Andy Ho

Array ( [id] => 2522499 [patent_doc_number] => 04870345 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-09-26 [patent_title] => 'Semiconductor intergrated circuit device' [patent_app_type] => 1 [patent_app_number] => 7/081095 [patent_app_country] => US [patent_app_date] => 1987-08-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 14 [patent_no_of_words] => 8216 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 217 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/870/04870345.pdf [firstpage_image] =>[orig_patent_app_number] => 081095 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2642674 [patent_doc_number] => 04914385 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-04-03 [patent_title] => 'Current detector' [patent_app_type] => 1 [patent_app_number] => 7/077934 [patent_app_country] => US [patent_app_date] => 1987-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2377 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 20 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/914/04914385.pdf [firstpage_image] =>[orig_patent_app_number] => 077934 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2494680 [patent_doc_number] => 04859938 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-08-22 [patent_title] => 'Novel technique to detect oxydonor generation in IC fabrication' [patent_app_type] => 1 [patent_app_number] => 7/078094 [patent_app_country] => US [patent_app_date] => 1987-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 15 [patent_no_of_words] => 3956 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 166 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/859/04859938.pdf [firstpage_image] =>[orig_patent_app_number] => 078094 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2567515 [patent_doc_number] => 04835469 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-05-30 [patent_title] => 'Integrated circuit clip for circuit analyzer' [patent_app_type] => 1 [patent_app_number] => 7/077648 [patent_app_country] => US [patent_app_date] => 1987-07-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2662 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 15 [patent_words_short_claim] => 197 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/835/04835469.pdf [firstpage_image] =>[orig_patent_app_number] => 077648 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2513037 [patent_doc_number] => 04795974 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-01-03 [patent_title] => 'Digital energy meter' [patent_app_type] => 1 [patent_app_number] => 7/077579 [patent_app_country] => US [patent_app_date] => 1987-07-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 5 [patent_no_of_words] => 2257 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 304 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/795/04795974.pdf [firstpage_image] =>[orig_patent_app_number] => 077579 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2393095 [patent_doc_number] => 04764720 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1988-08-16 [patent_title] => 'Apparatus and method for measuring variable frequency power' [patent_app_type] => 1 [patent_app_number] => 7/077009 [patent_app_country] => US [patent_app_date] => 1987-07-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2746 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 320 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/764/04764720.pdf [firstpage_image] =>[orig_patent_app_number] => 077009 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2516642 [patent_doc_number] => 04841241 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-06-20 [patent_title] => 'Testing device for both-sided contacting of component-equipped printed circuit boards' [patent_app_type] => 1 [patent_app_number] => 7/075994 [patent_app_country] => US [patent_app_date] => 1987-07-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 2408 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 127 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/841/04841241.pdf [firstpage_image] =>[orig_patent_app_number] => 075994 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2497203 [patent_doc_number] => 04825155 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-04-25 [patent_title] => 'X-band logic test jig' [patent_app_type] => 1 [patent_app_number] => 7/075714 [patent_app_country] => US [patent_app_date] => 1987-07-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 7 [patent_no_of_words] => 3197 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 129 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/825/04825155.pdf [firstpage_image] =>[orig_patent_app_number] => 075714 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2507799 [patent_doc_number] => 04799021 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-01-17 [patent_title] => 'Method and apparatus for testing EPROM type semiconductor devices during burn-in' [patent_app_type] => 1 [patent_app_number] => 7/073654 [patent_app_country] => US [patent_app_date] => 1987-07-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 3474 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 396 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/799/04799021.pdf [firstpage_image] =>[orig_patent_app_number] => 073654 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2624988 [patent_doc_number] => 04894610 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-01-16 [patent_title] => 'Current-transformer arrangement for an electrostatic meter' [patent_app_type] => 1 [patent_app_number] => 7/057918 [patent_app_country] => US [patent_app_date] => 1987-06-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 15 [patent_no_of_words] => 3593 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 222 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/894/04894610.pdf [firstpage_image] =>[orig_patent_app_number] => 057918 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2607494 [patent_doc_number] => 04912399 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-03-27 [patent_title] => 'Multiple lead probe for integrated circuits in wafer form' [patent_app_type] => 1 [patent_app_number] => 7/059903 [patent_app_country] => US [patent_app_date] => 1987-06-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 4 [patent_no_of_words] => 3944 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 305 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/912/04912399.pdf [firstpage_image] =>[orig_patent_app_number] => 059903 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2591082 [patent_doc_number] => 04908570 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-03-13 [patent_title] => 'Method of measuring FET noise parameters' [patent_app_type] => 1 [patent_app_number] => 7/056848 [patent_app_country] => US [patent_app_date] => 1987-06-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 5249 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 96 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/908/04908570.pdf [firstpage_image] =>[orig_patent_app_number] => 056848 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2613605 [patent_doc_number] => 04902969 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-02-20 [patent_title] => 'Automated burn-in system' [patent_app_type] => 1 [patent_app_number] => 7/057255 [patent_app_country] => US [patent_app_date] => 1987-06-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 42 [patent_figures_cnt] => 54 [patent_no_of_words] => 16623 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 113 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/902/04902969.pdf [firstpage_image] =>[orig_patent_app_number] => 057255 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2558343 [patent_doc_number] => 04803423 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-02-07 [patent_title] => 'Input circuit for a probe of a logic analyser and probe and logic analyser provided with such a circuit' [patent_app_type] => 1 [patent_app_number] => 7/055659 [patent_app_country] => US [patent_app_date] => 1987-05-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 5 [patent_no_of_words] => 3056 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 171 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/803/04803423.pdf [firstpage_image] =>[orig_patent_app_number] => 055659 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2447798 [patent_doc_number] => 04779041 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1988-10-18 [patent_title] => 'Integrated circuit transfer test device system' [patent_app_type] => 1 [patent_app_number] => 7/052528 [patent_app_country] => US [patent_app_date] => 1987-05-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 2023 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 172 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/779/04779041.pdf [firstpage_image] =>[orig_patent_app_number] => 052528 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2522993 [patent_doc_number] => 04855672 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-08-08 [patent_title] => 'Method and process for testing the reliability of integrated circuit (IC) chips and novel IC circuitry for accomplishing same' [patent_app_type] => 1 [patent_app_number] => 7/051888 [patent_app_country] => US [patent_app_date] => 1987-05-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 2885 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 82 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/855/04855672.pdf [firstpage_image] =>[orig_patent_app_number] => 051888 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2418236 [patent_doc_number] => 04786863 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1988-11-22 [patent_title] => 'Solid state watthour meter with switched-capacitor integration' [patent_app_type] => 1 [patent_app_number] => 7/050628 [patent_app_country] => US [patent_app_date] => 1987-05-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 13 [patent_no_of_words] => 4691 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 250 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/786/04786863.pdf [firstpage_image] =>[orig_patent_app_number] => 050628 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2507507 [patent_doc_number] => 04799005 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-01-17 [patent_title] => 'Electrical power line parameter measurement apparatus and systems, including compact, line-mounted modules' [patent_app_type] => 1 [patent_app_number] => 7/048579 [patent_app_country] => US [patent_app_date] => 1987-05-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 22 [patent_no_of_words] => 8586 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 185 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/799/04799005.pdf [firstpage_image] =>[orig_patent_app_number] => 048579 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2461869 [patent_doc_number] => 04785237 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1988-11-15 [patent_title] => 'Amplifier with D.C. compensation' [patent_app_type] => 1 [patent_app_number] => 7/045207 [patent_app_country] => US [patent_app_date] => 1987-05-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 1829 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/785/04785237.pdf [firstpage_image] =>[orig_patent_app_number] => 045207 [rel_patent_id] =>[rel_patent_doc_number] =>)