| Application number | Title of the application | Filing Date | Status |
|---|
Array
(
[id] => 2418254
[patent_doc_number] => 04786864
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1988-11-22
[patent_title] => 'Photon assisted tunneling testing of passivated integrated circuits'
[patent_app_type] => 1
[patent_app_number] => 6/932128
[patent_app_country] => US
[patent_app_date] => 1986-11-18
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[pdf_file] => patents/04/786/04786864.pdf
[firstpage_image] =>[orig_patent_app_number] => 932128
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/932128 | Photon assisted tunneling testing of passivated integrated circuits | Nov 17, 1986 | Issued |
| 06/925764 | ELECTRON BEAM CONTACTLESS TESTING SYSTEM WITH GRID BIAS SWITCHING | Oct 29, 1986 | Issued |
Array
(
[id] => 2458580
[patent_doc_number] => 04768196
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1988-08-30
[patent_title] => 'Programmable logic array'
[patent_app_type] => 1
[patent_app_number] => 6/923984
[patent_app_country] => US
[patent_app_date] => 1986-10-28
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/04/768/04768196.pdf
[firstpage_image] =>[orig_patent_app_number] => 923984
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/923984 | Programmable logic array | Oct 27, 1986 | Issued |
Array
(
[id] => 2528081
[patent_doc_number] => 04878017
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1989-10-31
[patent_title] => 'High speed D.C. non-contacting electrostatic voltage follower'
[patent_app_type] => 1
[patent_app_number] => 6/924054
[patent_app_country] => US
[patent_app_date] => 1986-10-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[pdf_file] => patents/04/878/04878017.pdf
[firstpage_image] =>[orig_patent_app_number] => 924054
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/924054 | High speed D.C. non-contacting electrostatic voltage follower | Oct 27, 1986 | Issued |
| 06/923438 | POWER SENSOR FOR RF POWER MEASUREMENTS | Oct 26, 1986 | Abandoned |
Array
(
[id] => 2418638
[patent_doc_number] => 04742296
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1988-05-03
[patent_title] => 'Arrangement for measuring electrical power'
[patent_app_type] => 1
[patent_app_number] => 6/922124
[patent_app_country] => US
[patent_app_date] => 1986-10-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
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[pdf_file] => patents/04/742/04742296.pdf
[firstpage_image] =>[orig_patent_app_number] => 922124
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/922124 | Arrangement for measuring electrical power | Oct 21, 1986 | Issued |
| 06/919374 | ELECTRIC WATER HEATER ANALYZER | Oct 15, 1986 | Abandoned |
Array
(
[id] => 2429782
[patent_doc_number] => 04739254
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1988-04-19
[patent_title] => 'Voltage measuring device of a high voltage metalclad installation'
[patent_app_type] => 1
[patent_app_number] => 6/916569
[patent_app_country] => US
[patent_app_date] => 1986-10-08
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[pdf_file] => patents/04/739/04739254.pdf
[firstpage_image] =>[orig_patent_app_number] => 916569
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/916569 | Voltage measuring device of a high voltage metalclad installation | Oct 7, 1986 | Issued |
Array
(
[id] => 2421731
[patent_doc_number] => 04771230
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1988-09-13
[patent_title] => 'Electro-luminescent method and testing system for unpopulated printed circuit boards, ceramic substrates, and the like having both electrical and electro-optical read-out'
[patent_app_type] => 1
[patent_app_number] => 6/914308
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[pdf_file] => patents/04/771/04771230.pdf
[firstpage_image] =>[orig_patent_app_number] => 914308
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/914308 | Electro-luminescent method and testing system for unpopulated printed circuit boards, ceramic substrates, and the like having both electrical and electro-optical read-out | Oct 1, 1986 | Issued |
| 06/914719 | APPARATUS INCLUDING A FOCUSED UV LIGHT SOURCE FOR NON-CONTACT MEASUREMENT AND ALTERATION OF ELECTRICAL PROPERTIES OF CONDUCTORS | Oct 1, 1986 | Abandoned |
| 06/913193 | MOTOR CURRENT SIGNATURE ANALYSIS METHOD AND APPARATUS FOR DRAGNOSING M OTOR OPERATED DEVICE | Sep 29, 1986 | Abandoned |
Array
(
[id] => 2472850
[patent_doc_number] => 04845427
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1989-07-04
[patent_title] => 'Arrangement for the measurement of electronic units'
[patent_app_type] => 1
[patent_app_number] => 6/914826
[patent_app_country] => US
[patent_app_date] => 1986-09-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[pdf_file] => patents/04/845/04845427.pdf
[firstpage_image] =>[orig_patent_app_number] => 914826
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/914826 | Arrangement for the measurement of electronic units | Sep 25, 1986 | Issued |
Array
(
[id] => 2527777
[patent_doc_number] => 04881029
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1989-11-14
[patent_title] => 'Semiconductor integrated circuit devices and methods for testing same'
[patent_app_type] => 1
[patent_app_number] => 6/911739
[patent_app_country] => US
[patent_app_date] => 1986-09-26
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/04/881/04881029.pdf
[firstpage_image] =>[orig_patent_app_number] => 911739
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/911739 | Semiconductor integrated circuit devices and methods for testing same | Sep 25, 1986 | Issued |
| 06/912024 | CONCURRENT MEMORY ACCESS SYSTEM | Sep 24, 1986 | Abandoned |
Array
(
[id] => 2428053
[patent_doc_number] => 04763066
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1988-08-09
[patent_title] => 'Automatic test equipment for integrated circuits'
[patent_app_type] => 1
[patent_app_number] => 6/910483
[patent_app_country] => US
[patent_app_date] => 1986-09-23
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[pdf_file] => patents/04/763/04763066.pdf
[firstpage_image] =>[orig_patent_app_number] => 910483
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/910483 | Automatic test equipment for integrated circuits | Sep 22, 1986 | Issued |
Array
(
[id] => 2493096
[patent_doc_number] => 04801871
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1989-01-31
[patent_title] => 'Testing apparatus for semiconductor device'
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[patent_app_number] => 6/909303
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[pdf_file] => patents/04/801/04801871.pdf
[firstpage_image] =>[orig_patent_app_number] => 909303
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/909303 | Testing apparatus for semiconductor device | Sep 18, 1986 | Issued |
Array
(
[id] => 2357507
[patent_doc_number] => 04714879
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1987-12-22
[patent_title] => 'Holding and testing device for electronic modules within flat carriers'
[patent_app_type] => 1
[patent_app_number] => 6/908238
[patent_app_country] => US
[patent_app_date] => 1986-09-17
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[pdf_file] => patents/04/714/04714879.pdf
[firstpage_image] =>[orig_patent_app_number] => 908238
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/908238 | Holding and testing device for electronic modules within flat carriers | Sep 16, 1986 | Issued |
Array
(
[id] => 2672783
[patent_doc_number] => 04904933
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1990-02-27
[patent_title] => 'Integrated circuit probe station'
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[firstpage_image] =>[orig_patent_app_number] => 905359
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/905359 | Integrated circuit probe station | Sep 7, 1986 | Issued |
Array
(
[id] => 2420839
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[patent_issue_date] => 1988-03-01
[patent_title] => 'Method and apparatus for converting an electrical signal into a proportional frequency'
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[firstpage_image] =>[orig_patent_app_number] => 904045
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/904045 | Method and apparatus for converting an electrical signal into a proportional frequency | Sep 3, 1986 | Issued |
Array
(
[id] => 2558789
[patent_doc_number] => 04814696
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1989-03-21
[patent_title] => 'Method and circuit arrangement for measuring in-phase and quadrature components of current in an electrical alternating current power supply'
[patent_app_type] => 1
[patent_app_number] => 6/892349
[patent_app_country] => US
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[rel_patent_id] =>[rel_patent_doc_number] =>) 06/892349 | Method and circuit arrangement for measuring in-phase and quadrature components of current in an electrical alternating current power supply | Jul 31, 1986 | Issued |