
Andy Ho
Examiner (ID: 5607, Phone: (571)272-3762 , Office: P/2194 )
| Most Active Art Unit | 2194 |
| Art Unit(s) | 2126, 2194, 2151 |
| Total Applications | 1669 |
| Issued Applications | 1447 |
| Pending Applications | 77 |
| Abandoned Applications | 165 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 2567774
[patent_doc_number] => 04857838
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1989-08-15
[patent_title] => 'Apparatus for testing electronic components, in particular IC\'s'
[patent_app_type] => 1
[patent_app_number] => 7/045429
[patent_app_country] => US
[patent_app_date] => 1987-05-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 3
[patent_no_of_words] => 2096
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 244
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/857/04857838.pdf
[firstpage_image] =>[orig_patent_app_number] => 045429
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/045429 | Apparatus for testing electronic components, in particular IC's | May 3, 1987 | Issued |
| 07/043789 | PROBE CARD APPARATUS AND METHOD OF PROVIDING SAME WITH RECONFIGURABLE PROBE CARD CIRCUITRY | Apr 28, 1987 | Abandoned |
| 07/037708 | METHOD AND APPARATUS FOR HIGH ACCURACY MEASUREMENT OF VLSI COMPONENTS | Apr 12, 1987 | Abandoned |
Array
(
[id] => 2493190
[patent_doc_number] => 04801876
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1989-01-31
[patent_title] => 'Printed wiring board tester'
[patent_app_type] => 1
[patent_app_number] => 7/037004
[patent_app_country] => US
[patent_app_date] => 1987-04-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 6
[patent_no_of_words] => 2488
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 239
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/801/04801876.pdf
[firstpage_image] =>[orig_patent_app_number] => 037004
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/037004 | Printed wiring board tester | Apr 9, 1987 | Issued |
Array
(
[id] => 2534347
[patent_doc_number] => 04839600
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1989-06-13
[patent_title] => 'Ammeter for use with A.C. electric power lines'
[patent_app_type] => 1
[patent_app_number] => 7/026601
[patent_app_country] => US
[patent_app_date] => 1987-03-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 11
[patent_no_of_words] => 4912
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 199
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/839/04839600.pdf
[firstpage_image] =>[orig_patent_app_number] => 026601
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/026601 | Ammeter for use with A.C. electric power lines | Mar 16, 1987 | Issued |
| 07/027116 | ENVIRONMENTAL TESTING FACILITY FOR ELECTRONIC COMPONENTS | Mar 15, 1987 | Abandoned |
Array
(
[id] => 2393232
[patent_doc_number] => 04777434
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1988-10-11
[patent_title] => 'Microelectronic burn-in system'
[patent_app_type] => 1
[patent_app_number] => 7/023892
[patent_app_country] => US
[patent_app_date] => 1987-03-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 5
[patent_no_of_words] => 3011
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 98
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/777/04777434.pdf
[firstpage_image] =>[orig_patent_app_number] => 023892
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/023892 | Microelectronic burn-in system | Mar 8, 1987 | Issued |
Array
(
[id] => 2449076
[patent_doc_number] => 04745361
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1988-05-17
[patent_title] => 'Electro-optic measurement (network analysis) system'
[patent_app_type] => 1
[patent_app_number] => 7/021089
[patent_app_country] => US
[patent_app_date] => 1987-03-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 5
[patent_no_of_words] => 3810
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 103
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/745/04745361.pdf
[firstpage_image] =>[orig_patent_app_number] => 021089
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/021089 | Electro-optic measurement (network analysis) system | Mar 2, 1987 | Issued |
Array
(
[id] => 2449674
[patent_doc_number] => 04740746
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1988-04-26
[patent_title] => 'Controlled impedance microcircuit probe'
[patent_app_type] => 1
[patent_app_number] => 7/018729
[patent_app_country] => US
[patent_app_date] => 1987-02-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 5
[patent_no_of_words] => 2249
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 188
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/740/04740746.pdf
[firstpage_image] =>[orig_patent_app_number] => 018729
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/018729 | Controlled impedance microcircuit probe | Feb 23, 1987 | Issued |
Array
(
[id] => 2567457
[patent_doc_number] => 04835466
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1989-05-30
[patent_title] => 'Apparatus and method for detecting spot defects in integrated circuits'
[patent_app_type] => 1
[patent_app_number] => 7/011729
[patent_app_country] => US
[patent_app_date] => 1987-02-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 20
[patent_no_of_words] => 4773
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 189
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/835/04835466.pdf
[firstpage_image] =>[orig_patent_app_number] => 011729
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/011729 | Apparatus and method for detecting spot defects in integrated circuits | Feb 5, 1987 | Issued |
Array
(
[id] => 2497185
[patent_doc_number] => 04825154
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1989-04-25
[patent_title] => 'Current probe'
[patent_app_type] => 1
[patent_app_number] => 7/011019
[patent_app_country] => US
[patent_app_date] => 1987-02-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 2
[patent_no_of_words] => 2404
[patent_no_of_claims] => 2
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 232
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/825/04825154.pdf
[firstpage_image] =>[orig_patent_app_number] => 011019
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/011019 | Current probe | Feb 4, 1987 | Issued |
Array
(
[id] => 2421797
[patent_doc_number] => 04771233
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1988-09-13
[patent_title] => 'Printed curcuit board lead ammeter'
[patent_app_type] => 1
[patent_app_number] => 7/007979
[patent_app_country] => US
[patent_app_date] => 1987-01-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 2
[patent_no_of_words] => 3471
[patent_no_of_claims] => 30
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 180
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/771/04771233.pdf
[firstpage_image] =>[orig_patent_app_number] => 007979
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/007979 | Printed curcuit board lead ammeter | Jan 28, 1987 | Issued |
Array
(
[id] => 2555774
[patent_doc_number] => 04806852
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1989-02-21
[patent_title] => 'Automatic test system with enhanced performance of timing generators'
[patent_app_type] => 1
[patent_app_number] => 7/008030
[patent_app_country] => US
[patent_app_date] => 1987-01-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 7
[patent_no_of_words] => 6659
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 220
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/806/04806852.pdf
[firstpage_image] =>[orig_patent_app_number] => 008030
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/008030 | Automatic test system with enhanced performance of timing generators | Jan 27, 1987 | Issued |
Array
(
[id] => 2387455
[patent_doc_number] => 04720670
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1988-01-19
[patent_title] => 'On chip performance predictor circuit'
[patent_app_type] => 1
[patent_app_number] => 6/945728
[patent_app_country] => US
[patent_app_date] => 1986-12-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 6
[patent_no_of_words] => 4402
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 244
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/720/04720670.pdf
[firstpage_image] =>[orig_patent_app_number] => 945728
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/945728 | On chip performance predictor circuit | Dec 22, 1986 | Issued |
Array
(
[id] => 2449253
[patent_doc_number] => 04749940
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1988-06-07
[patent_title] => 'Folded bar current sensor'
[patent_app_type] => 1
[patent_app_number] => 6/944028
[patent_app_country] => US
[patent_app_date] => 1986-12-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 4945
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 175
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/749/04749940.pdf
[firstpage_image] =>[orig_patent_app_number] => 944028
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/944028 | Folded bar current sensor | Dec 21, 1986 | Issued |
Array
(
[id] => 2415369
[patent_doc_number] => 04761606
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1988-08-02
[patent_title] => 'Auto-ranging in electric watthour meter'
[patent_app_type] => 1
[patent_app_number] => 6/944029
[patent_app_country] => US
[patent_app_date] => 1986-12-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 4941
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 187
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/761/04761606.pdf
[firstpage_image] =>[orig_patent_app_number] => 944029
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/944029 | Auto-ranging in electric watthour meter | Dec 21, 1986 | Issued |
| 06/941298 | TESTING APPARATUS FOR PLATED THROUGH-HOLES ON PRINTED CIRCUIT BOARDS, AND PROBE THEREFOR | Dec 11, 1986 | Abandoned |
Array
(
[id] => 2559832
[patent_doc_number] => 04897599
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1990-01-30
[patent_title] => 'Signal processing device with a level adapter circuit'
[patent_app_type] => 1
[patent_app_number] => 6/945958
[patent_app_country] => US
[patent_app_date] => 1986-11-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 5
[patent_no_of_words] => 6962
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 160
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/897/04897599.pdf
[firstpage_image] =>[orig_patent_app_number] => 945958
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/945958 | Signal processing device with a level adapter circuit | Nov 27, 1986 | Issued |
Array
(
[id] => 2418598
[patent_doc_number] => 04743840
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1988-05-10
[patent_title] => 'Diagnosing method for logic circuits'
[patent_app_type] => 1
[patent_app_number] => 6/935259
[patent_app_country] => US
[patent_app_date] => 1986-11-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 4
[patent_no_of_words] => 1732
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 188
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/743/04743840.pdf
[firstpage_image] =>[orig_patent_app_number] => 935259
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/935259 | Diagnosing method for logic circuits | Nov 25, 1986 | Issued |
Array
(
[id] => 2427967
[patent_doc_number] => 04774461
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1988-09-27
[patent_title] => 'System for inspecting exposure pattern data of semiconductor integrated circuit device'
[patent_app_type] => 1
[patent_app_number] => 6/934788
[patent_app_country] => US
[patent_app_date] => 1986-11-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 38
[patent_no_of_words] => 7141
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 167
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/774/04774461.pdf
[firstpage_image] =>[orig_patent_app_number] => 934788
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/934788 | System for inspecting exposure pattern data of semiconductor integrated circuit device | Nov 24, 1986 | Issued |