
Andrew Yang
Examiner (ID: 19, Phone: (571)272-3472 , Office: P/3775 )
| Most Active Art Unit | 3775 |
| Art Unit(s) | 3733, 3775 |
| Total Applications | 1589 |
| Issued Applications | 1273 |
| Pending Applications | 126 |
| Abandoned Applications | 226 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 7143849
[patent_doc_number] => 20040169142
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-09-02
[patent_title] => 'Method for analyzing organic material per microscopic area, and device for analysis per microscopic area'
[patent_app_type] => new
[patent_app_number] => 10/788163
[patent_app_country] => US
[patent_app_date] => 2004-02-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 13102
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 71
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0169/20040169142.pdf
[firstpage_image] =>[orig_patent_app_number] => 10788163
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/788163 | Method for analyzing organic material per microscopic area, and device for analysis per microscopic area | Feb 24, 2004 | Abandoned |
Array
(
[id] => 4577658
[patent_doc_number] => 07825374
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-11-02
[patent_title] => 'Tandem time-of-flight mass spectrometer'
[patent_app_type] => utility
[patent_app_number] => 10/546323
[patent_app_country] => US
[patent_app_date] => 2004-02-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 13
[patent_no_of_words] => 6697
[patent_no_of_claims] => 30
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 172
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/825/07825374.pdf
[firstpage_image] =>[orig_patent_app_number] => 10546323
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/546323 | Tandem time-of-flight mass spectrometer | Feb 22, 2004 | Issued |
Array
(
[id] => 655594
[patent_doc_number] => 07109474
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-09-19
[patent_title] => 'Measuring ion number and detector gain'
[patent_app_type] => utility
[patent_app_number] => 10/783600
[patent_app_country] => US
[patent_app_date] => 2004-02-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 9
[patent_no_of_words] => 8414
[patent_no_of_claims] => 30
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 58
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/109/07109474.pdf
[firstpage_image] =>[orig_patent_app_number] => 10783600
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/783600 | Measuring ion number and detector gain | Feb 19, 2004 | Issued |
Array
(
[id] => 7314109
[patent_doc_number] => 20040222375
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-11-11
[patent_title] => 'Method of determining the concavity and convexity on sample surface, and charged particle beam apparatus'
[patent_app_type] => new
[patent_app_number] => 10/779749
[patent_app_country] => US
[patent_app_date] => 2004-02-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 2998
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 95
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0222/20040222375.pdf
[firstpage_image] =>[orig_patent_app_number] => 10779749
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/779749 | Method of determining the concavity and convexity on sample surface, and charged particle beam apparatus | Feb 17, 2004 | Abandoned |
Array
(
[id] => 759034
[patent_doc_number] => 07015481
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-03-21
[patent_title] => 'Charged-particle optical system'
[patent_app_type] => utility
[patent_app_number] => 10/778937
[patent_app_country] => US
[patent_app_date] => 2004-02-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 11
[patent_no_of_words] => 16659
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 11
[patent_words_short_claim] => 96
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/015/07015481.pdf
[firstpage_image] =>[orig_patent_app_number] => 10778937
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/778937 | Charged-particle optical system | Feb 12, 2004 | Issued |
Array
(
[id] => 7420211
[patent_doc_number] => 20040183013
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-09-23
[patent_title] => 'Electron beam apparatus and method of manufacturing semiconductor device using the apparatus'
[patent_app_type] => new
[patent_app_number] => 10/766041
[patent_app_country] => US
[patent_app_date] => 2004-01-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 59
[patent_figures_cnt] => 59
[patent_no_of_words] => 39870
[patent_no_of_claims] => 57
[patent_no_of_ind_claims] => 2
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[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0183/20040183013.pdf
[firstpage_image] =>[orig_patent_app_number] => 10766041
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/766041 | Electron beam apparatus and method of manufacturing semiconductor device using the apparatus | Jan 28, 2004 | Issued |
Array
(
[id] => 75049
[patent_doc_number] => 07750295
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-07-06
[patent_title] => 'Extractor for an microcolumn, an alignment method for an extractor aperture to an electron emitter, and a measuring method and an alignment method using thereof'
[patent_app_type] => utility
[patent_app_number] => 10/538284
[patent_app_country] => US
[patent_app_date] => 2003-12-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 11
[patent_no_of_words] => 7339
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 118
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/750/07750295.pdf
[firstpage_image] =>[orig_patent_app_number] => 10538284
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/538284 | Extractor for an microcolumn, an alignment method for an extractor aperture to an electron emitter, and a measuring method and an alignment method using thereof | Dec 29, 2003 | Issued |
Array
(
[id] => 7362617
[patent_doc_number] => 20040217302
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-11-04
[patent_title] => 'Electron beam lithography system'
[patent_app_type] => new
[patent_app_number] => 10/750004
[patent_app_country] => US
[patent_app_date] => 2003-12-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 3056
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 99
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0217/20040217302.pdf
[firstpage_image] =>[orig_patent_app_number] => 10750004
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/750004 | Electron beam lithography system | Dec 29, 2003 | Abandoned |
Array
(
[id] => 453864
[patent_doc_number] => 07247866
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-07-24
[patent_title] => 'Contamination barrier with expandable lamellas'
[patent_app_type] => utility
[patent_app_number] => 10/743265
[patent_app_country] => US
[patent_app_date] => 2003-12-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 8
[patent_no_of_words] => 7193
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 7
[patent_words_short_claim] => 61
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/247/07247866.pdf
[firstpage_image] =>[orig_patent_app_number] => 10743265
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/743265 | Contamination barrier with expandable lamellas | Dec 22, 2003 | Issued |
Array
(
[id] => 23108
[patent_doc_number] => 07800079
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-09-21
[patent_title] => 'Assembly for detection of radiation flux and contamination of an optical component, lithographic apparatus including such an assembly and device manufacturing method'
[patent_app_type] => utility
[patent_app_number] => 10/740829
[patent_app_country] => US
[patent_app_date] => 2003-12-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 14
[patent_no_of_words] => 5883
[patent_no_of_claims] => 25
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 86
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/800/07800079.pdf
[firstpage_image] =>[orig_patent_app_number] => 10740829
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/740829 | Assembly for detection of radiation flux and contamination of an optical component, lithographic apparatus including such an assembly and device manufacturing method | Dec 21, 2003 | Issued |
Array
(
[id] => 7442918
[patent_doc_number] => 20040185644
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-09-23
[patent_title] => 'Method of manufacturing semiconductor device, semiconductor manufacturing apparatus, and stencil mask'
[patent_app_type] => new
[patent_app_number] => 10/738038
[patent_app_country] => US
[patent_app_date] => 2003-12-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 7113
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 7
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0185/20040185644.pdf
[firstpage_image] =>[orig_patent_app_number] => 10738038
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/738038 | Method of manufacturing semiconductor device, semiconductor manufacturing apparatus, and stencil mask | Dec 17, 2003 | Issued |
Array
(
[id] => 225196
[patent_doc_number] => 07605381
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-10-20
[patent_title] => 'Charged particle beam alignment method and charged particle beam apparatus'
[patent_app_type] => utility
[patent_app_number] => 10/734261
[patent_app_country] => US
[patent_app_date] => 2003-12-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
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[pdf_file] => patents/07/605/07605381.pdf
[firstpage_image] =>[orig_patent_app_number] => 10734261
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/734261 | Charged particle beam alignment method and charged particle beam apparatus | Dec 14, 2003 | Issued |
Array
(
[id] => 5691578
[patent_doc_number] => 20060151723
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-07-13
[patent_title] => 'Infra-red source and gas sensor'
[patent_app_type] => utility
[patent_app_number] => 10/532332
[patent_app_country] => US
[patent_app_date] => 2003-12-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 3066
[patent_no_of_claims] => 7
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0151/20060151723.pdf
[firstpage_image] =>[orig_patent_app_number] => 10532332
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/532332 | Infra-red source and gas sensor | Dec 8, 2003 | Issued |
| 10/221377 | Charged particle beam scanning device | Nov 23, 2003 | Abandoned |
Array
(
[id] => 7422967
[patent_doc_number] => 20040161076
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-08-19
[patent_title] => 'Radiation protection system'
[patent_app_type] => new
[patent_app_number] => 10/721032
[patent_app_country] => US
[patent_app_date] => 2003-11-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 5230
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0161/20040161076.pdf
[firstpage_image] =>[orig_patent_app_number] => 10721032
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/721032 | Radiation protection system | Nov 23, 2003 | Issued |
Array
(
[id] => 7301117
[patent_doc_number] => 20040113094
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-06-17
[patent_title] => 'Bulk material irradiation system and method'
[patent_app_type] => new
[patent_app_number] => 10/718754
[patent_app_country] => US
[patent_app_date] => 2003-11-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 19
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[pdf_file] => publications/A1/0113/20040113094.pdf
[firstpage_image] =>[orig_patent_app_number] => 10718754
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/718754 | Bulk material irradiation system and method | Nov 20, 2003 | Issued |
Array
(
[id] => 5007952
[patent_doc_number] => 20070278429
[patent_country] => US
[patent_kind] => A9
[patent_issue_date] => 2007-12-06
[patent_title] => 'High flux, high energy photon source'
[patent_app_type] => utility
[patent_app_number] => 10/703923
[patent_app_country] => US
[patent_app_date] => 2003-11-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A9/0278/20070278429.pdf
[firstpage_image] =>[orig_patent_app_number] => 10703923
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/703923 | High flux, high energy photon source | Nov 6, 2003 | Issued |
Array
(
[id] => 5007952
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/703923 | High flux, high energy photon source | Nov 6, 2003 | Issued |
Array
(
[id] => 7530710
[patent_doc_number] => 07842933
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[patent_kind] => B2
[patent_issue_date] => 2010-11-30
[patent_title] => 'System and method for measuring overlay errors'
[patent_app_type] => utility
[patent_app_number] => 10/691746
[patent_app_country] => US
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[pdf_file] => patents/07/842/07842933.pdf
[firstpage_image] =>[orig_patent_app_number] => 10691746
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/691746 | System and method for measuring overlay errors | Oct 21, 2003 | Issued |
Array
(
[id] => 4569676
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[patent_issue_date] => 2010-12-07
[patent_title] => 'Scanning electron microscope having multiple detectors and a method for multiple detector based imaging'
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[patent_app_number] => 10/502104
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[pdf_file] => patents/07/847/07847267.pdf
[firstpage_image] =>[orig_patent_app_number] => 10502104
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/502104 | Scanning electron microscope having multiple detectors and a method for multiple detector based imaging | Oct 21, 2003 | Issued |