Search

Andy Ho

Examiner (ID: 5607, Phone: (571)272-3762 , Office: P/2194 )

Most Active Art Unit
2194
Art Unit(s)
2126, 2194, 2151
Total Applications
1669
Issued Applications
1447
Pending Applications
77
Abandoned Applications
165

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 2927341 [patent_doc_number] => 05200693 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-04-06 [patent_title] => 'Method for determining characteristics of pn semiconductor structures' [patent_app_type] => 1 [patent_app_number] => 7/661019 [patent_app_country] => US [patent_app_date] => 1991-02-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 5517 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 91 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/200/05200693.pdf [firstpage_image] =>[orig_patent_app_number] => 661019 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/661019
Method for determining characteristics of pn semiconductor structures Feb 25, 1991 Issued
Array ( [id] => 2787135 [patent_doc_number] => 05087877 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-02-11 [patent_title] => 'Test contact fixture using flexible circuit tape' [patent_app_type] => 1 [patent_app_number] => 7/659644 [patent_app_country] => US [patent_app_date] => 1991-02-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2928 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/087/05087877.pdf [firstpage_image] =>[orig_patent_app_number] => 659644 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/659644
Test contact fixture using flexible circuit tape Feb 24, 1991 Issued
07/660014 IC TESTER Feb 24, 1991 Abandoned
Array ( [id] => 2793612 [patent_doc_number] => 05101150 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-03-31 [patent_title] => 'Automatic circuit tester with separate instrument and scanner buses' [patent_app_type] => 1 [patent_app_number] => 7/660289 [patent_app_country] => US [patent_app_date] => 1991-02-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 6130 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 293 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/101/05101150.pdf [firstpage_image] =>[orig_patent_app_number] => 660289 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/660289
Automatic circuit tester with separate instrument and scanner buses Feb 21, 1991 Issued
Array ( [id] => 2811369 [patent_doc_number] => 05157325 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-10-20 [patent_title] => 'Compact, wireless apparatus for electrically testing printed circuit boards' [patent_app_type] => 1 [patent_app_number] => 7/656578 [patent_app_country] => US [patent_app_date] => 1991-02-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 10 [patent_no_of_words] => 6787 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 398 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/157/05157325.pdf [firstpage_image] =>[orig_patent_app_number] => 656578 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/656578
Compact, wireless apparatus for electrically testing printed circuit boards Feb 14, 1991 Issued
Array ( [id] => 2864604 [patent_doc_number] => 05150043 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-09-22 [patent_title] => 'Apparatus and method for non-contact surface voltage probing by scanning photoelectron emission' [patent_app_type] => 1 [patent_app_number] => 7/653829 [patent_app_country] => US [patent_app_date] => 1991-02-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 1972 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/150/05150043.pdf [firstpage_image] =>[orig_patent_app_number] => 653829 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/653829
Apparatus and method for non-contact surface voltage probing by scanning photoelectron emission Feb 10, 1991 Issued
Array ( [id] => 2809779 [patent_doc_number] => 05115189 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-05-19 [patent_title] => 'Anti-aliasing dithering method and apparatus for low frequency signal sampling' [patent_app_type] => 1 [patent_app_number] => 7/651694 [patent_app_country] => US [patent_app_date] => 1991-02-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 11 [patent_no_of_words] => 2822 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 205 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/115/05115189.pdf [firstpage_image] =>[orig_patent_app_number] => 651694 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/651694
Anti-aliasing dithering method and apparatus for low frequency signal sampling Feb 5, 1991 Issued
Array ( [id] => 2791834 [patent_doc_number] => 05155431 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-10-13 [patent_title] => 'Very fast autoscale topology for digitizing oscilloscopes' [patent_app_type] => 1 [patent_app_number] => 7/651674 [patent_app_country] => US [patent_app_date] => 1991-02-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2778 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 192 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/155/05155431.pdf [firstpage_image] =>[orig_patent_app_number] => 651674 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/651674
Very fast autoscale topology for digitizing oscilloscopes Feb 5, 1991 Issued
Array ( [id] => 2791466 [patent_doc_number] => 05130644 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-07-14 [patent_title] => 'Integrated circuit self-testing device and method' [patent_app_type] => 1 [patent_app_number] => 7/648329 [patent_app_country] => US [patent_app_date] => 1991-01-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 2085 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 105 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/130/05130644.pdf [firstpage_image] =>[orig_patent_app_number] => 648329 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/648329
Integrated circuit self-testing device and method Jan 28, 1991 Issued
07/646268 TESTABILITY CIRCUIT FOR LOGIC CIRCUIT ARRAYS Jan 27, 1991 Abandoned
Array ( [id] => 2845617 [patent_doc_number] => 05172047 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-12-15 [patent_title] => 'Semiconductor test apparatus' [patent_app_type] => 1 [patent_app_number] => 7/644634 [patent_app_country] => US [patent_app_date] => 1991-01-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3608 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 245 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/172/05172047.pdf [firstpage_image] =>[orig_patent_app_number] => 644634 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/644634
Semiconductor test apparatus Jan 22, 1991 Issued
07/643599 METHOD TO REDUCE TEST VECTORS/TEST TIME IN DEVICES USING EQUIVALENT BLOCKS Jan 21, 1991 Abandoned
Array ( [id] => 2913319 [patent_doc_number] => 05216359 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-06-01 [patent_title] => 'Electro-optical method and apparatus for testing integrated circuits' [patent_app_type] => 1 [patent_app_number] => 7/644038 [patent_app_country] => US [patent_app_date] => 1991-01-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 23 [patent_no_of_words] => 4969 [patent_no_of_claims] => 42 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/216/05216359.pdf [firstpage_image] =>[orig_patent_app_number] => 644038 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/644038
Electro-optical method and apparatus for testing integrated circuits Jan 17, 1991 Issued
Array ( [id] => 2841667 [patent_doc_number] => 05121052 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-06-09 [patent_title] => 'Automated handler for semiconductor devices' [patent_app_type] => 1 [patent_app_number] => 7/642774 [patent_app_country] => US [patent_app_date] => 1991-01-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 2287 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 71 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/121/05121052.pdf [firstpage_image] =>[orig_patent_app_number] => 642774 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/642774
Automated handler for semiconductor devices Jan 17, 1991 Issued
07/641699 LSI TEST CIRCUIT Jan 15, 1991 Abandoned
07/640198 WAFER BURN-IN AND TEST SYSTEM Jan 10, 1991 Abandoned
Array ( [id] => 2878199 [patent_doc_number] => 05091692 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-02-25 [patent_title] => 'Probing test device' [patent_app_type] => 1 [patent_app_number] => 7/636094 [patent_app_country] => US [patent_app_date] => 1990-12-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 11 [patent_no_of_words] => 4511 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 205 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/091/05091692.pdf [firstpage_image] =>[orig_patent_app_number] => 636094 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/636094
Probing test device Dec 30, 1990 Issued
Array ( [id] => 2713865 [patent_doc_number] => 05061894 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-10-29 [patent_title] => 'Probe device' [patent_app_type] => 1 [patent_app_number] => 7/633254 [patent_app_country] => US [patent_app_date] => 1990-12-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 4035 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 314 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/061/05061894.pdf [firstpage_image] =>[orig_patent_app_number] => 633254 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/633254
Probe device Dec 20, 1990 Issued
Array ( [id] => 2719524 [patent_doc_number] => 05053693 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-10-01 [patent_title] => 'Fibreoptical sensor' [patent_app_type] => 1 [patent_app_number] => 7/631439 [patent_app_country] => US [patent_app_date] => 1990-12-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 6696 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 159 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/053/05053693.pdf [firstpage_image] =>[orig_patent_app_number] => 631439 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/631439
Fibreoptical sensor Dec 20, 1990 Issued
Array ( [id] => 2779553 [patent_doc_number] => 05132609 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-07-21 [patent_title] => 'Circuit for measuring the level of an electrical signal and including offset correction means, and application thereof to amplifiers having automatic gain control' [patent_app_type] => 1 [patent_app_number] => 7/629904 [patent_app_country] => US [patent_app_date] => 1990-12-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 3911 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 187 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/132/05132609.pdf [firstpage_image] =>[orig_patent_app_number] => 629904 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/629904
Circuit for measuring the level of an electrical signal and including offset correction means, and application thereof to amplifiers having automatic gain control Dec 18, 1990 Issued
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