
Andrew Yang
Examiner (ID: 19, Phone: (571)272-3472 , Office: P/3775 )
| Most Active Art Unit | 3775 |
| Art Unit(s) | 3733, 3775 |
| Total Applications | 1589 |
| Issued Applications | 1273 |
| Pending Applications | 126 |
| Abandoned Applications | 226 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 7295719
[patent_doc_number] => 20040124374
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-07-01
[patent_title] => 'Amorphous composition for high level radiation and environmental protection'
[patent_app_type] => new
[patent_app_number] => 10/346680
[patent_app_country] => US
[patent_app_date] => 2003-01-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 6090
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[pdf_file] => publications/A1/0124/20040124374.pdf
[firstpage_image] =>[orig_patent_app_number] => 10346680
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/346680 | Amorphous composition for high level radiation and environmental protection | Jan 15, 2003 | Abandoned |
Array
(
[id] => 7066911
[patent_doc_number] => 20050242293
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-11-03
[patent_title] => 'Mounting mechanism for plasma extraction aperture'
[patent_app_type] => utility
[patent_app_number] => 10/395720
[patent_app_country] => US
[patent_app_date] => 2003-01-07
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[firstpage_image] =>[orig_patent_app_number] => 10395720
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/395720 | Mounting mechanism for plasma extraction aperture | Jan 6, 2003 | Abandoned |
Array
(
[id] => 1171656
[patent_doc_number] => 06753525
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2004-06-22
[patent_title] => 'Materials analysis using backscatter electron emissions'
[patent_app_type] => B1
[patent_app_number] => 10/335274
[patent_app_country] => US
[patent_app_date] => 2002-12-31
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/335274 | Materials analysis using backscatter electron emissions | Dec 30, 2002 | Issued |
Array
(
[id] => 1066105
[patent_doc_number] => 06847044
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2005-01-25
[patent_title] => 'Electrical discharge gas plasma EUV source insulator components'
[patent_app_type] => utility
[patent_app_number] => 10/335094
[patent_app_country] => US
[patent_app_date] => 2002-12-31
[patent_effective_date] => 0000-00-00
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/335094 | Electrical discharge gas plasma EUV source insulator components | Dec 30, 2002 | Issued |
Array
(
[id] => 975880
[patent_doc_number] => 06933497
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2005-08-23
[patent_title] => 'Time-of-flight mass analyzer with multiple flight paths'
[patent_app_type] => utility
[patent_app_number] => 10/327471
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[patent_app_date] => 2002-12-20
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[pdf_file] => patents/06/933/06933497.pdf
[firstpage_image] =>[orig_patent_app_number] => 10327471
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/327471 | Time-of-flight mass analyzer with multiple flight paths | Dec 19, 2002 | Issued |
Array
(
[id] => 6785664
[patent_doc_number] => 20030136903
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-07-24
[patent_title] => 'Time-of-flight mass spectrometers with orthogonal ion injection'
[patent_app_type] => new
[patent_app_number] => 10/316173
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/316173 | Time-of-flight mass spectrometers with orthogonal ion injection | Dec 9, 2002 | Issued |
Array
(
[id] => 996800
[patent_doc_number] => 06914242
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2005-07-05
[patent_title] => 'Time of flight ion trap tandem mass spectrometer system'
[patent_app_type] => utility
[patent_app_number] => 10/314409
[patent_app_country] => US
[patent_app_date] => 2002-12-06
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[pdf_file] => patents/06/914/06914242.pdf
[firstpage_image] =>[orig_patent_app_number] => 10314409
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/314409 | Time of flight ion trap tandem mass spectrometer system | Dec 5, 2002 | Issued |
Array
(
[id] => 7461991
[patent_doc_number] => 20040101226
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-05-27
[patent_title] => 'Magnet isolator with integrated focusing apparatus'
[patent_app_type] => new
[patent_app_number] => 10/306486
[patent_app_country] => US
[patent_app_date] => 2002-11-26
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[pdf_file] => publications/A1/0101/20040101226.pdf
[firstpage_image] =>[orig_patent_app_number] => 10306486
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/306486 | Magnet isolator with integrated focusing apparatus | Nov 25, 2002 | Abandoned |
Array
(
[id] => 680964
[patent_doc_number] => 07084406
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[patent_kind] => B2
[patent_issue_date] => 2006-08-01
[patent_title] => 'Detector arrangement and detection method'
[patent_app_type] => utility
[patent_app_number] => 10/294609
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[firstpage_image] =>[orig_patent_app_number] => 10294609
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/294609 | Detector arrangement and detection method | Nov 14, 2002 | Issued |
Array
(
[id] => 7360540
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[patent_issue_date] => 2004-05-13
[patent_title] => 'System, probe and methods for colorimetric testing'
[patent_app_type] => new
[patent_app_number] => 10/293896
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[patent_app_date] => 2002-11-12
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[pdf_file] => publications/A1/0091/20040091212.pdf
[firstpage_image] =>[orig_patent_app_number] => 10293896
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/293896 | System, probe and methods for colorimetric testing | Nov 11, 2002 | Issued |
Array
(
[id] => 7378666
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[patent_title] => 'Method and apparatus for modulating an optical beam with a ring resonator having a charge modulated region'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/280397 | Method and apparatus for modulating an optical beam with a ring resonator having a charge modulated region | Oct 24, 2002 | Abandoned |
Array
(
[id] => 705565
[patent_doc_number] => 07065271
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[patent_issue_date] => 2006-06-20
[patent_title] => 'Optical grating coupler'
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Array
(
[id] => 585410
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[patent_issue_date] => 2008-11-11
[patent_title] => 'System and method for depth profiling and characterization of thin films'
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Array
(
[id] => 483642
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[patent_title] => 'Radiation-free optical cavity'
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[firstpage_image] =>[orig_patent_app_number] => 10279777
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/279777 | Radiation-free optical cavity | Oct 23, 2002 | Issued |
Array
(
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[patent_title] => 'Method and apparatus for correcting spherical aberration of an electron beam'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/065489 | Method and apparatus for correcting spherical aberration of an electron beam | Oct 22, 2002 | Abandoned |
Array
(
[id] => 7378730
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[patent_kind] => A1
[patent_issue_date] => 2004-04-29
[patent_title] => 'Optical fiber array collimator'
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Array
(
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Array
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Array
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Array
(
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/265767 | Control method and device for optical filter | Oct 7, 2002 | Issued |