Search

Anthony J. Weier

Examiner (ID: 12004, Phone: (571)272-1409 , Office: P/1792 )

Most Active Art Unit
1792
Art Unit(s)
1302, 1761, 1781, 1794, 1792, 1305
Total Applications
2689
Issued Applications
1896
Pending Applications
153
Abandoned Applications
656

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 20008586 [patent_doc_number] => 20250146808 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-05-08 [patent_title] => CLEARANCE MEASURING APPARATUS [patent_app_type] => utility [patent_app_number] => 18/584974 [patent_app_country] => US [patent_app_date] => 2024-02-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 0 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 76 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18584974 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/584974
CLEARANCE MEASURING APPARATUS Feb 21, 2024 Pending
Array ( [id] => 19911262 [patent_doc_number] => 12287470 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-04-29 [patent_title] => Dark field microscope [patent_app_type] => utility [patent_app_number] => 18/441710 [patent_app_country] => US [patent_app_date] => 2024-02-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 18 [patent_no_of_words] => 4863 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18441710 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/441710
Dark field microscope Feb 13, 2024 Issued
Array ( [id] => 20387808 [patent_doc_number] => 12487533 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-12-02 [patent_title] => Amplitude asymmetry measurements in overlay metrology [patent_app_type] => utility [patent_app_number] => 18/422668 [patent_app_country] => US [patent_app_date] => 2024-01-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 27 [patent_figures_cnt] => 27 [patent_no_of_words] => 10217 [patent_no_of_claims] => 34 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 173 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18422668 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/422668
Amplitude asymmetry measurements in overlay metrology Jan 24, 2024 Issued
Array ( [id] => 19521991 [patent_doc_number] => 12123705 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-10-22 [patent_title] => Combiner alignment detector [patent_app_type] => utility [patent_app_number] => 18/421517 [patent_app_country] => US [patent_app_date] => 2024-01-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5479 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 223 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18421517 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/421517
Combiner alignment detector Jan 23, 2024 Issued
Array ( [id] => 19189028 [patent_doc_number] => 20240167941 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-05-23 [patent_title] => POLARIZER AND ANALYZER CONFIGURATION OPTIMIZATION METHOD AND POLARIZING AND ANALYZING SYSTEM [patent_app_type] => utility [patent_app_number] => 18/415388 [patent_app_country] => US [patent_app_date] => 2024-01-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 14852 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 98 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18415388 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/415388
POLARIZER AND ANALYZER CONFIGURATION OPTIMIZATION METHOD AND POLARIZING AND ANALYZING SYSTEM Jan 16, 2024 Pending
Array ( [id] => 19319505 [patent_doc_number] => 20240241048 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-07-18 [patent_title] => SAMPLE ANALYZER AND METHOD FOR CONTROLLING SAMPLE ANALYZER [patent_app_type] => utility [patent_app_number] => 18/413139 [patent_app_country] => US [patent_app_date] => 2024-01-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 18000 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 238 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18413139 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/413139
SAMPLE ANALYZER AND METHOD FOR CONTROLLING SAMPLE ANALYZER Jan 15, 2024 Pending
Array ( [id] => 20101147 [patent_doc_number] => 20250231083 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-07-17 [patent_title] => MULTIPLE MAGNIFICATION INSPECTION OF DUTS [patent_app_type] => utility [patent_app_number] => 18/412079 [patent_app_country] => US [patent_app_date] => 2024-01-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6752 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 108 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18412079 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/412079
MULTIPLE MAGNIFICATION INSPECTION OF DUTS Jan 11, 2024 Pending
Array ( [id] => 19302665 [patent_doc_number] => 20240231244 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-07-11 [patent_title] => MEASURING DEVICE AND MEASURING METHOD [patent_app_type] => utility [patent_app_number] => 18/405339 [patent_app_country] => US [patent_app_date] => 2024-01-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7350 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 186 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18405339 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/405339
Measuring device and measuring method Jan 4, 2024 Issued
Array ( [id] => 19390565 [patent_doc_number] => 20240280435 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-08-22 [patent_title] => OPTICAL MEASUREMENT APPARATUS [patent_app_type] => utility [patent_app_number] => 18/402505 [patent_app_country] => US [patent_app_date] => 2024-01-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7368 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 66 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18402505 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/402505
Optical measurement apparatus Jan 1, 2024 Issued
Array ( [id] => 19101003 [patent_doc_number] => 20240120231 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-04-11 [patent_title] => OFFSET ALIGNMENT AND REPAIR IN MICRO DEVICE TRANSFER [patent_app_type] => utility [patent_app_number] => 18/390304 [patent_app_country] => US [patent_app_date] => 2023-12-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2966 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 69 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18390304 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/390304
Offset alignment and repair in micro device transfer Dec 19, 2023 Issued
Array ( [id] => 20316614 [patent_doc_number] => 12455158 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-10-28 [patent_title] => Metrology system with high speed position and orientation tracking mode [patent_app_type] => utility [patent_app_number] => 18/542066 [patent_app_country] => US [patent_app_date] => 2023-12-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 29 [patent_no_of_words] => 16288 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 290 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18542066 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/542066
Metrology system with high speed position and orientation tracking mode Dec 14, 2023 Issued
Array ( [id] => 19084044 [patent_doc_number] => 20240110845 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-04-04 [patent_title] => Fiber Span Characterization Utilizing Paired Optical Time Domain Reflectometers [patent_app_type] => utility [patent_app_number] => 18/530940 [patent_app_country] => US [patent_app_date] => 2023-12-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6127 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -11 [patent_words_short_claim] => 275 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18530940 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/530940
Fiber span characterization utilizing paired optical time domain reflectometers Dec 5, 2023 Issued
Array ( [id] => 19052673 [patent_doc_number] => 20240094642 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-03-21 [patent_title] => SYSTEM AND METHOD FOR DETERMINING POST BONDING OVERLAY [patent_app_type] => utility [patent_app_number] => 18/520244 [patent_app_country] => US [patent_app_date] => 2023-11-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7267 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 126 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18520244 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/520244
System and method for determining post bonding overlay Nov 26, 2023 Issued
Array ( [id] => 19035452 [patent_doc_number] => 20240085267 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-03-14 [patent_title] => Method and Device for Detecting Absolute or Relative Temperature and/or Absolute or Relative Wavelength [patent_app_type] => utility [patent_app_number] => 18/388307 [patent_app_country] => US [patent_app_date] => 2023-11-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10059 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 564 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18388307 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/388307
Method and device for detecting absolute or relative temperature and/or absolute or relative wavelength Nov 8, 2023 Issued
Array ( [id] => 18956311 [patent_doc_number] => 20240044638 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-02-08 [patent_title] => METHODS AND APPARATUS TO DETERMINE A SHAPE OF AN OPTICAL FIBER SENSOR [patent_app_type] => utility [patent_app_number] => 18/382315 [patent_app_country] => US [patent_app_date] => 2023-10-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 12479 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 123 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18382315 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/382315
Methods and apparatus to determine a shape of an optical fiber sensor Oct 19, 2023 Issued
Array ( [id] => 19991914 [patent_doc_number] => 20250130136 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-04-24 [patent_title] => Optical Time Domain Reflectometry (OTDR) Device And Methods [patent_app_type] => utility [patent_app_number] => 18/490045 [patent_app_country] => US [patent_app_date] => 2023-10-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 1212 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 142 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18490045 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/490045
Optical time domain reflectometry (OTDR) device and methods Oct 18, 2023 Issued
Array ( [id] => 19114355 [patent_doc_number] => 20240126105 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-04-18 [patent_title] => MEASUREMENT SYSTEM FOR MEASURING A POSITION OF AN EYEBOX OF A VIRTUAL IMAGE AND METHOD FOR MEASURING A POSITION OF AN EYEBOX OF A VIRTUAL IMAGE [patent_app_type] => utility [patent_app_number] => 18/485280 [patent_app_country] => US [patent_app_date] => 2023-10-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9466 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 150 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18485280 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/485280
Measurement system for measuring a position of an eyebox of a virtual image and method for measuring a position of an eyebox of a virtual image Oct 10, 2023 Issued
Array ( [id] => 20145327 [patent_doc_number] => 12379669 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-08-05 [patent_title] => Massive overlay metrology sampling with multiple measurement columns [patent_app_type] => utility [patent_app_number] => 18/376703 [patent_app_country] => US [patent_app_date] => 2023-10-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 8701 [patent_no_of_claims] => 33 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 216 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18376703 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/376703
Massive overlay metrology sampling with multiple measurement columns Oct 3, 2023 Issued
Array ( [id] => 19404754 [patent_doc_number] => 20240288265 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-08-29 [patent_title] => SEMICONDUCTOR MEASUREMENT APPARATUS [patent_app_type] => utility [patent_app_number] => 18/372391 [patent_app_country] => US [patent_app_date] => 2023-09-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10986 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 124 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18372391 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/372391
SEMICONDUCTOR MEASUREMENT APPARATUS Sep 24, 2023 Pending
Array ( [id] => 19498935 [patent_doc_number] => 20240337953 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-10-10 [patent_title] => SYSTEM AND METHOD FOR TRACKING REAL-TIME POSITION FOR SCANNING OVERLAY METROLOGY [patent_app_type] => utility [patent_app_number] => 18/372531 [patent_app_country] => US [patent_app_date] => 2023-09-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 12431 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -32 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18372531 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/372531
SYSTEM AND METHOD FOR TRACKING REAL-TIME POSITION FOR SCANNING OVERLAY METROLOGY Sep 24, 2023 Pending
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