Search

Andrew Yang

Examiner (ID: 19, Phone: (571)272-3472 , Office: P/3775 )

Most Active Art Unit
3775
Art Unit(s)
3733, 3775
Total Applications
1589
Issued Applications
1273
Pending Applications
126
Abandoned Applications
226

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 7143849 [patent_doc_number] => 20040169142 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-09-02 [patent_title] => 'Method for analyzing organic material per microscopic area, and device for analysis per microscopic area' [patent_app_type] => new [patent_app_number] => 10/788163 [patent_app_country] => US [patent_app_date] => 2004-02-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 13102 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 71 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0169/20040169142.pdf [firstpage_image] =>[orig_patent_app_number] => 10788163 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/788163
Method for analyzing organic material per microscopic area, and device for analysis per microscopic area Feb 24, 2004 Abandoned
Array ( [id] => 4577658 [patent_doc_number] => 07825374 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-11-02 [patent_title] => 'Tandem time-of-flight mass spectrometer' [patent_app_type] => utility [patent_app_number] => 10/546323 [patent_app_country] => US [patent_app_date] => 2004-02-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 13 [patent_no_of_words] => 6697 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 172 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/825/07825374.pdf [firstpage_image] =>[orig_patent_app_number] => 10546323 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/546323
Tandem time-of-flight mass spectrometer Feb 22, 2004 Issued
Array ( [id] => 655594 [patent_doc_number] => 07109474 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-09-19 [patent_title] => 'Measuring ion number and detector gain' [patent_app_type] => utility [patent_app_number] => 10/783600 [patent_app_country] => US [patent_app_date] => 2004-02-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 9 [patent_no_of_words] => 8414 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 58 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/109/07109474.pdf [firstpage_image] =>[orig_patent_app_number] => 10783600 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/783600
Measuring ion number and detector gain Feb 19, 2004 Issued
Array ( [id] => 7314109 [patent_doc_number] => 20040222375 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-11-11 [patent_title] => 'Method of determining the concavity and convexity on sample surface, and charged particle beam apparatus' [patent_app_type] => new [patent_app_number] => 10/779749 [patent_app_country] => US [patent_app_date] => 2004-02-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2998 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 95 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0222/20040222375.pdf [firstpage_image] =>[orig_patent_app_number] => 10779749 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/779749
Method of determining the concavity and convexity on sample surface, and charged particle beam apparatus Feb 17, 2004 Abandoned
Array ( [id] => 759034 [patent_doc_number] => 07015481 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-03-21 [patent_title] => 'Charged-particle optical system' [patent_app_type] => utility [patent_app_number] => 10/778937 [patent_app_country] => US [patent_app_date] => 2004-02-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 11 [patent_no_of_words] => 16659 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 11 [patent_words_short_claim] => 96 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/015/07015481.pdf [firstpage_image] =>[orig_patent_app_number] => 10778937 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/778937
Charged-particle optical system Feb 12, 2004 Issued
Array ( [id] => 7420211 [patent_doc_number] => 20040183013 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-09-23 [patent_title] => 'Electron beam apparatus and method of manufacturing semiconductor device using the apparatus' [patent_app_type] => new [patent_app_number] => 10/766041 [patent_app_country] => US [patent_app_date] => 2004-01-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 59 [patent_figures_cnt] => 59 [patent_no_of_words] => 39870 [patent_no_of_claims] => 57 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 118 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0183/20040183013.pdf [firstpage_image] =>[orig_patent_app_number] => 10766041 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/766041
Electron beam apparatus and method of manufacturing semiconductor device using the apparatus Jan 28, 2004 Issued
Array ( [id] => 75049 [patent_doc_number] => 07750295 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-07-06 [patent_title] => 'Extractor for an microcolumn, an alignment method for an extractor aperture to an electron emitter, and a measuring method and an alignment method using thereof' [patent_app_type] => utility [patent_app_number] => 10/538284 [patent_app_country] => US [patent_app_date] => 2003-12-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 11 [patent_no_of_words] => 7339 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 118 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/750/07750295.pdf [firstpage_image] =>[orig_patent_app_number] => 10538284 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/538284
Extractor for an microcolumn, an alignment method for an extractor aperture to an electron emitter, and a measuring method and an alignment method using thereof Dec 29, 2003 Issued
Array ( [id] => 7362617 [patent_doc_number] => 20040217302 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-11-04 [patent_title] => 'Electron beam lithography system' [patent_app_type] => new [patent_app_number] => 10/750004 [patent_app_country] => US [patent_app_date] => 2003-12-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3056 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 99 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0217/20040217302.pdf [firstpage_image] =>[orig_patent_app_number] => 10750004 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/750004
Electron beam lithography system Dec 29, 2003 Abandoned
Array ( [id] => 453864 [patent_doc_number] => 07247866 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-07-24 [patent_title] => 'Contamination barrier with expandable lamellas' [patent_app_type] => utility [patent_app_number] => 10/743265 [patent_app_country] => US [patent_app_date] => 2003-12-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 7193 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 61 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/247/07247866.pdf [firstpage_image] =>[orig_patent_app_number] => 10743265 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/743265
Contamination barrier with expandable lamellas Dec 22, 2003 Issued
Array ( [id] => 23108 [patent_doc_number] => 07800079 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-09-21 [patent_title] => 'Assembly for detection of radiation flux and contamination of an optical component, lithographic apparatus including such an assembly and device manufacturing method' [patent_app_type] => utility [patent_app_number] => 10/740829 [patent_app_country] => US [patent_app_date] => 2003-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 14 [patent_no_of_words] => 5883 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 86 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/800/07800079.pdf [firstpage_image] =>[orig_patent_app_number] => 10740829 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/740829
Assembly for detection of radiation flux and contamination of an optical component, lithographic apparatus including such an assembly and device manufacturing method Dec 21, 2003 Issued
Array ( [id] => 7442918 [patent_doc_number] => 20040185644 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-09-23 [patent_title] => 'Method of manufacturing semiconductor device, semiconductor manufacturing apparatus, and stencil mask' [patent_app_type] => new [patent_app_number] => 10/738038 [patent_app_country] => US [patent_app_date] => 2003-12-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 7113 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 41 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0185/20040185644.pdf [firstpage_image] =>[orig_patent_app_number] => 10738038 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/738038
Method of manufacturing semiconductor device, semiconductor manufacturing apparatus, and stencil mask Dec 17, 2003 Issued
Array ( [id] => 225196 [patent_doc_number] => 07605381 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-10-20 [patent_title] => 'Charged particle beam alignment method and charged particle beam apparatus' [patent_app_type] => utility [patent_app_number] => 10/734261 [patent_app_country] => US [patent_app_date] => 2003-12-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 14 [patent_no_of_words] => 11683 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 242 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/605/07605381.pdf [firstpage_image] =>[orig_patent_app_number] => 10734261 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/734261
Charged particle beam alignment method and charged particle beam apparatus Dec 14, 2003 Issued
Array ( [id] => 5691578 [patent_doc_number] => 20060151723 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-07-13 [patent_title] => 'Infra-red source and gas sensor' [patent_app_type] => utility [patent_app_number] => 10/532332 [patent_app_country] => US [patent_app_date] => 2003-12-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3066 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0151/20060151723.pdf [firstpage_image] =>[orig_patent_app_number] => 10532332 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/532332
Infra-red source and gas sensor Dec 8, 2003 Issued
10/221377 Charged particle beam scanning device Nov 23, 2003 Abandoned
Array ( [id] => 7422967 [patent_doc_number] => 20040161076 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-08-19 [patent_title] => 'Radiation protection system' [patent_app_type] => new [patent_app_number] => 10/721032 [patent_app_country] => US [patent_app_date] => 2003-11-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 5230 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 206 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0161/20040161076.pdf [firstpage_image] =>[orig_patent_app_number] => 10721032 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/721032
Radiation protection system Nov 23, 2003 Issued
Array ( [id] => 7301117 [patent_doc_number] => 20040113094 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-06-17 [patent_title] => 'Bulk material irradiation system and method' [patent_app_type] => new [patent_app_number] => 10/718754 [patent_app_country] => US [patent_app_date] => 2003-11-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 19 [patent_no_of_words] => 13594 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 65 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0113/20040113094.pdf [firstpage_image] =>[orig_patent_app_number] => 10718754 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/718754
Bulk material irradiation system and method Nov 20, 2003 Issued
Array ( [id] => 5007952 [patent_doc_number] => 20070278429 [patent_country] => US [patent_kind] => A9 [patent_issue_date] => 2007-12-06 [patent_title] => 'High flux, high energy photon source' [patent_app_type] => utility [patent_app_number] => 10/703923 [patent_app_country] => US [patent_app_date] => 2003-11-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4110 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A9/0278/20070278429.pdf [firstpage_image] =>[orig_patent_app_number] => 10703923 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/703923
High flux, high energy photon source Nov 6, 2003 Issued
Array ( [id] => 5007952 [patent_doc_number] => 20070278429 [patent_country] => US [patent_kind] => A9 [patent_issue_date] => 2007-12-06 [patent_title] => 'High flux, high energy photon source' [patent_app_type] => utility [patent_app_number] => 10/703923 [patent_app_country] => US [patent_app_date] => 2003-11-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4110 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A9/0278/20070278429.pdf [firstpage_image] =>[orig_patent_app_number] => 10703923 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/703923
High flux, high energy photon source Nov 6, 2003 Issued
Array ( [id] => 7530710 [patent_doc_number] => 07842933 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-11-30 [patent_title] => 'System and method for measuring overlay errors' [patent_app_type] => utility [patent_app_number] => 10/691746 [patent_app_country] => US [patent_app_date] => 2003-10-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 9 [patent_no_of_words] => 3449 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 16 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/842/07842933.pdf [firstpage_image] =>[orig_patent_app_number] => 10691746 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/691746
System and method for measuring overlay errors Oct 21, 2003 Issued
Array ( [id] => 4569676 [patent_doc_number] => 07847267 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-12-07 [patent_title] => 'Scanning electron microscope having multiple detectors and a method for multiple detector based imaging' [patent_app_type] => utility [patent_app_number] => 10/502104 [patent_app_country] => US [patent_app_date] => 2003-10-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3086 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 258 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/847/07847267.pdf [firstpage_image] =>[orig_patent_app_number] => 10502104 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/502104
Scanning electron microscope having multiple detectors and a method for multiple detector based imaging Oct 21, 2003 Issued
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