Search

Andy Ho

Examiner (ID: 5607, Phone: (571)272-3762 , Office: P/2194 )

Most Active Art Unit
2194
Art Unit(s)
2126, 2194, 2151
Total Applications
1669
Issued Applications
1447
Pending Applications
77
Abandoned Applications
165

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 2567774 [patent_doc_number] => 04857838 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-08-15 [patent_title] => 'Apparatus for testing electronic components, in particular IC\'s' [patent_app_type] => 1 [patent_app_number] => 7/045429 [patent_app_country] => US [patent_app_date] => 1987-05-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 2096 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 244 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/857/04857838.pdf [firstpage_image] =>[orig_patent_app_number] => 045429 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/045429
Apparatus for testing electronic components, in particular IC's May 3, 1987 Issued
07/043789 PROBE CARD APPARATUS AND METHOD OF PROVIDING SAME WITH RECONFIGURABLE PROBE CARD CIRCUITRY Apr 28, 1987 Abandoned
07/037708 METHOD AND APPARATUS FOR HIGH ACCURACY MEASUREMENT OF VLSI COMPONENTS Apr 12, 1987 Abandoned
Array ( [id] => 2493190 [patent_doc_number] => 04801876 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-01-31 [patent_title] => 'Printed wiring board tester' [patent_app_type] => 1 [patent_app_number] => 7/037004 [patent_app_country] => US [patent_app_date] => 1987-04-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 2488 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 239 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/801/04801876.pdf [firstpage_image] =>[orig_patent_app_number] => 037004 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/037004
Printed wiring board tester Apr 9, 1987 Issued
Array ( [id] => 2534347 [patent_doc_number] => 04839600 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-06-13 [patent_title] => 'Ammeter for use with A.C. electric power lines' [patent_app_type] => 1 [patent_app_number] => 7/026601 [patent_app_country] => US [patent_app_date] => 1987-03-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 11 [patent_no_of_words] => 4912 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 199 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/839/04839600.pdf [firstpage_image] =>[orig_patent_app_number] => 026601 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/026601
Ammeter for use with A.C. electric power lines Mar 16, 1987 Issued
07/027116 ENVIRONMENTAL TESTING FACILITY FOR ELECTRONIC COMPONENTS Mar 15, 1987 Abandoned
Array ( [id] => 2393232 [patent_doc_number] => 04777434 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1988-10-11 [patent_title] => 'Microelectronic burn-in system' [patent_app_type] => 1 [patent_app_number] => 7/023892 [patent_app_country] => US [patent_app_date] => 1987-03-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 3011 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 98 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/777/04777434.pdf [firstpage_image] =>[orig_patent_app_number] => 023892 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/023892
Microelectronic burn-in system Mar 8, 1987 Issued
Array ( [id] => 2449076 [patent_doc_number] => 04745361 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1988-05-17 [patent_title] => 'Electro-optic measurement (network analysis) system' [patent_app_type] => 1 [patent_app_number] => 7/021089 [patent_app_country] => US [patent_app_date] => 1987-03-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 3810 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 103 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/745/04745361.pdf [firstpage_image] =>[orig_patent_app_number] => 021089 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/021089
Electro-optic measurement (network analysis) system Mar 2, 1987 Issued
Array ( [id] => 2449674 [patent_doc_number] => 04740746 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1988-04-26 [patent_title] => 'Controlled impedance microcircuit probe' [patent_app_type] => 1 [patent_app_number] => 7/018729 [patent_app_country] => US [patent_app_date] => 1987-02-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 5 [patent_no_of_words] => 2249 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 188 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/740/04740746.pdf [firstpage_image] =>[orig_patent_app_number] => 018729 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/018729
Controlled impedance microcircuit probe Feb 23, 1987 Issued
Array ( [id] => 2567457 [patent_doc_number] => 04835466 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-05-30 [patent_title] => 'Apparatus and method for detecting spot defects in integrated circuits' [patent_app_type] => 1 [patent_app_number] => 7/011729 [patent_app_country] => US [patent_app_date] => 1987-02-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 20 [patent_no_of_words] => 4773 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 189 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/835/04835466.pdf [firstpage_image] =>[orig_patent_app_number] => 011729 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/011729
Apparatus and method for detecting spot defects in integrated circuits Feb 5, 1987 Issued
Array ( [id] => 2497185 [patent_doc_number] => 04825154 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-04-25 [patent_title] => 'Current probe' [patent_app_type] => 1 [patent_app_number] => 7/011019 [patent_app_country] => US [patent_app_date] => 1987-02-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 2404 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 232 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/825/04825154.pdf [firstpage_image] =>[orig_patent_app_number] => 011019 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/011019
Current probe Feb 4, 1987 Issued
Array ( [id] => 2421797 [patent_doc_number] => 04771233 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1988-09-13 [patent_title] => 'Printed curcuit board lead ammeter' [patent_app_type] => 1 [patent_app_number] => 7/007979 [patent_app_country] => US [patent_app_date] => 1987-01-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 3471 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 180 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/771/04771233.pdf [firstpage_image] =>[orig_patent_app_number] => 007979 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/007979
Printed curcuit board lead ammeter Jan 28, 1987 Issued
Array ( [id] => 2555774 [patent_doc_number] => 04806852 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-02-21 [patent_title] => 'Automatic test system with enhanced performance of timing generators' [patent_app_type] => 1 [patent_app_number] => 7/008030 [patent_app_country] => US [patent_app_date] => 1987-01-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 7 [patent_no_of_words] => 6659 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 220 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/806/04806852.pdf [firstpage_image] =>[orig_patent_app_number] => 008030 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/008030
Automatic test system with enhanced performance of timing generators Jan 27, 1987 Issued
Array ( [id] => 2387455 [patent_doc_number] => 04720670 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1988-01-19 [patent_title] => 'On chip performance predictor circuit' [patent_app_type] => 1 [patent_app_number] => 6/945728 [patent_app_country] => US [patent_app_date] => 1986-12-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 4402 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 244 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/720/04720670.pdf [firstpage_image] =>[orig_patent_app_number] => 945728 [rel_patent_id] =>[rel_patent_doc_number] =>)
06/945728
On chip performance predictor circuit Dec 22, 1986 Issued
Array ( [id] => 2449253 [patent_doc_number] => 04749940 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1988-06-07 [patent_title] => 'Folded bar current sensor' [patent_app_type] => 1 [patent_app_number] => 6/944028 [patent_app_country] => US [patent_app_date] => 1986-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4945 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 175 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/749/04749940.pdf [firstpage_image] =>[orig_patent_app_number] => 944028 [rel_patent_id] =>[rel_patent_doc_number] =>)
06/944028
Folded bar current sensor Dec 21, 1986 Issued
Array ( [id] => 2415369 [patent_doc_number] => 04761606 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1988-08-02 [patent_title] => 'Auto-ranging in electric watthour meter' [patent_app_type] => 1 [patent_app_number] => 6/944029 [patent_app_country] => US [patent_app_date] => 1986-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4941 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 187 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/761/04761606.pdf [firstpage_image] =>[orig_patent_app_number] => 944029 [rel_patent_id] =>[rel_patent_doc_number] =>)
06/944029
Auto-ranging in electric watthour meter Dec 21, 1986 Issued
06/941298 TESTING APPARATUS FOR PLATED THROUGH-HOLES ON PRINTED CIRCUIT BOARDS, AND PROBE THEREFOR Dec 11, 1986 Abandoned
Array ( [id] => 2559832 [patent_doc_number] => 04897599 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-01-30 [patent_title] => 'Signal processing device with a level adapter circuit' [patent_app_type] => 1 [patent_app_number] => 6/945958 [patent_app_country] => US [patent_app_date] => 1986-11-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 6962 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 160 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/897/04897599.pdf [firstpage_image] =>[orig_patent_app_number] => 945958 [rel_patent_id] =>[rel_patent_doc_number] =>)
06/945958
Signal processing device with a level adapter circuit Nov 27, 1986 Issued
Array ( [id] => 2418598 [patent_doc_number] => 04743840 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1988-05-10 [patent_title] => 'Diagnosing method for logic circuits' [patent_app_type] => 1 [patent_app_number] => 6/935259 [patent_app_country] => US [patent_app_date] => 1986-11-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 1732 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 188 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/743/04743840.pdf [firstpage_image] =>[orig_patent_app_number] => 935259 [rel_patent_id] =>[rel_patent_doc_number] =>)
06/935259
Diagnosing method for logic circuits Nov 25, 1986 Issued
Array ( [id] => 2427967 [patent_doc_number] => 04774461 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1988-09-27 [patent_title] => 'System for inspecting exposure pattern data of semiconductor integrated circuit device' [patent_app_type] => 1 [patent_app_number] => 6/934788 [patent_app_country] => US [patent_app_date] => 1986-11-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 38 [patent_no_of_words] => 7141 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 167 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/774/04774461.pdf [firstpage_image] =>[orig_patent_app_number] => 934788 [rel_patent_id] =>[rel_patent_doc_number] =>)
06/934788
System for inspecting exposure pattern data of semiconductor integrated circuit device Nov 24, 1986 Issued
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