Search

Andy Ho

Examiner (ID: 5607, Phone: (571)272-3762 , Office: P/2194 )

Most Active Art Unit
2194
Art Unit(s)
2126, 2194, 2151
Total Applications
1669
Issued Applications
1447
Pending Applications
77
Abandoned Applications
165

Applications

Application numberTitle of the applicationFiling DateStatus
07/628133 TESTING OPERATION OF ELECTRIC ENERGY METER DEVICE SYSTEM Dec 16, 1990 Abandoned
07/625246 ELECTRONIC WATTHOUR METER Dec 9, 1990 Abandoned
Array ( [id] => 2875038 [patent_doc_number] => 05162727 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-11-10 [patent_title] => 'Method and apparatus of determining the stator flux estimate of an electric machine' [patent_app_type] => 1 [patent_app_number] => 7/623699 [patent_app_country] => US [patent_app_date] => 1990-12-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2422 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 234 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/162/05162727.pdf [firstpage_image] =>[orig_patent_app_number] => 623699 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/623699
Method and apparatus of determining the stator flux estimate of an electric machine Dec 6, 1990 Issued
Array ( [id] => 2711386 [patent_doc_number] => 05068598 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-11-26 [patent_title] => 'Tension potential measuring circuit with selected time constant' [patent_app_type] => 1 [patent_app_number] => 7/620798 [patent_app_country] => US [patent_app_date] => 1990-12-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 1600 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 232 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/068/05068598.pdf [firstpage_image] =>[orig_patent_app_number] => 620798 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/620798
Tension potential measuring circuit with selected time constant Dec 2, 1990 Issued
Array ( [id] => 2764505 [patent_doc_number] => 05059893 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-10-22 [patent_title] => 'AC evaluation equipment for an IC tester' [patent_app_type] => 1 [patent_app_number] => 7/620788 [patent_app_country] => US [patent_app_date] => 1990-12-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 9 [patent_no_of_words] => 3820 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 316 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/059/05059893.pdf [firstpage_image] =>[orig_patent_app_number] => 620788 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/620788
AC evaluation equipment for an IC tester Dec 2, 1990 Issued
Array ( [id] => 2787156 [patent_doc_number] => 05087878 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-02-11 [patent_title] => 'Top-accessible system, and related methods, for simultaneously testing the opposite sides of printed circuit board' [patent_app_type] => 1 [patent_app_number] => 7/621324 [patent_app_country] => US [patent_app_date] => 1990-11-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 6992 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 275 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/087/05087878.pdf [firstpage_image] =>[orig_patent_app_number] => 621324 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/621324
Top-accessible system, and related methods, for simultaneously testing the opposite sides of printed circuit board Nov 29, 1990 Issued
Array ( [id] => 2807353 [patent_doc_number] => 05124624 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-06-23 [patent_title] => 'Arrangement for electrical measurement' [patent_app_type] => 1 [patent_app_number] => 7/618478 [patent_app_country] => US [patent_app_date] => 1990-11-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 5413 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 155 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/124/05124624.pdf [firstpage_image] =>[orig_patent_app_number] => 618478 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/618478
Arrangement for electrical measurement Nov 26, 1990 Issued
Array ( [id] => 2789868 [patent_doc_number] => 05142221 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-08-25 [patent_title] => 'Automatic function selecting multimeter' [patent_app_type] => 1 [patent_app_number] => 7/615169 [patent_app_country] => US [patent_app_date] => 1990-11-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5336 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 161 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/142/05142221.pdf [firstpage_image] =>[orig_patent_app_number] => 615169 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/615169
Automatic function selecting multimeter Nov 22, 1990 Issued
Array ( [id] => 2873353 [patent_doc_number] => 05153507 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-10-06 [patent_title] => 'Multi-purpose bond pad test die' [patent_app_type] => 1 [patent_app_number] => 7/614404 [patent_app_country] => US [patent_app_date] => 1990-11-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 9 [patent_no_of_words] => 4159 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 116 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/153/05153507.pdf [firstpage_image] =>[orig_patent_app_number] => 614404 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/614404
Multi-purpose bond pad test die Nov 15, 1990 Issued
Array ( [id] => 2951822 [patent_doc_number] => 05180975 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1993-01-19 [patent_title] => 'Positioning device and IC conveyor utilizing the same' [patent_app_type] => 1 [patent_app_number] => 7/612434 [patent_app_country] => US [patent_app_date] => 1990-11-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 9 [patent_no_of_words] => 3668 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 187 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/180/05180975.pdf [firstpage_image] =>[orig_patent_app_number] => 612434 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/612434
Positioning device and IC conveyor utilizing the same Nov 13, 1990 Issued
Array ( [id] => 2864657 [patent_doc_number] => 05166604 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-11-24 [patent_title] => 'Methods and apparatus for facilitating scan testing of asynchronous logic circuitry' [patent_app_type] => 1 [patent_app_number] => 7/611974 [patent_app_country] => US [patent_app_date] => 1990-11-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2889 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 176 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/166/05166604.pdf [firstpage_image] =>[orig_patent_app_number] => 611974 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/611974
Methods and apparatus for facilitating scan testing of asynchronous logic circuitry Nov 12, 1990 Issued
Array ( [id] => 2853194 [patent_doc_number] => 05111137 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-05-05 [patent_title] => 'Method and apparatus for the detection of leakage current' [patent_app_type] => 1 [patent_app_number] => 7/605289 [patent_app_country] => US [patent_app_date] => 1990-10-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 3015 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 113 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/111/05111137.pdf [firstpage_image] =>[orig_patent_app_number] => 605289 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/605289
Method and apparatus for the detection of leakage current Oct 28, 1990 Issued
Array ( [id] => 2853068 [patent_doc_number] => 05107205 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-04-21 [patent_title] => 'Semiconductor device tester with a test waveform monitoring circuit' [patent_app_type] => 1 [patent_app_number] => 7/599839 [patent_app_country] => US [patent_app_date] => 1990-10-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 9 [patent_no_of_words] => 2748 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 142 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/107/05107205.pdf [firstpage_image] =>[orig_patent_app_number] => 599839 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/599839
Semiconductor device tester with a test waveform monitoring circuit Oct 18, 1990 Issued
07/600384 PSEUDO-RANDOM SCAN TEST APPARATUS Oct 18, 1990 Abandoned
07/598889 METHOD FOR MEASURING DC CURRENT/VOLTAGE CHARACTERISTIC OF SEMICONDUCTOR DEVICE Oct 18, 1990 Abandoned
Array ( [id] => 2857888 [patent_doc_number] => 05126661 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-06-30 [patent_title] => 'Optical probing method and apparatus' [patent_app_type] => 1 [patent_app_number] => 7/599579 [patent_app_country] => US [patent_app_date] => 1990-10-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 3293 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 196 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/126/05126661.pdf [firstpage_image] =>[orig_patent_app_number] => 599579 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/599579
Optical probing method and apparatus Oct 17, 1990 Issued
Array ( [id] => 2779533 [patent_doc_number] => 05132608 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-07-21 [patent_title] => 'Current measuring method and apparatus therefor' [patent_app_type] => 1 [patent_app_number] => 7/598918 [patent_app_country] => US [patent_app_date] => 1990-10-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 2472 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 207 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/132/05132608.pdf [firstpage_image] =>[orig_patent_app_number] => 598918 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/598918
Current measuring method and apparatus therefor Oct 14, 1990 Issued
07/596229 METHOD AND APPARATUS FOR MAPPING TEST SIGNALS OF AN INTEGRATED CIRCUIT Oct 11, 1990 Abandoned
07/590198 PNEUMATIC ENERGY FLUXMETER Sep 27, 1990 Abandoned
Array ( [id] => 2781237 [patent_doc_number] => 05151652 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-09-29 [patent_title] => 'Measuring position for microwave components' [patent_app_type] => 1 [patent_app_number] => 7/589214 [patent_app_country] => US [patent_app_date] => 1990-09-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 11 [patent_no_of_words] => 4768 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 95 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/151/05151652.pdf [firstpage_image] =>[orig_patent_app_number] => 589214 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/589214
Measuring position for microwave components Sep 27, 1990 Issued
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