Search

Andy Ho

Examiner (ID: 5607, Phone: (571)272-3762 , Office: P/2194 )

Most Active Art Unit
2194
Art Unit(s)
2126, 2194, 2151
Total Applications
1669
Issued Applications
1447
Pending Applications
77
Abandoned Applications
165

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 2320172 [patent_doc_number] => 04686466 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1987-08-11 [patent_title] => 'Method for automatically setting the voltage resolution in particle beam measuring devices and apparatus for implementation thereof' [patent_app_type] => 1 [patent_app_number] => 6/705983 [patent_app_country] => US [patent_app_date] => 1985-02-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 1704 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 84 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/686/04686466.pdf [firstpage_image] =>[orig_patent_app_number] => 705983 [rel_patent_id] =>[rel_patent_doc_number] =>)
06/705983
Method for automatically setting the voltage resolution in particle beam measuring devices and apparatus for implementation thereof Feb 26, 1985 Issued
Array ( [id] => 2353489 [patent_doc_number] => 04703252 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1987-10-27 [patent_title] => 'Apparatus and methods for resistivity testing' [patent_app_type] => 1 [patent_app_number] => 6/704296 [patent_app_country] => US [patent_app_date] => 1985-02-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 12 [patent_no_of_words] => 4606 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 157 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/703/04703252.pdf [firstpage_image] =>[orig_patent_app_number] => 704296 [rel_patent_id] =>[rel_patent_doc_number] =>)
06/704296
Apparatus and methods for resistivity testing Feb 21, 1985 Issued
Array ( [id] => 2394133 [patent_doc_number] => 04754218 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1988-06-28 [patent_title] => 'Current sensing apparatus' [patent_app_type] => 1 [patent_app_number] => 6/703755 [patent_app_country] => US [patent_app_date] => 1985-02-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 13 [patent_no_of_words] => 3873 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 149 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/754/04754218.pdf [firstpage_image] =>[orig_patent_app_number] => 703755 [rel_patent_id] =>[rel_patent_doc_number] =>)
06/703755
Current sensing apparatus Feb 20, 1985 Issued
Array ( [id] => 2418565 [patent_doc_number] => 04719418 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1988-01-12 [patent_title] => 'Defect leakage screen system' [patent_app_type] => 1 [patent_app_number] => 6/703001 [patent_app_country] => US [patent_app_date] => 1985-02-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 3000 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 79 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/719/04719418.pdf [firstpage_image] =>[orig_patent_app_number] => 703001 [rel_patent_id] =>[rel_patent_doc_number] =>)
06/703001
Defect leakage screen system Feb 18, 1985 Issued
Array ( [id] => 2352633 [patent_doc_number] => 04692693 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1987-09-08 [patent_title] => 'Apparatus for measuring low currents with high dynamics' [patent_app_type] => 1 [patent_app_number] => 6/694439 [patent_app_country] => US [patent_app_date] => 1985-01-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 2391 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 461 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/692/04692693.pdf [firstpage_image] =>[orig_patent_app_number] => 694439 [rel_patent_id] =>[rel_patent_doc_number] =>)
06/694439
Apparatus for measuring low currents with high dynamics Jan 23, 1985 Issued
Array ( [id] => 2339264 [patent_doc_number] => 04712057 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1987-12-08 [patent_title] => 'Method of examining and testing an electric device such as an integrated or printed circuit' [patent_app_type] => 1 [patent_app_number] => 6/705341 [patent_app_country] => US [patent_app_date] => 1985-01-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 4526 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 131 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/712/04712057.pdf [firstpage_image] =>[orig_patent_app_number] => 705341 [rel_patent_id] =>[rel_patent_doc_number] =>)
06/705341
Method of examining and testing an electric device such as an integrated or printed circuit Jan 17, 1985 Issued
Array ( [id] => 2295650 [patent_doc_number] => 04710707 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1987-12-01 [patent_title] => 'High voltage electronic component test apparatus' [patent_app_type] => 1 [patent_app_number] => 6/692583 [patent_app_country] => US [patent_app_date] => 1985-01-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 3 [patent_no_of_words] => 3731 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 209 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/710/04710707.pdf [firstpage_image] =>[orig_patent_app_number] => 692583 [rel_patent_id] =>[rel_patent_doc_number] =>)
06/692583
High voltage electronic component test apparatus Jan 15, 1985 Issued
Array ( [id] => 2345376 [patent_doc_number] => 04661772 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1987-04-28 [patent_title] => 'Measuring and testing circuit' [patent_app_type] => 1 [patent_app_number] => 6/691124 [patent_app_country] => US [patent_app_date] => 1985-01-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 1849 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 267 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/661/04661772.pdf [firstpage_image] =>[orig_patent_app_number] => 691124 [rel_patent_id] =>[rel_patent_doc_number] =>)
06/691124
Measuring and testing circuit Jan 13, 1985 Issued
Array ( [id] => 2651153 [patent_doc_number] => 04980635 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-12-25 [patent_title] => 'Integrated circuit package carrier' [patent_app_type] => 1 [patent_app_number] => 6/686335 [patent_app_country] => US [patent_app_date] => 1984-12-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 1945 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/980/04980635.pdf [firstpage_image] =>[orig_patent_app_number] => 686335 [rel_patent_id] =>[rel_patent_doc_number] =>)
06/686335
Integrated circuit package carrier Dec 25, 1984 Issued
Array ( [id] => 2363061 [patent_doc_number] => 04658212 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1987-04-14 [patent_title] => 'Connector terminal examination device' [patent_app_type] => 1 [patent_app_number] => 6/685917 [patent_app_country] => US [patent_app_date] => 1984-12-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 1848 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 240 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/658/04658212.pdf [firstpage_image] =>[orig_patent_app_number] => 685917 [rel_patent_id] =>[rel_patent_doc_number] =>)
06/685917
Connector terminal examination device Dec 25, 1984 Issued
Array ( [id] => 2352592 [patent_doc_number] => 04692690 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1987-09-08 [patent_title] => 'Pattern detecting apparatus' [patent_app_type] => 1 [patent_app_number] => 6/686007 [patent_app_country] => US [patent_app_date] => 1984-12-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 33 [patent_no_of_words] => 6722 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 237 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/692/04692690.pdf [firstpage_image] =>[orig_patent_app_number] => 686007 [rel_patent_id] =>[rel_patent_doc_number] =>)
06/686007
Pattern detecting apparatus Dec 23, 1984 Issued
Array ( [id] => 2339324 [patent_doc_number] => 04712062 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1987-12-08 [patent_title] => 'Ground shield apparatus for giga-hertz test jig' [patent_app_type] => 1 [patent_app_number] => 6/684767 [patent_app_country] => US [patent_app_date] => 1984-12-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 4811 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 200 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/712/04712062.pdf [firstpage_image] =>[orig_patent_app_number] => 684767 [rel_patent_id] =>[rel_patent_doc_number] =>)
06/684767
Ground shield apparatus for giga-hertz test jig Dec 19, 1984 Issued
Array ( [id] => 2331052 [patent_doc_number] => 04672312 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1987-06-09 [patent_title] => 'Giga-hertz test jig' [patent_app_type] => 1 [patent_app_number] => 6/684421 [patent_app_country] => US [patent_app_date] => 1984-12-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 3964 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 201 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/672/04672312.pdf [firstpage_image] =>[orig_patent_app_number] => 684421 [rel_patent_id] =>[rel_patent_doc_number] =>)
06/684421
Giga-hertz test jig Dec 19, 1984 Issued
Array ( [id] => 2345344 [patent_doc_number] => 04661770 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1987-04-28 [patent_title] => 'Method and apparatus for measuring minority carrier lifetime in a direct band-gap semiconductor' [patent_app_type] => 1 [patent_app_number] => 6/683111 [patent_app_country] => US [patent_app_date] => 1984-12-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 5781 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/661/04661770.pdf [firstpage_image] =>[orig_patent_app_number] => 683111 [rel_patent_id] =>[rel_patent_doc_number] =>)
06/683111
Method and apparatus for measuring minority carrier lifetime in a direct band-gap semiconductor Dec 17, 1984 Issued
06/681297 AMPLIFIER WITH D.C. BOOTSTRAPPING Dec 12, 1984 Abandoned
Array ( [id] => 2248150 [patent_doc_number] => 04633175 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1986-12-30 [patent_title] => 'Testing method and apparatus for electronic components' [patent_app_type] => 1 [patent_app_number] => 6/674519 [patent_app_country] => US [patent_app_date] => 1984-11-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 4 [patent_no_of_words] => 2482 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 203 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/633/04633175.pdf [firstpage_image] =>[orig_patent_app_number] => 674519 [rel_patent_id] =>[rel_patent_doc_number] =>)
06/674519
Testing method and apparatus for electronic components Nov 22, 1984 Issued
Array ( [id] => 2363070 [patent_doc_number] => 04658213 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1987-04-14 [patent_title] => 'Method and apparatus for testing direct current motors and generators, electromagnetic devices, and the like' [patent_app_type] => 1 [patent_app_number] => 6/671926 [patent_app_country] => US [patent_app_date] => 1984-11-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 7195 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 113 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/658/04658213.pdf [firstpage_image] =>[orig_patent_app_number] => 671926 [rel_patent_id] =>[rel_patent_doc_number] =>)
06/671926
Method and apparatus for testing direct current motors and generators, electromagnetic devices, and the like Nov 15, 1984 Issued
06/670090 CONTROLLED IMPEDANCE MICROCIRCUIT PROBE Nov 12, 1984 Abandoned
Array ( [id] => 2330431 [patent_doc_number] => 04706018 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1987-11-10 [patent_title] => 'Noncontact dynamic tester for integrated circuits' [patent_app_type] => 1 [patent_app_number] => 6/667506 [patent_app_country] => US [patent_app_date] => 1984-11-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 3416 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 202 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/706/04706018.pdf [firstpage_image] =>[orig_patent_app_number] => 667506 [rel_patent_id] =>[rel_patent_doc_number] =>)
06/667506
Noncontact dynamic tester for integrated circuits Oct 31, 1984 Issued
Array ( [id] => 2387546 [patent_doc_number] => 04720675 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1988-01-19 [patent_title] => 'Meter locking system' [patent_app_type] => 1 [patent_app_number] => 6/659896 [patent_app_country] => US [patent_app_date] => 1984-10-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 10 [patent_no_of_words] => 3096 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 302 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/720/04720675.pdf [firstpage_image] =>[orig_patent_app_number] => 659896 [rel_patent_id] =>[rel_patent_doc_number] =>)
06/659896
Meter locking system Oct 11, 1984 Issued
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