Search

Arleen M. Vazquez

Supervisory Patent Examiner (ID: 7798, Phone: (571)272-2619 , Office: P/2868 )

Most Active Art Unit
2829
Art Unit(s)
2858, 2857, 2868, 2829
Total Applications
509
Issued Applications
379
Pending Applications
20
Abandoned Applications
113

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 8115991 [patent_doc_number] => 08159212 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-04-17 [patent_title] => 'Magnetic encoder' [patent_app_type] => utility [patent_app_number] => 12/450205 [patent_app_country] => US [patent_app_date] => 2008-02-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 43 [patent_no_of_words] => 12725 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 278 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/159/08159212.pdf [firstpage_image] =>[orig_patent_app_number] => 12450205 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/450205
Magnetic encoder Feb 20, 2008 Issued
Array ( [id] => 8676293 [patent_doc_number] => 08384410 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2013-02-26 [patent_title] => 'Parallel test circuit with active devices' [patent_app_type] => utility [patent_app_number] => 12/035378 [patent_app_country] => US [patent_app_date] => 2008-02-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 8382 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 20 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12035378 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/035378
Parallel test circuit with active devices Feb 20, 2008 Issued
Array ( [id] => 6414254 [patent_doc_number] => 20100141287 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-06-10 [patent_title] => 'TEST OF ELECTRONIC DEVICES AT PACKAGE LEVEL USING TEST BOARDS WITHOUT SOCKETS' [patent_app_type] => utility [patent_app_number] => 12/527418 [patent_app_country] => US [patent_app_date] => 2008-02-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 7522 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0141/20100141287.pdf [firstpage_image] =>[orig_patent_app_number] => 12527418 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/527418
Test of electronic devices at package level using test boards without sockets Feb 13, 2008 Issued
Array ( [id] => 4830309 [patent_doc_number] => 20080129326 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-06-05 [patent_title] => 'CHARACTERIZATION ARRAY CIRCUIT' [patent_app_type] => utility [patent_app_number] => 12/030140 [patent_app_country] => US [patent_app_date] => 2008-02-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3380 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0129/20080129326.pdf [firstpage_image] =>[orig_patent_app_number] => 12030140 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/030140
Characterization array circuit Feb 11, 2008 Issued
Array ( [id] => 5478081 [patent_doc_number] => 20090201038 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-08-13 [patent_title] => 'TEST HEAD FOR FUNCTIONAL WAFER LEVEL TESTING, SYSTEM AND METHOD THEREFOR' [patent_app_type] => utility [patent_app_number] => 12/029086 [patent_app_country] => US [patent_app_date] => 2008-02-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 5168 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0201/20090201038.pdf [firstpage_image] =>[orig_patent_app_number] => 12029086 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/029086
TEST HEAD FOR FUNCTIONAL WAFER LEVEL TESTING, SYSTEM AND METHOD THEREFOR Feb 10, 2008 Abandoned
Array ( [id] => 6461801 [patent_doc_number] => 20100090692 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-04-15 [patent_title] => 'MAGNETIC SENSOR MODULE AND PISTON POSITION DETECTOR' [patent_app_type] => utility [patent_app_number] => 12/528585 [patent_app_country] => US [patent_app_date] => 2008-02-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 9027 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0090/20100090692.pdf [firstpage_image] =>[orig_patent_app_number] => 12528585 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/528585
MAGNETIC SENSOR MODULE AND PISTON POSITION DETECTOR Feb 7, 2008 Abandoned
Array ( [id] => 9128003 [patent_doc_number] => 08575954 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-11-05 [patent_title] => 'Structures and processes for fabrication of probe card assemblies with multi-layer interconnect' [patent_app_type] => utility [patent_app_number] => 12/525051 [patent_app_country] => US [patent_app_date] => 2008-01-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 10759 [patent_no_of_claims] => 44 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 187 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12525051 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/525051
Structures and processes for fabrication of probe card assemblies with multi-layer interconnect Jan 30, 2008 Issued
Array ( [id] => 63883 [patent_doc_number] => 07764079 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2010-07-27 [patent_title] => 'Modular probe system' [patent_app_type] => utility [patent_app_number] => 12/023787 [patent_app_country] => US [patent_app_date] => 2008-01-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 9 [patent_no_of_words] => 4791 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 172 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/764/07764079.pdf [firstpage_image] =>[orig_patent_app_number] => 12023787 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/023787
Modular probe system Jan 30, 2008 Issued
Array ( [id] => 6339080 [patent_doc_number] => 20100019779 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-01-28 [patent_title] => 'POTENTIAL MEASUREMENT APPARATUS AND IMAGE FORMING APPARATUS' [patent_app_type] => utility [patent_app_number] => 12/521081 [patent_app_country] => US [patent_app_date] => 2008-01-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4729 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0019/20100019779.pdf [firstpage_image] =>[orig_patent_app_number] => 12521081 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/521081
Potential measurement apparatus and image forming apparatus Jan 27, 2008 Issued
Array ( [id] => 4518725 [patent_doc_number] => 07911216 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-03-22 [patent_title] => 'Semiconductor integrated circuit, debug/trace circuit and semiconductor integrated circuit operation observing method' [patent_app_type] => utility [patent_app_number] => 12/525953 [patent_app_country] => US [patent_app_date] => 2008-01-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 15 [patent_no_of_words] => 9667 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 176 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/911/07911216.pdf [firstpage_image] =>[orig_patent_app_number] => 12525953 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/525953
Semiconductor integrated circuit, debug/trace circuit and semiconductor integrated circuit operation observing method Jan 24, 2008 Issued
Array ( [id] => 6339154 [patent_doc_number] => 20100019791 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-01-28 [patent_title] => 'ELECTRONIC COMPONENT PRESSING DEVICE AND ELECTRONIC COMPONENT TEST APPARATUS' [patent_app_type] => utility [patent_app_number] => 12/527976 [patent_app_country] => US [patent_app_date] => 2008-01-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 6866 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0019/20100019791.pdf [firstpage_image] =>[orig_patent_app_number] => 12527976 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/527976
Electronic component pressing device and electronic component test apparatus Jan 17, 2008 Issued
Array ( [id] => 8621926 [patent_doc_number] => 08354841 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-01-15 [patent_title] => 'Method for influencing and/or detecting magnetic particles in a region of action, magnetic particles and the use of magnetic particles' [patent_app_type] => utility [patent_app_number] => 12/523548 [patent_app_country] => US [patent_app_date] => 2008-01-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 5 [patent_no_of_words] => 4391 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 165 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12523548 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/523548
Method for influencing and/or detecting magnetic particles in a region of action, magnetic particles and the use of magnetic particles Jan 17, 2008 Issued
Array ( [id] => 5341007 [patent_doc_number] => 20090179657 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-07-16 [patent_title] => 'Printed circuit board for coupling probes to a tester, and apparatus and test system using same' [patent_app_type] => utility [patent_app_number] => 12/008590 [patent_app_country] => US [patent_app_date] => 2008-01-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 3352 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0179/20090179657.pdf [firstpage_image] =>[orig_patent_app_number] => 12008590 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/008590
Printed circuit board for coupling probes to a tester, and apparatus and test system using same Jan 10, 2008 Abandoned
Array ( [id] => 5949521 [patent_doc_number] => 20110031991 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-02-10 [patent_title] => 'PROBE BLOCK' [patent_app_type] => utility [patent_app_number] => 12/674097 [patent_app_country] => US [patent_app_date] => 2008-01-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3021 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0031/20110031991.pdf [firstpage_image] =>[orig_patent_app_number] => 12674097 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/674097
Probe block Jan 6, 2008 Issued
Array ( [id] => 4446350 [patent_doc_number] => 07863914 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-01-04 [patent_title] => 'Method for testing semiconductor memory device using probe and semiconductor memory device using the same' [patent_app_type] => utility [patent_app_number] => 12/003899 [patent_app_country] => US [patent_app_date] => 2008-01-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 8 [patent_no_of_words] => 6391 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 101 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/863/07863914.pdf [firstpage_image] =>[orig_patent_app_number] => 12003899 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/003899
Method for testing semiconductor memory device using probe and semiconductor memory device using the same Jan 2, 2008 Issued
Array ( [id] => 5543283 [patent_doc_number] => 20090153160 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-06-18 [patent_title] => 'CIRCUIT BOARD TEST CLAMP' [patent_app_type] => utility [patent_app_number] => 11/967059 [patent_app_country] => US [patent_app_date] => 2007-12-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 909 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0153/20090153160.pdf [firstpage_image] =>[orig_patent_app_number] => 11967059 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/967059
CIRCUIT BOARD TEST CLAMP Dec 28, 2007 Abandoned
Array ( [id] => 4925535 [patent_doc_number] => 20080164898 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-07-10 [patent_title] => 'Probe card for test of semiconductor chips and method for test of semiconductor chips using the same' [patent_app_type] => utility [patent_app_number] => 12/005888 [patent_app_country] => US [patent_app_date] => 2007-12-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 6859 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0164/20080164898.pdf [firstpage_image] =>[orig_patent_app_number] => 12005888 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/005888
Probe card for test of semiconductor chips and method for test of semiconductor chips using the same Dec 27, 2007 Abandoned
Array ( [id] => 4749723 [patent_doc_number] => 20080157794 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-07-03 [patent_title] => 'Probe unit substrate' [patent_app_type] => utility [patent_app_number] => 12/005488 [patent_app_country] => US [patent_app_date] => 2007-12-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 4781 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0157/20080157794.pdf [firstpage_image] =>[orig_patent_app_number] => 12005488 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/005488
Probe unit substrate Dec 26, 2007 Issued
Array ( [id] => 6339099 [patent_doc_number] => 20100019783 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-01-28 [patent_title] => 'METHOD, DETECTOR AND SYSTEM FOR MEASURING A SAMPLE CONCENTRATION' [patent_app_type] => utility [patent_app_number] => 12/521779 [patent_app_country] => US [patent_app_date] => 2007-12-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 2581 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0019/20100019783.pdf [firstpage_image] =>[orig_patent_app_number] => 12521779 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/521779
METHOD, DETECTOR AND SYSTEM FOR MEASURING A SAMPLE CONCENTRATION Dec 19, 2007 Abandoned
Array ( [id] => 5499770 [patent_doc_number] => 20090160458 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-06-25 [patent_title] => 'Network analyzer calibrator having electrical and electrooptical components' [patent_app_type] => utility [patent_app_number] => 12/004213 [patent_app_country] => US [patent_app_date] => 2007-12-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4867 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0160/20090160458.pdf [firstpage_image] =>[orig_patent_app_number] => 12004213 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/004213
Network analyzer calibrator having electrical and electrooptical components Dec 19, 2007 Issued
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