Andy Ho

Array ( [id] => 2878236 [patent_doc_number] => 05091694 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-02-25 [patent_title] => 'Quartz probe apparatus' [patent_app_type] => 1 [patent_app_number] => 7/472228 [patent_app_country] => US [patent_app_date] => 1990-01-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 11 [patent_no_of_words] => 4036 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 114 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/091/05091694.pdf [firstpage_image] =>[orig_patent_app_number] => 472228 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2638896 [patent_doc_number] => 04952871 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-08-28 [patent_title] => 'Method and apparatus of testing printed circuit boards and assembly employable therewith' [patent_app_type] => 1 [patent_app_number] => 7/469717 [patent_app_country] => US [patent_app_date] => 1990-01-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 9 [patent_no_of_words] => 5178 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 242 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/952/04952871.pdf [firstpage_image] =>[orig_patent_app_number] => 469717 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2687045 [patent_doc_number] => 05045782 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-09-03 [patent_title] => 'Negative feedback high current driver for in-circuit tester' [patent_app_type] => 1 [patent_app_number] => 7/469668 [patent_app_country] => US [patent_app_date] => 1990-01-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 2557 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 152 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/045/05045782.pdf [firstpage_image] =>[orig_patent_app_number] => 469668 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2754067 [patent_doc_number] => 05030908 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-07-09 [patent_title] => 'Method of testing semiconductor elements and apparatus for testing the same' [patent_app_type] => 1 [patent_app_number] => 7/468934 [patent_app_country] => US [patent_app_date] => 1990-01-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 12 [patent_no_of_words] => 5002 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 168 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/030/05030908.pdf [firstpage_image] =>[orig_patent_app_number] => 468934 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2722072 [patent_doc_number] => 05008618 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-04-16 [patent_title] => 'Scan test apparatus for asynchronous circuitry' [patent_app_type] => 1 [patent_app_number] => 7/468534 [patent_app_country] => US [patent_app_date] => 1990-01-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 3 [patent_no_of_words] => 3026 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 98 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/008/05008618.pdf [firstpage_image] =>[orig_patent_app_number] => 468534 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2713885 [patent_doc_number] => 05061895 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-10-29 [patent_title] => 'System for detecting and correcting misalignment of semiconductor package leads' [patent_app_type] => 1 [patent_app_number] => 7/467714 [patent_app_country] => US [patent_app_date] => 1990-01-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3419 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 191 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/061/05061895.pdf [firstpage_image] =>[orig_patent_app_number] => 467714 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2674758 [patent_doc_number] => 05047709 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-09-10 [patent_title] => 'Calibrated voltage cursors' [patent_app_type] => 1 [patent_app_number] => 7/465859 [patent_app_country] => US [patent_app_date] => 1990-01-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 858 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 67 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/047/05047709.pdf [firstpage_image] =>[orig_patent_app_number] => 465859 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2817401 [patent_doc_number] => 05086271 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-02-04 [patent_title] => 'Driver system and distributed transmission line network for driving devices under test' [patent_app_type] => 1 [patent_app_number] => 7/464404 [patent_app_country] => US [patent_app_date] => 1990-01-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 5034 [patent_no_of_claims] => 37 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 56 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/086/05086271.pdf [firstpage_image] =>[orig_patent_app_number] => 464404 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2754645 [patent_doc_number] => 05021733 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-06-04 [patent_title] => 'Burn-in apparatus' [patent_app_type] => 1 [patent_app_number] => 7/463544 [patent_app_country] => US [patent_app_date] => 1990-01-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 16 [patent_no_of_words] => 1953 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 102 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/021/05021733.pdf [firstpage_image] =>[orig_patent_app_number] => 463544 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2600818 [patent_doc_number] => 04975637 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-12-04 [patent_title] => 'Method and apparatus for integrated circuit device testing' [patent_app_type] => 1 [patent_app_number] => 7/459088 [patent_app_country] => US [patent_app_date] => 1989-12-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 2635 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 141 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/975/04975637.pdf [firstpage_image] =>[orig_patent_app_number] => 459088 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2740277 [patent_doc_number] => 05077521 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-12-31 [patent_title] => 'Supply connection integrity monitor' [patent_app_type] => 1 [patent_app_number] => 7/456759 [patent_app_country] => US [patent_app_date] => 1989-12-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4565 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 140 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/077/05077521.pdf [firstpage_image] =>[orig_patent_app_number] => 456759 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2853104 [patent_doc_number] => 05107207 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-04-21 [patent_title] => 'Method and an apparatus for testing AC characteristics of an integrated circuit' [patent_app_type] => 1 [patent_app_number] => 7/451878 [patent_app_country] => US [patent_app_date] => 1989-12-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 15 [patent_no_of_words] => 4400 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 76 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/107/05107207.pdf [firstpage_image] =>[orig_patent_app_number] => 451878 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2711739 [patent_doc_number] => 05001419 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-03-19 [patent_title] => 'Method of deriving an AC waveform from two phase shifted electrical signals' [patent_app_type] => 1 [patent_app_number] => 7/450974 [patent_app_country] => US [patent_app_date] => 1989-12-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 11 [patent_no_of_words] => 6693 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 117 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/001/05001419.pdf [firstpage_image] =>[orig_patent_app_number] => 450974 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2738374 [patent_doc_number] => 05039936 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-08-13 [patent_title] => 'Voltage rotation indicator mounting apparatus' [patent_app_type] => 1 [patent_app_number] => 7/450289 [patent_app_country] => US [patent_app_date] => 1989-12-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 2209 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 102 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/039/05039936.pdf [firstpage_image] =>[orig_patent_app_number] => 450289 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2764585 [patent_doc_number] => 05059897 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-10-22 [patent_title] => 'Method and apparatus for testing passive substrates for integrated circuit mounting' [patent_app_type] => 1 [patent_app_number] => 7/447328 [patent_app_country] => US [patent_app_date] => 1989-12-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 2965 [patent_no_of_claims] => 31 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 152 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/059/05059897.pdf [firstpage_image] =>[orig_patent_app_number] => 447328 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2675428 [patent_doc_number] => 05034681 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-07-23 [patent_title] => 'Voltage detection' [patent_app_type] => 1 [patent_app_number] => 7/447099 [patent_app_country] => US [patent_app_date] => 1989-12-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 1422 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 172 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/034/05034681.pdf [firstpage_image] =>[orig_patent_app_number] => 447099 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2687008 [patent_doc_number] => 05045780 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-09-03 [patent_title] => 'Electrical test probe contact tip' [patent_app_type] => 1 [patent_app_number] => 7/445979 [patent_app_country] => US [patent_app_date] => 1989-12-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 5 [patent_no_of_words] => 3131 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 284 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/045/05045780.pdf [firstpage_image] =>[orig_patent_app_number] => 445979 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2677102 [patent_doc_number] => 04983909 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-01-08 [patent_title] => 'Repetitive-switching' [patent_app_type] => 1 [patent_app_number] => 7/442289 [patent_app_country] => US [patent_app_date] => 1989-11-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 5 [patent_no_of_words] => 4296 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 268 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/983/04983909.pdf [firstpage_image] =>[orig_patent_app_number] => 442289 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2672947 [patent_doc_number] => 04935696 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-06-19 [patent_title] => 'Test pin assembly for circuit board tester' [patent_app_type] => 1 [patent_app_number] => 7/438734 [patent_app_country] => US [patent_app_date] => 1989-11-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 10 [patent_no_of_words] => 4456 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 19 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/935/04935696.pdf [firstpage_image] =>[orig_patent_app_number] => 438734 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2796180 [patent_doc_number] => 05103169 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-04-07 [patent_title] => 'Relayless interconnections in high performance signal paths' [patent_app_type] => 1 [patent_app_number] => 7/436844 [patent_app_country] => US [patent_app_date] => 1989-11-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2416 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 70 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/103/05103169.pdf [firstpage_image] =>[orig_patent_app_number] => 436844 [rel_patent_id] =>[rel_patent_doc_number] =>)