
Arleen M. Vazquez
Supervisory Patent Examiner (ID: 12561, Phone: (571)272-2619 , Office: P/2868 )
| Most Active Art Unit | 2829 |
| Art Unit(s) | 2858, 2857, 2868, 2829 |
| Total Applications | 508 |
| Issued Applications | 374 |
| Pending Applications | 25 |
| Abandoned Applications | 113 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 5506255
[patent_doc_number] => 20090079462
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-03-26
[patent_title] => 'Semiconductor device testing apparatus'
[patent_app_type] => utility
[patent_app_number] => 11/903887
[patent_app_country] => US
[patent_app_date] => 2007-09-25
[patent_effective_date] => 0000-00-00
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[patent_figures_cnt] => 4
[patent_no_of_words] => 1035
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0079/20090079462.pdf
[firstpage_image] =>[orig_patent_app_number] => 11903887
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/903887 | Semiconductor device testing apparatus | Sep 24, 2007 | Abandoned |
Array
(
[id] => 6605623
[patent_doc_number] => 20100033204
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-02-11
[patent_title] => 'SEMICONDUCTOR INSPECTION APPARATUS AND SEMICONDUCTOR INTEGRATED CIRCUIT'
[patent_app_type] => utility
[patent_app_number] => 12/442768
[patent_app_country] => US
[patent_app_date] => 2007-09-19
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0033/20100033204.pdf
[firstpage_image] =>[orig_patent_app_number] => 12442768
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/442768 | SEMICONDUCTOR INSPECTION APPARATUS AND SEMICONDUCTOR INTEGRATED CIRCUIT | Sep 18, 2007 | Abandoned |
Array
(
[id] => 4925530
[patent_doc_number] => 20080164893
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-07-10
[patent_title] => 'Probe card for testing wafer'
[patent_app_type] => utility
[patent_app_number] => 11/901868
[patent_app_country] => US
[patent_app_date] => 2007-09-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
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[firstpage_image] =>[orig_patent_app_number] => 11901868
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/901868 | Probe card for testing wafer | Sep 18, 2007 | Abandoned |
Array
(
[id] => 8534079
[patent_doc_number] => 08310237
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-11-13
[patent_title] => 'Apparatus for and method of detecting a conductive object'
[patent_app_type] => utility
[patent_app_number] => 12/439751
[patent_app_country] => US
[patent_app_date] => 2007-08-31
[patent_effective_date] => 0000-00-00
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[patent_no_of_words] => 5501
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[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12439751
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/439751 | Apparatus for and method of detecting a conductive object | Aug 30, 2007 | Issued |
Array
(
[id] => 6357731
[patent_doc_number] => 20100250140
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-09-30
[patent_title] => 'Method and System for Detecting and Mapping Hydrocarbon Reservoirs Using Electromagnetic Fields'
[patent_app_type] => utility
[patent_app_number] => 12/377594
[patent_app_country] => US
[patent_app_date] => 2007-08-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
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[pdf_file] => publications/A1/0250/20100250140.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/377594 | Method and system for detecting and mapping hydrocarbon reservoirs using electromagnetic fields | Aug 29, 2007 | Issued |
Array
(
[id] => 6461890
[patent_doc_number] => 20100090701
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-04-15
[patent_title] => 'MARINE EM EXPLORATION'
[patent_app_type] => utility
[patent_app_number] => 12/310471
[patent_app_country] => US
[patent_app_date] => 2007-08-28
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0090/20100090701.pdf
[firstpage_image] =>[orig_patent_app_number] => 12310471
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/310471 | Marine EM exploration | Aug 27, 2007 | Issued |
Array
(
[id] => 93476
[patent_doc_number] => 07737709
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[patent_issue_date] => 2010-06-15
[patent_title] => 'Methods for planarizing a semiconductor contactor'
[patent_app_type] => utility
[patent_app_number] => 11/846012
[patent_app_country] => US
[patent_app_date] => 2007-08-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[patent_no_of_words] => 4497
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/737/07737709.pdf
[firstpage_image] =>[orig_patent_app_number] => 11846012
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/846012 | Methods for planarizing a semiconductor contactor | Aug 27, 2007 | Issued |
Array
(
[id] => 5444600
[patent_doc_number] => 20090045826
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-02-19
[patent_title] => 'Measuring probe with optical cable'
[patent_app_type] => utility
[patent_app_number] => 11/734787
[patent_app_country] => US
[patent_app_date] => 2007-08-18
[patent_effective_date] => 0000-00-00
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/734787 | Measuring probe with optical cable | Aug 17, 2007 | Abandoned |
Array
(
[id] => 5444601
[patent_doc_number] => 20090045827
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-02-19
[patent_title] => 'Multi-Site Probe'
[patent_app_type] => utility
[patent_app_number] => 11/840587
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[firstpage_image] =>[orig_patent_app_number] => 11840587
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/840587 | Multi-site probe | Aug 16, 2007 | Issued |
Array
(
[id] => 5288505
[patent_doc_number] => 20090021235
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-01-22
[patent_title] => 'METHODS AND SYSTEMS FOR DETECTING DC INFLUENCE IN A CURRENT SENSOR'
[patent_app_type] => utility
[patent_app_number] => 11/778463
[patent_app_country] => US
[patent_app_date] => 2007-07-16
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0021/20090021235.pdf
[firstpage_image] =>[orig_patent_app_number] => 11778463
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/778463 | Methods and systems for detecting DC influence in a current sensor | Jul 15, 2007 | Issued |
Array
(
[id] => 4913488
[patent_doc_number] => 20080094087
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-04-24
[patent_title] => 'Device for detecting chip location and method of detecting chip location using the device'
[patent_app_type] => utility
[patent_app_number] => 11/827689
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[patent_app_date] => 2007-07-13
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[firstpage_image] =>[orig_patent_app_number] => 11827689
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/827689 | Device for detecting chip location and method of detecting chip location using the device | Jul 12, 2007 | Abandoned |
Array
(
[id] => 6225830
[patent_doc_number] => 20100182034
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-07-22
[patent_title] => 'CIRCUIT FOR CONTINUOUSLY MEASURING DISCONTINUOUS METAL INSULATOR TRANSITION OF MIT ELEMENT AND MIT SENSOR USING THE SAME'
[patent_app_type] => utility
[patent_app_number] => 12/376668
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/376668 | Circuit for continuously measuring discontinuous metal insulator transition of MIT element and MIT sensor using the same | Jul 4, 2007 | Issued |
Array
(
[id] => 6523643
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[patent_title] => 'Oscilloscope Probe'
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Array
(
[id] => 4477860
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[patent_title] => 'Integrated light conditioning devices on a probe card for testing imaging devices, and methods of fabricating same'
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Array
(
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/768087 | Ultra-fine pitch probe card structure | Jun 24, 2007 | Issued |
Array
(
[id] => 4795683
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[patent_title] => 'Testing method and testing device for an integrated circuit'
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Array
(
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Array
(
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Array
(
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/227441 | Semiconductor device with fault detection function | Jun 12, 2007 | Issued |
Array
(
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[firstpage_image] =>[orig_patent_app_number] => 11811691
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/811691 | Current and voltage measurement device | Jun 11, 2007 | Issued |