Arleen M. Vazquez

Array ( [id] => 6551775 [patent_doc_number] => 20100045333 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-02-25 [patent_title] => 'GENERATING TEST BENCHES FOR PRE-SILICON VALIDATION OF RETIMED COMPLEX IC DESIGNS AGAINST A REFERENCE DESIGN' [patent_app_type] => utility [patent_app_number] => 12/526691 [patent_app_country] => US [patent_app_date] => 2008-03-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 6089 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0045/20100045333.pdf [firstpage_image] =>[orig_patent_app_number] => 12526691 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6579142 [patent_doc_number] => 20100097049 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-04-22 [patent_title] => 'High Bandwidth Open-Loop Current Sensor' [patent_app_type] => utility [patent_app_number] => 12/529287 [patent_app_country] => US [patent_app_date] => 2008-02-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2614 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0097/20100097049.pdf [firstpage_image] =>[orig_patent_app_number] => 12529287 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8528523 [patent_doc_number] => 08305100 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-11-06 [patent_title] => 'Diagnosing an electronic sensor' [patent_app_type] => utility [patent_app_number] => 12/531536 [patent_app_country] => US [patent_app_date] => 2008-02-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 2192 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 111 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12531536 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8676293 [patent_doc_number] => 08384410 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2013-02-26 [patent_title] => 'Parallel test circuit with active devices' [patent_app_type] => utility [patent_app_number] => 12/035378 [patent_app_country] => US [patent_app_date] => 2008-02-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 8382 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 20 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12035378 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8115991 [patent_doc_number] => 08159212 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-04-17 [patent_title] => 'Magnetic encoder' [patent_app_type] => utility [patent_app_number] => 12/450205 [patent_app_country] => US [patent_app_date] => 2008-02-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 43 [patent_no_of_words] => 12725 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 278 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/159/08159212.pdf [firstpage_image] =>[orig_patent_app_number] => 12450205 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6414254 [patent_doc_number] => 20100141287 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-06-10 [patent_title] => 'TEST OF ELECTRONIC DEVICES AT PACKAGE LEVEL USING TEST BOARDS WITHOUT SOCKETS' [patent_app_type] => utility [patent_app_number] => 12/527418 [patent_app_country] => US [patent_app_date] => 2008-02-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 7522 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0141/20100141287.pdf [firstpage_image] =>[orig_patent_app_number] => 12527418 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4830309 [patent_doc_number] => 20080129326 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-06-05 [patent_title] => 'CHARACTERIZATION ARRAY CIRCUIT' [patent_app_type] => utility [patent_app_number] => 12/030140 [patent_app_country] => US [patent_app_date] => 2008-02-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3380 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0129/20080129326.pdf [firstpage_image] =>[orig_patent_app_number] => 12030140 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5478081 [patent_doc_number] => 20090201038 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-08-13 [patent_title] => 'TEST HEAD FOR FUNCTIONAL WAFER LEVEL TESTING, SYSTEM AND METHOD THEREFOR' [patent_app_type] => utility [patent_app_number] => 12/029086 [patent_app_country] => US [patent_app_date] => 2008-02-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 5168 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0201/20090201038.pdf [firstpage_image] =>[orig_patent_app_number] => 12029086 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6461801 [patent_doc_number] => 20100090692 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-04-15 [patent_title] => 'MAGNETIC SENSOR MODULE AND PISTON POSITION DETECTOR' [patent_app_type] => utility [patent_app_number] => 12/528585 [patent_app_country] => US [patent_app_date] => 2008-02-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 9027 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0090/20100090692.pdf [firstpage_image] =>[orig_patent_app_number] => 12528585 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 63883 [patent_doc_number] => 07764079 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2010-07-27 [patent_title] => 'Modular probe system' [patent_app_type] => utility [patent_app_number] => 12/023787 [patent_app_country] => US [patent_app_date] => 2008-01-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 9 [patent_no_of_words] => 4791 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 172 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/764/07764079.pdf [firstpage_image] =>[orig_patent_app_number] => 12023787 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 9128003 [patent_doc_number] => 08575954 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-11-05 [patent_title] => 'Structures and processes for fabrication of probe card assemblies with multi-layer interconnect' [patent_app_type] => utility [patent_app_number] => 12/525051 [patent_app_country] => US [patent_app_date] => 2008-01-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 10759 [patent_no_of_claims] => 44 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 187 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12525051 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6339080 [patent_doc_number] => 20100019779 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-01-28 [patent_title] => 'POTENTIAL MEASUREMENT APPARATUS AND IMAGE FORMING APPARATUS' [patent_app_type] => utility [patent_app_number] => 12/521081 [patent_app_country] => US [patent_app_date] => 2008-01-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4729 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0019/20100019779.pdf [firstpage_image] =>[orig_patent_app_number] => 12521081 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4518725 [patent_doc_number] => 07911216 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-03-22 [patent_title] => 'Semiconductor integrated circuit, debug/trace circuit and semiconductor integrated circuit operation observing method' [patent_app_type] => utility [patent_app_number] => 12/525953 [patent_app_country] => US [patent_app_date] => 2008-01-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 15 [patent_no_of_words] => 9667 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 176 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/911/07911216.pdf [firstpage_image] =>[orig_patent_app_number] => 12525953 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8621926 [patent_doc_number] => 08354841 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-01-15 [patent_title] => 'Method for influencing and/or detecting magnetic particles in a region of action, magnetic particles and the use of magnetic particles' [patent_app_type] => utility [patent_app_number] => 12/523548 [patent_app_country] => US [patent_app_date] => 2008-01-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 5 [patent_no_of_words] => 4391 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 165 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12523548 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6339154 [patent_doc_number] => 20100019791 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-01-28 [patent_title] => 'ELECTRONIC COMPONENT PRESSING DEVICE AND ELECTRONIC COMPONENT TEST APPARATUS' [patent_app_type] => utility [patent_app_number] => 12/527976 [patent_app_country] => US [patent_app_date] => 2008-01-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 6866 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0019/20100019791.pdf [firstpage_image] =>[orig_patent_app_number] => 12527976 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5341007 [patent_doc_number] => 20090179657 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-07-16 [patent_title] => 'Printed circuit board for coupling probes to a tester, and apparatus and test system using same' [patent_app_type] => utility [patent_app_number] => 12/008590 [patent_app_country] => US [patent_app_date] => 2008-01-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 3352 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0179/20090179657.pdf [firstpage_image] =>[orig_patent_app_number] => 12008590 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5949521 [patent_doc_number] => 20110031991 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-02-10 [patent_title] => 'PROBE BLOCK' [patent_app_type] => utility [patent_app_number] => 12/674097 [patent_app_country] => US [patent_app_date] => 2008-01-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3021 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0031/20110031991.pdf [firstpage_image] =>[orig_patent_app_number] => 12674097 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4446350 [patent_doc_number] => 07863914 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-01-04 [patent_title] => 'Method for testing semiconductor memory device using probe and semiconductor memory device using the same' [patent_app_type] => utility [patent_app_number] => 12/003899 [patent_app_country] => US [patent_app_date] => 2008-01-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 8 [patent_no_of_words] => 6391 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 101 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/863/07863914.pdf [firstpage_image] =>[orig_patent_app_number] => 12003899 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5543283 [patent_doc_number] => 20090153160 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-06-18 [patent_title] => 'CIRCUIT BOARD TEST CLAMP' [patent_app_type] => utility [patent_app_number] => 11/967059 [patent_app_country] => US [patent_app_date] => 2007-12-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 909 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0153/20090153160.pdf [firstpage_image] =>[orig_patent_app_number] => 11967059 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4925535 [patent_doc_number] => 20080164898 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-07-10 [patent_title] => 'Probe card for test of semiconductor chips and method for test of semiconductor chips using the same' [patent_app_type] => utility [patent_app_number] => 12/005888 [patent_app_country] => US [patent_app_date] => 2007-12-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 6859 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0164/20080164898.pdf [firstpage_image] =>[orig_patent_app_number] => 12005888 [rel_patent_id] =>[rel_patent_doc_number] =>)