Search

Angela Marie Bertagna

Examiner (ID: 11617, Phone: (571)272-8291 , Office: P/1637 )

Most Active Art Unit
1637
Art Unit(s)
1637, 1681
Total Applications
958
Issued Applications
329
Pending Applications
113
Abandoned Applications
538

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 3127986 [patent_doc_number] => 05381234 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-01-10 [patent_title] => 'Method and apparatus for real-time film surface detection for large area wafers' [patent_app_type] => 1 [patent_app_number] => 8/173390 [patent_app_country] => US [patent_app_date] => 1993-12-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 5208 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 74 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/381/05381234.pdf [firstpage_image] =>[orig_patent_app_number] => 173390 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/173390
Method and apparatus for real-time film surface detection for large area wafers Dec 22, 1993 Issued
Array ( [id] => 3125874 [patent_doc_number] => 05450203 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-09-12 [patent_title] => 'Method and apparatus for determining an objects position, topography and for imaging' [patent_app_type] => 1 [patent_app_number] => 8/172426 [patent_app_country] => US [patent_app_date] => 1993-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 8979 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 15 [patent_words_short_claim] => 84 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/450/05450203.pdf [firstpage_image] =>[orig_patent_app_number] => 172426 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/172426
Method and apparatus for determining an objects position, topography and for imaging Dec 21, 1993 Issued
08/169396 DISPLACEMENT DETECTION APPARATUS Dec 19, 1993 Abandoned
Array ( [id] => 3469086 [patent_doc_number] => 05392124 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-02-21 [patent_title] => 'Method and apparatus for real-time, in-situ endpoint detection and closed loop etch process control' [patent_app_type] => 1 [patent_app_number] => 8/169876 [patent_app_country] => US [patent_app_date] => 1993-12-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 6407 [patent_no_of_claims] => 40 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 489 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/392/05392124.pdf [firstpage_image] =>[orig_patent_app_number] => 169876 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/169876
Method and apparatus for real-time, in-situ endpoint detection and closed loop etch process control Dec 16, 1993 Issued
Array ( [id] => 3483534 [patent_doc_number] => 05432601 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-07-11 [patent_title] => 'Fine particle analyzing device' [patent_app_type] => 1 [patent_app_number] => 8/167086 [patent_app_country] => US [patent_app_date] => 1993-12-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4726 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 246 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/432/05432601.pdf [firstpage_image] =>[orig_patent_app_number] => 167086 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/167086
Fine particle analyzing device Dec 15, 1993 Issued
Array ( [id] => 3479956 [patent_doc_number] => 05477327 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-12-19 [patent_title] => 'High resolution low noise optical polarimeter' [patent_app_type] => 1 [patent_app_number] => 8/168119 [patent_app_country] => US [patent_app_date] => 1993-12-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 9 [patent_no_of_words] => 2073 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 236 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/477/05477327.pdf [firstpage_image] =>[orig_patent_app_number] => 168119 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/168119
High resolution low noise optical polarimeter Dec 14, 1993 Issued
08/165823 DUAL INTERFEROMETER APPARATUS COMPENSATING FOR ENVIRONMENTAL TURBULENCE OR FLUCTUATION Dec 13, 1993 Abandoned
Array ( [id] => 3495158 [patent_doc_number] => 05475485 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-12-12 [patent_title] => 'Instrument for working the surfaces of parts inside engineered cavities' [patent_app_type] => 1 [patent_app_number] => 8/164917 [patent_app_country] => US [patent_app_date] => 1993-12-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 2677 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 344 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/475/05475485.pdf [firstpage_image] =>[orig_patent_app_number] => 164917 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/164917
Instrument for working the surfaces of parts inside engineered cavities Dec 9, 1993 Issued
Array ( [id] => 3497781 [patent_doc_number] => 05440383 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-08-08 [patent_title] => 'Phase detection deflectometer-type optical device having a large measuring range' [patent_app_type] => 1 [patent_app_number] => 8/150127 [patent_app_country] => US [patent_app_date] => 1993-11-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 1863 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 137 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/440/05440383.pdf [firstpage_image] =>[orig_patent_app_number] => 150127 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/150127
Phase detection deflectometer-type optical device having a large measuring range Nov 29, 1993 Issued
08/157327 METHOD OF DETECTING IMPURITIES IN MOLTEN RESIN Nov 25, 1993 Abandoned
Array ( [id] => 3464350 [patent_doc_number] => 05402225 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-03-28 [patent_title] => 'Optical instrument evaluation using modulation transfer function chart' [patent_app_type] => 1 [patent_app_number] => 8/157617 [patent_app_country] => US [patent_app_date] => 1993-11-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2828 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 80 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/402/05402225.pdf [firstpage_image] =>[orig_patent_app_number] => 157617 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/157617
Optical instrument evaluation using modulation transfer function chart Nov 23, 1993 Issued
08/150648 OPTICAL DETECTORS AND SOURCES WITH MERGED HOLOGRAPHIC OPTICAL ELEMENTS SUITABLE FOR OPTOELECTRONIC INTERCONNECTS Nov 8, 1993 Abandoned
Array ( [id] => 3449415 [patent_doc_number] => 05430540 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-07-04 [patent_title] => 'Luminous flux measuring apparatus using an integrating hemisphere or an integrating quarter sphere' [patent_app_type] => 1 [patent_app_number] => 8/149046 [patent_app_country] => US [patent_app_date] => 1993-11-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 2468 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/430/05430540.pdf [firstpage_image] =>[orig_patent_app_number] => 149046 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/149046
Luminous flux measuring apparatus using an integrating hemisphere or an integrating quarter sphere Nov 7, 1993 Issued
08/144030 APPARATUS AND METHOD FOR DETECTION OF MATERIAL USED IN CONSTRUCTION OF CONTAINERS AND COLOR OF SAME Oct 31, 1993 Abandoned
Array ( [id] => 3599473 [patent_doc_number] => 05488493 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-01-30 [patent_title] => 'Holographic CHMSL including a hologram assembly and a refractive element laminarly attached thereto for diverging zero order beam' [patent_app_type] => 1 [patent_app_number] => 8/146244 [patent_app_country] => US [patent_app_date] => 1993-11-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2884 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 62 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/488/05488493.pdf [firstpage_image] =>[orig_patent_app_number] => 146244 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/146244
Holographic CHMSL including a hologram assembly and a refractive element laminarly attached thereto for diverging zero order beam Oct 31, 1993 Issued
Array ( [id] => 3560812 [patent_doc_number] => 05493425 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-02-20 [patent_title] => 'Optical pickup apparatus having a quadrant hologram and a quadrant photo detector' [patent_app_type] => 1 [patent_app_number] => 8/143145 [patent_app_country] => US [patent_app_date] => 1993-10-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 16 [patent_no_of_words] => 4245 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 258 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/493/05493425.pdf [firstpage_image] =>[orig_patent_app_number] => 143145 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/143145
Optical pickup apparatus having a quadrant hologram and a quadrant photo detector Oct 28, 1993 Issued
Array ( [id] => 3532599 [patent_doc_number] => 05504573 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-04-02 [patent_title] => 'Apparatus and method for analyzing particles deposited on a substrate using substantially continuous profile data' [patent_app_type] => 1 [patent_app_number] => 8/135683 [patent_app_country] => US [patent_app_date] => 1993-10-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 10 [patent_no_of_words] => 6294 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 138 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/504/05504573.pdf [firstpage_image] =>[orig_patent_app_number] => 135683 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/135683
Apparatus and method for analyzing particles deposited on a substrate using substantially continuous profile data Oct 12, 1993 Issued
Array ( [id] => 3133036 [patent_doc_number] => 05436725 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-07-25 [patent_title] => 'Cofocal optical system for thickness measurements of patterned wafers' [patent_app_type] => 1 [patent_app_number] => 8/134729 [patent_app_country] => US [patent_app_date] => 1993-10-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 3270 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 106 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/436/05436725.pdf [firstpage_image] =>[orig_patent_app_number] => 134729 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/134729
Cofocal optical system for thickness measurements of patterned wafers Oct 11, 1993 Issued
08/130446 METHOD OF MEASURING PERFORMANCE OF PROJECTION OPTICAL SYSTEM AND A MASK FOR MEASURING THE IMAGING PERFORMANCE Sep 30, 1993 Abandoned
08/130015 FOURIER SPECTROMETER WITH EXCHANGEABLE ENTRANCE AND EXIT PORTS Sep 29, 1993 Abandoned
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