Search

Andy Ho

Examiner (ID: 5607, Phone: (571)272-3762 , Office: P/2194 )

Most Active Art Unit
2194
Art Unit(s)
2126, 2194, 2151
Total Applications
1669
Issued Applications
1447
Pending Applications
77
Abandoned Applications
165

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 2853179 [patent_doc_number] => 05111136 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-05-05 [patent_title] => 'Semiconductor circuit' [patent_app_type] => 1 [patent_app_number] => 7/746148 [patent_app_country] => US [patent_app_date] => 1991-08-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2682 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 153 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/111/05111136.pdf [firstpage_image] =>[orig_patent_app_number] => 746148 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/746148
Semiconductor circuit Aug 13, 1991 Issued
Array ( [id] => 2985119 [patent_doc_number] => 05204614 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-04-20 [patent_title] => 'Broad-band microwave power sensor using diodes above their resonant frequency' [patent_app_type] => 1 [patent_app_number] => 7/744858 [patent_app_country] => US [patent_app_date] => 1991-08-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 24 [patent_no_of_words] => 6858 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 231 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/204/05204614.pdf [firstpage_image] =>[orig_patent_app_number] => 744858 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/744858
Broad-band microwave power sensor using diodes above their resonant frequency Aug 13, 1991 Issued
Array ( [id] => 2965157 [patent_doc_number] => 05198752 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-03-30 [patent_title] => 'Electric probing-test machine having a cooling system' [patent_app_type] => 1 [patent_app_number] => 7/738304 [patent_app_country] => US [patent_app_date] => 1991-07-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 25 [patent_no_of_words] => 8855 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 141 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/198/05198752.pdf [firstpage_image] =>[orig_patent_app_number] => 738304 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/738304
Electric probing-test machine having a cooling system Jul 30, 1991 Issued
Array ( [id] => 2898051 [patent_doc_number] => 05210485 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-05-11 [patent_title] => 'Probe for wafer burn-in test system' [patent_app_type] => 1 [patent_app_number] => 7/736899 [patent_app_country] => US [patent_app_date] => 1991-07-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4748 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 239 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/210/05210485.pdf [firstpage_image] =>[orig_patent_app_number] => 736899 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/736899
Probe for wafer burn-in test system Jul 25, 1991 Issued
Array ( [id] => 2913344 [patent_doc_number] => 05216361 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-06-01 [patent_title] => 'Modular board test system having wireless receiver' [patent_app_type] => 1 [patent_app_number] => 7/727278 [patent_app_country] => US [patent_app_date] => 1991-07-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 15 [patent_no_of_words] => 5283 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 237 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/216/05216361.pdf [firstpage_image] =>[orig_patent_app_number] => 727278 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/727278
Modular board test system having wireless receiver Jul 9, 1991 Issued
Array ( [id] => 2980687 [patent_doc_number] => 05208529 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-05-04 [patent_title] => 'Electric device contact assembly' [patent_app_type] => 1 [patent_app_number] => 7/725334 [patent_app_country] => US [patent_app_date] => 1991-07-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 11 [patent_no_of_words] => 4336 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 10 [patent_words_short_claim] => 58 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/208/05208529.pdf [firstpage_image] =>[orig_patent_app_number] => 725334 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/725334
Electric device contact assembly Jul 2, 1991 Issued
Array ( [id] => 2845727 [patent_doc_number] => 05172053 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-12-15 [patent_title] => 'Prober apparatus' [patent_app_type] => 1 [patent_app_number] => 7/726725 [patent_app_country] => US [patent_app_date] => 1991-07-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 18 [patent_no_of_words] => 4744 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 303 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/172/05172053.pdf [firstpage_image] =>[orig_patent_app_number] => 726725 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/726725
Prober apparatus Jun 30, 1991 Issued
Array ( [id] => 2932927 [patent_doc_number] => 05187431 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-02-16 [patent_title] => 'Universal multicontact connection between an EWS probe card and a test card of a \"test-on-wafer\" station' [patent_app_type] => 1 [patent_app_number] => 7/716704 [patent_app_country] => US [patent_app_date] => 1991-06-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 2780 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 202 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/187/05187431.pdf [firstpage_image] =>[orig_patent_app_number] => 716704 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/716704
Universal multicontact connection between an EWS probe card and a test card of a "test-on-wafer" station Jun 17, 1991 Issued
Array ( [id] => 2898088 [patent_doc_number] => 05210487 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-05-11 [patent_title] => 'Double-gated integrating scheme for electron beam tester' [patent_app_type] => 1 [patent_app_number] => 7/710768 [patent_app_country] => US [patent_app_date] => 1991-06-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 7610 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 229 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/210/05210487.pdf [firstpage_image] =>[orig_patent_app_number] => 710768 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/710768
Double-gated integrating scheme for electron beam tester Jun 3, 1991 Issued
07/707844 APPARATUS AND METHOD FOR TESTING ELECTRONIC DEVICES May 29, 1991 Abandoned
Array ( [id] => 2828447 [patent_doc_number] => 05095267 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-03-10 [patent_title] => 'Method of screening A.C. performance characteristics during D.C. parametric test operation' [patent_app_type] => 1 [patent_app_number] => 7/706788 [patent_app_country] => US [patent_app_date] => 1991-05-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4715 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 147 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/095/05095267.pdf [firstpage_image] =>[orig_patent_app_number] => 706788 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/706788
Method of screening A.C. performance characteristics during D.C. parametric test operation May 28, 1991 Issued
Array ( [id] => 2899041 [patent_doc_number] => 05177436 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-01-05 [patent_title] => 'Contactor for testing integrated circuit chips mounted in molded carrier rings' [patent_app_type] => 1 [patent_app_number] => 7/703604 [patent_app_country] => US [patent_app_date] => 1991-05-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 9 [patent_no_of_words] => 3932 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 235 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/177/05177436.pdf [firstpage_image] =>[orig_patent_app_number] => 703604 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/703604
Contactor for testing integrated circuit chips mounted in molded carrier rings May 20, 1991 Issued
Array ( [id] => 2853086 [patent_doc_number] => 05107206 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-04-21 [patent_title] => 'Printed circuit board inspection apparatus' [patent_app_type] => 1 [patent_app_number] => 7/702858 [patent_app_country] => US [patent_app_date] => 1991-05-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 23 [patent_no_of_words] => 4765 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 219 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/107/05107206.pdf [firstpage_image] =>[orig_patent_app_number] => 702858 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/702858
Printed circuit board inspection apparatus May 19, 1991 Issued
07/702218 ELECTRONIC WATTHOUR METER May 16, 1991 Abandoned
Array ( [id] => 2825564 [patent_doc_number] => 05168217 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-12-01 [patent_title] => 'Method of detecting floated lead of electrical component' [patent_app_type] => 1 [patent_app_number] => 7/696388 [patent_app_country] => US [patent_app_date] => 1991-05-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 1467 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 108 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/168/05168217.pdf [firstpage_image] =>[orig_patent_app_number] => 696388 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/696388
Method of detecting floated lead of electrical component May 5, 1991 Issued
Array ( [id] => 2800166 [patent_doc_number] => 05144228 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-09-01 [patent_title] => 'Probe interface assembly' [patent_app_type] => 1 [patent_app_number] => 7/690404 [patent_app_country] => US [patent_app_date] => 1991-04-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 10 [patent_no_of_words] => 7156 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 285 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/144/05144228.pdf [firstpage_image] =>[orig_patent_app_number] => 690404 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/690404
Probe interface assembly Apr 22, 1991 Issued
Array ( [id] => 2860260 [patent_doc_number] => 05113130 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-05-12 [patent_title] => 'Testing operation of electric energy meter optics system' [patent_app_type] => 1 [patent_app_number] => 7/687788 [patent_app_country] => US [patent_app_date] => 1991-04-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 3540 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 93 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/113/05113130.pdf [firstpage_image] =>[orig_patent_app_number] => 687788 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/687788
Testing operation of electric energy meter optics system Apr 21, 1991 Issued
07/685878 ACTIVE PROBE CARD Apr 14, 1991 Abandoned
Array ( [id] => 2939915 [patent_doc_number] => 05196784 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-03-23 [patent_title] => 'Isolated current monitoring circuit for measuring direct and high duty factor currents' [patent_app_type] => 1 [patent_app_number] => 7/670664 [patent_app_country] => US [patent_app_date] => 1991-03-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 29 [patent_no_of_words] => 8529 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 319 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/196/05196784.pdf [firstpage_image] =>[orig_patent_app_number] => 670664 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/670664
Isolated current monitoring circuit for measuring direct and high duty factor currents Mar 17, 1991 Issued
Array ( [id] => 2779607 [patent_doc_number] => 05132612 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-07-21 [patent_title] => 'Apparatus for electrostatic discharge (ESD) stress/testing' [patent_app_type] => 1 [patent_app_number] => 7/669254 [patent_app_country] => US [patent_app_date] => 1991-03-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 1927 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 196 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/132/05132612.pdf [firstpage_image] =>[orig_patent_app_number] => 669254 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/669254
Apparatus for electrostatic discharge (ESD) stress/testing Mar 13, 1991 Issued
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