
Andy Ho
Examiner (ID: 5607, Phone: (571)272-3762 , Office: P/2194 )
| Most Active Art Unit | 2194 |
| Art Unit(s) | 2126, 2194, 2151 |
| Total Applications | 1669 |
| Issued Applications | 1447 |
| Pending Applications | 77 |
| Abandoned Applications | 165 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 2738925
[patent_doc_number] => 05051690
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1991-09-24
[patent_title] => 'Apparatus and method for detecting vertically propagated defects in integrated circuits'
[patent_app_type] => 1
[patent_app_number] => 7/357546
[patent_app_country] => US
[patent_app_date] => 1989-05-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 24
[patent_no_of_words] => 8290
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 257
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/051/05051690.pdf
[firstpage_image] =>[orig_patent_app_number] => 357546
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/357546 | Apparatus and method for detecting vertically propagated defects in integrated circuits | May 25, 1989 | Issued |
Array
(
[id] => 2698330
[patent_doc_number] => 05019772
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1991-05-28
[patent_title] => 'Test selection techniques'
[patent_app_type] => 1
[patent_app_number] => 7/355589
[patent_app_country] => US
[patent_app_date] => 1989-05-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[patent_no_of_words] => 4175
[patent_no_of_claims] => 25
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/019/05019772.pdf
[firstpage_image] =>[orig_patent_app_number] => 355589
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/355589 | Test selection techniques | May 22, 1989 | Issued |
Array
(
[id] => 2751937
[patent_doc_number] => 05015943
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1991-05-14
[patent_title] => 'High power, high sensitivity microwave calorimeter'
[patent_app_type] => 1
[patent_app_number] => 7/354559
[patent_app_country] => US
[patent_app_date] => 1989-05-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[patent_no_of_words] => 2914
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[pdf_file] => patents/05/015/05015943.pdf
[firstpage_image] =>[orig_patent_app_number] => 354559
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/354559 | High power, high sensitivity microwave calorimeter | May 21, 1989 | Issued |
Array
(
[id] => 2754053
[patent_doc_number] => 05030907
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1991-07-09
[patent_title] => 'CAD driven microprobe integrated circuit tester'
[patent_app_type] => 1
[patent_app_number] => 7/354268
[patent_app_country] => US
[patent_app_date] => 1989-05-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
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[patent_no_of_words] => 7751
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[pdf_file] => patents/05/030/05030907.pdf
[firstpage_image] =>[orig_patent_app_number] => 354268
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/354268 | CAD driven microprobe integrated circuit tester | May 18, 1989 | Issued |
Array
(
[id] => 2638914
[patent_doc_number] => 04952872
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1990-08-28
[patent_title] => 'Apparatus for electrically testing printed circuit boards having contact pads in an extremely fine grid'
[patent_app_type] => 1
[patent_app_number] => 7/354225
[patent_app_country] => US
[patent_app_date] => 1989-05-19
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/04/952/04952872.pdf
[firstpage_image] =>[orig_patent_app_number] => 354225
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/354225 | Apparatus for electrically testing printed circuit boards having contact pads in an extremely fine grid | May 18, 1989 | Issued |
Array
(
[id] => 2775552
[patent_doc_number] => 04985673
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1991-01-15
[patent_title] => 'Method and system for inspecting plural semiconductor devices'
[patent_app_type] => 1
[patent_app_number] => 7/353764
[patent_app_country] => US
[patent_app_date] => 1989-05-18
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[pdf_file] => patents/04/985/04985673.pdf
[firstpage_image] =>[orig_patent_app_number] => 353764
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/353764 | Method and system for inspecting plural semiconductor devices | May 17, 1989 | Issued |
Array
(
[id] => 2631738
[patent_doc_number] => 04967146
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1990-10-30
[patent_title] => 'Semiconductor chip production and testing processes'
[patent_app_type] => 1
[patent_app_number] => 7/351638
[patent_app_country] => US
[patent_app_date] => 1989-05-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/967/04967146.pdf
[firstpage_image] =>[orig_patent_app_number] => 351638
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/351638 | Semiconductor chip production and testing processes | May 14, 1989 | Issued |
Array
(
[id] => 2711477
[patent_doc_number] => 05068603
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1991-11-26
[patent_title] => 'Structure and method for producing mask-programmed integrated circuits which are pin compatible substitutes for memory-configured logic arrays'
[patent_app_type] => 1
[patent_app_number] => 7/351888
[patent_app_country] => US
[patent_app_date] => 1989-05-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 42
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[patent_no_of_words] => 22375
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[pdf_file] => patents/05/068/05068603.pdf
[firstpage_image] =>[orig_patent_app_number] => 351888
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/351888 | Structure and method for producing mask-programmed integrated circuits which are pin compatible substitutes for memory-configured logic arrays | May 14, 1989 | Issued |
Array
(
[id] => 2939546
[patent_doc_number] => 05220280
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1993-06-15
[patent_title] => 'Method and an apparatus for testing the assembly of a plurality of electrical components on a substrate'
[patent_app_type] => 1
[patent_app_number] => 7/350489
[patent_app_country] => US
[patent_app_date] => 1989-05-11
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/220/05220280.pdf
[firstpage_image] =>[orig_patent_app_number] => 350489
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/350489 | Method and an apparatus for testing the assembly of a plurality of electrical components on a substrate | May 10, 1989 | Issued |
Array
(
[id] => 2692329
[patent_doc_number] => 05049812
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1991-09-17
[patent_title] => 'Device for the electric characterization of samples and application to electric mapping of large area semiconductor samples'
[patent_app_type] => 1
[patent_app_number] => 7/490558
[patent_app_country] => US
[patent_app_date] => 1989-05-09
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/049/05049812.pdf
[firstpage_image] =>[orig_patent_app_number] => 490558
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/490558 | Device for the electric characterization of samples and application to electric mapping of large area semiconductor samples | May 8, 1989 | Issued |
Array
(
[id] => 2593118
[patent_doc_number] => 04928059
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1990-05-22
[patent_title] => 'Sinusoidal current sense and scaling circuit'
[patent_app_type] => 1
[patent_app_number] => 7/345939
[patent_app_country] => US
[patent_app_date] => 1989-05-01
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/04/928/04928059.pdf
[firstpage_image] =>[orig_patent_app_number] => 345939
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/345939 | Sinusoidal current sense and scaling circuit | Apr 30, 1989 | Issued |
Array
(
[id] => 2673962
[patent_doc_number] => 04999571
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1991-03-12
[patent_title] => 'Current and/or voltage detector for a distribution system'
[patent_app_type] => 1
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[patent_app_date] => 1989-04-20
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[firstpage_image] =>[orig_patent_app_number] => 340934
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/340934 | Current and/or voltage detector for a distribution system | Apr 19, 1989 | Issued |
Array
(
[id] => 2603204
[patent_doc_number] => 04922196
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1990-05-01
[patent_title] => 'Beam-blanking apparatus for stroboscopic electron beam instruments'
[patent_app_type] => 1
[patent_app_number] => 7/342629
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[patent_app_date] => 1989-04-19
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[pdf_file] => patents/04/922/04922196.pdf
[firstpage_image] =>[orig_patent_app_number] => 342629
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/342629 | Beam-blanking apparatus for stroboscopic electron beam instruments | Apr 18, 1989 | Issued |
Array
(
[id] => 2712210
[patent_doc_number] => 05014002
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1991-05-07
[patent_title] => 'ATE jumper programmable interface board'
[patent_app_type] => 1
[patent_app_number] => 7/340109
[patent_app_country] => US
[patent_app_date] => 1989-04-18
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/014/05014002.pdf
[firstpage_image] =>[orig_patent_app_number] => 340109
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/340109 | ATE jumper programmable interface board | Apr 17, 1989 | Issued |
Array
(
[id] => 2573709
[patent_doc_number] => 04901010
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1990-02-13
[patent_title] => 'Current-measuring device'
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[pdf_file] => patents/04/901/04901010.pdf
[firstpage_image] =>[orig_patent_app_number] => 338050
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/338050 | Current-measuring device | Apr 12, 1989 | Issued |
Array
(
[id] => 2771401
[patent_doc_number] => 05006792
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1991-04-09
[patent_title] => 'Flip-chip test socket adaptor and method'
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[pdf_file] => patents/05/006/05006792.pdf
[firstpage_image] =>[orig_patent_app_number] => 330839
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/330839 | Flip-chip test socket adaptor and method | Mar 29, 1989 | Issued |
Array
(
[id] => 2634118
[patent_doc_number] => 04916386
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[patent_issue_date] => 1990-04-10
[patent_title] => 'Microwave wattage indicator'
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[pdf_file] => patents/04/916/04916386.pdf
[firstpage_image] =>[orig_patent_app_number] => 325918
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/325918 | Microwave wattage indicator | Mar 19, 1989 | Issued |
Array
(
[id] => 2721944
[patent_doc_number] => 05008611
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[patent_issue_date] => 1991-04-16
[patent_title] => 'Method of eliminating the effects of birefringence from the detection of electric current using Faraday rotation'
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[pdf_file] => patents/05/008/05008611.pdf
[firstpage_image] =>[orig_patent_app_number] => 323599
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Array
(
[id] => 2761132
[patent_doc_number] => 05043655
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[patent_issue_date] => 1991-08-27
[patent_title] => 'Current sensing buffer for digital signal line testing'
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[pdf_file] => patents/05/043/05043655.pdf
[firstpage_image] =>[orig_patent_app_number] => 323938
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/323938 | Current sensing buffer for digital signal line testing | Mar 13, 1989 | Issued |
Array
(
[id] => 2522696
[patent_doc_number] => 04870356
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[pdf_file] => patents/04/870/04870356.pdf
[firstpage_image] =>[orig_patent_app_number] => 320926
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/320926 | Multi-component test fixture | Mar 7, 1989 | Issued |