| Application number | Title of the application | Filing Date | Status |
|---|
Array
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[patent_doc_number] => 05200693
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[patent_kind] => NA
[patent_issue_date] => 1993-04-06
[patent_title] => 'Method for determining characteristics of pn semiconductor structures'
[patent_app_type] => 1
[patent_app_number] => 7/661019
[patent_app_country] => US
[patent_app_date] => 1991-02-26
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[firstpage_image] =>[orig_patent_app_number] => 661019
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/661019 | Method for determining characteristics of pn semiconductor structures | Feb 25, 1991 | Issued |
Array
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[patent_doc_number] => 05087877
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-02-11
[patent_title] => 'Test contact fixture using flexible circuit tape'
[patent_app_type] => 1
[patent_app_number] => 7/659644
[patent_app_country] => US
[patent_app_date] => 1991-02-25
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[pdf_file] => patents/05/087/05087877.pdf
[firstpage_image] =>[orig_patent_app_number] => 659644
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/659644 | Test contact fixture using flexible circuit tape | Feb 24, 1991 | Issued |
| 07/660014 | IC TESTER | Feb 24, 1991 | Abandoned |
Array
(
[id] => 2793612
[patent_doc_number] => 05101150
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-03-31
[patent_title] => 'Automatic circuit tester with separate instrument and scanner buses'
[patent_app_type] => 1
[patent_app_number] => 7/660289
[patent_app_country] => US
[patent_app_date] => 1991-02-22
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/101/05101150.pdf
[firstpage_image] =>[orig_patent_app_number] => 660289
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/660289 | Automatic circuit tester with separate instrument and scanner buses | Feb 21, 1991 | Issued |
Array
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[id] => 2811369
[patent_doc_number] => 05157325
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-10-20
[patent_title] => 'Compact, wireless apparatus for electrically testing printed circuit boards'
[patent_app_type] => 1
[patent_app_number] => 7/656578
[patent_app_country] => US
[patent_app_date] => 1991-02-15
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/157/05157325.pdf
[firstpage_image] =>[orig_patent_app_number] => 656578
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/656578 | Compact, wireless apparatus for electrically testing printed circuit boards | Feb 14, 1991 | Issued |
Array
(
[id] => 2864604
[patent_doc_number] => 05150043
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-09-22
[patent_title] => 'Apparatus and method for non-contact surface voltage probing by scanning photoelectron emission'
[patent_app_type] => 1
[patent_app_number] => 7/653829
[patent_app_country] => US
[patent_app_date] => 1991-02-11
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[pdf_file] => patents/05/150/05150043.pdf
[firstpage_image] =>[orig_patent_app_number] => 653829
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/653829 | Apparatus and method for non-contact surface voltage probing by scanning photoelectron emission | Feb 10, 1991 | Issued |
Array
(
[id] => 2809779
[patent_doc_number] => 05115189
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-05-19
[patent_title] => 'Anti-aliasing dithering method and apparatus for low frequency signal sampling'
[patent_app_type] => 1
[patent_app_number] => 7/651694
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[firstpage_image] =>[orig_patent_app_number] => 651694
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/651694 | Anti-aliasing dithering method and apparatus for low frequency signal sampling | Feb 5, 1991 | Issued |
Array
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[id] => 2791834
[patent_doc_number] => 05155431
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-10-13
[patent_title] => 'Very fast autoscale topology for digitizing oscilloscopes'
[patent_app_type] => 1
[patent_app_number] => 7/651674
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[patent_app_date] => 1991-02-06
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[pdf_file] => patents/05/155/05155431.pdf
[firstpage_image] =>[orig_patent_app_number] => 651674
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/651674 | Very fast autoscale topology for digitizing oscilloscopes | Feb 5, 1991 | Issued |
Array
(
[id] => 2791466
[patent_doc_number] => 05130644
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-07-14
[patent_title] => 'Integrated circuit self-testing device and method'
[patent_app_type] => 1
[patent_app_number] => 7/648329
[patent_app_country] => US
[patent_app_date] => 1991-01-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[pdf_file] => patents/05/130/05130644.pdf
[firstpage_image] =>[orig_patent_app_number] => 648329
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/648329 | Integrated circuit self-testing device and method | Jan 28, 1991 | Issued |
| 07/646268 | TESTABILITY CIRCUIT FOR LOGIC CIRCUIT ARRAYS | Jan 27, 1991 | Abandoned |
Array
(
[id] => 2845617
[patent_doc_number] => 05172047
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-12-15
[patent_title] => 'Semiconductor test apparatus'
[patent_app_type] => 1
[patent_app_number] => 7/644634
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[patent_app_date] => 1991-01-23
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[pdf_file] => patents/05/172/05172047.pdf
[firstpage_image] =>[orig_patent_app_number] => 644634
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/644634 | Semiconductor test apparatus | Jan 22, 1991 | Issued |
| 07/643599 | METHOD TO REDUCE TEST VECTORS/TEST TIME IN DEVICES USING EQUIVALENT BLOCKS | Jan 21, 1991 | Abandoned |
Array
(
[id] => 2913319
[patent_doc_number] => 05216359
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1993-06-01
[patent_title] => 'Electro-optical method and apparatus for testing integrated circuits'
[patent_app_type] => 1
[patent_app_number] => 7/644038
[patent_app_country] => US
[patent_app_date] => 1991-01-18
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[pdf_file] => patents/05/216/05216359.pdf
[firstpage_image] =>[orig_patent_app_number] => 644038
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/644038 | Electro-optical method and apparatus for testing integrated circuits | Jan 17, 1991 | Issued |
Array
(
[id] => 2841667
[patent_doc_number] => 05121052
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-06-09
[patent_title] => 'Automated handler for semiconductor devices'
[patent_app_type] => 1
[patent_app_number] => 7/642774
[patent_app_country] => US
[patent_app_date] => 1991-01-18
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/121/05121052.pdf
[firstpage_image] =>[orig_patent_app_number] => 642774
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/642774 | Automated handler for semiconductor devices | Jan 17, 1991 | Issued |
| 07/641699 | LSI TEST CIRCUIT | Jan 15, 1991 | Abandoned |
| 07/640198 | WAFER BURN-IN AND TEST SYSTEM | Jan 10, 1991 | Abandoned |
Array
(
[id] => 2878199
[patent_doc_number] => 05091692
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-02-25
[patent_title] => 'Probing test device'
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[patent_app_number] => 7/636094
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[firstpage_image] =>[orig_patent_app_number] => 636094
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/636094 | Probing test device | Dec 30, 1990 | Issued |
Array
(
[id] => 2713865
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[patent_title] => 'Probe device'
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[firstpage_image] =>[orig_patent_app_number] => 633254
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/633254 | Probe device | Dec 20, 1990 | Issued |
Array
(
[id] => 2719524
[patent_doc_number] => 05053693
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[patent_kind] => NA
[patent_issue_date] => 1991-10-01
[patent_title] => 'Fibreoptical sensor'
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[patent_app_number] => 7/631439
[patent_app_country] => US
[patent_app_date] => 1990-12-21
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[firstpage_image] =>[orig_patent_app_number] => 631439
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/631439 | Fibreoptical sensor | Dec 20, 1990 | Issued |
Array
(
[id] => 2779553
[patent_doc_number] => 05132609
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-07-21
[patent_title] => 'Circuit for measuring the level of an electrical signal and including offset correction means, and application thereof to amplifiers having automatic gain control'
[patent_app_type] => 1
[patent_app_number] => 7/629904
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[pdf_file] => patents/05/132/05132609.pdf
[firstpage_image] =>[orig_patent_app_number] => 629904
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/629904 | Circuit for measuring the level of an electrical signal and including offset correction means, and application thereof to amplifiers having automatic gain control | Dec 18, 1990 | Issued |