
Andrew Yang
Examiner (ID: 19, Phone: (571)272-3472 , Office: P/3775 )
| Most Active Art Unit | 3775 |
| Art Unit(s) | 3733, 3775 |
| Total Applications | 1589 |
| Issued Applications | 1273 |
| Pending Applications | 126 |
| Abandoned Applications | 226 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 1309616
[patent_doc_number] => 06617589
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2003-09-09
[patent_title] => 'Repair apparatus for a vehicle'
[patent_app_type] => B2
[patent_app_number] => 09/958086
[patent_app_country] => US
[patent_app_date] => 2001-10-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 13
[patent_no_of_words] => 7378
[patent_no_of_claims] => 14
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[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/617/06617589.pdf
[firstpage_image] =>[orig_patent_app_number] => 09958086
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/958086 | Repair apparatus for a vehicle | Oct 3, 2001 | Issued |
Array
(
[id] => 1237058
[patent_doc_number] => 06690020
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2004-02-10
[patent_title] => 'Compact self-shielded irradiation system and method'
[patent_app_type] => B2
[patent_app_number] => 09/971986
[patent_app_country] => US
[patent_app_date] => 2001-10-04
[patent_effective_date] => 0000-00-00
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/690/06690020.pdf
[firstpage_image] =>[orig_patent_app_number] => 09971986
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/971986 | Compact self-shielded irradiation system and method | Oct 3, 2001 | Issued |
Array
(
[id] => 1266269
[patent_doc_number] => 06660999
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2003-12-09
[patent_title] => 'Helium droplet mass spectrometry (HDMS)'
[patent_app_type] => B2
[patent_app_number] => 09/965900
[patent_app_country] => US
[patent_app_date] => 2001-09-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/965900 | Helium droplet mass spectrometry (HDMS) | Sep 27, 2001 | Issued |
Array
(
[id] => 7376475
[patent_doc_number] => 20040028175
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-02-12
[patent_title] => 'Illumination system particularly for microlithography'
[patent_app_type] => new
[patent_app_number] => 10/381945
[patent_app_country] => US
[patent_app_date] => 2003-08-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
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[pdf_file] => publications/A1/0028/20040028175.pdf
[firstpage_image] =>[orig_patent_app_number] => 10381945
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/381945 | Illumination system particularly for microlithography | Sep 27, 2001 | Issued |
Array
(
[id] => 1181822
[patent_doc_number] => 06740876
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2004-05-25
[patent_title] => 'Scanning probe microscope'
[patent_app_type] => B2
[patent_app_number] => 09/966719
[patent_app_country] => US
[patent_app_date] => 2001-09-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
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[patent_no_of_words] => 3350
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[pdf_file] => patents/06/740/06740876.pdf
[firstpage_image] =>[orig_patent_app_number] => 09966719
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/966719 | Scanning probe microscope | Sep 26, 2001 | Issued |
Array
(
[id] => 5812953
[patent_doc_number] => 20020038853
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[patent_kind] => A1
[patent_issue_date] => 2002-04-04
[patent_title] => 'Electron beam exposure apparatus'
[patent_app_type] => new
[patent_app_number] => 09/965399
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[firstpage_image] =>[orig_patent_app_number] => 09965399
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/965399 | Electron beam exposure apparatus | Sep 25, 2001 | Abandoned |
Array
(
[id] => 1276417
[patent_doc_number] => 06649908
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2003-11-18
[patent_title] => 'Multiplexing capillary array for atmospheric pressure ionization-mass spectrometry'
[patent_app_type] => B2
[patent_app_number] => 09/960890
[patent_app_country] => US
[patent_app_date] => 2001-09-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[patent_no_of_words] => 4518
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/649/06649908.pdf
[firstpage_image] =>[orig_patent_app_number] => 09960890
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/960890 | Multiplexing capillary array for atmospheric pressure ionization-mass spectrometry | Sep 19, 2001 | Issued |
Array
(
[id] => 1237003
[patent_doc_number] => 06690008
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2004-02-10
[patent_title] => 'Probe and method of manufacturing mounted AFM probes'
[patent_app_type] => B2
[patent_app_number] => 09/954681
[patent_app_country] => US
[patent_app_date] => 2001-09-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
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[pdf_file] => patents/06/690/06690008.pdf
[firstpage_image] =>[orig_patent_app_number] => 09954681
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/954681 | Probe and method of manufacturing mounted AFM probes | Sep 13, 2001 | Issued |
Array
(
[id] => 6727595
[patent_doc_number] => 20030183785
[patent_country] => US
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[patent_issue_date] => 2003-10-02
[patent_title] => 'Radiation source and device'
[patent_app_type] => new
[patent_app_number] => 10/380996
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[pdf_file] => publications/A1/0183/20030183785.pdf
[firstpage_image] =>[orig_patent_app_number] => 10380996
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/380996 | Radiation source and device | Sep 11, 2001 | Issued |
Array
(
[id] => 5996992
[patent_doc_number] => 20020027204
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[patent_issue_date] => 2002-03-07
[patent_title] => 'Electron beam exposure apparatus, device for shaping a beam of charged particles and method for manufacturing the device'
[patent_app_type] => new
[patent_app_number] => 09/946395
[patent_app_country] => US
[patent_app_date] => 2001-09-04
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[pdf_file] => publications/A1/0027/20020027204.pdf
[firstpage_image] =>[orig_patent_app_number] => 09946395
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/946395 | Electron beam exposure apparatus, device for shaping a beam of charged particles and method for manufacturing the device | Sep 3, 2001 | Abandoned |
Array
(
[id] => 6426570
[patent_doc_number] => 20020175279
[patent_country] => US
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[patent_issue_date] => 2002-11-28
[patent_title] => 'Method of mass spectrometry, to enhance separation of ions with different charges'
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[firstpage_image] =>[orig_patent_app_number] => 09942586
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/942586 | Method of mass spectrometry, to enhance separation of ions with different charges | Aug 30, 2001 | Issued |
Array
(
[id] => 7623568
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[patent_title] => 'Substrate rotating device, and manufacturing method and apparatus of recording medium master'
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Array
(
[id] => 6747911
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[patent_title] => 'Fuse and anti-fuse concept using a focused ion beam writing technique'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/941287 | Fuse and anti-fuse concept using a focused ion beam writing technique | Aug 27, 2001 | Abandoned |
Array
(
[id] => 6474852
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[patent_title] => 'Electron-beam drawing appraratus electron-beam drawing method'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/935185 | Electron-beam drawing appraratus electron-beam drawing method | Aug 21, 2001 | Abandoned |
Array
(
[id] => 6474839
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[patent_title] => 'Mask defect checking method and device for electron beam exposure'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/933785 | Mask defect checking method and device for electron beam exposure | Aug 19, 2001 | Abandoned |
| 09/913892 | HOLDER FOR RADIOACTIVE SUBSTANCES | Aug 19, 2001 | Abandoned |
Array
(
[id] => 6713727
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[patent_title] => 'Scanning confocal electron microscope'
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Array
(
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Array
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Array
(
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