Search

Andy Ho

Examiner (ID: 5607, Phone: (571)272-3762 , Office: P/2194 )

Most Active Art Unit
2194
Art Unit(s)
2126, 2194, 2151
Total Applications
1669
Issued Applications
1447
Pending Applications
77
Abandoned Applications
165

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 2641713 [patent_doc_number] => 04910455 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-03-20 [patent_title] => 'Non-intrusive current measuring circuit' [patent_app_type] => 1 [patent_app_number] => 7/318869 [patent_app_country] => US [patent_app_date] => 1989-03-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 2181 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 281 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/910/04910455.pdf [firstpage_image] =>[orig_patent_app_number] => 318869 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/318869
Non-intrusive current measuring circuit Mar 5, 1989 Issued
Array ( [id] => 2750237 [patent_doc_number] => 05003253 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-03-26 [patent_title] => 'Millimeter-wave active probe system' [patent_app_type] => 1 [patent_app_number] => 7/318744 [patent_app_country] => US [patent_app_date] => 1989-03-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 26 [patent_no_of_words] => 15724 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 287 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/003/05003253.pdf [firstpage_image] =>[orig_patent_app_number] => 318744 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/318744
Millimeter-wave active probe system Mar 2, 1989 Issued
Array ( [id] => 2607553 [patent_doc_number] => 04912402 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-03-27 [patent_title] => 'Fixture for measuring the static characteristics of microwave three-terminal active components' [patent_app_type] => 1 [patent_app_number] => 7/316409 [patent_app_country] => US [patent_app_date] => 1989-02-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2285 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 353 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/912/04912402.pdf [firstpage_image] =>[orig_patent_app_number] => 316409 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/316409
Fixture for measuring the static characteristics of microwave three-terminal active components Feb 26, 1989 Issued
07/314898 PROBER APPARATUS WITH DETACHABLE PROBE CARD Feb 23, 1989 Abandoned
Array ( [id] => 2532033 [patent_doc_number] => 04862077 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-08-29 [patent_title] => 'Probe card apparatus and method of providing same with reconfigurable probe card circuitry' [patent_app_type] => 1 [patent_app_number] => 7/311448 [patent_app_country] => US [patent_app_date] => 1989-02-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 19 [patent_no_of_words] => 6733 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 236 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/862/04862077.pdf [firstpage_image] =>[orig_patent_app_number] => 311448 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/311448
Probe card apparatus and method of providing same with reconfigurable probe card circuitry Feb 12, 1989 Issued
Array ( [id] => 2562808 [patent_doc_number] => 04961050 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-10-02 [patent_title] => 'Test fixture for microstrip assemblies' [patent_app_type] => 1 [patent_app_number] => 7/309698 [patent_app_country] => US [patent_app_date] => 1989-02-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 6795 [patent_no_of_claims] => 36 [patent_no_of_ind_claims] => 15 [patent_words_short_claim] => 150 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/961/04961050.pdf [firstpage_image] =>[orig_patent_app_number] => 309698 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/309698
Test fixture for microstrip assemblies Feb 9, 1989 Issued
Array ( [id] => 2522608 [patent_doc_number] => 04870351 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-09-26 [patent_title] => 'Electronic watt-hour meter with up and down integration for error correction' [patent_app_type] => 1 [patent_app_number] => 7/308348 [patent_app_country] => US [patent_app_date] => 1989-02-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 9 [patent_no_of_words] => 4517 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 360 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/870/04870351.pdf [firstpage_image] =>[orig_patent_app_number] => 308348 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/308348
Electronic watt-hour meter with up and down integration for error correction Feb 6, 1989 Issued
Array ( [id] => 2597450 [patent_doc_number] => 04918385 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-04-17 [patent_title] => 'Method and process for testing the reliability of integrated circuit (IC) chips and novel IC circuitry for accomplishing same' [patent_app_type] => 1 [patent_app_number] => 7/307727 [patent_app_country] => US [patent_app_date] => 1989-02-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 2884 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 142 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/918/04918385.pdf [firstpage_image] =>[orig_patent_app_number] => 307727 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/307727
Method and process for testing the reliability of integrated circuit (IC) chips and novel IC circuitry for accomplishing same Feb 6, 1989 Issued
Array ( [id] => 2712806 [patent_doc_number] => 04982153 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-01-01 [patent_title] => 'Method and apparatus for cooling an integrated circuit chip during testing' [patent_app_type] => 1 [patent_app_number] => 7/307259 [patent_app_country] => US [patent_app_date] => 1989-02-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 2451 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 113 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/982/04982153.pdf [firstpage_image] =>[orig_patent_app_number] => 307259 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/307259
Method and apparatus for cooling an integrated circuit chip during testing Feb 5, 1989 Issued
Array ( [id] => 2623069 [patent_doc_number] => 04968930 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-11-06 [patent_title] => 'Display device for measuring instruments' [patent_app_type] => 1 [patent_app_number] => 7/315669 [patent_app_country] => US [patent_app_date] => 1989-01-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 13 [patent_no_of_words] => 7416 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 101 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/968/04968930.pdf [firstpage_image] =>[orig_patent_app_number] => 315669 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/315669
Display device for measuring instruments Jan 26, 1989 Issued
07/298302 ELECTRIC PROBING-TEST MACHINE WITH DEHUMIDIFYING FUNCTION Jan 16, 1989 Abandoned
Array ( [id] => 2674094 [patent_doc_number] => 04999578 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-03-12 [patent_title] => 'Function inspecting system' [patent_app_type] => 1 [patent_app_number] => 7/296779 [patent_app_country] => US [patent_app_date] => 1989-01-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 3505 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 191 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/999/04999578.pdf [firstpage_image] =>[orig_patent_app_number] => 296779 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/296779
Function inspecting system Jan 12, 1989 Issued
Array ( [id] => 2738430 [patent_doc_number] => 05039939 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-08-13 [patent_title] => 'Calculating AC chip performance using the LSSD scan path' [patent_app_type] => 1 [patent_app_number] => 7/291919 [patent_app_country] => US [patent_app_date] => 1988-12-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 3608 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 104 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/039/05039939.pdf [firstpage_image] =>[orig_patent_app_number] => 291919 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/291919
Calculating AC chip performance using the LSSD scan path Dec 28, 1988 Issued
Array ( [id] => 2573688 [patent_doc_number] => 04901009 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-02-13 [patent_title] => 'Method and device for the automatic recording of signal curves' [patent_app_type] => 1 [patent_app_number] => 7/291508 [patent_app_country] => US [patent_app_date] => 1988-12-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 4850 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 153 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/901/04901009.pdf [firstpage_image] =>[orig_patent_app_number] => 291508 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/291508
Method and device for the automatic recording of signal curves Dec 28, 1988 Issued
Array ( [id] => 2674740 [patent_doc_number] => 05047708 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-09-10 [patent_title] => 'Apparatus for testing circuit boards' [patent_app_type] => 1 [patent_app_number] => 7/290268 [patent_app_country] => US [patent_app_date] => 1988-12-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 1644 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 156 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/047/05047708.pdf [firstpage_image] =>[orig_patent_app_number] => 290268 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/290268
Apparatus for testing circuit boards Dec 22, 1988 Issued
Array ( [id] => 2483513 [patent_doc_number] => 04876501 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-10-24 [patent_title] => 'Method and apparatus for high accuracy measurment of VLSI components' [patent_app_type] => 1 [patent_app_number] => 7/285362 [patent_app_country] => US [patent_app_date] => 1988-12-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3772 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 207 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/876/04876501.pdf [firstpage_image] =>[orig_patent_app_number] => 285362 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/285362
Method and apparatus for high accuracy measurment of VLSI components Dec 13, 1988 Issued
Array ( [id] => 2583831 [patent_doc_number] => 04973904 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-11-27 [patent_title] => 'Test circuit and method' [patent_app_type] => 1 [patent_app_number] => 7/282719 [patent_app_country] => US [patent_app_date] => 1988-12-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 5 [patent_no_of_words] => 3056 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 160 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/973/04973904.pdf [firstpage_image] =>[orig_patent_app_number] => 282719 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/282719
Test circuit and method Dec 11, 1988 Issued
07/279178 ELECTRONIC METER DIGITAL PHASE COMPENSATION Dec 1, 1988 Abandoned
Array ( [id] => 2660485 [patent_doc_number] => 04972143 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-11-20 [patent_title] => 'Diaphragm test probe' [patent_app_type] => 1 [patent_app_number] => 7/277819 [patent_app_country] => US [patent_app_date] => 1988-11-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 7 [patent_no_of_words] => 2144 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 133 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/972/04972143.pdf [firstpage_image] =>[orig_patent_app_number] => 277819 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/277819
Diaphragm test probe Nov 29, 1988 Issued
07/276179 INTEGRATED CIRCUIT SELF-TESTING DEVICE AND METHOD Nov 22, 1988 Abandoned
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