
Anita Karen Alanko
Examiner (ID: 6769, Phone: (571)272-1458 , Office: P/1713 )
| Most Active Art Unit | 1713 |
| Art Unit(s) | 1713, 1763, 1792, 1746, 1765, 1109 |
| Total Applications | 1488 |
| Issued Applications | 1061 |
| Pending Applications | 142 |
| Abandoned Applications | 314 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
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[id] => 11252843
[patent_doc_number] => 09478354
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[patent_issue_date] => 2016-10-25
[patent_title] => 'Inductor manufacturing method'
[patent_app_type] => utility
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Array
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[patent_title] => 'INTEGRATED ETCH/CLEAN FOR DIELECTRIC ETCH APPLICATIONS'
[patent_app_type] => utility
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Array
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[patent_title] => 'Patterned mask using cured spin-on-glass composition'
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Array
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[patent_title] => 'APPARATUSES FACILITATING FLUID FLOW INTO VIA HOLES, VENTS, AND OTHER OPENINGS COMMUNICATING WITH SURFACES OF SUBSTRATES OF SEMICONDUCTOR DEVICE COMPONENTS'
[patent_app_type] => utility
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Array
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[patent_title] => 'POLISHING METHOD AND POLISHING APPARATUS'
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Array
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[patent_title] => 'METAL OXIDE-POLYMER COMPOSITE PARTICLES FOR CHEMICAL MECHANICAL PLANARIZATION'
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Array
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[patent_title] => 'METHOD OF SUBSTRATE TEMPERATURE CONTROL DURING HIGH TEMPERATURE WET PROCESSING'
[patent_app_type] => utility
[patent_app_number] => 14/565542
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Array
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[patent_title] => 'METHOD OF USING SEPARATE WAFER CONTACTS DURING WAFER PROCESSING'
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Array
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[id] => 10809486
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[patent_title] => 'Removal Of Defects By In-Situ Etching During Chemical-Mechanical Polishing Processing'
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Array
(
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Array
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Array
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Array
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