
Andy Ho
Examiner (ID: 5607, Phone: (571)272-3762 , Office: P/2194 )
| Most Active Art Unit | 2194 |
| Art Unit(s) | 2126, 2194, 2151 |
| Total Applications | 1669 |
| Issued Applications | 1447 |
| Pending Applications | 77 |
| Abandoned Applications | 165 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 2651134
[patent_doc_number] => 04980634
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1990-12-25
[patent_title] => 'Electric power measuring system'
[patent_app_type] => 1
[patent_app_number] => 7/394054
[patent_app_country] => US
[patent_app_date] => 1989-08-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 2
[patent_no_of_words] => 2888
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 185
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/980/04980634.pdf
[firstpage_image] =>[orig_patent_app_number] => 394054
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/394054 | Electric power measuring system | Aug 14, 1989 | Issued |
Array
(
[id] => 2651172
[patent_doc_number] => 04980636
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1990-12-25
[patent_title] => 'Universal nondestructive MM-wave integrated circuit test fixture'
[patent_app_type] => 1
[patent_app_number] => 7/392239
[patent_app_country] => US
[patent_app_date] => 1989-08-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 8
[patent_no_of_words] => 2789
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 291
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/980/04980636.pdf
[firstpage_image] =>[orig_patent_app_number] => 392239
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/392239 | Universal nondestructive MM-wave integrated circuit test fixture | Aug 9, 1989 | Issued |
Array
(
[id] => 2712767
[patent_doc_number] => 04982151
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1991-01-01
[patent_title] => 'Voltage measuring apparatus'
[patent_app_type] => 1
[patent_app_number] => 7/390768
[patent_app_country] => US
[patent_app_date] => 1989-08-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 13
[patent_no_of_words] => 4950
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 158
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/982/04982151.pdf
[firstpage_image] =>[orig_patent_app_number] => 390768
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/390768 | Voltage measuring apparatus | Aug 7, 1989 | Issued |
| 07/390234 | METHOD AND APPARATUS FOR DIGITALLY MEASRUING ELECTRICAL ENERGY CONSUMPTION | Aug 6, 1989 | Abandoned |
Array
(
[id] => 2729304
[patent_doc_number] => 05057769
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1991-10-15
[patent_title] => 'AC current sensor'
[patent_app_type] => 1
[patent_app_number] => 7/386788
[patent_app_country] => US
[patent_app_date] => 1989-07-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 5
[patent_no_of_words] => 7202
[patent_no_of_claims] => 35
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 186
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/057/05057769.pdf
[firstpage_image] =>[orig_patent_app_number] => 386788
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/386788 | AC current sensor | Jul 26, 1989 | Issued |
Array
(
[id] => 2748175
[patent_doc_number] => 05028865
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1991-07-02
[patent_title] => 'Device having main and secondary optical sensors'
[patent_app_type] => 1
[patent_app_number] => 7/381428
[patent_app_country] => US
[patent_app_date] => 1989-07-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 2
[patent_no_of_words] => 2810
[patent_no_of_claims] => 8
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[patent_words_short_claim] => 63
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/028/05028865.pdf
[firstpage_image] =>[orig_patent_app_number] => 381428
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/381428 | Device having main and secondary optical sensors | Jul 17, 1989 | Issued |
Array
(
[id] => 2739180
[patent_doc_number] => 04998062
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1991-03-05
[patent_title] => 'Probe device having micro-strip line structure'
[patent_app_type] => 1
[patent_app_number] => 7/379544
[patent_app_country] => US
[patent_app_date] => 1989-07-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 4
[patent_no_of_words] => 4018
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 293
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/998/04998062.pdf
[firstpage_image] =>[orig_patent_app_number] => 379544
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/379544 | Probe device having micro-strip line structure | Jul 12, 1989 | Issued |
| 07/378919 | SIGNATURE COMPRESSION CIRCUIT | Jul 11, 1989 | Abandoned |
Array
(
[id] => 2750544
[patent_doc_number] => 05012183
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1991-04-30
[patent_title] => 'Electrooptic effect element and electrical signal waveform measuring apparatus using the same'
[patent_app_type] => 1
[patent_app_number] => 7/391548
[patent_app_country] => US
[patent_app_date] => 1989-07-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 21
[patent_no_of_words] => 7600
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 168
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/012/05012183.pdf
[firstpage_image] =>[orig_patent_app_number] => 391548
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/391548 | Electrooptic effect element and electrical signal waveform measuring apparatus using the same | Jul 9, 1989 | Issued |
Array
(
[id] => 2865901
[patent_doc_number] => 05083083
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-01-21
[patent_title] => 'Testability architecture and techniques for programmable interconnect architecture'
[patent_app_type] => 1
[patent_app_number] => 7/375799
[patent_app_country] => US
[patent_app_date] => 1989-07-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 10
[patent_no_of_words] => 8587
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 174
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/083/05083083.pdf
[firstpage_image] =>[orig_patent_app_number] => 375799
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/375799 | Testability architecture and techniques for programmable interconnect architecture | Jul 4, 1989 | Issued |
Array
(
[id] => 2594349
[patent_doc_number] => 04970461
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1990-11-13
[patent_title] => 'Method and apparatus for non-contact opens/shorts testing of electrical circuits'
[patent_app_type] => 1
[patent_app_number] => 7/371589
[patent_app_country] => US
[patent_app_date] => 1989-06-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 5
[patent_no_of_words] => 3496
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 231
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/970/04970461.pdf
[firstpage_image] =>[orig_patent_app_number] => 371589
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/371589 | Method and apparatus for non-contact opens/shorts testing of electrical circuits | Jun 25, 1989 | Issued |
Array
(
[id] => 2737763
[patent_doc_number] => 05032786
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1991-07-16
[patent_title] => 'Method of a measuring physical properties of buried channel'
[patent_app_type] => 1
[patent_app_number] => 7/371009
[patent_app_country] => US
[patent_app_date] => 1989-06-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 14
[patent_no_of_words] => 2522
[patent_no_of_claims] => 2
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 134
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/032/05032786.pdf
[firstpage_image] =>[orig_patent_app_number] => 371009
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/371009 | Method of a measuring physical properties of buried channel | Jun 25, 1989 | Issued |
Array
(
[id] => 2722051
[patent_doc_number] => 05008617
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1991-04-16
[patent_title] => 'Functional testing of ultra large area, ultra large scale integrated circuits'
[patent_app_type] => 1
[patent_app_number] => 7/369784
[patent_app_country] => US
[patent_app_date] => 1989-06-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[patent_no_of_words] => 5181
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/008/05008617.pdf
[firstpage_image] =>[orig_patent_app_number] => 369784
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/369784 | Functional testing of ultra large area, ultra large scale integrated circuits | Jun 19, 1989 | Issued |
Array
(
[id] => 2711502
[patent_doc_number] => 05068604
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1991-11-26
[patent_title] => 'Method of and device for testing multiple power supply connections of an integrated circuit on a printed circuit board'
[patent_app_type] => 1
[patent_app_number] => 7/368748
[patent_app_country] => US
[patent_app_date] => 1989-06-20
[patent_effective_date] => 0000-00-00
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/068/05068604.pdf
[firstpage_image] =>[orig_patent_app_number] => 368748
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/368748 | Method of and device for testing multiple power supply connections of an integrated circuit on a printed circuit board | Jun 19, 1989 | Issued |
Array
(
[id] => 2598357
[patent_doc_number] => 04940931
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1990-07-10
[patent_title] => 'Digital waveform measuring apparatus having a shading-tone display function'
[patent_app_type] => 1
[patent_app_number] => 7/368868
[patent_app_country] => US
[patent_app_date] => 1989-06-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
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[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/940/04940931.pdf
[firstpage_image] =>[orig_patent_app_number] => 368868
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/368868 | Digital waveform measuring apparatus having a shading-tone display function | Jun 19, 1989 | Issued |
Array
(
[id] => 2737818
[patent_doc_number] => 05032789
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1991-07-16
[patent_title] => 'Modular/concurrent board tester'
[patent_app_type] => 1
[patent_app_number] => 7/367839
[patent_app_country] => US
[patent_app_date] => 1989-06-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 25
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[patent_no_of_words] => 24301
[patent_no_of_claims] => 76
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/032/05032789.pdf
[firstpage_image] =>[orig_patent_app_number] => 367839
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/367839 | Modular/concurrent board tester | Jun 18, 1989 | Issued |
Array
(
[id] => 2717795
[patent_doc_number] => 05010295
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1991-04-23
[patent_title] => 'Ball screw supported Z stage'
[patent_app_type] => 1
[patent_app_number] => 7/365878
[patent_app_country] => US
[patent_app_date] => 1989-06-14
[patent_effective_date] => 0000-00-00
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/010/05010295.pdf
[firstpage_image] =>[orig_patent_app_number] => 365878
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/365878 | Ball screw supported Z stage | Jun 13, 1989 | Issued |
Array
(
[id] => 2593175
[patent_doc_number] => 04928062
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1990-05-22
[patent_title] => 'Loading and accurate measurement of integrated dynamic parameters at point of contact in automatic device handlers'
[patent_app_type] => 1
[patent_app_number] => 7/368157
[patent_app_country] => US
[patent_app_date] => 1989-06-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/04/928/04928062.pdf
[firstpage_image] =>[orig_patent_app_number] => 368157
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/368157 | Loading and accurate measurement of integrated dynamic parameters at point of contact in automatic device handlers | Jun 13, 1989 | Issued |
Array
(
[id] => 2754018
[patent_doc_number] => 05030905
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1991-07-09
[patent_title] => 'Below a minute burn-in'
[patent_app_type] => 1
[patent_app_number] => 7/362898
[patent_app_country] => US
[patent_app_date] => 1989-06-06
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/030/05030905.pdf
[firstpage_image] =>[orig_patent_app_number] => 362898
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/362898 | Below a minute burn-in | Jun 5, 1989 | Issued |
Array
(
[id] => 2772167
[patent_doc_number] => 05036272
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1991-07-30
[patent_title] => 'Plural test mode selection circuit'
[patent_app_type] => 1
[patent_app_number] => 7/357989
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[pdf_file] => patents/05/036/05036272.pdf
[firstpage_image] =>[orig_patent_app_number] => 357989
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/357989 | Plural test mode selection circuit | May 29, 1989 | Issued |