
Arleen M. Vazquez
Supervisory Patent Examiner (ID: 7798, Phone: (571)272-2619 , Office: P/2868 )
| Most Active Art Unit | 2829 |
| Art Unit(s) | 2858, 2857, 2868, 2829 |
| Total Applications | 509 |
| Issued Applications | 379 |
| Pending Applications | 20 |
| Abandoned Applications | 113 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4708659
[patent_doc_number] => 20080297185
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-12-04
[patent_title] => 'Multi probe card unit, probe test device including the multi probe card unit, and methods of fabricating and using the same'
[patent_app_type] => utility
[patent_app_number] => 12/155185
[patent_app_country] => US
[patent_app_date] => 2008-05-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 3790
[patent_no_of_claims] => 23
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[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0297/20080297185.pdf
[firstpage_image] =>[orig_patent_app_number] => 12155185
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/155185 | Multi probe card unit, probe test device including the multi probe card unit, and methods of fabricating and using the same | May 29, 2008 | Abandoned |
Array
(
[id] => 6499188
[patent_doc_number] => 20100201386
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-08-12
[patent_title] => 'PROBE BOARD, TEST FIXTURE, METHOD FOR MAKING A PROBE BOARD, AND METHOD FOR TESTING A PRINTED CIRCUIT BOARD (PCB)'
[patent_app_type] => utility
[patent_app_number] => 12/601423
[patent_app_country] => US
[patent_app_date] => 2008-05-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 18
[patent_figures_cnt] => 18
[patent_no_of_words] => 7256
[patent_no_of_claims] => 30
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[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0201/20100201386.pdf
[firstpage_image] =>[orig_patent_app_number] => 12601423
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/601423 | PROBE BOARD, TEST FIXTURE, METHOD FOR MAKING A PROBE BOARD, AND METHOD FOR TESTING A PRINTED CIRCUIT BOARD (PCB) | May 22, 2008 | Abandoned |
Array
(
[id] => 4776458
[patent_doc_number] => 20080284456
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-11-20
[patent_title] => 'Test Apparatus of Semiconductor Devices'
[patent_app_type] => utility
[patent_app_number] => 12/122087
[patent_app_country] => US
[patent_app_date] => 2008-05-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0284/20080284456.pdf
[firstpage_image] =>[orig_patent_app_number] => 12122087
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/122087 | Test Apparatus of Semiconductor Devices | May 15, 2008 | Abandoned |
Array
(
[id] => 5550280
[patent_doc_number] => 20090284266
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-11-19
[patent_title] => 'Test method and device for land grid array components'
[patent_app_type] => utility
[patent_app_number] => 12/153287
[patent_app_country] => US
[patent_app_date] => 2008-05-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 1671
[patent_no_of_claims] => 12
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[pdf_file] => publications/A1/0284/20090284266.pdf
[firstpage_image] =>[orig_patent_app_number] => 12153287
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/153287 | Test method and device for land grid array components | May 15, 2008 | Abandoned |
Array
(
[id] => 8676292
[patent_doc_number] => 08384409
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2013-02-26
[patent_title] => 'Ultra-thin organic TFT chemical sensor, making thereof, and sensing method'
[patent_app_type] => utility
[patent_app_number] => 12/597976
[patent_app_country] => US
[patent_app_date] => 2008-05-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[patent_no_of_words] => 8058
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 3
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[patent_maintenance] => 1
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[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12597976
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/597976 | Ultra-thin organic TFT chemical sensor, making thereof, and sensing method | May 4, 2008 | Issued |
Array
(
[id] => 4728948
[patent_doc_number] => 20080208492
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-08-28
[patent_title] => 'System and Method for Early Qualification of Semiconductor Devices'
[patent_app_type] => utility
[patent_app_number] => 12/114405
[patent_app_country] => US
[patent_app_date] => 2008-05-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[pdf_file] => publications/A1/0208/20080208492.pdf
[firstpage_image] =>[orig_patent_app_number] => 12114405
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/114405 | System and Method for Early Qualification of Semiconductor Devices | May 1, 2008 | Abandoned |
Array
(
[id] => 6330812
[patent_doc_number] => 20100327896
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-12-30
[patent_title] => 'PROBE ASSEMBLY AND MANUFACTURING METHOD THEREOF'
[patent_app_type] => utility
[patent_app_number] => 12/667128
[patent_app_country] => US
[patent_app_date] => 2008-04-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 20
[patent_figures_cnt] => 20
[patent_no_of_words] => 10577
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[pdf_file] => publications/A1/0327/20100327896.pdf
[firstpage_image] =>[orig_patent_app_number] => 12667128
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/667128 | Probe assembly and manufacturing method thereof | Apr 20, 2008 | Issued |
Array
(
[id] => 5308001
[patent_doc_number] => 20090015282
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-01-15
[patent_title] => 'ELECTRONICS TESTER WITH A SIGNAL DISTRIBUTION BOARD AND A WAFER CHUCK HAVING DIFFERENT COEFFICIENTS OF THERMAL EXPANSION'
[patent_app_type] => utility
[patent_app_number] => 12/062988
[patent_app_country] => US
[patent_app_date] => 2008-04-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 18
[patent_figures_cnt] => 18
[patent_no_of_words] => 15388
[patent_no_of_claims] => 92
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[pdf_file] => publications/A1/0015/20090015282.pdf
[firstpage_image] =>[orig_patent_app_number] => 12062988
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/062988 | Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion | Apr 3, 2008 | Issued |
Array
(
[id] => 5567752
[patent_doc_number] => 20090251130
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-10-08
[patent_title] => 'MULTIMETER HAVING COMMUNICATIONS VIA MEASUREMENT TERMINALS AND COMMUNICATION SYSTEM FOR SAME'
[patent_app_type] => utility
[patent_app_number] => 12/098289
[patent_app_country] => US
[patent_app_date] => 2008-04-04
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0251/20090251130.pdf
[firstpage_image] =>[orig_patent_app_number] => 12098289
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/098289 | Multimeter having communications via measurement terminals and communication system for same | Apr 3, 2008 | Issued |
Array
(
[id] => 5567789
[patent_doc_number] => 20090251167
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-10-08
[patent_title] => 'Array-Based Early Threshold Voltage Recovery Characterization Measurement'
[patent_app_type] => utility
[patent_app_number] => 12/061077
[patent_app_country] => US
[patent_app_date] => 2008-04-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[firstpage_image] =>[orig_patent_app_number] => 12061077
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/061077 | Array-based early threshold voltage recovery characterization measurement | Apr 1, 2008 | Issued |
Array
(
[id] => 104189
[patent_doc_number] => 07724013
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[patent_issue_date] => 2010-05-25
[patent_title] => 'On-chip self test circuit and self test method for signal distortion'
[patent_app_type] => utility
[patent_app_number] => 12/076890
[patent_app_country] => US
[patent_app_date] => 2008-03-25
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[pdf_file] => patents/07/724/07724013.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/076890 | On-chip self test circuit and self test method for signal distortion | Mar 24, 2008 | Issued |
Array
(
[id] => 7811849
[patent_doc_number] => 08134381
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-03-13
[patent_title] => 'Connection board, probe card, and electronic device test apparatus comprising same'
[patent_app_type] => utility
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/532688 | Connection board, probe card, and electronic device test apparatus comprising same | Mar 17, 2008 | Issued |
Array
(
[id] => 4708657
[patent_doc_number] => 20080297183
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-12-04
[patent_title] => 'PROBE CARD HAVING COLUMNAR BASE PORTION AND METHOD OF PRODUCING THE SAME'
[patent_app_type] => utility
[patent_app_number] => 12/050085
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[firstpage_image] =>[orig_patent_app_number] => 12050085
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/050085 | PROBE CARD HAVING COLUMNAR BASE PORTION AND METHOD OF PRODUCING THE SAME | Mar 16, 2008 | Abandoned |
Array
(
[id] => 4715933
[patent_doc_number] => 20080238455
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[patent_kind] => A1
[patent_issue_date] => 2008-10-02
[patent_title] => 'PROBING METHOD, PROBE APPARATUS AND STORAGE MEDIUM'
[patent_app_type] => utility
[patent_app_number] => 12/049799
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Array
(
[id] => 23671
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[patent_issue_date] => 2010-09-21
[patent_title] => 'Apparatus and method for testing electrical interconnects'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/048085 | Apparatus and method for testing electrical interconnects | Mar 12, 2008 | Issued |
Array
(
[id] => 4737648
[patent_doc_number] => 20080231300
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[patent_kind] => A1
[patent_issue_date] => 2008-09-25
[patent_title] => 'METHOD FOR DETECTING TIP POSITION OF PROBE, ALIGNMENT METHOD, APPARATUS FOR DETECTING TIP POSITION OF PROBE AND PROBE APPARATUS'
[patent_app_type] => utility
[patent_app_number] => 12/046879
[patent_app_country] => US
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[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0231/20080231300.pdf
[firstpage_image] =>[orig_patent_app_number] => 12046879
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/046879 | Method for detecting tip position of probe, alignment method, apparatus for detecting tip position of probe and probe apparatus | Mar 11, 2008 | Issued |
Array
(
[id] => 4696004
[patent_doc_number] => 20080218188
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[patent_kind] => A1
[patent_issue_date] => 2008-09-11
[patent_title] => 'JIG FOR PRINTED SUBSTRATE INSPECTION AND PRINTED SUBSTRATE INSPECTION APPARATUS'
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[patent_app_number] => 12/044593
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Array
(
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[patent_doc_number] => 20100045333
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[patent_issue_date] => 2010-02-25
[patent_title] => 'GENERATING TEST BENCHES FOR PRE-SILICON VALIDATION OF RETIMED COMPLEX IC DESIGNS AGAINST A REFERENCE DESIGN'
[patent_app_type] => utility
[patent_app_number] => 12/526691
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/526691 | Generating test benches for pre-silicon validation of retimed complex IC designs against a reference design | Mar 1, 2008 | Issued |
Array
(
[id] => 6579142
[patent_doc_number] => 20100097049
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-04-22
[patent_title] => 'High Bandwidth Open-Loop Current Sensor'
[patent_app_type] => utility
[patent_app_number] => 12/529287
[patent_app_country] => US
[patent_app_date] => 2008-02-22
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[firstpage_image] =>[orig_patent_app_number] => 12529287
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/529287 | High bandwidth open-loop current sensor | Feb 21, 2008 | Issued |
Array
(
[id] => 8528523
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[patent_kind] => B2
[patent_issue_date] => 2012-11-06
[patent_title] => 'Diagnosing an electronic sensor'
[patent_app_type] => utility
[patent_app_number] => 12/531536
[patent_app_country] => US
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[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12531536
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/531536 | Diagnosing an electronic sensor | Feb 21, 2008 | Issued |