| Application number | Title of the application | Filing Date | Status |
|---|
Array
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[patent_kind] => NA
[patent_issue_date] => 1990-03-20
[patent_title] => 'Non-intrusive current measuring circuit'
[patent_app_type] => 1
[patent_app_number] => 7/318869
[patent_app_country] => US
[patent_app_date] => 1989-03-06
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[rel_patent_id] =>[rel_patent_doc_number] =>) 07/318869 | Non-intrusive current measuring circuit | Mar 5, 1989 | Issued |
Array
(
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[patent_doc_number] => 05003253
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1991-03-26
[patent_title] => 'Millimeter-wave active probe system'
[patent_app_type] => 1
[patent_app_number] => 7/318744
[patent_app_country] => US
[patent_app_date] => 1989-03-03
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[firstpage_image] =>[orig_patent_app_number] => 318744
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/318744 | Millimeter-wave active probe system | Mar 2, 1989 | Issued |
Array
(
[id] => 2607553
[patent_doc_number] => 04912402
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1990-03-27
[patent_title] => 'Fixture for measuring the static characteristics of microwave three-terminal active components'
[patent_app_type] => 1
[patent_app_number] => 7/316409
[patent_app_country] => US
[patent_app_date] => 1989-02-27
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/04/912/04912402.pdf
[firstpage_image] =>[orig_patent_app_number] => 316409
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/316409 | Fixture for measuring the static characteristics of microwave three-terminal active components | Feb 26, 1989 | Issued |
| 07/314898 | PROBER APPARATUS WITH DETACHABLE PROBE CARD | Feb 23, 1989 | Abandoned |
Array
(
[id] => 2532033
[patent_doc_number] => 04862077
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1989-08-29
[patent_title] => 'Probe card apparatus and method of providing same with reconfigurable probe card circuitry'
[patent_app_type] => 1
[patent_app_number] => 7/311448
[patent_app_country] => US
[patent_app_date] => 1989-02-13
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[pdf_file] => patents/04/862/04862077.pdf
[firstpage_image] =>[orig_patent_app_number] => 311448
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/311448 | Probe card apparatus and method of providing same with reconfigurable probe card circuitry | Feb 12, 1989 | Issued |
Array
(
[id] => 2562808
[patent_doc_number] => 04961050
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1990-10-02
[patent_title] => 'Test fixture for microstrip assemblies'
[patent_app_type] => 1
[patent_app_number] => 7/309698
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[patent_app_date] => 1989-02-10
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[firstpage_image] =>[orig_patent_app_number] => 309698
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/309698 | Test fixture for microstrip assemblies | Feb 9, 1989 | Issued |
Array
(
[id] => 2522608
[patent_doc_number] => 04870351
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1989-09-26
[patent_title] => 'Electronic watt-hour meter with up and down integration for error correction'
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[patent_app_number] => 7/308348
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[rel_patent_id] =>[rel_patent_doc_number] =>) 07/308348 | Electronic watt-hour meter with up and down integration for error correction | Feb 6, 1989 | Issued |
Array
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[patent_kind] => NA
[patent_issue_date] => 1990-04-17
[patent_title] => 'Method and process for testing the reliability of integrated circuit (IC) chips and novel IC circuitry for accomplishing same'
[patent_app_type] => 1
[patent_app_number] => 7/307727
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[pdf_file] => patents/04/918/04918385.pdf
[firstpage_image] =>[orig_patent_app_number] => 307727
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/307727 | Method and process for testing the reliability of integrated circuit (IC) chips and novel IC circuitry for accomplishing same | Feb 6, 1989 | Issued |
Array
(
[id] => 2712806
[patent_doc_number] => 04982153
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1991-01-01
[patent_title] => 'Method and apparatus for cooling an integrated circuit chip during testing'
[patent_app_type] => 1
[patent_app_number] => 7/307259
[patent_app_country] => US
[patent_app_date] => 1989-02-06
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[pdf_file] => patents/04/982/04982153.pdf
[firstpage_image] =>[orig_patent_app_number] => 307259
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/307259 | Method and apparatus for cooling an integrated circuit chip during testing | Feb 5, 1989 | Issued |
Array
(
[id] => 2623069
[patent_doc_number] => 04968930
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1990-11-06
[patent_title] => 'Display device for measuring instruments'
[patent_app_type] => 1
[patent_app_number] => 7/315669
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[patent_app_date] => 1989-01-27
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[firstpage_image] =>[orig_patent_app_number] => 315669
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/315669 | Display device for measuring instruments | Jan 26, 1989 | Issued |
| 07/298302 | ELECTRIC PROBING-TEST MACHINE WITH DEHUMIDIFYING FUNCTION | Jan 16, 1989 | Abandoned |
Array
(
[id] => 2674094
[patent_doc_number] => 04999578
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1991-03-12
[patent_title] => 'Function inspecting system'
[patent_app_type] => 1
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[patent_app_country] => US
[patent_app_date] => 1989-01-13
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[firstpage_image] =>[orig_patent_app_number] => 296779
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/296779 | Function inspecting system | Jan 12, 1989 | Issued |
Array
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[patent_doc_number] => 05039939
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[patent_issue_date] => 1991-08-13
[patent_title] => 'Calculating AC chip performance using the LSSD scan path'
[patent_app_type] => 1
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[pdf_file] => patents/05/039/05039939.pdf
[firstpage_image] =>[orig_patent_app_number] => 291919
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/291919 | Calculating AC chip performance using the LSSD scan path | Dec 28, 1988 | Issued |
Array
(
[id] => 2573688
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Array
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[firstpage_image] =>[orig_patent_app_number] => 290268
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/290268 | Apparatus for testing circuit boards | Dec 22, 1988 | Issued |
Array
(
[id] => 2483513
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[firstpage_image] =>[orig_patent_app_number] => 285362
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/285362 | Method and apparatus for high accuracy measurment of VLSI components | Dec 13, 1988 | Issued |
Array
(
[id] => 2583831
[patent_doc_number] => 04973904
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[patent_kind] => NA
[patent_issue_date] => 1990-11-27
[patent_title] => 'Test circuit and method'
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[patent_app_date] => 1988-12-12
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[firstpage_image] =>[orig_patent_app_number] => 282719
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/282719 | Test circuit and method | Dec 11, 1988 | Issued |
| 07/279178 | ELECTRONIC METER DIGITAL PHASE COMPENSATION | Dec 1, 1988 | Abandoned |
Array
(
[id] => 2660485
[patent_doc_number] => 04972143
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1990-11-20
[patent_title] => 'Diaphragm test probe'
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[patent_app_date] => 1988-11-30
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[firstpage_image] =>[orig_patent_app_number] => 277819
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/277819 | Diaphragm test probe | Nov 29, 1988 | Issued |
| 07/276179 | INTEGRATED CIRCUIT SELF-TESTING DEVICE AND METHOD | Nov 22, 1988 | Abandoned |