [patent_app_type] => utility [patent_app_number] => 11/645808 [patent_app_country] => US [patent_app_date] => 2006-12-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3971 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0159/20080159471.pdf [firstpage_image] =>[orig_patent_app_number] => 11645808 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/645808
Debris mitigation system and lithographic apparatus Dec 26, 2006 Issued
Array ( [id] => 5217257 [patent_doc_number] => 20070158568 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-07-12 [patent_title] => 'Apparatus and measuring method of aberration coefficient of scanning transmission electron microscope' [patent_app_type] => utility [patent_app_number] => 11/645567 [patent_app_country] => US [patent_app_date] => 2006-12-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 7108 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0158/20070158568.pdf [firstpage_image] =>[orig_patent_app_number] => 11645567 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/645567
Apparatus and measuring method of aberration coefficient of scanning transmission electron microscope Dec 26, 2006 Abandoned
Array ( [id] => 5217256 [patent_doc_number] => 20070158567 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-07-12 [patent_title] => 'Apparatus and adjusting method for a scanning transmission electron microscope' [patent_app_type] => utility [patent_app_number] => 11/644877 [patent_app_country] => US [patent_app_date] => 2006-12-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 14744 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0158/20070158567.pdf [firstpage_image] =>[orig_patent_app_number] => 11644877 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/644877
Apparatus and adjusting method for a scanning transmission electron microscope Dec 25, 2006 Abandoned
Array ( [id] => 75074 [patent_doc_number] => 07750320 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-07-06 [patent_title] => 'System and method for two-dimensional beam scan across a workpiece of an ion implanter' [patent_app_type] => utility [patent_app_number] => 11/644623 [patent_app_country] => US [patent_app_date] => 2006-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4413 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 67 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/750/07750320.pdf [firstpage_image] =>[orig_patent_app_number] => 11644623 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/644623
System and method for two-dimensional beam scan across a workpiece of an ion implanter Dec 21, 2006 Issued
Array ( [id] => 4875596 [patent_doc_number] => 20080148978 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-06-26 [patent_title] => 'Assembly for blocking a beam of radiation and method of blocking a beam of radiation' [patent_app_type] => utility [patent_app_number] => 11/643954 [patent_app_country] => US [patent_app_date] => 2006-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 8578 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0148/20080148978.pdf [firstpage_image] =>[orig_patent_app_number] => 11643954 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/643954
Assembly for blocking a beam of radiation and method of blocking a beam of radiation Dec 21, 2006 Issued
Array ( [id] => 4443376 [patent_doc_number] => 07928416 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-04-19 [patent_title] => 'Laser produced plasma EUV light source' [patent_app_type] => utility [patent_app_number] => 11/644153 [patent_app_country] => US [patent_app_date] => 2006-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 14 [patent_no_of_words] => 10264 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 70 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/928/07928416.pdf [firstpage_image] =>[orig_patent_app_number] => 11644153 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/644153
Laser produced plasma EUV light source Dec 21, 2006 Issued
Array ( [id] => 4876438 [patent_doc_number] => 20080149821 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-06-26 [patent_title] => 'Method and apparatus for identifying the apex of a chromatographic peak' [patent_app_type] => utility [patent_app_number] => 11/644180 [patent_app_country] => US [patent_app_date] => 2006-12-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 5079 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0149/20080149821.pdf [firstpage_image] =>[orig_patent_app_number] => 11644180 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/644180
Method and apparatus for identifying the apex of a chromatographic peak Dec 20, 2006 Issued
Array ( [id] => 4946832 [patent_doc_number] => 20080302958 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-12-11 [patent_title] => 'Mass Spectrometer' [patent_app_type] => utility [patent_app_number] => 12/158603 [patent_app_country] => US [patent_app_date] => 2006-12-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 25 [patent_figures_cnt] => 25 [patent_no_of_words] => 19230 [patent_no_of_claims] => 34 [patent_no_of_ind_claims] => 17 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0302/20080302958.pdf [firstpage_image] =>[orig_patent_app_number] => 12158603 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/158603
Mass spectrometer Dec 20, 2006 Issued
Array ( [id] => 4756501 [patent_doc_number] => 20080308726 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-12-18 [patent_title] => 'Method for the Operation of a Measurement System With a Scanning Probe Microscope and a Measurement System' [patent_app_type] => utility [patent_app_number] => 12/160039 [patent_app_country] => US [patent_app_date] => 2006-12-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 6119 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0308/20080308726.pdf [firstpage_image] =>[orig_patent_app_number] => 12160039 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/160039
Method for the operation of a measurement system with a scanning probe microscope and a measurement system Dec 20, 2006 Issued
Array ( [id] => 4443349 [patent_doc_number] => 07928407 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-04-19 [patent_title] => 'Lithographic apparatus and device manufacturing method' [patent_app_type] => utility [patent_app_number] => 11/603228 [patent_app_country] => US [patent_app_date] => 2006-11-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 13 [patent_no_of_words] => 6879 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 64 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/928/07928407.pdf [firstpage_image] =>[orig_patent_app_number] => 11603228 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/603228
Lithographic apparatus and device manufacturing method Nov 21, 2006 Issued
Array ( [id] => 5092784 [patent_doc_number] => 20070114393 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-05-24 [patent_title] => 'Q-pole type mass spectrometer' [patent_app_type] => utility [patent_app_number] => 11/592330 [patent_app_country] => US [patent_app_date] => 2006-11-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 11669 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 14 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0114/20070114393.pdf [firstpage_image] =>[orig_patent_app_number] => 11592330 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/592330
Q-pole type mass spectrometer Nov 2, 2006 Abandoned
Array ( [id] => 5092778 [patent_doc_number] => 20070114387 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-05-24 [patent_title] => 'Matrix assisted laser desorption ionization (MALDI) support structures and methods of making MALDI support structures' [patent_app_type] => utility [patent_app_number] => 11/546610 [patent_app_country] => US [patent_app_date] => 2006-10-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4802 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0114/20070114387.pdf [firstpage_image] =>[orig_patent_app_number] => 11546610 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/546610
Matrix assisted laser desorption ionization (MALDI) support structures and methods of making MALDI support structures Oct 11, 2006 Abandoned
Array ( [id] => 6282236 [patent_doc_number] => 20100257641 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-10-07 [patent_title] => 'Real-time, active picometer-scale alignment, stabilization, and registration in one or more dimensions' [patent_app_type] => utility [patent_app_number] => 11/545498 [patent_app_country] => US [patent_app_date] => 2006-10-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 5891 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0257/20100257641.pdf [firstpage_image] =>[orig_patent_app_number] => 11545498 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/545498
Real-time, active picometer-scale alignment, stabilization, and registration in one or more dimensions Oct 10, 2006 Issued
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