Search

Arleen M. Vazquez

Supervisory Patent Examiner (ID: 7798, Phone: (571)272-2619 , Office: P/2868 )

Most Active Art Unit
2829
Art Unit(s)
2858, 2857, 2868, 2829
Total Applications
509
Issued Applications
379
Pending Applications
20
Abandoned Applications
113

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4708659 [patent_doc_number] => 20080297185 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-12-04 [patent_title] => 'Multi probe card unit, probe test device including the multi probe card unit, and methods of fabricating and using the same' [patent_app_type] => utility [patent_app_number] => 12/155185 [patent_app_country] => US [patent_app_date] => 2008-05-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3790 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0297/20080297185.pdf [firstpage_image] =>[orig_patent_app_number] => 12155185 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/155185
Multi probe card unit, probe test device including the multi probe card unit, and methods of fabricating and using the same May 29, 2008 Abandoned
Array ( [id] => 6499188 [patent_doc_number] => 20100201386 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-08-12 [patent_title] => 'PROBE BOARD, TEST FIXTURE, METHOD FOR MAKING A PROBE BOARD, AND METHOD FOR TESTING A PRINTED CIRCUIT BOARD (PCB)' [patent_app_type] => utility [patent_app_number] => 12/601423 [patent_app_country] => US [patent_app_date] => 2008-05-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 18 [patent_no_of_words] => 7256 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0201/20100201386.pdf [firstpage_image] =>[orig_patent_app_number] => 12601423 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/601423
PROBE BOARD, TEST FIXTURE, METHOD FOR MAKING A PROBE BOARD, AND METHOD FOR TESTING A PRINTED CIRCUIT BOARD (PCB) May 22, 2008 Abandoned
Array ( [id] => 4776458 [patent_doc_number] => 20080284456 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-11-20 [patent_title] => 'Test Apparatus of Semiconductor Devices' [patent_app_type] => utility [patent_app_number] => 12/122087 [patent_app_country] => US [patent_app_date] => 2008-05-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 3669 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0284/20080284456.pdf [firstpage_image] =>[orig_patent_app_number] => 12122087 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/122087
Test Apparatus of Semiconductor Devices May 15, 2008 Abandoned
Array ( [id] => 5550280 [patent_doc_number] => 20090284266 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-11-19 [patent_title] => 'Test method and device for land grid array components' [patent_app_type] => utility [patent_app_number] => 12/153287 [patent_app_country] => US [patent_app_date] => 2008-05-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 1671 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0284/20090284266.pdf [firstpage_image] =>[orig_patent_app_number] => 12153287 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/153287
Test method and device for land grid array components May 15, 2008 Abandoned
Array ( [id] => 8676292 [patent_doc_number] => 08384409 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-02-26 [patent_title] => 'Ultra-thin organic TFT chemical sensor, making thereof, and sensing method' [patent_app_type] => utility [patent_app_number] => 12/597976 [patent_app_country] => US [patent_app_date] => 2008-05-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 8058 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 53 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12597976 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/597976
Ultra-thin organic TFT chemical sensor, making thereof, and sensing method May 4, 2008 Issued
Array ( [id] => 4728948 [patent_doc_number] => 20080208492 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-08-28 [patent_title] => 'System and Method for Early Qualification of Semiconductor Devices' [patent_app_type] => utility [patent_app_number] => 12/114405 [patent_app_country] => US [patent_app_date] => 2008-05-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2230 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0208/20080208492.pdf [firstpage_image] =>[orig_patent_app_number] => 12114405 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/114405
System and Method for Early Qualification of Semiconductor Devices May 1, 2008 Abandoned
Array ( [id] => 6330812 [patent_doc_number] => 20100327896 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-12-30 [patent_title] => 'PROBE ASSEMBLY AND MANUFACTURING METHOD THEREOF' [patent_app_type] => utility [patent_app_number] => 12/667128 [patent_app_country] => US [patent_app_date] => 2008-04-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 20 [patent_no_of_words] => 10577 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0327/20100327896.pdf [firstpage_image] =>[orig_patent_app_number] => 12667128 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/667128
Probe assembly and manufacturing method thereof Apr 20, 2008 Issued
Array ( [id] => 5308001 [patent_doc_number] => 20090015282 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-01-15 [patent_title] => 'ELECTRONICS TESTER WITH A SIGNAL DISTRIBUTION BOARD AND A WAFER CHUCK HAVING DIFFERENT COEFFICIENTS OF THERMAL EXPANSION' [patent_app_type] => utility [patent_app_number] => 12/062988 [patent_app_country] => US [patent_app_date] => 2008-04-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 18 [patent_no_of_words] => 15388 [patent_no_of_claims] => 92 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0015/20090015282.pdf [firstpage_image] =>[orig_patent_app_number] => 12062988 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/062988
Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion Apr 3, 2008 Issued
Array ( [id] => 5567752 [patent_doc_number] => 20090251130 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-10-08 [patent_title] => 'MULTIMETER HAVING COMMUNICATIONS VIA MEASUREMENT TERMINALS AND COMMUNICATION SYSTEM FOR SAME' [patent_app_type] => utility [patent_app_number] => 12/098289 [patent_app_country] => US [patent_app_date] => 2008-04-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4415 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0251/20090251130.pdf [firstpage_image] =>[orig_patent_app_number] => 12098289 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/098289
Multimeter having communications via measurement terminals and communication system for same Apr 3, 2008 Issued
Array ( [id] => 5567789 [patent_doc_number] => 20090251167 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-10-08 [patent_title] => 'Array-Based Early Threshold Voltage Recovery Characterization Measurement' [patent_app_type] => utility [patent_app_number] => 12/061077 [patent_app_country] => US [patent_app_date] => 2008-04-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4028 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0251/20090251167.pdf [firstpage_image] =>[orig_patent_app_number] => 12061077 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/061077
Array-based early threshold voltage recovery characterization measurement Apr 1, 2008 Issued
Array ( [id] => 104189 [patent_doc_number] => 07724013 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-05-25 [patent_title] => 'On-chip self test circuit and self test method for signal distortion' [patent_app_type] => utility [patent_app_number] => 12/076890 [patent_app_country] => US [patent_app_date] => 2008-03-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 13 [patent_no_of_words] => 4387 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 160 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/724/07724013.pdf [firstpage_image] =>[orig_patent_app_number] => 12076890 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/076890
On-chip self test circuit and self test method for signal distortion Mar 24, 2008 Issued
Array ( [id] => 7811849 [patent_doc_number] => 08134381 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-03-13 [patent_title] => 'Connection board, probe card, and electronic device test apparatus comprising same' [patent_app_type] => utility [patent_app_number] => 12/532688 [patent_app_country] => US [patent_app_date] => 2008-03-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 4325 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 209 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/134/08134381.pdf [firstpage_image] =>[orig_patent_app_number] => 12532688 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/532688
Connection board, probe card, and electronic device test apparatus comprising same Mar 17, 2008 Issued
Array ( [id] => 4708657 [patent_doc_number] => 20080297183 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-12-04 [patent_title] => 'PROBE CARD HAVING COLUMNAR BASE PORTION AND METHOD OF PRODUCING THE SAME' [patent_app_type] => utility [patent_app_number] => 12/050085 [patent_app_country] => US [patent_app_date] => 2008-03-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 6085 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0297/20080297183.pdf [firstpage_image] =>[orig_patent_app_number] => 12050085 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/050085
PROBE CARD HAVING COLUMNAR BASE PORTION AND METHOD OF PRODUCING THE SAME Mar 16, 2008 Abandoned
Array ( [id] => 4715933 [patent_doc_number] => 20080238455 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-10-02 [patent_title] => 'PROBING METHOD, PROBE APPARATUS AND STORAGE MEDIUM' [patent_app_type] => utility [patent_app_number] => 12/049799 [patent_app_country] => US [patent_app_date] => 2008-03-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3846 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0238/20080238455.pdf [firstpage_image] =>[orig_patent_app_number] => 12049799 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/049799
Probing method, probe apparatus and storage medium Mar 16, 2008 Issued
Array ( [id] => 23671 [patent_doc_number] => 07800385 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-09-21 [patent_title] => 'Apparatus and method for testing electrical interconnects' [patent_app_type] => utility [patent_app_number] => 12/048085 [patent_app_country] => US [patent_app_date] => 2008-03-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 10030 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 213 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/800/07800385.pdf [firstpage_image] =>[orig_patent_app_number] => 12048085 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/048085
Apparatus and method for testing electrical interconnects Mar 12, 2008 Issued
Array ( [id] => 4737648 [patent_doc_number] => 20080231300 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-09-25 [patent_title] => 'METHOD FOR DETECTING TIP POSITION OF PROBE, ALIGNMENT METHOD, APPARATUS FOR DETECTING TIP POSITION OF PROBE AND PROBE APPARATUS' [patent_app_type] => utility [patent_app_number] => 12/046879 [patent_app_country] => US [patent_app_date] => 2008-03-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5897 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0231/20080231300.pdf [firstpage_image] =>[orig_patent_app_number] => 12046879 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/046879
Method for detecting tip position of probe, alignment method, apparatus for detecting tip position of probe and probe apparatus Mar 11, 2008 Issued
Array ( [id] => 4696004 [patent_doc_number] => 20080218188 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-09-11 [patent_title] => 'JIG FOR PRINTED SUBSTRATE INSPECTION AND PRINTED SUBSTRATE INSPECTION APPARATUS' [patent_app_type] => utility [patent_app_number] => 12/044593 [patent_app_country] => US [patent_app_date] => 2008-03-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 6404 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0218/20080218188.pdf [firstpage_image] =>[orig_patent_app_number] => 12044593 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/044593
JIG FOR PRINTED SUBSTRATE INSPECTION AND PRINTED SUBSTRATE INSPECTION APPARATUS Mar 6, 2008 Abandoned
Array ( [id] => 6551775 [patent_doc_number] => 20100045333 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-02-25 [patent_title] => 'GENERATING TEST BENCHES FOR PRE-SILICON VALIDATION OF RETIMED COMPLEX IC DESIGNS AGAINST A REFERENCE DESIGN' [patent_app_type] => utility [patent_app_number] => 12/526691 [patent_app_country] => US [patent_app_date] => 2008-03-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 6089 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0045/20100045333.pdf [firstpage_image] =>[orig_patent_app_number] => 12526691 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/526691
Generating test benches for pre-silicon validation of retimed complex IC designs against a reference design Mar 1, 2008 Issued
Array ( [id] => 6579142 [patent_doc_number] => 20100097049 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-04-22 [patent_title] => 'High Bandwidth Open-Loop Current Sensor' [patent_app_type] => utility [patent_app_number] => 12/529287 [patent_app_country] => US [patent_app_date] => 2008-02-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2614 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0097/20100097049.pdf [firstpage_image] =>[orig_patent_app_number] => 12529287 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/529287
High bandwidth open-loop current sensor Feb 21, 2008 Issued
Array ( [id] => 8528523 [patent_doc_number] => 08305100 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-11-06 [patent_title] => 'Diagnosing an electronic sensor' [patent_app_type] => utility [patent_app_number] => 12/531536 [patent_app_country] => US [patent_app_date] => 2008-02-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 2192 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 111 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12531536 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/531536
Diagnosing an electronic sensor Feb 21, 2008 Issued
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