
Andrew Yang
Examiner (ID: 19, Phone: (571)272-3472 , Office: P/3775 )
| Most Active Art Unit | 3775 |
| Art Unit(s) | 3733, 3775 |
| Total Applications | 1589 |
| Issued Applications | 1273 |
| Pending Applications | 126 |
| Abandoned Applications | 226 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 5790613
[patent_doc_number] => 20060011826
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-01-19
[patent_title] => 'Focal plane detector assembly of a mass spectrometer'
[patent_app_type] => utility
[patent_app_number] => 11/073426
[patent_app_country] => US
[patent_app_date] => 2005-03-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 4655
[patent_no_of_claims] => 33
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0011/20060011826.pdf
[firstpage_image] =>[orig_patent_app_number] => 11073426
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/073426 | Focal plane detector assembly of a mass spectrometer | Mar 3, 2005 | Issued |
Array
(
[id] => 5790617
[patent_doc_number] => 20060011829
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-01-19
[patent_title] => 'Gas chromatograph and mass spectrometer'
[patent_app_type] => utility
[patent_app_number] => 11/071992
[patent_app_country] => US
[patent_app_date] => 2005-03-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 4781
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0011/20060011829.pdf
[firstpage_image] =>[orig_patent_app_number] => 11071992
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/071992 | Gas chromatograph and mass spectrometer | Mar 3, 2005 | Abandoned |
Array
(
[id] => 7132653
[patent_doc_number] => 20050178958
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-08-18
[patent_title] => 'Mass spectrometer'
[patent_app_type] => utility
[patent_app_number] => 11/071370
[patent_app_country] => US
[patent_app_date] => 2005-03-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 5054
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0178/20050178958.pdf
[firstpage_image] =>[orig_patent_app_number] => 11071370
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/071370 | Mass spectrometer | Mar 3, 2005 | Abandoned |
Array
(
[id] => 605673
[patent_doc_number] => 07153037
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-12-26
[patent_title] => 'Multichannel optical communications module'
[patent_app_type] => utility
[patent_app_number] => 11/071517
[patent_app_country] => US
[patent_app_date] => 2005-03-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 17
[patent_figures_cnt] => 33
[patent_no_of_words] => 11684
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 80
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/153/07153037.pdf
[firstpage_image] =>[orig_patent_app_number] => 11071517
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/071517 | Multichannel optical communications module | Mar 1, 2005 | Issued |
Array
(
[id] => 7048141
[patent_doc_number] => 20050184028
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-08-25
[patent_title] => 'Probe tip processing'
[patent_app_type] => utility
[patent_app_number] => 11/064131
[patent_app_country] => US
[patent_app_date] => 2005-02-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 14
[patent_no_of_words] => 21426
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0184/20050184028.pdf
[firstpage_image] =>[orig_patent_app_number] => 11064131
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/064131 | Probe tip processing | Feb 22, 2005 | Abandoned |
Array
(
[id] => 911216
[patent_doc_number] => 07329879
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-02-12
[patent_title] => 'Apparatus for manipulation of ions and methods of making apparatus'
[patent_app_type] => utility
[patent_app_number] => 11/064036
[patent_app_country] => US
[patent_app_date] => 2005-02-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 29
[patent_figures_cnt] => 48
[patent_no_of_words] => 19194
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 83
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/329/07329879.pdf
[firstpage_image] =>[orig_patent_app_number] => 11064036
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/064036 | Apparatus for manipulation of ions and methods of making apparatus | Feb 21, 2005 | Issued |
Array
(
[id] => 6958588
[patent_doc_number] => 20050214958
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-09-29
[patent_title] => 'Electron beam apparatus, a device manufacturing method using the same apparatus, a pattern evaluation method, a device manufacturing method using the same method, and a resist pattern or processed wafer evaluation method'
[patent_app_type] => utility
[patent_app_number] => 11/058216
[patent_app_country] => US
[patent_app_date] => 2005-02-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 33
[patent_figures_cnt] => 33
[patent_no_of_words] => 41625
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 9
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0214/20050214958.pdf
[firstpage_image] =>[orig_patent_app_number] => 11058216
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/058216 | Electron beam apparatus, a device manufacturing method using the same apparatus, a pattern evaluation method, a device manufacturing method using the same method, and a resist pattern or processed wafer evaluation method | Feb 15, 2005 | Issued |
Array
(
[id] => 5520480
[patent_doc_number] => 20090028461
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-01-29
[patent_title] => 'IMAGING OF BURIED STRUCTURES'
[patent_app_type] => utility
[patent_app_number] => 10/598077
[patent_app_country] => US
[patent_app_date] => 2005-02-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 11
[patent_no_of_words] => 3649
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0028/20090028461.pdf
[firstpage_image] =>[orig_patent_app_number] => 10598077
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/598077 | Imaging of buried structures | Feb 14, 2005 | Issued |
Array
(
[id] => 590765
[patent_doc_number] => 07439529
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-10-21
[patent_title] => 'High current density ion source'
[patent_app_type] => utility
[patent_app_number] => 11/056418
[patent_app_country] => US
[patent_app_date] => 2005-02-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 8
[patent_no_of_words] => 4376
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 96
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/439/07439529.pdf
[firstpage_image] =>[orig_patent_app_number] => 11056418
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/056418 | High current density ion source | Feb 10, 2005 | Issued |
Array
(
[id] => 7185350
[patent_doc_number] => 20050191768
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-09-01
[patent_title] => 'Apparatus and method for measuring substrates'
[patent_app_type] => utility
[patent_app_number] => 11/054752
[patent_app_country] => US
[patent_app_date] => 2005-02-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 5821
[patent_no_of_claims] => 28
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0191/20050191768.pdf
[firstpage_image] =>[orig_patent_app_number] => 11054752
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/054752 | Apparatus and method for measuring substrates | Feb 8, 2005 | Abandoned |
Array
(
[id] => 7019183
[patent_doc_number] => 20050221202
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-10-06
[patent_title] => 'Wavelength filtering in nanolithography'
[patent_app_type] => utility
[patent_app_number] => 11/052336
[patent_app_country] => US
[patent_app_date] => 2005-02-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 2062
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0221/20050221202.pdf
[firstpage_image] =>[orig_patent_app_number] => 11052336
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/052336 | Wavelength filtering in nanolithography | Feb 6, 2005 | Abandoned |
Array
(
[id] => 6993957
[patent_doc_number] => 20050133733
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-06-23
[patent_title] => 'Electron beam system and method of manufacturing devices using the system'
[patent_app_type] => utility
[patent_app_number] => 11/034873
[patent_app_country] => US
[patent_app_date] => 2005-01-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
[patent_figures_cnt] => 15
[patent_no_of_words] => 14248
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0133/20050133733.pdf
[firstpage_image] =>[orig_patent_app_number] => 11034873
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/034873 | Electron beam system and method of manufacturing devices using the system | Jan 13, 2005 | Issued |
Array
(
[id] => 6909871
[patent_doc_number] => 20050173629
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-08-11
[patent_title] => 'Methods and apparatus for enhanced sample identification based on combined analytical techniques'
[patent_app_type] => utility
[patent_app_number] => 11/035800
[patent_app_country] => US
[patent_app_date] => 2005-01-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 96
[patent_figures_cnt] => 96
[patent_no_of_words] => 50422
[patent_no_of_claims] => 34
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0173/20050173629.pdf
[firstpage_image] =>[orig_patent_app_number] => 11035800
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/035800 | Methods and apparatus for enhanced sample identification based on combined analytical techniques | Jan 12, 2005 | Issued |
Array
(
[id] => 6589183
[patent_doc_number] => 20100001182
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-01-07
[patent_title] => 'Tandem differential mobility ion mobility spectrometer for chemical vapor detection'
[patent_app_type] => utility
[patent_app_number] => 11/033205
[patent_app_country] => US
[patent_app_date] => 2005-01-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 2982
[patent_no_of_claims] => 26
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0001/20100001182.pdf
[firstpage_image] =>[orig_patent_app_number] => 11033205
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/033205 | Tandem differential mobility ion mobility spectrometer for chemical vapor detection | Jan 10, 2005 | Issued |
Array
(
[id] => 888902
[patent_doc_number] => 07348555
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-03-25
[patent_title] => 'Apparatus and method for irradiating electron beam'
[patent_app_type] => utility
[patent_app_number] => 11/029810
[patent_app_country] => US
[patent_app_date] => 2005-01-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 11
[patent_no_of_words] => 6769
[patent_no_of_claims] => 23
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 206
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/348/07348555.pdf
[firstpage_image] =>[orig_patent_app_number] => 11029810
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/029810 | Apparatus and method for irradiating electron beam | Jan 3, 2005 | Issued |
Array
(
[id] => 613095
[patent_doc_number] => 07148494
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-12-12
[patent_title] => 'Level sensor, lithographic apparatus and device manufacturing method'
[patent_app_type] => utility
[patent_app_number] => 11/022593
[patent_app_country] => US
[patent_app_date] => 2004-12-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 15
[patent_no_of_words] => 9031
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 95
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/148/07148494.pdf
[firstpage_image] =>[orig_patent_app_number] => 11022593
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/022593 | Level sensor, lithographic apparatus and device manufacturing method | Dec 28, 2004 | Issued |
Array
(
[id] => 5653863
[patent_doc_number] => 20060139598
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-06-29
[patent_title] => 'Lithographic apparatus and device manufacturing method'
[patent_app_type] => utility
[patent_app_number] => 11/019524
[patent_app_country] => US
[patent_app_date] => 2004-12-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 10897
[patent_no_of_claims] => 27
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0139/20060139598.pdf
[firstpage_image] =>[orig_patent_app_number] => 11019524
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/019524 | Lithographic apparatus and device manufacturing method | Dec 22, 2004 | Issued |
Array
(
[id] => 869432
[patent_doc_number] => 07365309
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-04-29
[patent_title] => 'Mass spectrometer'
[patent_app_type] => utility
[patent_app_number] => 11/018086
[patent_app_country] => US
[patent_app_date] => 2004-12-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 14
[patent_no_of_words] => 8200
[patent_no_of_claims] => 33
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 145
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/365/07365309.pdf
[firstpage_image] =>[orig_patent_app_number] => 11018086
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/018086 | Mass spectrometer | Dec 20, 2004 | Issued |
Array
(
[id] => 484206
[patent_doc_number] => 07220970
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-05-22
[patent_title] => 'Process and device for measuring ions'
[patent_app_type] => utility
[patent_app_number] => 11/015405
[patent_app_country] => US
[patent_app_date] => 2004-12-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 2833
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 98
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/220/07220970.pdf
[firstpage_image] =>[orig_patent_app_number] => 11015405
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/015405 | Process and device for measuring ions | Dec 16, 2004 | Issued |
Array
(
[id] => 4486740
[patent_doc_number] => 07902498
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-03-08
[patent_title] => 'Methods and apparatus for enhanced ion based sample detection using selective pre-separation and amplification'
[patent_app_type] => utility
[patent_app_number] => 11/015413
[patent_app_country] => US
[patent_app_date] => 2004-12-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 82
[patent_figures_cnt] => 110
[patent_no_of_words] => 40166
[patent_no_of_claims] => 37
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 147
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/902/07902498.pdf
[firstpage_image] =>[orig_patent_app_number] => 11015413
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/015413 | Methods and apparatus for enhanced ion based sample detection using selective pre-separation and amplification | Dec 16, 2004 | Issued |