Arleen M. Vazquez

Array ( [id] => 6403764 [patent_doc_number] => 20100148808 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-06-17 [patent_title] => 'METHODS AND APPARATUS TO ANALYZE ON-CHIP CONTROLLED INTEGRATED CIRCUITS' [patent_app_type] => utility [patent_app_number] => 12/335286 [patent_app_country] => US [patent_app_date] => 2008-12-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4485 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0148/20100148808.pdf [firstpage_image] =>[orig_patent_app_number] => 12335286 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5543299 [patent_doc_number] => 20090153176 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-06-18 [patent_title] => 'Semiconductor device' [patent_app_type] => utility [patent_app_number] => 12/314586 [patent_app_country] => US [patent_app_date] => 2008-12-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 12526 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0153/20090153176.pdf [firstpage_image] =>[orig_patent_app_number] => 12314586 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8592685 [patent_doc_number] => 08350562 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-01-08 [patent_title] => 'Device with contactless adjustment means' [patent_app_type] => utility [patent_app_number] => 12/332748 [patent_app_country] => US [patent_app_date] => 2008-12-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 11 [patent_no_of_words] => 3192 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 139 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12332748 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8018535 [patent_doc_number] => 08138775 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-03-20 [patent_title] => 'CMOS-controlled printhead sense circuit in inkjet printer' [patent_app_type] => utility [patent_app_number] => 12/330586 [patent_app_country] => US [patent_app_date] => 2008-12-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2187 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 218 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/138/08138775.pdf [firstpage_image] =>[orig_patent_app_number] => 12330586 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5420218 [patent_doc_number] => 20090146673 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-06-11 [patent_title] => 'Manufacturing method of probe card and the probe card' [patent_app_type] => utility [patent_app_number] => 12/315745 [patent_app_country] => US [patent_app_date] => 2008-12-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3239 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0146/20090146673.pdf [firstpage_image] =>[orig_patent_app_number] => 12315745 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 9255401 [patent_doc_number] => 08618824 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-12-31 [patent_title] => 'MEMS based Kelvin probe for material state characterization' [patent_app_type] => utility [patent_app_number] => 12/277116 [patent_app_country] => US [patent_app_date] => 2008-11-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2430 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 111 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12277116 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5531193 [patent_doc_number] => 20090230981 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-09-17 [patent_title] => 'INCREASING THERMAL ISOLATION OF A PROBE CARD ASSEMBLY' [patent_app_type] => utility [patent_app_number] => 12/275491 [patent_app_country] => US [patent_app_date] => 2008-11-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 6147 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0230/20090230981.pdf [firstpage_image] =>[orig_patent_app_number] => 12275491 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6521790 [patent_doc_number] => 20100123455 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-05-20 [patent_title] => 'HIGH VOLTAGE CONNECTOR AND METHOD HAVING INTEGRATED VOLTAGE MEASUREMENT PROBE POINTS' [patent_app_type] => utility [patent_app_number] => 12/274384 [patent_app_country] => US [patent_app_date] => 2008-11-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3468 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0123/20100123455.pdf [firstpage_image] =>[orig_patent_app_number] => 12274384 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5562028 [patent_doc_number] => 20090134880 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-05-28 [patent_title] => 'TEST CIRCUITS AND CURRENT PULSE GENERATOR FOR SIMULATING AN ELECTOSTATIC DISCHARGE' [patent_app_type] => utility [patent_app_number] => 12/274365 [patent_app_country] => US [patent_app_date] => 2008-11-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 7175 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0134/20090134880.pdf [firstpage_image] =>[orig_patent_app_number] => 12274365 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6305972 [patent_doc_number] => 20100109698 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-05-06 [patent_title] => 'PROBE ASSEMBLY ARRANGEMENT' [patent_app_type] => utility [patent_app_number] => 12/265592 [patent_app_country] => US [patent_app_date] => 2008-11-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 4818 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0109/20100109698.pdf [firstpage_image] =>[orig_patent_app_number] => 12265592 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5407840 [patent_doc_number] => 20090121738 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-05-14 [patent_title] => 'SEMICONDUCTOR TEST DEVICE' [patent_app_type] => utility [patent_app_number] => 12/261489 [patent_app_country] => US [patent_app_date] => 2008-10-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 7959 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0121/20090121738.pdf [firstpage_image] =>[orig_patent_app_number] => 12261489 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 143434 [patent_doc_number] => 07692420 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-04-06 [patent_title] => 'Fiber-optic current sensor with polarimetric detection scheme' [patent_app_type] => utility [patent_app_number] => 12/256289 [patent_app_country] => US [patent_app_date] => 2008-10-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 3 [patent_no_of_words] => 2916 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 166 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/692/07692420.pdf [firstpage_image] =>[orig_patent_app_number] => 12256289 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5426290 [patent_doc_number] => 20090085600 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-04-02 [patent_title] => 'Method and System for Derivation of Breakdown Voltage for MOS Integrated Circuit Devices' [patent_app_type] => utility [patent_app_number] => 12/251387 [patent_app_country] => US [patent_app_date] => 2008-10-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 7522 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0085/20090085600.pdf [firstpage_image] =>[orig_patent_app_number] => 12251387 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 9300373 [patent_doc_number] => 08648605 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-02-11 [patent_title] => 'Sensor, sensor system, portable sensor system, method of analyzing metal ions, mounting substrate, method of analyzing plating preventing chemical species, method of analyzing produced compound, and method of analyzing monovalent copper chemical species' [patent_app_type] => utility [patent_app_number] => 12/680447 [patent_app_country] => US [patent_app_date] => 2008-09-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 37 [patent_figures_cnt] => 42 [patent_no_of_words] => 29037 [patent_no_of_claims] => 37 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 263 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12680447 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 75656 [patent_doc_number] => 07750662 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-07-06 [patent_title] => 'Electro-optical device and electronic apparatus' [patent_app_type] => utility [patent_app_number] => 12/237188 [patent_app_country] => US [patent_app_date] => 2008-09-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 11 [patent_no_of_words] => 23811 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 165 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/750/07750662.pdf [firstpage_image] =>[orig_patent_app_number] => 12237188 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8785323 [patent_doc_number] => 08432169 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-04-30 [patent_title] => 'Proximity sensor' [patent_app_type] => utility [patent_app_number] => 12/679157 [patent_app_country] => US [patent_app_date] => 2008-09-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 32 [patent_figures_cnt] => 34 [patent_no_of_words] => 44311 [patent_no_of_claims] => 49 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 167 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12679157 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5389553 [patent_doc_number] => 20090206865 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-08-20 [patent_title] => 'ELECTRICAL TEST STRUCTURE AND METHOD FOR CHARACTERIZATION OF DEEP TRENCH SIDEWALL RELIABILITY' [patent_app_type] => utility [patent_app_number] => 12/212289 [patent_app_country] => US [patent_app_date] => 2008-09-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4599 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0206/20090206865.pdf [firstpage_image] =>[orig_patent_app_number] => 12212289 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 93484 [patent_doc_number] => 07737717 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-06-15 [patent_title] => 'Current-voltage-based method for evaluating thin dielectrics based on interface traps' [patent_app_type] => utility [patent_app_number] => 12/209986 [patent_app_country] => US [patent_app_date] => 2008-09-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 10 [patent_no_of_words] => 7829 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 174 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/737/07737717.pdf [firstpage_image] =>[orig_patent_app_number] => 12209986 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5269071 [patent_doc_number] => 20090072846 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-03-19 [patent_title] => 'HIGH FREQUENCY DIFFERENTIAL TEST PROBE FOR AUTOMATED PRINTED WIRING BOARD TEST SYSTEMS' [patent_app_type] => utility [patent_app_number] => 12/208590 [patent_app_country] => US [patent_app_date] => 2008-09-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 7391 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0072/20090072846.pdf [firstpage_image] =>[orig_patent_app_number] => 12208590 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4624994 [patent_doc_number] => 08004296 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-08-23 [patent_title] => 'Probe head apparatus for testing semiconductors' [patent_app_type] => utility [patent_app_number] => 12/209190 [patent_app_country] => US [patent_app_date] => 2008-09-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 14 [patent_no_of_words] => 10866 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 166 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/004/08004296.pdf [firstpage_image] =>[orig_patent_app_number] => 12209190 [rel_patent_id] =>[rel_patent_doc_number] =>)