
Andy Ho
Examiner (ID: 5607, Phone: (571)272-3762 , Office: P/2194 )
| Most Active Art Unit | 2194 |
| Art Unit(s) | 2126, 2194, 2151 |
| Total Applications | 1669 |
| Issued Applications | 1447 |
| Pending Applications | 77 |
| Abandoned Applications | 165 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 2853179
[patent_doc_number] => 05111136
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-05-05
[patent_title] => 'Semiconductor circuit'
[patent_app_type] => 1
[patent_app_number] => 7/746148
[patent_app_country] => US
[patent_app_date] => 1991-08-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 2682
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 153
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/111/05111136.pdf
[firstpage_image] =>[orig_patent_app_number] => 746148
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/746148 | Semiconductor circuit | Aug 13, 1991 | Issued |
Array
(
[id] => 2985119
[patent_doc_number] => 05204614
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1993-04-20
[patent_title] => 'Broad-band microwave power sensor using diodes above their resonant frequency'
[patent_app_type] => 1
[patent_app_number] => 7/744858
[patent_app_country] => US
[patent_app_date] => 1991-08-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 24
[patent_no_of_words] => 6858
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 231
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/204/05204614.pdf
[firstpage_image] =>[orig_patent_app_number] => 744858
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/744858 | Broad-band microwave power sensor using diodes above their resonant frequency | Aug 13, 1991 | Issued |
Array
(
[id] => 2965157
[patent_doc_number] => 05198752
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1993-03-30
[patent_title] => 'Electric probing-test machine having a cooling system'
[patent_app_type] => 1
[patent_app_number] => 7/738304
[patent_app_country] => US
[patent_app_date] => 1991-07-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 25
[patent_no_of_words] => 8855
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 141
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/198/05198752.pdf
[firstpage_image] =>[orig_patent_app_number] => 738304
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/738304 | Electric probing-test machine having a cooling system | Jul 30, 1991 | Issued |
Array
(
[id] => 2898051
[patent_doc_number] => 05210485
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1993-05-11
[patent_title] => 'Probe for wafer burn-in test system'
[patent_app_type] => 1
[patent_app_number] => 7/736899
[patent_app_country] => US
[patent_app_date] => 1991-07-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 4748
[patent_no_of_claims] => 24
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 239
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/210/05210485.pdf
[firstpage_image] =>[orig_patent_app_number] => 736899
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/736899 | Probe for wafer burn-in test system | Jul 25, 1991 | Issued |
Array
(
[id] => 2913344
[patent_doc_number] => 05216361
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1993-06-01
[patent_title] => 'Modular board test system having wireless receiver'
[patent_app_type] => 1
[patent_app_number] => 7/727278
[patent_app_country] => US
[patent_app_date] => 1991-07-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 15
[patent_no_of_words] => 5283
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 8
[patent_words_short_claim] => 237
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/216/05216361.pdf
[firstpage_image] =>[orig_patent_app_number] => 727278
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/727278 | Modular board test system having wireless receiver | Jul 9, 1991 | Issued |
Array
(
[id] => 2980687
[patent_doc_number] => 05208529
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1993-05-04
[patent_title] => 'Electric device contact assembly'
[patent_app_type] => 1
[patent_app_number] => 7/725334
[patent_app_country] => US
[patent_app_date] => 1991-07-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 11
[patent_no_of_words] => 4336
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 10
[patent_words_short_claim] => 58
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/208/05208529.pdf
[firstpage_image] =>[orig_patent_app_number] => 725334
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/725334 | Electric device contact assembly | Jul 2, 1991 | Issued |
Array
(
[id] => 2845727
[patent_doc_number] => 05172053
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-12-15
[patent_title] => 'Prober apparatus'
[patent_app_type] => 1
[patent_app_number] => 7/726725
[patent_app_country] => US
[patent_app_date] => 1991-07-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 18
[patent_no_of_words] => 4744
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 303
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/172/05172053.pdf
[firstpage_image] =>[orig_patent_app_number] => 726725
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/726725 | Prober apparatus | Jun 30, 1991 | Issued |
Array
(
[id] => 2932927
[patent_doc_number] => 05187431
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1993-02-16
[patent_title] => 'Universal multicontact connection between an EWS probe card and a test card of a \"test-on-wafer\" station'
[patent_app_type] => 1
[patent_app_number] => 7/716704
[patent_app_country] => US
[patent_app_date] => 1991-06-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 5
[patent_no_of_words] => 2780
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 202
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/187/05187431.pdf
[firstpage_image] =>[orig_patent_app_number] => 716704
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/716704 | Universal multicontact connection between an EWS probe card and a test card of a "test-on-wafer" station | Jun 17, 1991 | Issued |
Array
(
[id] => 2898088
[patent_doc_number] => 05210487
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1993-05-11
[patent_title] => 'Double-gated integrating scheme for electron beam tester'
[patent_app_type] => 1
[patent_app_number] => 7/710768
[patent_app_country] => US
[patent_app_date] => 1991-06-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 14
[patent_no_of_words] => 7610
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 8
[patent_words_short_claim] => 229
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/210/05210487.pdf
[firstpage_image] =>[orig_patent_app_number] => 710768
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/710768 | Double-gated integrating scheme for electron beam tester | Jun 3, 1991 | Issued |
| 07/707844 | APPARATUS AND METHOD FOR TESTING ELECTRONIC DEVICES | May 29, 1991 | Abandoned |
Array
(
[id] => 2828447
[patent_doc_number] => 05095267
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-03-10
[patent_title] => 'Method of screening A.C. performance characteristics during D.C. parametric test operation'
[patent_app_type] => 1
[patent_app_number] => 7/706788
[patent_app_country] => US
[patent_app_date] => 1991-05-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 4715
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 147
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/095/05095267.pdf
[firstpage_image] =>[orig_patent_app_number] => 706788
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/706788 | Method of screening A.C. performance characteristics during D.C. parametric test operation | May 28, 1991 | Issued |
Array
(
[id] => 2899041
[patent_doc_number] => 05177436
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1993-01-05
[patent_title] => 'Contactor for testing integrated circuit chips mounted in molded carrier rings'
[patent_app_type] => 1
[patent_app_number] => 7/703604
[patent_app_country] => US
[patent_app_date] => 1991-05-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 9
[patent_no_of_words] => 3932
[patent_no_of_claims] => 24
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 235
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/177/05177436.pdf
[firstpage_image] =>[orig_patent_app_number] => 703604
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/703604 | Contactor for testing integrated circuit chips mounted in molded carrier rings | May 20, 1991 | Issued |
Array
(
[id] => 2853086
[patent_doc_number] => 05107206
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-04-21
[patent_title] => 'Printed circuit board inspection apparatus'
[patent_app_type] => 1
[patent_app_number] => 7/702858
[patent_app_country] => US
[patent_app_date] => 1991-05-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 23
[patent_no_of_words] => 4765
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 219
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/107/05107206.pdf
[firstpage_image] =>[orig_patent_app_number] => 702858
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/702858 | Printed circuit board inspection apparatus | May 19, 1991 | Issued |
| 07/702218 | ELECTRONIC WATTHOUR METER | May 16, 1991 | Abandoned |
Array
(
[id] => 2825564
[patent_doc_number] => 05168217
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-12-01
[patent_title] => 'Method of detecting floated lead of electrical component'
[patent_app_type] => 1
[patent_app_number] => 7/696388
[patent_app_country] => US
[patent_app_date] => 1991-05-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 5
[patent_no_of_words] => 1467
[patent_no_of_claims] => 2
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 108
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/168/05168217.pdf
[firstpage_image] =>[orig_patent_app_number] => 696388
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/696388 | Method of detecting floated lead of electrical component | May 5, 1991 | Issued |
Array
(
[id] => 2800166
[patent_doc_number] => 05144228
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-09-01
[patent_title] => 'Probe interface assembly'
[patent_app_type] => 1
[patent_app_number] => 7/690404
[patent_app_country] => US
[patent_app_date] => 1991-04-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 10
[patent_no_of_words] => 7156
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 285
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/144/05144228.pdf
[firstpage_image] =>[orig_patent_app_number] => 690404
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/690404 | Probe interface assembly | Apr 22, 1991 | Issued |
Array
(
[id] => 2860260
[patent_doc_number] => 05113130
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-05-12
[patent_title] => 'Testing operation of electric energy meter optics system'
[patent_app_type] => 1
[patent_app_number] => 7/687788
[patent_app_country] => US
[patent_app_date] => 1991-04-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 6
[patent_no_of_words] => 3540
[patent_no_of_claims] => 26
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 93
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/113/05113130.pdf
[firstpage_image] =>[orig_patent_app_number] => 687788
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/687788 | Testing operation of electric energy meter optics system | Apr 21, 1991 | Issued |
| 07/685878 | ACTIVE PROBE CARD | Apr 14, 1991 | Abandoned |
Array
(
[id] => 2939915
[patent_doc_number] => 05196784
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1993-03-23
[patent_title] => 'Isolated current monitoring circuit for measuring direct and high duty factor currents'
[patent_app_type] => 1
[patent_app_number] => 7/670664
[patent_app_country] => US
[patent_app_date] => 1991-03-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 29
[patent_no_of_words] => 8529
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 319
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/196/05196784.pdf
[firstpage_image] =>[orig_patent_app_number] => 670664
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/670664 | Isolated current monitoring circuit for measuring direct and high duty factor currents | Mar 17, 1991 | Issued |
Array
(
[id] => 2779607
[patent_doc_number] => 05132612
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-07-21
[patent_title] => 'Apparatus for electrostatic discharge (ESD) stress/testing'
[patent_app_type] => 1
[patent_app_number] => 7/669254
[patent_app_country] => US
[patent_app_date] => 1991-03-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 6
[patent_no_of_words] => 1927
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 196
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/132/05132612.pdf
[firstpage_image] =>[orig_patent_app_number] => 669254
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/669254 | Apparatus for electrostatic discharge (ESD) stress/testing | Mar 13, 1991 | Issued |