
Andy Ho
Examiner (ID: 5607, Phone: (571)272-3762 , Office: P/2194 )
| Most Active Art Unit | 2194 |
| Art Unit(s) | 2126, 2194, 2151 |
| Total Applications | 1669 |
| Issued Applications | 1447 |
| Pending Applications | 77 |
| Abandoned Applications | 165 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 2320172
[patent_doc_number] => 04686466
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1987-08-11
[patent_title] => 'Method for automatically setting the voltage resolution in particle beam measuring devices and apparatus for implementation thereof'
[patent_app_type] => 1
[patent_app_number] => 6/705983
[patent_app_country] => US
[patent_app_date] => 1985-02-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 1
[patent_no_of_words] => 1704
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 84
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/686/04686466.pdf
[firstpage_image] =>[orig_patent_app_number] => 705983
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/705983 | Method for automatically setting the voltage resolution in particle beam measuring devices and apparatus for implementation thereof | Feb 26, 1985 | Issued |
Array
(
[id] => 2353489
[patent_doc_number] => 04703252
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1987-10-27
[patent_title] => 'Apparatus and methods for resistivity testing'
[patent_app_type] => 1
[patent_app_number] => 6/704296
[patent_app_country] => US
[patent_app_date] => 1985-02-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 12
[patent_no_of_words] => 4606
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 157
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/703/04703252.pdf
[firstpage_image] =>[orig_patent_app_number] => 704296
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/704296 | Apparatus and methods for resistivity testing | Feb 21, 1985 | Issued |
Array
(
[id] => 2394133
[patent_doc_number] => 04754218
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1988-06-28
[patent_title] => 'Current sensing apparatus'
[patent_app_type] => 1
[patent_app_number] => 6/703755
[patent_app_country] => US
[patent_app_date] => 1985-02-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 13
[patent_no_of_words] => 3873
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 149
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/754/04754218.pdf
[firstpage_image] =>[orig_patent_app_number] => 703755
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/703755 | Current sensing apparatus | Feb 20, 1985 | Issued |
Array
(
[id] => 2418565
[patent_doc_number] => 04719418
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1988-01-12
[patent_title] => 'Defect leakage screen system'
[patent_app_type] => 1
[patent_app_number] => 6/703001
[patent_app_country] => US
[patent_app_date] => 1985-02-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 3000
[patent_no_of_claims] => 23
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 79
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/719/04719418.pdf
[firstpage_image] =>[orig_patent_app_number] => 703001
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/703001 | Defect leakage screen system | Feb 18, 1985 | Issued |
Array
(
[id] => 2352633
[patent_doc_number] => 04692693
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1987-09-08
[patent_title] => 'Apparatus for measuring low currents with high dynamics'
[patent_app_type] => 1
[patent_app_number] => 6/694439
[patent_app_country] => US
[patent_app_date] => 1985-01-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 5
[patent_no_of_words] => 2391
[patent_no_of_claims] => 2
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 461
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/692/04692693.pdf
[firstpage_image] =>[orig_patent_app_number] => 694439
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/694439 | Apparatus for measuring low currents with high dynamics | Jan 23, 1985 | Issued |
Array
(
[id] => 2339264
[patent_doc_number] => 04712057
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1987-12-08
[patent_title] => 'Method of examining and testing an electric device such as an integrated or printed circuit'
[patent_app_type] => 1
[patent_app_number] => 6/705341
[patent_app_country] => US
[patent_app_date] => 1985-01-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 5
[patent_no_of_words] => 4526
[patent_no_of_claims] => 28
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 131
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/712/04712057.pdf
[firstpage_image] =>[orig_patent_app_number] => 705341
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/705341 | Method of examining and testing an electric device such as an integrated or printed circuit | Jan 17, 1985 | Issued |
Array
(
[id] => 2295650
[patent_doc_number] => 04710707
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1987-12-01
[patent_title] => 'High voltage electronic component test apparatus'
[patent_app_type] => 1
[patent_app_number] => 6/692583
[patent_app_country] => US
[patent_app_date] => 1985-01-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 3
[patent_no_of_words] => 3731
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 209
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/710/04710707.pdf
[firstpage_image] =>[orig_patent_app_number] => 692583
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/692583 | High voltage electronic component test apparatus | Jan 15, 1985 | Issued |
Array
(
[id] => 2345376
[patent_doc_number] => 04661772
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1987-04-28
[patent_title] => 'Measuring and testing circuit'
[patent_app_type] => 1
[patent_app_number] => 6/691124
[patent_app_country] => US
[patent_app_date] => 1985-01-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 1
[patent_no_of_words] => 1849
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 267
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/661/04661772.pdf
[firstpage_image] =>[orig_patent_app_number] => 691124
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/691124 | Measuring and testing circuit | Jan 13, 1985 | Issued |
Array
(
[id] => 2651153
[patent_doc_number] => 04980635
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1990-12-25
[patent_title] => 'Integrated circuit package carrier'
[patent_app_type] => 1
[patent_app_number] => 6/686335
[patent_app_country] => US
[patent_app_date] => 1984-12-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 4
[patent_no_of_words] => 1945
[patent_no_of_claims] => 2
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 112
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/980/04980635.pdf
[firstpage_image] =>[orig_patent_app_number] => 686335
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/686335 | Integrated circuit package carrier | Dec 25, 1984 | Issued |
Array
(
[id] => 2363061
[patent_doc_number] => 04658212
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1987-04-14
[patent_title] => 'Connector terminal examination device'
[patent_app_type] => 1
[patent_app_number] => 6/685917
[patent_app_country] => US
[patent_app_date] => 1984-12-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 3
[patent_no_of_words] => 1848
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 240
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/658/04658212.pdf
[firstpage_image] =>[orig_patent_app_number] => 685917
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/685917 | Connector terminal examination device | Dec 25, 1984 | Issued |
Array
(
[id] => 2352592
[patent_doc_number] => 04692690
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1987-09-08
[patent_title] => 'Pattern detecting apparatus'
[patent_app_type] => 1
[patent_app_number] => 6/686007
[patent_app_country] => US
[patent_app_date] => 1984-12-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 33
[patent_no_of_words] => 6722
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 237
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/692/04692690.pdf
[firstpage_image] =>[orig_patent_app_number] => 686007
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/686007 | Pattern detecting apparatus | Dec 23, 1984 | Issued |
Array
(
[id] => 2339324
[patent_doc_number] => 04712062
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1987-12-08
[patent_title] => 'Ground shield apparatus for giga-hertz test jig'
[patent_app_type] => 1
[patent_app_number] => 6/684767
[patent_app_country] => US
[patent_app_date] => 1984-12-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 7
[patent_no_of_words] => 4811
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 200
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/712/04712062.pdf
[firstpage_image] =>[orig_patent_app_number] => 684767
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/684767 | Ground shield apparatus for giga-hertz test jig | Dec 19, 1984 | Issued |
Array
(
[id] => 2331052
[patent_doc_number] => 04672312
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1987-06-09
[patent_title] => 'Giga-hertz test jig'
[patent_app_type] => 1
[patent_app_number] => 6/684421
[patent_app_country] => US
[patent_app_date] => 1984-12-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 6
[patent_no_of_words] => 3964
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 201
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/672/04672312.pdf
[firstpage_image] =>[orig_patent_app_number] => 684421
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/684421 | Giga-hertz test jig | Dec 19, 1984 | Issued |
Array
(
[id] => 2345344
[patent_doc_number] => 04661770
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1987-04-28
[patent_title] => 'Method and apparatus for measuring minority carrier lifetime in a direct band-gap semiconductor'
[patent_app_type] => 1
[patent_app_number] => 6/683111
[patent_app_country] => US
[patent_app_date] => 1984-12-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 5781
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 125
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/661/04661770.pdf
[firstpage_image] =>[orig_patent_app_number] => 683111
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/683111 | Method and apparatus for measuring minority carrier lifetime in a direct band-gap semiconductor | Dec 17, 1984 | Issued |
| 06/681297 | AMPLIFIER WITH D.C. BOOTSTRAPPING | Dec 12, 1984 | Abandoned |
Array
(
[id] => 2248150
[patent_doc_number] => 04633175
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1986-12-30
[patent_title] => 'Testing method and apparatus for electronic components'
[patent_app_type] => 1
[patent_app_number] => 6/674519
[patent_app_country] => US
[patent_app_date] => 1984-11-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 4
[patent_no_of_words] => 2482
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 203
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/633/04633175.pdf
[firstpage_image] =>[orig_patent_app_number] => 674519
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/674519 | Testing method and apparatus for electronic components | Nov 22, 1984 | Issued |
Array
(
[id] => 2363070
[patent_doc_number] => 04658213
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1987-04-14
[patent_title] => 'Method and apparatus for testing direct current motors and generators, electromagnetic devices, and the like'
[patent_app_type] => 1
[patent_app_number] => 6/671926
[patent_app_country] => US
[patent_app_date] => 1984-11-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 4
[patent_no_of_words] => 7195
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 113
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/658/04658213.pdf
[firstpage_image] =>[orig_patent_app_number] => 671926
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/671926 | Method and apparatus for testing direct current motors and generators, electromagnetic devices, and the like | Nov 15, 1984 | Issued |
| 06/670090 | CONTROLLED IMPEDANCE MICROCIRCUIT PROBE | Nov 12, 1984 | Abandoned |
Array
(
[id] => 2330431
[patent_doc_number] => 04706018
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1987-11-10
[patent_title] => 'Noncontact dynamic tester for integrated circuits'
[patent_app_type] => 1
[patent_app_number] => 6/667506
[patent_app_country] => US
[patent_app_date] => 1984-11-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 2
[patent_no_of_words] => 3416
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 202
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/706/04706018.pdf
[firstpage_image] =>[orig_patent_app_number] => 667506
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/667506 | Noncontact dynamic tester for integrated circuits | Oct 31, 1984 | Issued |
Array
(
[id] => 2387546
[patent_doc_number] => 04720675
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1988-01-19
[patent_title] => 'Meter locking system'
[patent_app_type] => 1
[patent_app_number] => 6/659896
[patent_app_country] => US
[patent_app_date] => 1984-10-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 10
[patent_no_of_words] => 3096
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 302
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/720/04720675.pdf
[firstpage_image] =>[orig_patent_app_number] => 659896
[rel_patent_id] =>[rel_patent_doc_number] =>) 06/659896 | Meter locking system | Oct 11, 1984 | Issued |